Independent supply for CMOS output stage
with 2.5V/3.3V capability
■ SFDR= -68.3 dBc @ Fin=10MHz
■ 1GHz analog bandwidth Track-and-Hold
■ Common clocking between channels
■ Dual simultaneous Sample and Hold inputs
■ Multiplexed outputs
■ Built-in reference voltage with external bias
capability
DESCRIPTION
The TSA1203 is a new generati on of high speed,
dual-channel Analog to Digital converter pro-
cessed in a mainstream 0.25µm CMOS techno logy yielding high performances and very low power
consumption.
The TSA1203 is specifically designed for applications requiring very low noise floor, high SFDR
and good isolation b etween channels. It is based
on a pipeline structure and digital error correction
to provide high sta tic linearity at Fs=40M sps, and
Fin=10MHz.
For each channel, a voltage reference is integrated to simplify the design and minimize external
components. It is nevertheless possible to use the
circuit with external references.
Each ADC outputs are multiplexed in a common
bus with small number of pins. A tri-state capability is available for the outputs, allowing chip s election. The inputs of t he ADC must be differentially
driven.
The TSA1203 is available in extended (0 to
+85°C) temperature range, in a small 48 pins
TQFP package.
APPLICATIONS
■ Medical imaging and ultrasound
■ 3G basestation
■ I/Q signal processing applications
■ High speed data acquisition system
■ Portable in st ru me nta t ion
PIN CONNECTIONS (top view)
REFPI
REFMI
INCMI
index
corner
AVCCB
4844 43 42 41 40 39 38
46 45
47
1
AGND
2
INI
3
AGND
4
INIB
5
AGND
6
IPOL
7
8
AGND
INQ
9
10
AGND
11
INBQ
AGND
12
13 14 15 16 17 18 19 20 21 22
REFPQ
INCMQ
REFMQ
AVCC
AVCC
TSA1203
AGND
AVCC
DVCC
GNDBE
VCCBI
VCCBI
OEB
SELECT
CLK
DGND
BLOCK DIAGRAM
SELECT
CLK
Timing
12
12
GND
M
U
X
VINI
VINBI
VINCMI
VREFMI
IPOL
VINQ
VINBQ
common mode
Polar.
common mode
VREFPI
VREFPQ
VREFMQ
VINCMQ
PACKAGE
+2.5V/3.3V
AD 12
I channel
AD 12
Q channel
REF I
REF Q
DGND
VCCBE
12
D0(LSB)
23 24
DVCC
OEB
D1
37
36
34
33
27
26
25
GNDBI
Buffers
GNDBE
35
32
31
30
29
28
D2
D3
D4
D5
D6
D7
D8
D9
D10
D11(MSB)
VCCBE
GNDBE
VCCBE
12
D0
TO
D11
ORDER CODE
Part Number
TSA1203IF0°C to +85°CTQFP48TraySA120 3I
TSA1203IFT0°C to +85°CTQFP48Tape & ReelSA1203I
EVAL1203/BAEvaluation board
TodData Output Delay (Clock edge to Data Valid) 10pF load capacitance9ns
Tpd IData Pipeline delay for I channel7cycles
Tpd QData Pipeline delay for Q channel7.5cycles
TonFalling edge of OEB to digital output valid data1ns
ToffRising edge of OEB to digital output tri-state1ns
2/20
TIMING DIAGRAM
Simultaneous sampling
on I/Q channels
N+3
N+4
N+5
N+6
N+12
TSA1203
N+13
I
Q
CLK
SELECT
OEB
DATA
OUTPUT
sample N-9
I channel
N-1
N
sample N-8
I channel
samp le N-7
Q channel
N+1
N+2
sample N-6
Q channel
PIN CONNECTIONS (top view)
index
corner
1
AGND
2
INI
3
AGND
4
INIB
5
AGND
6
IPOL
7
AVCCB
8
AGND
INQ
9
10
AGND
INBQ
11
AGND
12
N+7
Tpd I + Tod
CLOCK AND SELECT CONNECTED TOGETHER
sample N+1
I channel
