Datasheet TSA1203IFT, TSA1203IF, TSA1203 Datasheet (SGS Thomson Microelectronics)

TSA1203
DUAL-CHANNEL, 12-BIT, 40MSPS, 230mW A/D CONVERTER
Low power consumption: 230mW@40Msps
Single supply voltage: 2.5V
Independent supply for CMOS output stage with 2.5V/3.3V capability
SFDR= -68.3 dBc @ Fin=10MHz
1GHz analog bandwidth Track-and-Hold
Common clocking between channels
Multiplexed outputs
Built-in reference voltage with external bias
capability
DESCRIPTION
The TSA1203 is a new generati on of high speed, dual-channel Analog to Digital converter pro-
cessed in a mainstream 0.25µm CMOS techno lo­gy yielding high performances and very low power consumption. The TSA1203 is specifically designed for applica­tions requiring very low noise floor, high SFDR and good isolation b etween channels. It is based on a pipeline structure and digital error correction to provide high sta tic linearity at Fs=40M sps, and Fin=10MHz. For each channel, a voltage reference is integrat­ed to simplify the design and minimize external components. It is nevertheless possible to use the circuit with external references. Each ADC outputs are multiplexed in a common bus with small number of pins. A tri-state capabili­ty is available for the outputs, allowing chip s elec­tion. The inputs of t he ADC must be differentially driven. The TSA1203 is available in extended (0 to +85°C) temperature range, in a small 48 pins TQFP package.
APPLICATIONS
Medical imaging and ultrasound
3G basestation
I/Q signal processing applications
High speed data acquisition system
Portable in st ru me nta t ion
PIN CONNECTIONS (top view)
REFPI
REFMI
INCMI
index corner
AVCCB
48 44 43 42 41 40 39 38
46 45
47
1
AGND
2
INI
3
AGND
4
INIB
5
AGND
6
IPOL
7 8
AGND
INQ
9
10
AGND
11
INBQ AGND
12
13 14 15 16 17 18 19 20 21 22
REFPQ
INCMQ
REFMQ
AVCC
AVCC
TSA1203
AGND
AVCC
DVCC
GNDBE
VCCBI
VCCBI
OEB
SELECT
CLK
DGND
BLOCK DIAGRAM
SELECT
CLK
Timing
12
12
GND
M U X
VINI
VINBI
VINCMI
VREFMI
IPOL
VINQ
VINBQ
common mode
Polar.
common mode
VREFPI
VREFPQ
VREFMQ
VINCMQ
PACKAGE
+2.5V/3.3V
AD 12 I channel
AD 12 Q channel
REF I
REF Q
DGND
VCCBE
12
D0(LSB)
23 24
DVCC
OEB
D1
37
36
34 33
27 26
25
GNDBI
Buffers
GNDBE
35
32 31 30 29 28
D2 D3 D4 D5 D6 D7 D8 D9 D10 D11(MSB) VCCBE GNDBE
VCCBE
12
D0 TO D11
ORDER CODE
Part Number
TSA1203IF 0°C to +85°C TQFP48 Tray SA120 3I TSA1203IFT 0°C to +85°C TQFP48 Tape & Reel SA1203I EVAL1203/BA Evaluation board
February 2003
Temperature
Range
Package Conditioning Marking
7 × 7 mm TQFP48
1/20
TSA1203
CONDITIONS
AVCC = DVCC = VCCB = 2.5V, Fs= 40Msps, Fin=10.13MHz, Vin@ -1dBFS, VREFP=0.8V , VREFM =0V
Tamb = 25°C (unless otherwise specified)
DYNAMIC CHARACTERISTICS
Symbol Parameter Test conditions Min Typ Max Unit
SFDR Spurious Free Dynamic Range -68.3 -59.5 dBc
SNR Signal to Noise Ratio 60.7 66.1 dB THD Total Harmonics Distortion -66.6 -58 dBc
SINAD Signal to Noise and Distortion Ratio 56.5 62.8 dB
ENOB Effective Number of Bits 9.1 10.3 bits
TIMING CHARACTERISTICS
Symbol Parameter Test conditions Min Typ Max Unit
FS Sampling Frequency 0.5 40 MHz
DC Clock Duty Cycle 45 50 55 % TC1 Clock pulse width (high) 22.5 25 ns TC2 Clock pulse width (low) 22.5 25 ns
Tod Data Output Delay (Clock edge to Data Valid) 10pF load capacitance 9 ns
Tpd I Data Pipeline delay for I channel 7 cycles
Tpd Q Data Pipeline delay for Q channel 7.5 cycles
Ton Falling edge of OEB to digital output valid data 1 ns Toff Rising edge of OEB to digital output tri-state 1 ns
2/20
TIMING DIAGRAM
Simultaneous sampling on I/Q channels
N+3
N+4
N+5
N+6
N+12
TSA1203
N+13
I
Q
CLK
SELECT
OEB
DATA
OUTPUT
sample N-9 I channel
N-1
N
sample N-8 I channel
samp le N-7 Q channel
N+1
N+2
sample N-6 Q channel
PIN CONNECTIONS (top view)
index corner
1
AGND
2
INI
3
AGND
4
INIB
5
AGND
6
IPOL
7
AVCCB
8
AGND
INQ
9
10
AGND INBQ
11
AGND
12
N+7
Tpd I + Tod
CLOCK AND SELECT CONNECTED TOGETHER
sample N+1 I channel
GNDBE
REFPI
REFMI
INCMI
AVCC
47
48 44 43 42 41 40 39 38
46 45
VCCBI
AVCC
OEB
VCCBE
VCCBI
TSA1203
13 14 15 16 17 18 19 20 21 22
REFPQ
AGND
AVCC
INCMQ
REFMQ
DVCC
SELECT
CLK
DGND
DGND
sample N Q channe l
