= 600V to 800V
EXCELLENT SWITCHING PERFORMANCES
INSULATING VOLTAGE = 1500V
(RMS)
U.L. RECOGNIZED : E81734
DESCRIPTION
TheT820/830Wtriacsusehighperformanceglass
passivated chip technology, housed in a fully
molded plastic ISOWATT220AB package.
TM
The SNUBBERLESS
concept offers suppression of R-C network, and is suitable for applications such as phase control and static switch on
inductive and resistive loads.
T830-xxxW
SNUBBERLESS TRIAC
A
2
A
1
G
ISOWATT220AB
(Plastic)
A1
G
A2
ABSOLUTE RATINGS (limiting values)
SymbolParameterValueUnit
I
T(RMS)
RMS on-state current
Tc= 95°C8A
(360° conduction angle)
I
TSM
Non repetitive surge peak on-state current
initial = 25°C )
(T
j
tp = 16.7 ms
(1 cycle, 60 Hz)
tp=10ms
88A
100
(1/2 cycle, 50 Hz)
2
t
I
dI/dt
2
I
t Value (half-cycle, 50 Hz)
Critical rate of rise of on-state current
Gate supply : I
= 500 mAdIG/dt=1A/µs.
G
tp=10ms50A
Repetitive
20A/µs
F=50Hz
Non Repetitive100
T
stg
T
j
Tl
Storage temperature range
Operating junction temperature range
Maximum lead temperature for soldering during 10s at 4.5 mm
-40to+150
-40to+125
260°C
from case
SymbolParameter
T820 / T830-xxxW
600700800
2
°C
Unit
s
V
DRM
V
RRM
September 2001 - Ed: 1A
Repetitive peak off-state voltage
= 125°C
T
j
600700800V
1/5
T820-xxxW / T830-xxxW
THERMAL RESISTANCES
SymbolParameterValueUnit
Rth(j-a)
Rth(j-c)
Junction to ambient
Junction to case for A.C (360° conduction angle)
50°C/W
3.1°C/W
GATE CHARACTERISTICS (maximum values)
P
=1W PGM=10W(tp=20µs)IGM=4A(tp=20µs
G (AV)
ELECTRICAL CHARACTERISTICS
SymbolTest ConditionsQuadrantT820T830Unit
I
GT
V
GT
V
GD
tgt
*
I
H
*
V
TM
VD=12V (DC) RL=33Ω
VD=12V (DC) RL=33Ω
VD=V
DRMRL
V
D=VDRMIG
/dt= 3Aµs
dl
G
I
= 100mAGate open
T
I
= 11A tp= 380µs
TM
=3.3kΩ
=500mA
Tj= 25°CI-II-IIIMAX2030mA
Tj= 25°CI-II-IIIMAX1.5V
Tj= 125°CI-II-IIIMIN0.2V
Tj= 25°CI-II-IIITYP2µs
Tj= 25°CMAX3550
Tj= 25°CMAX1.5V
I
DRM
I
RRM
VDRM rated
rated
V
RRM
Tj= 25°CMAX10µA
Tj= 125°CMAX2mA
dV/dt *
(dV/dt)c *
* For either polarity of electrode A2 voltage with reference to electrode A1.
Note : Inusualapplicationswhere (dI/dt)c is below 4.5 A/ms, the (dV/dt)c is always lower than 10V/µs, and, therefore, it is unnecessary to use
a snuber R-C network accross T820W / T830W triacs.
Linear slope up to
=67%V
V
D
DRM
Gate open
(dI/dt)c = 4.5 A/ms (see note)
Tj= 125°CMIN200300V/µs
Tj= 125°CMIN1020V/µs
2/5
T820-xxxW / T830-xxxW
Fig. 1: Maximum power dissipation versus RMS
on-state current.
P(W)
10
8
6
4
=30
180
=60
o
O
=90
= 120
o
o
=180
o
o
2
I(A)
0
012345678
T(RMS)
Fig. 3: RMS on-state current versus case temperature.
I(A)
T(RMS)
10
8
o
6
4
2
0
0 102030405060708090100110120130
=180
o
Tcase( C)
Fig. 2: Correlation between maximum powerdissipation and maximum allowable temperature
(Tamband Tcase) fordifferent thermal resistances
heatsink + contact.
o
P(W)
Tcase ( C)
10-90
8
-95
-100
6
4
o
Rth = 0 C/W
o
2.5 C/W
o
5C/W
o
7.5 C/W
-105
-110
-115
2
o
Tamb(C)
0
0 102030405060708090100110120130
-120
-125
Fig. 4: Thermal transient impedance junction to
case and junction to ambient versus pulse duration.
Zth/Rth
1
Zth(j-c)
0.1
Zth(j-a)
0.01
tp(s)
1E-3
1E-21E-11E+0
1E+1
1E+2 5E+2
Fig. 5: Relative variation of gate trigger current
and holding current versus junction temperature.
Igt[Tj]
Igt[Tj=25 C]
2.6
2.4
2.2
2.0
1.8
1.6
1.4
Ih
1.2
1.0
0.8
0.6
0.4
-40 -20020406080 100 120 140
o
Igt
Tj( C)
Ih[Tj]
Ih[Tj=25 C]
o
o
Fig. 6: Non repetitive surge peak on-state current
versus number of cycles.
I(A)
TSM
100
80
60
40
20
Number of cycles
0
110100
Tj init ial = 25 C
o
1000
3/5
T820-xxxW / T830-xxxW
Fig. 7: Non repetitive surge peak on-state current
for a sinusoidal pulse with width : tp 10ms, and
corresponding value of I
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