SGS Thomson Microelectronics STU8NA80 Datasheet

N - CHANNEL ENHANCEMENT MODE
FAST POWER MOS TRANSISTOR
TYPE V
DSS
STU8NA80 800 V < 1.0 8.3 A
R
DS(on)
I
D
STU8NA80
PRELIMINARY DATA
TYPICAL R
EFFICIENT AND RELAIBLE MOUNTING
DS(on)
= 0.85
± 30V GATE TO SOURCE VOLTA GE RATING
100% AVALANCHE TESTED
GATE CH ARGE MINIMIZED
REDUCED THRESHOLD VO LTA GE
SPREAD.
DESCRIPTION
The Max220 power package exibiting the same footprint as the industry standard TO-220, but designed to accomodate much larger silicon chips, normally supplied in bigger packages. The increased die capacity makes the device ideal to reduce component count in multiple paralleled TO-220 designs and save board space with respect to larger packages.
TM
package is a new high volume
APPLICATIONS
HIGH CURRENT, HIGH SPE ED SWI TCHING
SWITCH MODE P OW ER SUP P LIE S (S MP S)
DC-AC CONVERTERS FOR WELDING
EQUIPMENT AND UNINTERRUPTIBLE POWER SU PP LIE S (UPS)
3
2
1
Max220
TM
INTERNAL SCHEMATIC DIAGRAM
ABSOL UT E MAXIMU M RATINGS
Symbol Parameter Value Unit
V
V
V
I
DM
P
T
(•) Pulse width limited by safe operating area
March 1996
Drain-source Voltage (VGS = 0) 800 V
DS
Drain- gate Voltage (RGS = 20 k) 800 V
DGR
Gate-source Voltage ± 30 V
GS
I
Drain Current (continuous) at Tc = 25 oC 8.3 A
D
I
Drain Current (continuous) at Tc = 100 oC 5.3 A
D
() Drain Current (pulsed) 33.2 A
Total Dissipation at Tc = 25 oC 160 W
tot
Derating Factor 1.28 W/ Storage Temperature -65 to 150
stg
T
Max. Operating Junction Temperature 150
j
o
C
o
C
o
C
1/5
STU8NA80
THERMAL DATA
R
thj-case
Rthj-amb
R
thc-si n k
T
Thermal Resistance Junction-case Max Thermal Resistance Junction-ambient Max Thermal Resistance Case-sink Typ Maximum Lead Temperature For Soldering Purpose
l
AVALANCHE CHARACTERI S TICS
Symbol Parameter Max Value Unit
I
AR
E
E
I
AR
Avalanche Current, Repetitive or Not-Repetitive (pulse width limited by T
Single Pulse Avalanche Energy
AS
(starting T Repetitive Avalanche Energy
AR
= 25 oC, ID = IAR, V
j
(pulse width limited by T
max, δ < 1%)
j
DD
max, δ < 1%)
j
Avalanche Current, Repetitive or Not-Repetitive (T
= 100 oC, pulse width limited by Tj max, δ < 1%)
c
= 50 V)
0.78
62.5
0.5
300
8A
320 mJ
14 mJ
5.3 A
o
C/W
oC/W
o
C/W
o
C
ELECTRICAL CHARACTERISTICS (T
= 25 oC unless otherwise specified)
case
OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
Drain-source
ID = 250 µA V
= 0 800 V
GS
Breakdown Voltage
I
DSS
I
GSS
Zero Gate Voltage Drain Current (V
GS
Gate-body Leakage Current (V
DS
= 0)
= 0)
= Max Rating
V
DS
V
= Max Rating x 0.8 Tc = 125 oC
DS
= ± 30 V ± 100 nA
V
GS
250
1000µAµA
ON ()
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
GS(th)
R
DS(on)
I
D(on)
Gate Threshold Voltage V Static Drain-source On
Resistance
= VGS ID = 250 µA 2.25 3 3.75 V
DS
VGS = 10V ID = 4A V
= 10V ID = 4A Tc = 100oC
GS
On State Drain Current VDS > I
V
= 10 V
GS
D(on)
x R
DS(on)max
0.85 1 2
8.3 A
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
g
() Forward
fs
Transconductance
C
C
C
Input Capacitance
iss
Output Capacitance
oss
Reverse Transfer
rss
Capacitance
VDS > I
V
DS
x R
D(on)
DS(on)max
= 25 V f = 1 MHz V
ID = 4 A 7 9.5 S
= 0 2900
GS
290
80
3800
370 110
Ω Ω
pF pF pF
2/5
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