D0(LSB)
37
23 24
DVCC
GNDBI
N+8
D1
N+9
Tod
sample N+1 Q channel
sample N+2 I channel
D2
36
D3
35
D4
34
D5
33
32
D6
31
D7 D8
30
D9
29
D10
28
D11(MSB)
27 26
VCCBE
GNDBE
25
N+10
sample N+2 Q channel
sample N+3 I chan n el
N+11
3/20
TSA1203
PIN DESCRIPTION
Pin No Name Description Observation Pin No Name Description Observatio n
1 AGND Analog ground 0V 25 GNDBE Digital buff er ground 0V 2 INI I channel analog input 26 VCCBE Digital Buffer power supply 2.5V/3.3V 3 AGND Analog ground 0V 27 D11(MSB) Most Significant Bit output CMOS output (2.5V/3.3V) 4 INBI I channel inverted analog input 28 D10 Digital output CMOS output (2.5V/3.3V) 5 AGND Analog ground 0V 29 D9 Digital output C MOS output (2.5V/3.3V) 6 IPOL A nalog bias current input 30 D8 Digit al output CMOS output (2.5V/3.3V) 7 AVCC Analog power supply 2.5V 31 D7 Digital output CMOS output (2.5V/3.3V) 8 AGND Analog ground 0V 32 D6 Digital output C MOS output (2.5V/3.3V)
9 INQ Q channel analog input 33 D5 Digital output CMOS output (2.5V/3.3V) 10 AGND Analog grou nd 0V 3 4 D4 Digital ou tput CMOS output (2. 5V/3.3V) 11 INBQ Q channel inverted analog input 35 D3 Digital output CMOS output (2.5V/3.3V) 12 AGND Analog grou nd 0V 3 6 D2 Digital ou tput CMOS output (2. 5V/3.3V) 13 REFPQ Q channel top reference voltage 37 D1 Digital output CMOS output (2.5V/3.3V) 14 REFMQ Q channel bottom reference
15 INCMQ Q channel input common mode 39 VCCBE Digital Buffer power supply 2.5V/3.3V - See Application
16 AGND Analog grou nd 0V 4 0 GNDBE Digital buffer ground 0V 17 AVCC Analog power supply 2.5V 41 VCCBI Digital Buffer power supply 2.5V 18 DVCC Digital power supply 2.5V 42 VCCBI Digital Buffer powe r s upply 2.5V 19 DGND Digital ground 0V 43 OEB Output Enable input 2.5V/3.3V CMOS input 20 CLK Clock input 2.5V CMOS input 44 AVCC Analog power supply 2.5V 21 SELECT Channel selection 2.5V CMOS input 45 AVCC Analog power supply 2.5V 22 DGND Digital ground 0V 46 INCMI I channel input common mode 23 DVCC Digital power supply 2.5V 47 REFMI I channel bottom reference voltage 0V 24 GNDBI Digital buffer ground 0V 48 REFPI I channel top reference voltage
voltage
0V 38 D0(LSB) Least Significant Bit output CMOS output (2.5V/3.3V)
Note
ELECTRICAL CHARACTERISTICS ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Values Unit
AVCC
DVCC
VCCBE
VCCBI
Analog Supply voltage Digital Supply voltage Digital buffer Supply voltage Digital buffer Supply voltage
IDout Digital output current -100 to 100 mA
Tstg Storage temperature +150 °C
ESD
HBM: Human Body Model CDM: Charged Device Model
Latch-up
1). All voltages values, except differential voltage, are with respect to network ground terminal. The magnitude of input and output voltages must not exceed -0.3V or VCC
2). ElectroStatic Discharge pulse (ESD pulse) simulating a human body discharge of 100 pF through 1.5k
3). Discharge to Ground of a device that has been previously charged.
4). Corporate ST Microelectronics procedure number 0018695
Class
4)
1)
1)
1)
1)
2)
3)
0 to 3.3 V 0 to 3.3 V 0 to 3.6 V 0 to 3.3 V
2
1.5
kV
A
4/20
OPERATING CONDITIONS
Symbol Parameter Min Typ Max Unit
AVCC Analog Supply voltage 2.25 2.5 2.7 V
DVCC Digital Supply voltage 2.25 2.5 2.7 V
VCCBE External Digital buffer Supply voltage 2.25 2.5 3.5 V
VCCBI Internal Digital buffer Supply voltage 2.25 2.5 2.7 V
TSA1203
VREFPI
VREFPQ
VREFMI
VREFMQ
INCMI
INCMQ
Forced top voltage reference 0.94 1.4 V
Forced bottom reference voltage 0 0.4 V
Forced input common mode voltage 0.2 1 V
ANALOG INPUTS
Symbol Parameter Test conditions Min Typ Max Unit
VIN-VINB Full scale refere nce voltag e Differential inputs mandatory 1.1 2.0 2 .8 Vpp
Cin Input capacitance 7.0 pF
Req Equivalent input resistor 10 K
BW Analog Input Bandwidth Vin@Full Scale, Fs=40Msps 1000 MHz
ERB Effective Resolution Bandwidth 70 MHz
DIGITAL INPUTS AND OUTPUTS
Symbol Parameter Test conditions Min Typ Max Unit
Clock and Select inputs
VIL Logic "0" voltage 0 0.8 V
VIH Logic "1" voltage 2.0 2.5 V
OEB input
VIL Logic "0" voltage 0
VIH Logic "1" voltage
Digital Outputs
VOL
VOH
