SGS Thomson Microelectronics VNP10N06 Datasheet

VNP10N06
”OMNIFET”:
FULLY AUTOPROTECTED POWER MOSFET
June 1997
1
2
3
TO-220
BLOCK DIAGRAM
clamp
R
DS(on)
I
lim
VNP10N06 60 V 0.3 10 A
LINEARCURRENTLIMITATION
THERMALSHUT DOWN
SHORTCIRCUIT PROTECTION
INTEGRATEDCLAMP
LOW CURRENTDRAWN FROM INPUT PIN
LOGICLEVEL INPUTTHRESHOLD
ESDPROTECTION
SCHMITTTRIGGER ON INPUT
HIGH NOISE IMMUNITY
STANDARD TO-220 PACKAGE
DESCRIPTION
The VNP10N06 is a monolithic device made using SGS-THOMSON Vertical Intelligent Power M0 Technology, intended for replacement of standard power MOSFETS in DC to 50 KHz applications. Built-in thermal shut-down, linear current limitation and overvoltage clamp protect the chip in harsh enviroments.
1/11
ABSOLUTEMAXIMUM RATING
Symbol Parameter Value Unit
V
DS
Drain-source Voltage (Vin= 0 ) Int er nall y Clamped V
V
in
Input Voltage Int er nall y Clamped V
I
in
Input Current ± 20 mA
I
D
Drain Current Internally Limited A
I
R
Reverse DC Output Current -15 A
V
esd
Elect r o st at ic Discharge (C= 100 pF, R=1. 5 K)
4000 V
P
tot
Tot al Dissipat ion at Tc=25oC42W
T
j
Oper at i ng Junct ion Temperat ur e Internally Limited
o
C
T
c
Case Operating Temperature Internally Limited
o
C
T
stg
St orage Temperature -55 t o 150
o
C
THERMAL DATA
R
thj-case
R
thj-amb
Ther mal Resis t an ce Junction- case M ax Ther mal Resis t an ce Junction- ambient Max
3
62.5
o
C/W
o
C/W
ELECTRICAL CHARACTERISTICS (T
case
=25oC unlessotherwise specified)
OFF
Symbol Parameter Test Condition s Min. Typ. Max. Unit
V
CLAMP
Drain-source Clamp Volt age
ID= 200 mA Vin= 0 50 60 70 V
V
IL
Input Low Level Volt age
I
D
= 100 µAVDS=16V
1.5 V
V
IH
Input High Lev el Volt age
R
L
=27VDD=16V
V
DS
=0.5V
3.2 V
V
INCL
Input-Source Reverse Clamp Voltage
Iin=-1mA I
in
=1mA
-1 8
-0.3 11
V V
I
DSS
Zer o I npu t V olt age Drain Current (V
in
=0)
V
DS
=50V Vin=V
IL
VDS<35V Vin=V
IL
250 100
µA µA
I
ISS
Supply Current from Input Pin
VDS=0V Vin= 5 V 150 300 µA
ON ()
Symbol Parameter Test Condition s Min. Typ. Max. Unit
R
DS(on)
St at ic Drain-sour ce On Resistance
Vin=7V ID=1A TJ< 125oC0.150.3
DYNAMIC
Symbol Parameter Test Condition s Min. Typ. Max. Unit
C
oss
Out put Capacit anc e VDS=13V f=1MHz Vin= 0 350 500 pF
VNP10N06
2/11
ELECTRICAL CHARACTERISTICS (continued) SWITCHING(∗∗)
Symbol Parameter Test Condition s Min. Typ. Max. Unit
t
d(on)
t
r
t
d(off)
t
f
Turn-on Delay Time Rise Time Turn-off Delay T ime Fall T ime
VDD=16V Id=1A V
gen
=7V R
gen
=10
(see figure 3)
1100
550 200 100
1600
900 400 200
ns ns ns ns
t
d(on)
t
r
t
d(off)
t
f
Turn-on Delay Time Rise Time Turn-off Delay T ime Fall T ime
VDD=16V Id=1A V
gen
=7V R
gen
=1000
(see figure 3)
1.2 1
1.6
1.2
1.8
1.5
2.3
1.8
µs µs µs µs
(di/dt)
on
Tur n-on Current Slope VDD=16V ID=1A
V
in
=7V R
gen
=10
1.5 A/µs
Q
i
Total Input Charge VDD=12V ID=1A Vin=7V 13 nC
SOURCE DRAIN DIODE
Symbol Parameter Test Condition s Min. Typ. Max. Unit
V
SD
()ForwardOnVoltage ISD=1A Vin=V
IL
0.8 1.6 V
t
rr
(∗∗)
Q
rr
(∗∗)
I
RRM
(∗∗)
Reverse Re covery Time Reverse Re covery Charge Reverse Re covery Current
I
SD
= 1 A di/dt = 100 A/µs
V
DD
=30V Tj=25oC
(see test cir cuit, figure 5)
125
0.22
3.5
ns
µC
A
PROTECTION
Symbol Parameter Test Condition s Min. Typ. Max. Unit
I
lim
Drain Current Limit Vin=7V VDS=13V 6 10 15 A
t
dlim
(∗∗) Step Response
Current Lim it
Vin=7V VDSstepfrom0to13V 12 20 µs
T
jsh
(∗∗) Ov ert emperatu re
Shut dow n
150
o
C
T
jrs
(∗∗) Ov ert emperatu re Reset 135
o
C
E
as
(∗∗) Si ngle Pulse
Avalanche E ner gy
starting Tj=25oCVDD=24V V
in
=7V R
gen
=1KΩ L=10mH
250 m J
() Pulsed: Pulse duration = 300 µs,duty cycle 1.5 % (∗∗) Parameters guaranteed by design/characterization
VNP10N06
3/11
PROTECTION FEATURES
During Normal Operation, the INPUT pin is electrically connected to the gate of the internal power MOSFET through a low impedance path as soon as V
IN>VIH
.
The device then behaves like a standard power MOSFET and can be used as a switch from DC to 50KHz. The only difference from the user’s standpoint is that a small DC current (typically 150 µA) flows into the INPUT pin in order to supplythe internalcircuitry.
During turn-off of an unclamped inductive load the output voltage is clamped to a safe level by an integrated Zener clamp between DRAIN pin and the gateof theinternal Power MOSFET.
In this condition, the Power MOSFET gate is set
to a voltage high enough to sustain the inductive load current even if the INPUT pin is driven to 0V.
The device integrates an active current limiter circuit which limits the drain current I
D
to I
lim
whateverthe INPUTpin Voltage. When the current limiter is active, the device
operatesin thelinear region,so power dissipation may exceed the heatsinkingcapability. Both case and junction temperatures increase, and if this phase lasts long enough, junction temperature may reach the overtemperaturethreshold T
jsh
.
If T
j
reaches T
jsh
, the device shuts down whatever the INPUT pin voltage. The device will restart automaticallywhen T
j
has cooled down to
T
jrs
VNP10N06
4/11
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