GNDBE
REFPI
REFMI
INCMI
AVCC
47
4844 43 42 41 40 39 38
46 45
VCCBI
AVCC
OEB
VCCBE
VCCBI
TSA1203
13 14 15 16 17 18 19 20 21 22
REFPQ
AGND
AVCC
INCMQ
REFMQ
DVCC
SELECT
CLK
DGND
DGND
sample N
Q channe l
D0(LSB)
37
23 24
DVCC
GNDBI
N+8
D1
N+9
Tod
sample N+1
Q channel
sample N+2
I channel
D2
36
D3
35
D4
34
D5
33
32
D6
31
D7
D8
30
D9
29
D10
28
D11(MSB)
27
26
VCCBE
GNDBE
25
N+10
sample N+2
Q channel
sample N+3
I chan n el
N+11
3/20
TSA1203
PIN DESCRIPTION
Pin NoNameDescriptionObservationPin NoNameDescriptionObservatio n
1AGND Analog ground0V25GNDBE Digital buff er ground0V
2INII channel analog input26VCCBE Digital Buffer power supply2.5V/3.3V
3AGND Analog ground0V27D11(MSB) Most Significant Bit outputCMOS output (2.5V/3.3V)
4INBII channel inverted analog input28D10Digital outputCMOS output (2.5V/3.3V)
5AGND Analog ground0V29D9Digital outputC MOS output (2.5V/3.3V)
6IPOLA nalog bias current input30D8Digit al outputCMOS output (2.5V/3.3V)
7AVCCAnalog power supply2.5V31D7Digital outputCMOS output (2.5V/3.3V)
8AGND Analog ground0V32D6Digital outputC MOS output (2.5V/3.3V)
9INQQ channel analog input33D5Digital outputCMOS output (2.5V/3.3V)
10AGND Analog grou nd0V3 4D4Digital ou tputCMOS output (2. 5V/3.3V)
11INBQQ channel inverted analog input35D3Digital outputCMOS output (2.5V/3.3V)
12AGND Analog grou nd0V3 6D2Digital ou tputCMOS output (2. 5V/3.3V)
13REFPQ Q channel top reference voltage37D1Digital outputCMOS output (2.5V/3.3V)
14REFMQ Q channel bottom reference
15INCMQ Q channel input common mode39VCCBE Digital Buffer power supply2.5V/3.3V - See Application
16AGND Analog grou nd0V4 0GNDBE Digital buffer ground0V
17AVCCAnalog power supply2.5V41VCCBIDigital Buffer power supply2.5V
18DVCCDigital power supply2.5V42VCCBIDigital Buffer powe r s upply2.5V
19DGNDDigital ground0V43OEBOutput Enable input2.5V/3.3V CMOS input
20CLKClock input2.5V CMOS input44AVCCAnalog power supply2.5V
21SELECT Channel selection2.5V CMOS input45AVCCAnalog power supply2.5V
22DGNDDigital ground0V46INCMII channel input common mode
23DVCCDigital power supply2.5V47REFMII channel bottom reference voltage 0V
24GNDBI Digital buffer ground0V48REFPII channel top reference voltage
voltage
0V38D0(LSB) Least Significant Bit outputCMOS output (2.5V/3.3V)
Note
ELECTRICAL CHARACTERISTICS
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValuesUnit
AVCC
DVCC
VCCBE
VCCBI
Analog Supply voltage
Digital Supply voltage
Digital buffer Supply voltage
Digital buffer Supply voltage
IDoutDigital output current-100 to 100mA
TstgStorage temperature+150°C
ESD
HBM: Human Body Model
CDM: Charged Device Model
Latch-up
1). All voltages values, except differential voltage, are with respect to network ground terminal. The magnitude of input and output voltages must not exceed -0.3V or VCC
2). ElectroStatic Discharge pulse (ESD pulse) simulating a human body discharge of 100 pF through 1.5kΩ
3). Discharge to Ground of a device that has been previously charged.