IOZ High Impedance leakage current OEB set to VIH -1.67 0 1.67 µA
Logic "0" voltage
Logic "1" voltage
C
Output Load Capacitance 15 pF
L
Iol=10µA
Ioh=10µA 0.9 x
0.75 x
VCCBE
VCCBE
VCCBE V
VCCBE V
0.25 x
VCCBE
0.1 x
0
VCCBE
V
V
5/20
TSA1203
CONDITIONS
AVCC = DVCC = VCCB = 2.5V, Fs= 40Msps, Fin=2MHz, Vin@ -1dBFS, VREFP=0.8V, VREFM=0V
Tamb = 25°C (unless otherwise specified)
REFERENCE VOLTAGE
Symbol Parameter Test conditions Min Typ Max Unit
VREFPI
VREFPQ
VINCMI
VINCMQ
POWER CONSUMPTION
Top internal reference voltage 0.81 0.88 0.94 V
Input common mode voltage 0.41 0.46 0.50 V
Symbol Parameter Min Typ Max Unit
ICCA Analog Supply current 82 96.5 mA ICCD Digital Supply Current 4.4 4.9 mA
ICCBE Digital Buffer Supply Current (10pF load) 6.6 9.4 mA
ICCBI Digital Buffer Supply Current 274 440
Pd Power consumption in normal operation mode 230 271 mW
Rthja Thermal resistance (TQFP 48) 80 °C/W
ACCURACY
Symbol Parameter Min Typ M ax Unit
OE Offset Error 2.97 LSB GE Gain Error 0.1 %
DNL Differential Non Linearity ±0.52 LSB
INL Integral Non Linearity ±3 LSB
- Monotonicity and no missing codes Guaranteed
A
µ
MATCHING BETWEEN CHANNELS
Symbol Parameter Min Typ Max Unit
GM Gain match 0.04 1 % OM Offset match 0.88 LSB
PHM Phase match 1 dg
XTLK Crosstalk rejection 85 dB
6/20
TSA1203
DEFINITIONS OF SPECIFIED PARAMETERS STATIC PARAMETERS
Static measurements are performed through method of histograms on a 2MHz input signal, sampled at 40Msps, which is high e nough to fully characterize the test frequency response. The input level is +1dBFS to saturate the signal.
Differen tial N on Li n e ari ty (DNL)
The average de viation of any output code width from the ideal code width of 1 LSB.
Integral Non linearity (INL)
An ideal c onverter pres ent s a transfer function as being the straight line from the starting code to the ending code. The INL is the deviation for each transition from this ideal curve.
DYNAMIC PARAMETERS
Dynamic measurements are performed by spectral analysis, applied to an input sine wave of various frequencies and sampled at 40Msps. The input level is -1dBFS to measure the linear
behavior of the converter. All the parameters are given without correction for the full scale ampli­tude performance except the calculated ENOB parameter.
Spurious Free Dynamic Range (SFDR)
The ratio between the power of the worst spurious signal (not always an harmonic) and the amplitude of fundamental tone (signal power) over the full Nyquist band. It is expressed in dBc.
Total Harmonic Distortion (THD)
The ratio of the rm s sum of the first five harmo nic distortion components to the rms value of the fundamental line. It is expressed in dB.
Signal to Noise Ratio (SNR)
The ratio of the rms value of the fundamental component to the rms sum of all other spectral components in the Nyquist band (f
/2) excluding
s
DC, fundamental and the first five harmonics. SNR is reported in dB.
Signal to Noise and Distortion Ratio (SINAD)
Similar ratio as for SNR but including the harmonic distortion components in the noise figure (not DC signal). It is expressed in dB.
From the SINAD, the Effective Number of Bits (ENOB) can easily be deduced using the formula:
SINAD= 6.02 × ENOB + 1.76 dB. When the applied signal is not Full Scale (FS), but
has an A
amplitude, the SINAD expression
0
becomes: SINAD SINAD
=SINAD
2Ao
=6.02 × ENOB + 1.76 dB + 20 log (2A0/
2Ao
Full Scale
+ 20 log (2A0/FS)
FS) The ENOB is expressed in bits.
Analog Input Bandwidth
The maximum analog input frequency at which the spectral response of a full power signal is reduced by 3dB. Higher values can be achieved with smaller input levels.
Effective Resolution Bandwidth (ERB)
The band of input signal frequencies that the ADC is intended to convert without loosin g linearity i.e. the maximum analog input frequency at which the SINAD is decreased by 3dB or t he ENOB b y 1/2 bit.
Pipeline delay
Delay between the initial sample of the analog input and the availability of the corresponding digital data output, on the output bus. Also called data latency. It is expressed as a num ber of clock cycles.
