SGS Thomson Microelectronics STQ1HNC60 Datasheet

STQ1HNC60
N-CHANNEL 600V - 7- 0.4A TO-92
PowerMesh™II MOSFET
PRELIMINARY DATA
TYPE V
DSS
R
DS(on)
I
D
STQ1HNC60 600 V < 8 0.4 A
TYPICAL R
EXTREMELY HIGH dv /d t C APABILITY
100% AVALANCHE TESTED
NEW HIGH VOLTAGE BENCHMARK
GATE CHARGE MINIMIZED
DS
DESCRIPTION
Using the latest high voltage MESH OVERLAY™II process, STMicroelectronics has designed an ad­vanced family of power MOSFETs with outstanding performances. The new patent pending strip layout coupled with the Company’s proprietary edge termi­nation structure, gives the lowest RDS(on) per area, exceptional avalanche and dv/dt capabilities and unrivalled gate charge and switching characteris­tics.
APPLICATIONS
SWITCH MODE LOW POWER SUPPIES
(SMPS)
CFL
TO-92
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
V
DS
V
DGR
V
GS
I
D
I
D
I
DM
P
TOT
dv/dt(1) Peak Diode Recovery voltage slope 3.5 V/ns
T
stg
T
(•)Pu l se width limited by safe operating area
August 2001
Drain-source Voltage (VGS = 0) Drain-gate Voltage (RGS = 20 k)
600 V 600 V
Gate- source Voltage ± 30 V
Drain Current (continuos) at TC = 25°C Drain Current (continuos) at TC = 100°C
()
Drain Current (pulsed) 1.6 A Total Dissipation at TC = 25°C
0.4 A
0.25 A
3.5 W
Derating Factor 0.028 W/°C
Storage Temperature –65 to 150 °C Max. Operating Junction Temperature 150 °C
j
(1)ISD 0.4 A, di/dt 100A/µs, VDD V
(BR)DSS
, Tj T
JMAX.
1/6
STQ1HNC60
THERMA L D ATA
Rthj-case
Rthj-amb
Thermal Resistance Junction-case Thermal Resistance Junction-ambient Max (Surface Mounted)
T
l
Maximum Lead Temperature For Soldering Purpose
AVALANCHE CHARACTERISTICS
Symbol Parameter Max Value Unit
I
AR
E
AS
Avalanche Current, Repetitive or Not-Repetitive (pulse width limited by T
max)
j
Single Pulse Avalanche Energy (starting T
= 25 °C, ID = IAR, VDD = 50 V)
j
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED) OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
I
DSS
I
GSS
Drain-source Breakdown Voltage
Zero Gate Voltage Drain Current (V
GS
Gate-body Leakage Current (V
DS
= 0)
= 0)
ID = 250 µA, VGS = 0 600 V
V
= Max Rating
DS
V
= Max Rating, TC = 125 °C
DS
V
= ± 30V ±100 nA
GS
35.7 60
300
0.4 A
100 mJ
A
50 µA
°C/W °C/W
°C
ON
(1)
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
V
GS(th)
R
DS(on)
Gate Threshold Voltage Static Drain-source On
= VGS, ID = 250 µA
DS
= 10V, ID = 0.4 A
V
GS
234V
78
Resistance
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
g
fs
Forward Transconductance VDS > I
ID= 0.4 A
C
iss
C
oss
C
rss
Input Capacitance Output Capacitance 26 pF Reverse Transfer
V
DS
Capacitance
x R
D(on)
DS(on)max,
= 25V, f = 1 MHz, VGS = 0
1.25 S
160 pF
3.8 pF
2/6
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