4). Corporate ST Microelectronics procedure number 0018695
Class
4)
1)
1)
1)
1)
2)
3)
0 to 3.3V
0 to 3.3V
0 to 3.6V
0 to 3.3V
2
1.5
kV
A
4/20
OPERATING CONDITIONS
SymbolParameterMinTypMaxUnit
AVCCAnalog Supply voltage2.252.52.7V
DVCCDigital Supply voltage2.252.52.7V
VCCBEExternal Digital buffer Supply voltage2.252.53.5V
VCCBIInternal Digital buffer Supply voltage2.252.52.7V
TSA1203
VREFPI
VREFPQ
VREFMI
VREFMQ
INCMI
INCMQ
Forced top voltage reference0.941.4V
Forced bottom reference voltage00.4V
Forced input common mode voltage0.21V
ANALOG INPUTS
SymbolParameterTest conditionsMinTypMaxUnit
VIN-VINB Full scale refere nce voltag eDifferential inputs mandatory1.12.02 .8Vpp
ICCBEDigital Buffer Supply Current (10pF load)6.69.4mA
ICCBIDigital Buffer Supply Current 274440
PdPower consumption in normal operation mode230271mW
RthjaThermal resistance (TQFP 48)80°C/W
ACCURACY
SymbolParameterMinTypM axUnit
OEOffset Error2.97LSB
GEGain Error0.1%
DNLDifferential Non Linearity±0.52LSB
INLIntegral Non Linearity±3LSB
-Monotonicity and no missing codesGuaranteed
A
µ
MATCHING BETWEEN CHANNELS
SymbolParameterMinTypMaxUnit
GMGain match0.041%
OMOffset match0.88LSB
PHMPhase match1dg
XTLKCrosstalk rejection85dB
6/20
TSA1203
DEFINITIONS OF SPECIFIED PARAMETERS
STATIC PARAMETERS
Static measurements are performed through
method of histograms on a 2MHz input signal,
sampled at 40Msps, which is high e nough to fully
characterize the test frequency response. The
input level is +1dBFS to saturate the signal.
Differen tial N on Li n e ari ty (DNL)
The average de viation of any output code width
from the ideal code width of 1 LSB.
Integral Non linearity (INL)
An ideal c onverter pres ent s a transfer function as
being the straight line from the starting code to the
ending code. The INL is the deviation for each
transition from this ideal curve.
DYNAMIC PARAMETERS
Dynamic measurements are performed by
spectral analysis, applied to an input sine wave of
various frequencies and sampled at 40Msps.
The input level is -1dBFS to measure the linear
behavior of the converter. All the parameters are
given without correction for the full scale amplitude performance except the calculated ENOB
parameter.
Spurious Free Dynamic Range (SFDR)
The ratio between the power of the worst spurious
signal (not always an harmonic) and the amplitude
of fundamental tone (signal power) over the full
Nyquist band. It is expressed in dBc.
Total Harmonic Distortion (THD)
The ratio of the rm s sum of the first five harmo nic
distortion components to the rms value of the
fundamental line. It is expressed in dB.
Signal to Noise Ratio (SNR)
The ratio of the rms value of the fundamental
component to the rms sum of all other spectral
components in the Nyquist band (f
/2) excluding
s
DC, fundamental and the first five harmonics.
SNR is reported in dB.
Signal to Noise and Distortion Ratio (SINAD)
Similar ratio as for SNR but including the harmonic
distortion components in the noise figure (not DC
signal). It is expressed in dB.
From the SINAD, the Effective Number of Bits
(ENOB) can easily be deduced using the formula:
SINAD= 6.02 × ENOB + 1.76 dB.
When the applied signal is not Full Scale (FS), but
has an A
amplitude, the SINAD expression
0
becomes:
SINAD
SINAD
=SINAD
2Ao
=6.02 × ENOB + 1.76 dB + 20 log (2A0/
2Ao
Full Scale
+ 20 log (2A0/FS)
FS)
The ENOB is expressed in bits.
Analog Input Bandwidth
The maximum analog input frequency at which the
spectral response of a full power signal is reduced
by 3dB. Higher values can be achieved with
smaller input levels.
Effective Resolution Bandwidth (ERB)
The band of input signal frequencies that the ADC
is intended to convert without loosin g linearity i.e.
the maximum analog input frequency at which the
SINAD is decreased by 3dB or t he ENOB b y 1/2
bit.
Pipeline delay
Delay between the initial sample of the analog
input and the availability of the corresponding
digital data output, on the output bus. Also called
data latency. It is expressed as a num ber of clock
cycles.
