SGS Thomson Microelectronics STP80NS04Z Datasheet

STP80NS04Z
N - CHANNEL CLAMPED 7.5mΩ - 80A - TO-220
FULLY PROTECTED MESH OVERLAY MOSFET
TYPE V
DSS
R
DS(on)
I
D
ST P80NS04Z CLAMP ED <0.0 08 80 A
TYPICALR
LOW CAPACITANCEAND GATECHARGE
175
o
C MAXIMUMJUNCTION
DS(on)
= 0.0075
TEMPERATURE
DESCRIPTION
This fully clamped Mosfet is produced by using the latest advanced Company’s Mesh Overlay processwhich is based on a novelstrip layout. The inherent benefits of the new technology coupledwith the extra clamping capabilitiesmake this product particularly suitable for the harshest operation conditions such as those encountered in the automotive environment. Any other application requiring extra ruggedness is also recommended.
APPLICATIONS
ABS, SOLENOIDDRIVERS
MOTORCONTROL
DC-DCCONVERTERS
3
2
1
TO-220
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
V V V
I I
I
DM
P
V
ESD
V
ESD
V
ESD
T
() Pulse width limited by safeoperating area (1)ISD≤ 80 A, di/dt ≤ 300 A/µs, VDD≤ V
December 1999
Dra in- sour c e Voltage (VGS= 0) CLAMPED V
DS
Drain- gate Voltage CLAMPED V
DG
Gate-s ource Volt age CLAMPED V
GS
Dra in Current (conti nuous) at Tc=25oC80A
I
D
Dra in Current (conti nuous) at Tc= 100oC60A
I
D
Dra in Gate Cur rent ( continuous )
DG
Gat e Source Current (continuous ) ± 50 mA
GS
50 mA
±
() Dra in Current (pulsed) 320 A
Tot al Dissipatio n at Tc=25oC 160 W
tot
Der ati ng Fac t or 1.06 W/ Gat e- Source ESD (H B M - C= 100pF , R=1.5 kΩ)2kV
(G-S) (G-D) G at e-Drain ESD (H BM - C= 100pF , R=1.5 k)4kV (D-S) Drain-Sour ce ESD (HB M - C= 100p F, R=1.5 k)4kV
St orage Temperat ur e -65 to 175
stg
Max. Operat ing Junc tion Tempe ra t ure -40 to 175
T
j
(BR)DSS,Tj≤TJMAX
o
C
o
C
o
C
1/8
STP80NS04Z
THERMAL DATA
R
thj-case
R
thj-case
R
thj-amb
R
thc-sink
T
AVALANCHE CHARACTERISTICS
Symbol Parameter Max Value Unit
I
AR
E
Ther mal Resistance J unction- ca se Max Ther mal Resistance J unction- ca se Ty p Ther mal Resistance J unction- am bie nt M a x Ther mal Resistance C ase-sink Ty p Maximum Lead Te mperature For Solder ing Purp os e
l
Avalanche Current, R epetitive or Not-Repetitive (pulse width limited by T
Single P ul s e Avalanche Energy
AS
(starting T
=25oC, ID=IAR,VDD=30V)
j
max, δ <1%)
j
0.94
0.65
62.5
0.5
300
80 A
500 mJ
o
C/W
o
C/W
o
C/W
o
C/W
o
C
ELECTRICAL CHARACTERISTICS
=25oC unless otherwisespecified)
(T
case
OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
CLAMP
I
DSS
I
GSS
V
GSS
Drain-G ate Breakdown Voltage
Zero Gate Voltage Drain Cur rent ( V
GS
=0)
Gat e- bod y L eak ag e Current (V
DS
=0)
Gate-Source
ID=1mA VGS=0
-40 < T V
V V
< 175oC
j
=16V Tj= 175oC50µA
DS
=± 10 V Tj=175oC
GS
= ± 16 V Tj=175oC
GS
33 V
50
150
IG= 100 µA18V
Break dow n Volt age
ON()
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
GS(th)
R
DS(on)
I
D(on)
Gate Threshold Voltage VDS=V
-40 < T
Sta t ic Drain -s ource On Resistance
VGS=10V ID=40A
=16V ID=40A
V
GS
On State Drain Current VDS>I
GSID
=1mA
< 150oC
j
D(on)xRDS(on)max
1.7 3 4.2 V
8
7.5
9 8
80 A
VGS=10V
DYNAMIC
µ µA
m m
A
Symbol Parameter Test Conditions Min. Typ. Max. Unit
g
(∗)Forward
fs
VDS>I
D(on)xRDS(on)maxID
=40 A 30 50 S
Tr ansc on duc tance
C
C
C
Input Capac i t ance
iss
Out put Capacitanc e
oss
Reverse Tr ansfer
rss
VDS=25V f=1MHz VGS= 0 4000
1250
230
5400 1700
320
Capacit a nc e
2/8
pF pF pF
STP80NS04Z
ELECTRICAL CHARACTERISTICS
(continued)
SWITCHING ON
Symbol Parameter Test Conditions Min. Typ. Max. Unit
Q Q Q
Tot al Gat e Charge
g
Gat e- Source Charg e
gs
Gate-Drain Charge
gd
VDD=16V ID=80A VGS= 10 V 105
24 41
142 nC
SWITCHING OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
r(Voff)
t
Off-voltage Rise Time Fall T ime
t
f
Cross-over T ime
c
V R
=30V ID=80A
CLAM P
=4.7 ΩVGS=10V
G
(see test circuit, figure 5)
60 140 220
80 190 300
SOURCEDRAINDIODE
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
I
SDM
V
SD
t
Q
I
RRM
(∗) Pulsed:Pulse duration = 300µs, duty cycle 1.5% () Pulse width limited by safe operating area
Source-drain Current
(•)
Source-drain Current
80 320
(pulsed)
(∗)ForwardOnVoltage ISD=80A VGS=0 1.5 V
Reverse Recovery
rr
Time Reverse Recovery
rr
ISD= 80 A di/dt = 100 A/µs
=25V Tj= 150oC
V
r
(see test circuit, figure 5)
75
0.21 Charge Reverse Recovery
6
Current
nC nC
ns ns ns
A A
ns
µ
A
C
SafeOperating Area ThermalImpedance
3/8
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