SGS Thomson Microelectronics STE38NB50F Datasheet

STE38NB50F
N - CHANNEL 500V- 0.11
TYPE V
DSS
ST E38NB50F 500 V < 0 . 14 38 A
TYPICALR
± 30V GATE TO SOURCE VOLTAGERATING
100%AVALANCHETESTED
LOW INTRINSICCAPACITANCE
GATECHARGE MINIMIZED
REDUCEDVOLTAGESPREAD
DS(on)
= 0.11
DESCRIPTION
Using the latest high voltage MESH OVERLAY process, STMicroelectronicshas designed an ad­vanced family of power MOSFETs with outstand­ing performances. The new patent pending strip layout coupled with the Company’s proprietary edge termination structure, gives the lowest RDS(on) per area, exceptional avalanche and dv/dt capabilities and unrivalled gate charge and switchingcharacteristics.
R
DS(on)
I
D
- 38A - ISOTOP
PowerMESHMOSFET
ISOTOP
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
HIGHCURRENT, HIGH SPEED SWITCHING
SWITCHMODE POWER SUPPLY (SMPS)
DC-AC CONVERTERFOR WELDING
EQUIPMENTANDUNINTERRUPTABLE POWERSUPPLY AND MOTOR DRIVE
ABSOLUTE MAXIMUM RATINGS
Symb o l Parameter Value Unit
V
V
V
I
DM
P
dv/dt
T
() Pulse width limited by safe operating area (1)ISD≤38 A, di/dt ≤ 200 A/µs, VDD≤ V
December 1999
Drain-source Volt age (VGS= 0) 500 V
DS
Drain- g at e Voltag e (RGS=20kΩ) 500 V
DGR
Gate-s ource Voltage
GS
I
Drain C urrent (continu ous ) at Tc=25oC38A
D
I
Drain C urrent (continu ous ) at Tc=100oC24A
D
30 V
±
() Drain C urrent (pulsed) 152 A
Tot al Diss i pat ion at Tc=25oC 400 W
tot
Derat ing Fact or 3.2 W/
(1) Peak Diode R ecov e ry volt ag e slope 4.5 V/ns
Sto rage Temper at ur e -65 to 150
stg
T
Max. Oper a t ing Junction Temperature 150
j
(BR)DSS,Tj≤TJMAX
o
C
o
C
o
C
1/8
STE38NB50F
THERMAL DATA
R
thj-case
R
thj-amb
R
thc-sink
T
AVALANCHE CHARACTERISTICS
Symbol Parameter Max Value Unit
I
AR
E
Ther mal Resistance J unction- ca se Max Ther mal Resistance J unction- am bie nt Max Ther mal Resistance C ase-sink Ty p Maximum Lead T e m perature For So lder ing Purpose
l
Avalanche Current, Repetitive or Not-Repetiti ve (pulse width limited by T
Single Pul s e Avalanc he E ner gy
AS
(starting T
=25oC, ID=IAR,VDD=50V)
j
max)
j
0.31 30
0.1
300
38 A
1200 mJ
o
C/W
o
C/W
o
C/W
o
C
ELECTRICAL CHARACTERISTICS
=25oC unless otherwisespecified)
(T
case
OFF
Symbol Parameter Test Condit ions Min. Typ. M ax. Unit
V
(BR)DSS
Drain-source
ID=250µAVGS= 0 500 V
Break dow n Voltage
I
DSS
I
GSS
Zero Gate Voltage Drain Current (V
GS
Gat e- bod y Leak ag e Current (V
DS
=0)
=0)
V
=MaxRating
DS
=MaxRating Tc= 125oC
V
DS
V
=± 30 V
GS
10
100
100 nA
±
ON()
Symbol Parameter Test Condit ions Min. Typ. M ax. Unit
V
GS(th)
R
DS(on)
Gate Threshold Voltage VDS=VGSID= 250 µA 345V Sta t ic Drain-s ource On
VGS=10V ID= 1 9 A 0.11 0.14
Resistance
I
D(on)
On State Drain Current VDS>I
D(on)xRDS(on)max
38 A
VGS=10V
DYNAMIC
Symbol Parameter Test Condit ions Min. Typ. M ax. Unit
g
(∗)Forward
fs
Tr ansc on duc tance
C
C
C
Input Capaci t anc e
iss
Out put Capac it ance
oss
Reverse Transfer
rss
Capacit a nc e
VDS>I
D(on)xRDS(on)maxID
=19A 27 S
VDS=25V f=1MHz VGS= 0 5900
880
80
µ µA
pF pF pF
A
2/8
STE38NB50F
ELECTRICAL CHARACTERISTICS
(continued)
SWITCHING ON
Symbol Parameter Test Condit ions Min. Typ. M ax. Unit
t
d(on)
t
r
Turn-on Time Rise Tim e
VDD=250V ID=19A R
=4.7
G
VGS=10V
45 35
(see test circuit, figure 3)
Q Q Q
Tot al Gate Charge
g
Gat e- Source Charg e
gs
Gate-Drain Charge
gd
VDD= 400 V ID=38A VGS= 10 V 140
38 61
196 nC
SWITCHING OFF
Symbol Parameter Test Condit ions Min. Typ. M ax. Unit
t
r(Voff)
t
t
Off-voltage Rise Time Fall T ime
f
Cross-over Time
c
VDD=400V ID=38A
=4.7 VGS=10V
R
G
(see test circuit, figure 5)
28 30 60
SOURCEDRAINDIODE
Symbol Parameter Test Condit ions Min. Typ. M ax. Unit
I
V
I
SDM
SD
Q
I
RRM
SD
t
Source-drain Current
(•)
Source-drain Current
38
152
(pulsed)
(∗)ForwardOnVoltage ISD=38A VGS=0 1.6 V
Reverse Recovery
rr
Time Reverse Recovery
rr
ISD= 38 A di/dt = 100 A/µs
= 100 V Tj=150oC
V
DD
(see test circuit, figure 5)
715
11.8 Charge Reverse Recovery
33
Current
ns ns
nC nC
ns ns ns
A A
ns
µ
A
C
(∗) Pulsed: Pulse duration = 300µs, duty cycle 1.5 % () Pulse width limited by safe operating area
SafeOperating Area ThermalImpedance
3/8
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