7/20
TSA1203
Static param e te r: Integral Non Linearity
Fs=40MSPS; Icca=60mA; Fin=2MHz
2.5 2
1.5 1
0.5 0
-0.5
INL (LSBs)
-1
-1.5
-2
-2.5 0 500 1000 1500 2000 2500 3000 3500 4000
Static param e te r: Dif fe ren t ial Non Li nearity
Fs=40MSPS; Icca=60mA; Fin=2MHz
Output Code
0.6
0.4
0.2
0
-0.2
DNL (LSBs)
-0.4
-0.6 0 500 1000 1500 2000 2500 3000 3500 4000
Linearity vs. Fs Fin=5MHz
80
75
70
65
60
ENOB_I
SINAD_I
Dynamic parameters (dB)
55
35 40 45 50
ENOB_Q
SNR_I
SINAD_Q
Fs (MHz)
SNR_Q
12
11.5 11
10.5 10
9.5 9
8.5 8
7.5 7
Output Code
Distortion vs. Fs Fin=5MHz
ENOB (bits)
Dynamic parameters (dBc)
-40
-50
-60
-70
-80
-90
-100 35 40 45 50
SFDR_Q
THD_I
THD_Q
SFDR_I
Fs (MHz)
8/20
TSA1203
Linearity vs. Fin
Fs=40MHz; Icca=60mA
90 85 80 75
SNR_Q
SINAD_I
SNR_I
SINAD_Q
70
(dB)
65 60
Dynamic parameters
55 50
0 20406080
ENOB_Q
ENOB_I
Fin (MHz)
Linearity vs. Tempera ture
Fs=40MHz; Icca=60mA ; Fin=2MHz
90 85 80 75 70 65 60 55
Dynamic parameters (dB)
50
-40 10 60 110
SINAD_I
SNR_Q
ENOB_I
ENOB_Q
SNR_I
SINAD_Q
Temperature (°C)
Distortion vs. Fin Fs=40MHz; Icca=60mA
12
11
10
9
8
ENOB (bits)
7
6
-40
-50
-60
-70
-80
-90
THD_Q
SFDR_Q
THD_I
SFDR_I
Dynamic parameters (dBc)
-100
0 20406080
Fin (MHz)
Distortion vs.Temperature Fs=40MSPS; Icca=60mA; Fin=2MHz
12 11 10 9 8 7
ENOB (bits)
6 5 4
100
95 90 85 80 75 70 65 60 55
Dynamic parameters (dBc)
50
-40 10 60 110
SFDR_Q
THD_I
THD_Q
SFDR_I
Temperature (°C)
Linearity vs. AVCC
Fs=40MSPS; Icca=60mA; Fin=10MHz
70 68 66 64 62 60 58 56 54 52
Dynamic parameters (dB)
50
2.25 2.35 2.45 2.55 2.65
SNR_Q
SINAD_I
ENOB_I
AVCC (V)
SINAD_Q
SNR_I
ENOB_Q
12
11.5
11
10.5
10
9.5
9
Distortion vs. AVCC
Fs=40MSP S; Icca=60 mA ; Fin=10 MHz
-50
-55
-60
-65
-70
-75
-80
ENOB (bits)
-85
-90
Dynamic Parameters (dBc)
-95
-100
THD_Q
2.25 2.35 2.45 2.55 2.65
SFDR_Q
THD_I
AVCC (V)
SFDR_I
9/20
TSA1203
Linearity vs. DVCC
Fs=40MSPS; Icc a=60m A ; Fin=10 MHz
70 68 66 64 62 60 58 56 54 52
Dynamic parameter s (dB)
50
2.25 2.35 2.45 2.55 2.65
SNR_Q
SINAD_I
ENOB_I
SINAD_Q
SNR_I
ENOB_Q
DVCC (V)
Linearity vs. VCCBI
Fs=40MSPS; Icc a=60m A ; Fin=10 MHz
70 68 66 64 62 60 58 56 54 52
Dynamic parameter s (dB)
50
2.25 2.35 2.45 2.55 2.65
SNR_Q
SINAD_I
SNR_I
ENOB_I
VCCBI (V)
SINAD_Q
ENOB_Q
12
11.5
11
10.5
10
9.5
9
12
11.5
11
10.5
10
9.5
9
Distortion vs. DVCC
Fs=40MSPS; Icc a=60m A ; Fin=10 MHz
-50
-55
-60
-65
-70
ENOB (bits)
-75
-80
-85
Dynamic Parameters (dBc)
-90
2.25 2.35 2.45 2.55 2.65
THD_I
DVCC (V)
Distortion vs. VCCBI
Fs=40MSPS; Icc a=60m A ; Fin=10 MHz
-50
-55
-60
-65
-70
ENOB (bits)
-75
-80
-85
Dynamic Parameters (dBc)
-90
2.25 2.35 2.45 2.55 2.65
THD_I
VCCBI (V)
SFDR_Q
THD_Q
SFDR_Q
THD_Q
SFDR_I
SFDR_I
Linearity vs. VCCBE Fs=40MSPS; Icca=60m A ; Fin=5M Hz
70 69 68 67 66 65 64
Dynamic parameter s (dB)
63 62 61 60
SINAD_Q
2.25 2.75 3.25
VCCBE (V)
10/20
SINAD_I
ENOB_I
SNR_ISNR_Q
ENOB_Q
12
11.5 11
10.5 10
9.5 9
8.5 8
Distortion vs. VCCBE Fs=40MSPS; Icca=60m A ; Fin=5M Hz
-40
-50
-60
-70
-80
ENOB (bits)
-90
-100
Dynamic Parameters (dBc)
-110
2.25 2.75 3.25
SFDR_Q
THD_I
SFDR_I
THD_Q
VCCBE (V)
TSA1203
Linearity vs. Duty Cycle
Fs=40MHz; Icca=60mA ; Fin=5MHz
100
90
80
70
60
50
Dynamic parameter s (dB)
40
ENOB_I
ENOB_Q
SNR_I SINAD_I
SNR_Q
SINAD_Q
48 49 50 51 52
Positive Dut y Cycle ( %)
Single-tone 8K FFT at 40Msps - Q Channel
Fin=5MHz; Icca=60mA, Vin@-1dBFS
0
-20
-40
-60
-80
-100
Power spectrum (dB)
-120
-140 2 4 6 8 121416182010
Distortion vs. Duty Cycle
Fs=40MHz; Icca=60mA ; Fin=5MHz
12 11 10 9 8 7
ENOB (bits)
6 5 4
Frequency (MHz)
-40
Dynamic parameters (dBc)
-50
-60
-70
-80
-90
-100
SFDR_Q
SFDR_I
48 49 50 51 52
THD_Q
THD_I
Positive Dut y Cycle (%)
Dual-tone 8K FFT at 40Msps - Q Channel
Fin1=0.93MHz; Fin2=1. 11MHz; Icca=70mA, Vin1@-7dBFS; Vin2@-7dBFS; IMD=-69d Bc
0
-20
-40
-60
-80
-100
Power spectrum (dB)
-120
2.5 5 7.5 10 15 17.5 2012.5
Frequency (MHz)
11/20
DETAILED INFORMATION
TSA1203 APPLICATION NOTE
The TSA1203 is a dual-channel, 12-bit resolution high speed ana log to digital converter based on a pipeline structure and the late st deep sub micron CMOS process t o a ch ieve the best pe rformanc es in terms of linearity and power consumption. Each channel achieves 12-bi t resolution through the pipeline structure which consists of 12 internal conversion stages in which the analog signal is fed and sequentially converted into digital data. A latency time of 7 clock periods is necessary to ob­tain the digitized data on the output bus. The input signals are simultaneously sampled on both channels on the rising edge of the clock. The output data are valid on the rising edge of the clock for I channel and on the falling edge of the clock for Q channel. The digital data out from the different stages mus t be time del ayed depending on their order of conversion. Then a digital data correction completes the p rocessing and ensures the validity of the ending codes on the output bus. The structure has been specifically designed to accept differential signals. The TSA1203 is pin to pin compatible with the dual 10 bits/20Msps, TSA1005-20, the dual 10bits /40Msps, TSA1005-40 and the dual 12bits/ 20Msps,TSA1204.