7/20
TSA1203
Static param e te r: Integral Non Linearity
Fs=40MSPS; Icca=60mA; Fin=2MHz
2.5
2
1.5
1
0.5
0
-0.5
INL (LSBs)
-1
-1.5
-2
-2.5
05001000150020002500300035004000
Static param e te r: Dif fe ren t ial Non Li nearity
Linearity vs. VCCBE
Fs=40MSPS; Icca=60m A ; Fin=5M Hz
70
69
68
67
66
65
64
Dynamic parameter s (dB)
63
62
61
60
SINAD_Q
2.252.753.25
VCCBE (V)
10/20
SINAD_I
ENOB_I
SNR_ISNR_Q
ENOB_Q
12
11.5
11
10.5
10
9.5
9
8.5
8
Distortion vs. VCCBE
Fs=40MSPS; Icca=60m A ; Fin=5M Hz
-40
-50
-60
-70
-80
ENOB (bits)
-90
-100
Dynamic Parameters (dBc)
-110
2.252.753.25
SFDR_Q
THD_I
SFDR_I
THD_Q
VCCBE (V)
TSA1203
Linearity vs. Duty Cycle
Fs=40MHz; Icca=60mA ; Fin=5MHz
100
90
80
70
60
50
Dynamic parameter s (dB)
40
ENOB_I
ENOB_Q
SNR_I SINAD_I
SNR_Q
SINAD_Q
4849505152
Positive Dut y Cycle ( %)
Single-tone 8K FFT at 40Msps - Q Channel
Fin=5MHz; Icca=60mA, Vin@-1dBFS
0
-20
-40
-60
-80
-100
Power spectrum (dB)
-120
-140
2 4 6 8121416182010
Distortion vs. Duty Cycle
Fs=40MHz; Icca=60mA ; Fin=5MHz
12
11
10
9
8
7
ENOB (bits)
6
5
4
Frequency (MHz)
-40
Dynamic parameters (dBc)
-50
-60
-70
-80
-90
-100
SFDR_Q
SFDR_I
4849505152
THD_Q
THD_I
Positive Dut y Cycle (%)
Dual-tone 8K FFT at 40Msps - Q Channel
Fin1=0.93MHz; Fin2=1. 11MHz; Icca=70mA, Vin1@-7dBFS; Vin2@-7dBFS; IMD=-69d Bc
0
-20
-40
-60
-80
-100
Power spectrum (dB)
-120
2.557.5101517.52012.5
Frequency (MHz)
11/20
DETAILED INFORMATION
TSA1203 APPLICATION NOTE
The TSA1203 is a dual-channel, 12-bit resolution
high speed ana log to digital converter based on a
pipeline structure and the late st deep sub micron
CMOS process t o a ch ieve the best pe rformanc es
in terms of linearity and power consumption.
Each channel achieves 12-bi t resolution through
the pipeline structure which consists of 12 internal
conversion stages in which the analog signal is
fed and sequentially converted into digital data. A
latency time of 7 clock periods is necessary to obtain the digitized data on the output bus.
The input signals are simultaneously sampled on
both channels on the rising edge of the clock. The
output data are valid on the rising edge of the
clock for I channel and on the falling edge of the
clock for Q channel. The digital data out from the
different stages mus t be time del ayed depending
on their order of conversion. Then a digital data
correction completes the p rocessing and ensures
the validity of the ending codes on the output bus.
The structure has been specifically designed to
accept differential signals.
The TSA1203 is pin to pin compatible with the
dual 10 bits/20Msps, TSA1005-20, the dual 10bits
/40Msps, TSA1005-40 and the dual 12bits/
20Msps,TSA1204.
COMPLEMENTARY FUNCTIONS
Some functionalities hav e been added i n order to
simplify as much as possible the application
board. These operational modes are described as
followed.
Output Enable (OEB)
When set to low level (VIL), all digital outputs
remain active and are in low impedance state.
When set to high level (VIH), all digital outputs
buffers are in high impedance state while the
converter goes on sampling. When OEB is set to a
low level again, t he data a re then present on the
output with a very short Ton delay.
Therefore, this allows the chip select of the device.
The timing diagram summarizes this functionality.
In order to remain in the normal operating m ode,
this pin should be grounded through a low value of
resistor.
SELECT
The digital data out from each ADC c ores are multiplexed together to share the same output bus.
This prevents from increasing t he num ber of pins
and enables to keep t he same p ackage as s ingle
channel ADC like TSA1201.
