SGS Thomson Microelectronics STU10NB80 Datasheet

STU10NB80
N - CHANNEL 800V - 0.65- 10A - Max220
PowerMESH MOSFET
PRELIMINARY DATA
TYPE V
DSS
R
DS(on)
I
D
STU10NB80 800 V < 0.8 10 A
TYPICAL R
EXTREMELY HIGH dv/dt CAPABILITY
100% AVALANCHE TESTED
VERY LOW INTRINSIC CAPACITANCES
GATE CHARGE MINIMIZED
DS(on)
= 0.65
DESCRIPTION
Using the latest high voltage MESH OVERLAY
process, STMicroelectronics has designed an advanced family of power MOSFETs with outstanding performances. The new patent pending strip layout coupled with the Company’s proprietary edge termination structure, gives the lowest R
per area, exceptional avalanche
DS(on)
and dv/dt capabilities and unrivalled gate charge and switching characteristics.
APPLICATIONS
SWITCH MODE POWER SUPP LIES (SMPS)
DC-AC CONVERTERS FOR WELDING EQUIPMENT AND UNINTERRUPTI BLE POWER SUPPLIES AND MOTOR DRIVE
HIGH CURRENT, HIGH SPEED SWITCH ING
3
2
1
Max220
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
V
V
V
I
DM
P
dv/dt (
T
(•) Pulse width limited by safe operating area (1) ISD
April 1999
Drain-source Voltage (VGS = 0) 800 V
DS
Drain- gate Voltage (RGS = 20 k)
DGR
Gate-source Voltage ± 30 V
GS
I
Drain Current (continuous) at Tc = 25 oC10A
D
I
Drain Current (continuous) at Tc = 100 oC 6.3 A
D
800 V
() Drain Current (pulsed) 40 A
Total Dissipation at Tc = 25 oC 160 W
tot
Derating Factor 1.28 W/
) Peak Diode Recovery voltage slope 4 V/ns
1
Storage Temperature -65 to 150
stg
T
Max. Operating Junction Temperature 150
j
≤10 Α, ≤
200 A/µs, VDD ≤ V
(BR)DSS
, Tj ≤ T
JMAX
o
C
o
C
o
C
1/5
STU10NB80
THERMAL DATA
R
thj-case
Rthj-am b
R
thc-sink
T
Thermal Resistance Junction-case Max Thermal Resistance Junction-ambient Max Thermal Resistance Case-sink Typ Maximum Lead Temperature For Soldering Purpose
l
AVALANCHE CHARACTERIST ICS
Symbol Parameter Max Value Unit
I
AR
Avalanche Current, Repetitive or Not-Repetitive 10 A
0.78
62.5
0.5
300
o
C/W
oC/W
o
C/W
o
C
E
Single Pulse Avalanche Energy
AS
(starting T
= 25 oC, ID = IAR, V
j
ELECTRICAL CHARACTERISTICS
= 50 V)
DD
= 25 oC unless otherwise specified)
(T
case
660 mJ
OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
Drain-source
I
= 250 µA V
D
GS
= 0
800 V
Breakdown Voltage
I
DSS
I
GSS
Zero Gate Voltage Drain Current (V
GS
Gate-body Leakage Current (V
DS
= 0)
= 0)
= Max Rating
V
DS
V
= Max Rating Tc = 100 oC
DS
V
= ± 30 V
GS
1
50
± 100 nA
ON (∗)
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
GS(th)
R
DS(on)
I
D(on)
Gate Threshold
V
= VGS ID = 250 µA
DS
Voltage Static Drain-source On
VGS = 10V ID = 5.5 A 0.65 0.8
Resistance On State Drain Current VDS > I
V
= 10 V
GS
D(on)
x R
DS(on)max
345V
10 A
µA µA
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
g
() Forward
fs
C
iss
C
oss
C
rss
2/5
Transconductance Input Capacitance
Output Capacitance Reverse Transfer Capacitance
VDS > I
V
DS
x R
D(on)
DS(on)max
= 25 V f = 1 MHz V
ID = 5.5 A 1.5 10 S
= 0 2900
GS
350
33
pF pF pF
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