COMPLEMENTARY FUNCTIONS
Some functionalities hav e been added i n order to simplify as much as possible the application board. These operational modes are described as followed.
Output Enable (OEB)
When set to low level (VIL), all digital outputs remain active and are in low impedance state. When set to high level (VIH), all digital outputs buffers are in high impedance state while the converter goes on sampling. When OEB is set to a low level again, t he data a re then present on the output with a very short Ton delay. Therefore, this allows the chip select of the device. The timing diagram summarizes this functionality. In order to remain in the normal operating m ode,
this pin should be grounded through a low value of resistor.
SELECT
The digital data out from each ADC c ores are mul­tiplexed together to share the same output bus. This prevents from increasing t he num ber of pins and enables to keep t he same p ackage as s ingle channel ADC like TSA1201. The selection of the chan nel information is done through the "SELECT" pin. When s et to high leve l (VIH), the I chan nel data are present o n the bus D0-D11. When set to low level (VIL), the Q chan­nel data are on the output bus D0-D11. Connecting SELECT to CLK allows I and Q chan­nels to be simultaneously present on D0-D11; I channel on the rising edge of the clock and Q channel on the falling edge of the clock. (see tim­ing diagram page 2).
REFERENCES AND COMMON MODE CONNECTION
VREFM must be always connected externally.
Internal reference and common mode
In the default configuration, the ADC operates with its own reference and common mode voltages generated by its internal bandgap. VREFM pins are connected externally to the Analog Ground while VREFP (respectively INCM) are set to their internal voltage of 0.89V (respectively 0.46V). It is recommended to dec ouple the V REFP and I NCM in order to minimize low and high frequency noise (refer to Figure 1).
Figure 1 : Internal reference and common mode setting
1.03V
VIN
TSA1203
VINB
VREFM
VREFP
INCM
330pF 4.7uF
10nF
0.57V
330pF 4.7uF
10nF
12/20
TSA1203
External reference and common mode
Each of the voltages VREFP and INCM can be fixed externally to better fit to the application
needs (Refer to Table ’OPERATING CONDITIONS’ page 5 for min/max values). The VREFP, VREFM voltages set the analog dynamic at the input of the converter that has a full scale amplitude of 2*(VREFP-VREFM). Using internal references, the dynamic range is 1.8V. The best linearity and distortion performances are achieved with a dynamic range ab ove 2Vpp and by increasing the VREFM voltage instead of lowering the VREFP one. The INCM is the mid voltage of the analog input signal. It is possible to use an external reference vo ltage device for specific applications requiring even better linearity, accuracy or enhanced temperature behavior. Using the STMicroelectronics TS821 or TS4041-1.2 Vref leads to optimum performanc es when configured as shown on Figure 2.
Figure 2 : External reference setting
1k
330pF 4.7uF
10nF
VCCA
VREFP
VIN
TSA1203
VINB
VREFM
TS821 TS4041
external reference
DRIVING THE DIFFERENTIAL ANALOG INPUTS
The TSA1203 has been designed to obtain optimum performances when being differentially driven. An RF transformer is a good way to achieve such performances. Figure 3 describes the schematics. The input signal is fed to the primary of the transformer, while the secondary drives both ADC inputs. The common mode voltage of the ADC (INCM) is connected to the center-tap of the secondary of the transformer in order to bias the input signal around this common voltage, internally set to
0.46V. It determines the DC component of the analog signal. As being an high impedance inp ut, it acts as an I /O and can be externally driven t o adjust this DC component. The INCM is decoupled to maintain a low noise level on this
node. Our evaluat ion board i s m ount ed with a 1:1 ADT1-1WT transformer from Minicircuits. You might also use a higher impedance ratio (1:2 or 1:4) to reduce the driving requirement on the analog signal source. Each analog input c an drive a 1.4Vpp amplitude
input signal, so the resultant differential amplitude is 2.8Vpp.
Figure 3 : Differential input configuration with transformer
Analog source
50
ADT1-1
1:1
330pF
33pF
10nF
VIN
VINB
TSA1203
I or Q ch.
INCM
470nF
Figure 4 represents the biasing of a differential input signal in AC-coupled differential input configuration. Both inputs VIN and VINB are centered around t he common mode voltage, that can be let internal or fixed externally.