The selection of the chan nel information is done
through the "SELECT" pin. When s et to high leve l
(VIH), the I chan nel data are present o n the bus
D0-D11. When set to low level (VIL), the Q channel data are on the output bus D0-D11.
Connecting SELECT to CLK allows I and Q channels to be simultaneously present on D0-D11; I
channel on the rising edge of the clock and Q
channel on the falling edge of the clock. (see timing diagram page 2).
REFERENCES AND COMMON MODE
CONNECTION
VREFM must be always connected externally.
Internal reference and common mode
In the default configuration, the ADC operates with
its own reference and common mode voltages
generated by its internal bandgap. VREFM pins
are connected externally to the Analog Ground
while VREFP (respectively INCM) are set to their
internal voltage of 0.89V (respectively 0.46V). It is
recommended to dec ouple the V REFP and I NCM
in order to minimize low and high frequency noise
(refer to Figure 1).
Figure 1 : Internal reference and common mode
setting
1.03V
VIN
TSA1203
VINB
VREFM
VREFP
INCM
330pF4.7uF
10nF
0.57V
330pF4.7uF
10nF
12/20
TSA1203
External reference and common mode
Each of the voltages VREFP and INCM can be
fixed externally to better fit to the application
needs (Refer to Table ’OPERATING
CONDITIONS’ page 5 for min/max values).
The VREFP, VREFM voltages set the analog
dynamic at the input of the converter that has a full
scale amplitude of 2*(VREFP-VREFM). Using
internal references, the dynamic range is 1.8V.
The best linearity and distortion performances are
achieved with a dynamic range ab ove 2Vpp and
by increasing the VREFM voltage instead of
lowering the VREFP one.
The INCM is the mid voltage of the analog input
signal.
It is possible to use an external reference vo ltage
device for specific applications requiring even
better linearity, accuracy or enhanced
temperature behavior.
Using the STMicroelectronics TS821 or
TS4041-1.2 Vref leads to optimum performanc es
when configured as shown on Figure 2.
Figure 2 : External reference setting
1k
Ω
330pF4.7uF
10nF
VCCA
VREFP
VIN
TSA1203
VINB
VREFM
TS821
TS4041
external
reference
DRIVING THE DIFFERENTIAL ANALOG
INPUTS
The TSA1203 has been designed to obtain
optimum performances when being differentially
driven. An RF transformer is a good way to
achieve such performances.
Figure 3 describes the schematics. The input
signal is fed to the primary of the transformer,
while the secondary drives both ADC inputs. The
common mode voltage of the ADC (INCM) is
connected to the center-tap of the secondary of
the transformer in order to bias the input signal
around this common voltage, internally set to
0.46V. It determines the DC component of the
analog signal. As being an high impedance inp ut,
it acts as an I /O and can be externally driven t o
adjust this DC component. The INCM is
decoupled to maintain a low noise level on this
node. Our evaluat ion board i s m ount ed with a 1:1
ADT1-1WT transformer from Minicircuits. You
might also use a higher impedance ratio (1:2 or
1:4) to reduce the driving requirement on the
analog signal source.
Each analog input c an drive a 1.4Vpp amplitude
input signal, so the resultant differential amplitude
is 2.8Vpp.
Figure 3 : Differential input configuration with
transformer
Analog source
50Ω
ADT1-1
1:1
330pF
33pF
10nF
VIN
VINB
TSA1203
I or Q ch.
INCM
470nF
Figure 4 represents the biasing of a differential
input signal in AC-coupled differential input
configuration. Both inputs VIN and VINB are
centered around t he common mode voltage, that
can be let internal or fixed externally.
Figure 4 : AC-coupled differential input
common
mode
50Ω
50Ω
10nF
33pF
10nF
100kΩ
100kΩ
INCM
VIN
TSA1203
VINB
Figure 5 shows a DC-coupled configuration with
forced VREFP and INCM to the 1V DC
analog input while VREFM is connected to
ground; we achieve a 2Vpp differential amplitude.
13/20
TSA1203
Figure 5 : DC-coupled 2Vpp differential analog
input
analog
DC
analog
DC
VREFP-VREFM = 1 V
AC+DC
330pF
VIN
VINB
10nF
VREFP
TSA1203
VREFM
INCM
4.7uF
Clock input
The TSA1203 performance i s very dependant on
your clock input accuracy, in terms of aperture
jitter; the use of low jitter crystal controlled
oscillator is recom m ended.
