SGS Thomson Microelectronics STD6NF10 Datasheet

STD6NF10
N-CHANNEL 100V - 0.22 - 6A IPAK/DPAK
LOW GATE CHARGE STripFET™ POWER MOSFET
TYPE
V
DSS
STD6NF10 100 V <0.250
TYPICAL R
100% AVALANCHE TESTED
LOW THRESHOLD DRIVE
THROUGH-HOLE IPAK (TO-251) POWER
(on) = 0.22
DS
R
DS(on)
I
D
6 A
PACKAGE IN TUBE (SUFFIX “- 1 ")
SURFACE-MOUNTING DPAK (TO-252)
POWER PACKAGE IN TAPE & REEL (SUFFIX “T4")
DESCRIPTION
This MOSFET series realized with STMicroelectronics unique STripFET process has specifically been designed to minimize input capacitance and gate charge. It is therefore suitable as primary switch in advanced high­efficiency, high-frequency isolated DC-DC converters for Telecom and Computer applications. It is also intended for any applications with low gate drive requirements.
APPLICATIONS
HIGH-EFFICIENCY DC-DC CONVERTERS
UPS AND MOTOR CONTROL
3
2
1
IP AK
TO-251
(Suffix “-1”)
DPAK
TO-252
(Suffix “T4”)
INTERNAL SCHEMATIC DIAGRAM
3
1
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
V
DS
V
DGR
V
GS
I
D
I
D
I
DM(
P
tot
dv/dt
E
AS
T
stg
T
j
Pulse width limited by safe operating area.
•)
(
.
Drain-source Voltage (VGS = 0) Drain-gate Voltage (RGS = 20 kΩ)
100 V 100 V
Gate- source Voltage ± 20 V
Drain Current (continuos) at TC = 25°C Drain Current (continuos) at TC = 100°C
•)
Drain Current (pulsed) 24 A
Total Dissipation at TC = 25°C
6A 4A
30 W
Derating Factor 0.2 W/°C
(1)
Peak Diode Recovery voltage slope 40 V/ns
(2)
Single Pulse Avalanche Energy 200 mJ Storage Temperature Max. Operating Junction Temperature
(1) I
≤6A, di/dt ≤300A/µs , VDD ≤ V
SD
(2) Starting Tj = 25 oC, ID = 3A, VDD= 50V
-65 to 175 °C
(BR)DSS
, Tj ≤ T
JMAX
1/9June 2001
STD6NF10
THERMA L D ATA
Rthj-case
Rthj-amb
T
Thermal Resistance Junction-case Thermal Resistance Junction-ambient Maximum Lead Temperature For Soldering Purpose
j
Max Max Typ
5 100 300
°C/W °C/W
°C
ELECTRICAL CHARACTERISTICS (T
= 25 °C UNLESS OTHERWISE SPECIFIED)
CASE
OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
= 250 µA, VGS = 0
D
V
= Max Rating
DS
V
= Max Rating TC = 125°C
DS
V
= ± 20V
GS
100 V
1
10 ±1 µA
ON
V
(BR)DSS
I
DSS
I
GSS
(1)
Drain-source Breakdown Voltage
Zero Gate Voltage Drain Current (V
GS
Gate-body Leakage Current (V
DS
= 0)
= 0)
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
V
GS(th)
R
DS(on)
Gate Threshold Voltage Static Drain-source On
Resistance
= VGS I
DS
V
= 10 V ID = 3 A
GS
= 250 µA
D
24V
0.22 0.25
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
> I
x R
D(on)
DS(on)max,
= 25V, f = 1 MHz, VGS = 0
(*)
g
fs
C
iss
C
oss
C
rss
Forward Transconductance
Input Capacitance Output Capacitance Reverse Transfer Capacitance
I
D
V
DS
=3 A
DS
34 S
280
45 20
µA µA
pF pF pF
2/9
STD6NF10
ELECTRICAL CHARACTERISTICS (continued) SWITCHING ON
Symbol Parameter Test Conditions Min. Typ. Max. Unit
= 50 V ID = 3 A
t
d(on)
Turn-on Delay Time
t
r
Rise Time
V
DD
R
= 4.7 Ω VGS = 10 V
G
(Resistive Load, Figure 3)
Q
Q
gs
Q
gd
Total Gate Charge
g
Gate-Source Charge Gate-Drain Charge
= 80 V ID = 6 A VGS= 10 V
V
DD
SWITCHING OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
= 50 V ID = 6 A
t
d(off)
Turn-off Delay Time
t
f
Fall Time
V
DD
R
= 4.7Ω, V
G
GS
(Resistive Load, Figure 3)
= 10 V
6
10
10
2.5 4
20
3
ns ns
nC nC nC
ns ns
t
d(Voff)
t
t
Off-voltage Rise Time
f
c
Fall Time Cross-over Time
= 80 V ID = 6 A
V
clamp
R
= 4.7Ω, V
G
GS
= 10 V
(Inductive Load, Figure 5)
19
8
15
SOURCE DRAIN DIODE
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
I
SDM
V
SD
t
rr
Q
rr
I
RRM
(*)
Pulsed: P ul se duration = 300 µs, duty c yc l e 1.5 %.
(
Pulse widt h l i m i ted by safe operating area.
•)
Saf e Oper ating A rea
Source-drain Current
(•)
Source-drain Current (pulsed)
(*)
Forward On Voltage Reverse Recovery Time
Reverse Recovery Charge Reverse Recovery Current
I
= 6 A VGS = 0
SD
= 6 A di/dt = 100A/µs
I
SD
V
= 10 V Tj = 150°C
DD
(see test circuit, Figure 5)
Thermal Impedance
6
24
1.3 V
70
175
5
ns ns ns
A A
ns
nC
A
3/9
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