Figure 4 : AC-coupled differential input
common mode
50
50
10nF
33pF
10nF
100k
100k
INCM
VIN
TSA1203
VINB
Figure 5 shows a DC-coupled configuration with forced VREFP and INCM to the 1V DC analog input while VREFM is connected to ground; we achieve a 2Vpp differential amplitude.
13/20
TSA1203
Figure 5 : DC-coupled 2Vpp differential analog
input
analog
DC
analog
DC
VREFP-VREFM = 1 V
AC+DC
330pF
VIN
VINB
10nF
VREFP
TSA1203
VREFM
INCM
4.7uF
Clock input
The TSA1203 performance i s very dependant on your clock input accuracy, in terms of aperture jitter; the use of low jitter crystal controlled oscillator is recom m ended.
The duty cycle must be between 45% and 55%. The clock power supplies must be separated from
the ADC output ones to avoid digital noise modulation at the output.
It is recommended to keep the circuit clocked, to avoid random states, before applying the supply voltages.
Power consumption
So as to optimize both performance and power consumption of the TSA1203 according the sampling frequency, a resistor is pl aced between IPOL and the analog Gr ound pins. Theref ore, the total dissipation is adjustable from 30Msps up to 40Msps.
The TSA1203 will combine hi ghest perf ormance s and lowest consumption at 40Msps when Rpol is equal to 18k. This value is nevertheless depen­dant on application and environment.
At lower sampling frequency range, this value of resistor may be adjusted in order to decrease the analog current without any degradation of dynamic performances.
The table below sums up the relevant data. Figure 6 : Total power consumption optimization
depending on Rpol value
Fs (Msps) 30 35 40
kΩ)
Rpol ( Optimized
power (mW)
38 28 18
145 180 230
APPLICATION Layout precautions
To use the ADC circuits in the best manner at high frequencies, some p recautions have to be taken for power supplies:
- First of all, the implementation of 4 separate proper supplies and ground planes (analog, digital, internal and external buffer ones) on the PCB is advised for high speed circuit applications to provide low inductance and low resistance common return.
The separation of the analog signal from the digital part is mandatory to prevent noise from coupling onto the input signal. The best compromise is to connec t from one pa rt AGND, DGND, GNDBI in a common point whereas GNDBE must be isolated. Similarly, The power supplies AVCC, DVCC and VCCBI must be separated from the VCCBE one.
- Power supply bypass capacitors must be placed as close as possible to the IC pins in order to improve high frequency bypassing and reduce harmonic distortion.
- Proper termination of all inputs and outputs must be incorporated with output termination resistors; then the amplifier load will be on ly resistive and the stability of the amplifier will be improved. All leads must be wide and as short as possible especially for the analog input in order to decrease parasitic capacitance and inductance.
- To keep the capacitive loading as low as possible at digital outputs, short lead lengths of routing are essential to minimize currents when the output changes. To minimize this output capacitance, buffers or latches close to the output pins will relax this constraint.
- Choose component sizes a s small as poss ible (SMD).
Digital Interface application
Thanks to its wide external buffer power supply range, the TSA1203 is perfectly suitable to plug in to 2.5V low voltage DSPs o r digital interfaces as well as to 3.3V ones.
Medical Imaging application
Driven by the demand of the applications requiring nowadays either porta bility or hig h degree of par­allelism (or both), this product has been devel­oped to satisfy medi cal imaging, and telecom in­frastructures needs.
As a typical system diag ram shows f igure 7, a nar ­row input beam of acoustic energy is sent i nto a living body via the transducer and the energy re­flected back is analyzed.
14/20
TSA1203
Figure 7 : Medical imaging application
HV TX amps
TX beam former
Mux and T/R
switches
ADC
TGC amplifier
RX beam former
Processing and dis play
The transducer is a p iezoele ctric ceram ic suc h as zirconium titanate. The whole array can reach up to 512 channels.
The TX beam former, amplified by the HV TX amps, delivers up to 100V amplitude excitation pulses with phase and amplitude shifts.
The mux and T/R s witch is a t wo wa y input signa l transmitter/ output receiver.
To compensate for skin and tissues attenuation effects, The Time Gain Com pensat ion (TGC) am ­plifier is an exponential amplifier that enables the amplification of low voltage signals to the ADC in­put range. Differential output structure with low
noise and very high linearity are man datory fac­tors.
These applications need high speed, low power and high performance ADCs. 10-12 bit
resolution is necessary to lower the quantification noise. As m ultiple c han nels are used, a dual c on­verter is a must for room saving issues.
The input signal is in the range of 2 to 20MHz (mainly 2 to 7MHz) and the application uses most­ly a 4 over-sampling ratio for Spurious Free Dy­namic Range (SFDR) optimization.
The next RX beam former and processing blocks enable the anal ysis of the outputs channels ver­sus the input beam.
EVAL1203/BA evaluation board
The EVAL1203/BA is a 4-layer board with high decoupling and grounding level. The schematic of the evaluation board is reported figure 11 and its top overlay view figure 10. The characterization of the board has been made with a fully ADC devoted test bench as shown on Figure 8. The analog input signal must be filtered to be very pure.
The dataready signal is the acquisition clock of the logic analyzer.
The ADC digital outputs are latched by the octal buffers 74LCX573.
All characterization measurements have been made with:
- SFSR=1dB for static parameters.
- SFSR=-1dB for dynamic paramete rs.