The duty cycle must be between 45% and 55%.
The clock power supplies must be separated from
the ADC output ones to avoid digital noise
modulation at the output.
It is recommended to keep the circuit clocked, to
avoid random states, before applying the supply
voltages.
Power consumption
So as to optimize both performance and power
consumption of the TSA1203 according the
sampling frequency, a resistor is pl aced between
IPOL and the analog Gr ound pins. Theref ore, the
total dissipation is adjustable from 30Msps up to
40Msps.
The TSA1203 will combine hi ghest perf ormance s
and lowest consumption at 40Msps when Rpol is
equal to 18kΩ. This value is nevertheless dependant on application and environment.
At lower sampling frequency range, this value of
resistor may be adjusted in order to decrease the
analog current without any degradation of
dynamic performances.
The table below sums up the relevant data.
Figure 6 : Total power consumption optimization
depending on Rpol value
Fs (Msps)303540
kΩ)
Rpol (
Optimized
power (mW)
382818
145180230
APPLICATION
Layout precautions
To use the ADC circuits in the best manner at high
frequencies, some p recautions have to be taken
for power supplies:
- First of all, the implementation of 4 separate
proper supplies and ground planes (analog,
digital, internal and external buffer ones) on the
PCB is advised for high speed circuit applications
to provide low inductance and low resistance
common return.
The separation of the analog signal from the
digital part is mandatory to prevent noise from
coupling onto the input signal. The best
compromise is to connec t from one pa rt AGND,
DGND, GNDBI in a common point whereas
GNDBE must be isolated. Similarly, The power
supplies AVCC, DVCC and VCCBI must be
separated from the VCCBE one.
- Power supply bypass capacitors must be placed
as close as possible to the IC pins in order to
improve high frequency bypassing and reduce
harmonic distortion.
- Proper termination of all inputs and outputs must
be incorporated with output termination resistors;
then the amplifier load will be on ly resistive and
the stability of the amplifier will be improved. All
leads must be wide and as short as possible
especially for the analog input in order to decrease
parasitic capacitance and inductance.
- To keep the capacitive loading as low as
possible at digital outputs, short lead lengths of
routing are essential to minimize currents when
the output changes. To minimize this output
capacitance, buffers or latches close to the output
pins will relax this constraint.
- Choose component sizes a s small as poss ible
(SMD).
Digital Interface application
Thanks to its wide external buffer power supply
range, the TSA1203 is perfectly suitable to plug in
to 2.5V low voltage DSPs o r digital interfaces as
well as to 3.3V ones.
Medical Imaging application
Driven by the demand of the applications requiring
nowadays either porta bility or hig h degree of parallelism (or both), this product has been developed to satisfy medi cal imaging, and telecom infrastructures needs.
As a typical system diag ram shows f igure 7, a nar row input beam of acoustic energy is sent i nto a
living body via the transducer and the energy reflected back is analyzed.
14/20
TSA1203
Figure 7 : Medical imaging application
HV TX amps
TX beam
former
Mux and
T/R
switches
ADC
TGC amplifier
RX beam
former
Processing
and dis play
The transducer is a p iezoele ctric ceram ic suc h as
zirconium titanate. The whole array can reach up
to 512 channels.
The TX beam former, amplified by the HV TX
amps, delivers up to 100V amplitude excitation
pulses with phase and amplitude shifts.
The mux and T/R s witch is a t wo wa y input signa l
transmitter/ output receiver.
To compensate for skin and tissues attenuation
effects, The Time Gain Com pensat ion (TGC) am plifier is an exponential amplifier that enables the
amplification of low voltage signals to the ADC input range. Differential output structure with low
noise and very high linearity are man datory factors.
These applications need high speed, low power
and high performance ADCs. 10-12 bit
resolution is necessary to lower the quantification
noise. As m ultiple c han nels are used, a dual c onverter is a must for room saving issues.
The input signal is in the range of 2 to 20MHz
(mainly 2 to 7MHz) and the application uses mostly a 4 over-sampling ratio for Spurious Free Dynamic Range (SFDR) optimization.
The next RX beam former and processing blocks
enable the anal ysis of the outputs channels versus the input beam.
EVAL1203/BA evaluation board
The EVAL1203/BA is a 4-layer board with high
decoupling and grounding level. The schematic of
the evaluation board is reported figure 11 and its
top overlay view figure 10. The characterization of
the board has been made with a fully ADC
devoted test bench as shown on Figure 8. The
analog input signal must be filtered to be very
pure.
The dataready signal is the acquisition clock of the
logic analyzer.
The ADC digital outputs are latched by the octal
buffers 74LCX573.
All characterization measurements have been
made with:
- SFSR=1dB for static parameters.
- SFSR=-1dB for dynamic paramete rs.
Figure 8 : Analog to Digital Converter characterization bench
HP8644
Sine Wave
Generator
Vin
HP8133
HP8644
ADC
evaluation
board
Pulse
Generator
Sine Wave
Generator
Data
Clk
Clk
Logic
Analyzer
PC
15/20
TSA1203
Operating conditions of the evaluation board:
Find below the connect ions to the b oard for the
power supplies and other pins:
board
notation
AVAVCC
AGAGND
RPIR EFPI0.89<1.4
RMIREFMI<0.4
CMIINCMI
RPQREFPQ
RMQREFMQ
CMQINCMQ
DVD VCC
connection
internal
voltage (V)
0.46<1
0.89<1.4
0.46<1
external
voltag e (V)
2.5
0
<0.4
2.5
Grounding consideration
So as to better reject noise on t he board, connect
on the bottom overlay AG (AGND), DG(DGND),
GB1(GNDBI) together from one part, and
GB2(GNDBE) with GB3(GNDB3) from the other
part.
Mode select
So as to evaluate a single channel or the dual
ones, you have to connect on the board the
relevant position for the SELECT pin (see figure 9)
With the strap connected
- to the upper connectors, the I channel at the output is selected.
- horizontally, the Q channel at the output is selected.
- to the lower connectors, both channels are selected, relative to the clock edge.
Figure 9 : mode select
DGDGND
GB1GNDB I
VB1VCCBI
GB2GNDBE
VB2V CCBE
GB3GNDB3
VB3VCCB32.5
0
0
2.5
0
2.5/3.3
0
Care should be taken for the evaluation board
considering the fact t hat the outputs of the converter are 2.5V/3.3V (VCCB2) tolerant whereas
the 74LCX573 external buffers are operating up to
2.5V.
Singl e and Differenti a l I nputs:
The ADC board compone nts are mounted to test
the TSA1203 with single analog input; the
ADT1-1WT transformer enables the differential
drive into the converter; in this configuration, the
resistors RSI6, RSI7, RSI8 for I channel (respectively RSQ6, RSQ7, RSQ8 for Q one) are connected as short circuits whereas RSI5, RSI9 (respectively RSQ5, RSQ9) are open circuits.
The other way is to test it via JI1 and JI1B differential inputs. So, the resistances RSI5, RSI9 for I
channel (respectively RSQ5, RSQ9 for Q one) are
connected as short circuits whereas RS I6, RSI7,
RSI8 (respectively RSQ6, RSQ7, RSQ8 for Q
one) are open circuits.
SELECT
I channel
SELECT
Q channel
I/Q channels
DVCCDGNDCLK
schematicboard
Consum pt io n adj ustment
Before any characterization, care should be taken
to adjust the Rpol (Raj1) and therefore Ipol value
in function of your sampling frequency.
16/20
Figure 10 : Printed circuit of evaluation board.
TSA1203
17/20
TSA1203
1
1
2
2
3
3
M
G
V
Figure 11 : TSA1203 Evaluation board schematic
D0 GND
D1 GND
D2 GND
D3 GND
D4 GND
D5 GND
D6 GND
D7 GND
D8 GND
D9 GND
D10 GND
D11 GND
CLK GND
J6
123456789
RS5 RS6 RS 7 RS 8 RS9
C C C
C C
C C
single input
differential input
Open Normal mode
Short High Impedance output mode
Switch S5
Open Normal mode
Short Test mode
VCCB3
VccB
GndB
VccB
VCCB2Switch S4 OEB Mode
GndB
VccB
GndB
VCCB1
J17
BU FPO W
J25
CKDATA
R5
50
1
2
J26
CON2
VCCB2
VCCB1
INCM
REF
REFP
JI2
VREF I
NM: non soudéanalog input with transformer (default)
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