Figure 8 : Analog to Digital Converter characterization bench
HP8644
Sine Wave
Generator
Vin
HP8133
HP8644
ADC
evaluation
board
Pulse
Generator
Sine Wave
Generator
Data
Clk
Clk
Logic
Analyzer
PC
15/20
TSA1203
Operating conditions of the evaluation board:
Find below the connect ions to the b oard for the power supplies and other pins:
board
notation
AV AVCC
AG AGND
RPI R EFPI 0.89 <1.4 RMI REFMI <0.4 CMI INCMI
RPQ REFPQ RMQ REFMQ CMQ INCMQ
DV D VCC
connection
internal
voltage (V)
0.46 <1
0.89 <1.4
0.46 <1
external
voltag e (V)
2.5 0
<0.4
2.5
Grounding consideration
So as to better reject noise on t he board, connect on the bottom overlay AG (AGND), DG(DGND), GB1(GNDBI) together from one part, and GB2(GNDBE) with GB3(GNDB3) from the other part.
Mode select
So as to evaluate a single channel or the dual ones, you have to connect on the board the relevant position for the SELECT pin (see figure 9) With the strap connected
- to the upper connectors, the I channel at the out­put is selected.
- horizontally, the Q channel at the output is se­lected.
- to the lower connectors, both channels are se­lected, relative to the clock edge.
Figure 9 : mode select
DG DGND
GB1 GNDB I
VB1 VCCBI
GB2 GNDBE
VB2 V CCBE
GB3 GNDB3
VB3 VCCB3 2.5
0 0
2.5 0
2.5/3.3 0
Care should be taken for the evaluation board considering the fact t hat the outputs of the con­verter are 2.5V/3.3V (VCCB2) tolerant whereas the 74LCX573 external buffers are operating up to
2.5V.
Singl e and Differenti a l I nputs:
The ADC board compone nts are mounted to test the TSA1203 with single analog input; the ADT1-1WT transformer enables the differential drive into the converter; in this configuration, the resistors RSI6, RSI7, RSI8 for I channel (respec­tively RSQ6, RSQ7, RSQ8 for Q one) are con­nected as short circuits whereas RSI5, RSI9 (re­spectively RSQ5, RSQ9) are open circuits. The other way is to test it via JI1 and JI1B differen­tial inputs. So, the resistances RSI5, RSI9 for I channel (respectively RSQ5, RSQ9 for Q one) are connected as short circuits whereas RS I6, RSI7, RSI8 (respectively RSQ6, RSQ7, RSQ8 for Q one) are open circuits.
SELECT
I channel
SELECT
Q channel
I/Q channels
DVCCDGNDCLK
schematic board
Consum pt io n adj ustment
Before any characterization, care should be taken to adjust the Rpol (Raj1) and therefore Ipol value in function of your sampling frequency.
16/20
Figure 10 : Printed circuit of evaluation board.
TSA1203
17/20
TSA1203
1
1
2
2
3
3
M
G
V
Figure 11 : TSA1203 Evaluation board schematic
D0 GND
D1 GND
D2 GND
D3 GND
D4 GND
D5 GND
D6 GND
D7 GND
D8 GND
D9 GND
D10 GND
D11 GND
CLK GND
J6
123456789
RS5 RS6 RS 7 RS 8 RS9
C C C
C C
C C
single input
differential input
Open Normal mode
Short High Impedance output mode
Switch S5
Open Normal mode
Short Test mode
VCCB3
VccB GndB VccB
VCCB2 Switch S4 OEB Mode
GndB VccB GndB
VCCB1
J17
BU FPO W
J25
CKDATA
R5
50
1
2
J26
CON2
VCCB2
VCCB1
INCM REF REFP
JI2
VREF I
NM: non soudé analog input with transformer (default)
VCCB2
S2
R12
47K
IN
U1
S5
SW-SPST
S4
SW-SPST
R11
R24
R23
R22
R21
VCCB2
C27
C28
470nF
D
47µF
Vcc
GNDS1
STG719
47K
0NM
0NM
0NM
0NM
C53 470nF
C43 10µF+C44
VCCB1
AVCC
C15 10nF
C16 470nF
RSI5
1011121314151617181920212223242526272829303132
D1D2D3D4D5
DO
VCCB3
20
47µF
+
C34
RSI7
0 NC
TI2
1
RSI6
C37 470nF
10nF
C52 10nF
C14 330pF
C25
0
0
RI1
C26 330pF
C39 10nF
330pF
C51 330pF
CI30
CI31
CI32
CI8
CI9
CI10
RSI80RSI9
4326
T2-AT1-1WT
50
CI11
CI12
CI13
330pF
10nF
470nF
330pF
10nF
470nF
JI1B
Q019Q118Q217Q316Q415Q514Q613Q7
VCC
OEB1D02D13D24D35D46D57D68D79GND
37 38 39 40 41 42 43 44 45 46 47 48
330pF
10nF
470nF
0 NC
RI19
50
InIB
D7D8D9
D6
12
11
20
LE
Q019Q118Q217Q316Q415Q514Q613Q7
VCC
U2
74LCX573
OEB1D02D13D24D35D46D57D68D79GND
10
36
D1
OEB
REFPI
AGND1INI2AGND3INBI4AGND5IPOL6AVCC7AGND8INQ9AGND10INBQ11AGND
CI6
CI1
27
28
D929D830D731D632D533D434D335D2
D10
D11(MSB)
D0(LSB) VCCBE GNDBE
VCCBI VCCBI
AVCC
8-14bits ADCJ9ADC D UAL 12B
AVCC INCMI REFMI
R2
1K
Raj1
47K
NM
C2
330pF
33pF
C4
10nF
C3
470nF
C41
10µF
C42
47µF
+
AVCC
JA
VCC
GND
D10
D11
CLK
12
11
LE
U3
26
ANALOG IC
74LCX573
10
10µF
+
C17 330pF
25
C29
DVcc
VCCBE
GNDBE
GNDBI
24
DVCC
23
DGND
22
SELECT
21
CLK
20
DGND
19
DVCC
18
AVCC
17
AGND
16
INCMQ
15
REFMQ
14
REFPQ
13
12
CQ6
NM
CQ1
33pF
RSQ70RSQ8
0 NC
RSQ5
TQ2 1
0
RSQ6
RQ1
50
C33 330pF
C40 10nF
C38 470nF
VCCB2
47µF
+
C18 10nF
C19 470nF
C35
DVCC
SW1
CD3 330pF
CD2 10nF
CD1 470nF
CQ11
330pF
CQ12
10nF
CQ13
470nF
CQ30
330pF
CQ31
10nF
CQ32
470nF
CQ8
330pF
CQ9
10nF
CQ10
470nF
0
4326
RSQ9
T2-AT1-1WT
JQ1B
InQB
C10 330pF
C20 330pF
0 NC
RQ19
50
R3
50
C5
J4
CLK
100nF
1
2
J27
CON2
C11 10nF
C13 470nF
AVCC
DVCC
C21 10nF
C22 470nF
C23 10µ F+C36
JQ2
C31 10µF+C32
47µF
INCM REFM
REFP
VREF Q
JD
DIGITAL
ND CC
47µF
18/20
Figure 12 : Printed circuit board - List of components
Name Footprint Name Footprint Name Foot pri nt Name Part Footprint
Part Type
0
RSQ6 RSQ7 RSQ8 RSI6 0 805 CQ12 10nF 603 C25 330pF 603 U3 74LCX573 TSSOP20 RSI7 0 805 CQ9 10nF 603 CI1 33pF 603 U1 STG719 SOT23-6 RSI8 R3
R5 RQ19 RI1 RQ1 RI19 47 603 C11 10nF 603 C32 47µF RB.1 JD DIGITAL connector RSI9 0NC 805 CI9 10nF 603 C37 470nF 805 JI1 InI SMA RSQ5 RSQ9 RSI5 R24 R23 R21 0NC 805 C51 330pF 603 CI32 470nF 805 S4 SW-SPST connector R22 0NC 805 C2 330pF 603 C13 470nF 805 TI2 T2-AT1-1WT ADT R2 R12 R11 Raj1
C23 C41 10µF 1210 C14 330pF 603 CD1 470nF 805 NC: non soldered C29 10µF 1210 CI30 330pF 603 C19 470nF 805
805 CD2 10nF 603 C26 330pF 603 CQ6 NC 805
0
805 C40 10nF 603 C20 330pF 603 CI6 NC 805
0
805 C39 10nF 603 C33 330pF 603 U2 74LCX573 TSSOP20
0
805 C52 10nF 603 CQ1 33pF 603 JA ANALOGIC connector
47
603 C18 10nF 603 C34 47µF RB.1 J17 BUFPOW connector
47
603 C21 10nF 603 C42 47µF RB.1 J25 CKDATA SMA
47
603 C4 10nF 603 C35 47µF RB.1 J4 CLK SMA
47
603 C15 10nF 603 C44 47µF RB.1 J27 CON2 SIP2
47
603 C27 10nF 603 C36 47µF RB.1 J26 CON2 SIP2
0NC
805 CI12 10nF 603 CQ10 470nF 805 JI1B InIB SMA
0NC
805 CI31 10nF 603 C28 470nF 805 JQ1 InQ SMA
0NC
805 CQ31 10nF 603 CI10 470nF 805 JQ1B InQB SMA
0NC
805 CQ30 330pF 603 CQ32 470nF 805 SW1 SWITCH connector
0NC
805 CI11 330pF 603 CQ13 470nF 805 S5 SW-SPST connector
1K
603 C17 330pF 603 C53 470nF 805 TQ2 T2-AT1-1WT ADT
47K
603 CD3 330pF 603 C16 470nF 805 JI2 VREFI connector
47K
603 C10 330pF 603 C3 470nF 805 JQ2 VREFQ connector
200K
VR5 trimmer
10µF
1210 CI8 330pF 603 C38 470nF 805
Part Type
CQ8 330pF 603 C22 470nF 805 J6 32Pin CQ11 330pF 603 CI13 470nF 805
Part Type
TSA1203
Type
IDC-32 connector
19/20
TSA1203
PACKAGE MECHANICAL DATA 48 PINS - PLASTIC PACKAGE
48 37
1
e
36
E3
E1
A
A2
A1
0,10 mm .004 inch
SEATING PLANE
B
E
12
13 24
D3
25
c
D1
D
L1
L
0,25 mm .010 inch
K
Millimeters Inches
Dim.
Min. Typ. Max. Min. Typ. Max.
A 1.60 0.063 A1 0.05 0.15 0.002 0.006 A2 1.35 1.40 1.45 0.053 0.055 0.057
B 0.17 0.22 0.27 0.007 0.009 0.011
C 0.09 0.20 0.004 0.008
D 9.00 0.354
D1 7.00 0.276 D3 5.50 0.216
e 0.50 0.0197
E 9.00 0.354 E1 7.00 0.276 E3 5.50 0.216
L 0.45 0.60 0.75 0.018 0.024 0.030 L1 1.00 0.039
K 0° (min.), 7° (max.)
Information furnished is bel ieved to be accurate and reliable. However, STMicroe lectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No li cense is granted by imp lica tion or otherwise under any patent or patent rig hts of STMicroelectronics. Specificat ions mentioned in this publication ar e subject to change without notice. This publication supersedes and replaces all information previously supplied. S TMicroelectronics products are not authorized for use as critica l components in life suppo rt devices or systems without express written approval of STMicroelectronics.
The ST logo is a registered trademark of STMicroelectronics
GAGE PLANE
20/20
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