SGS Thomson Microelectronics STD4NS25 Datasheet

STD4NS25
N-CHANNEL 250V - 0.9- 4A DPAK/IPAK
MESH OVERLAY™ MOSFET
TYPE V
DSS
STD4NS25 250 V < 1.1
TYPICAL R
EXTREMELY HIGH dv /d t C APABILITY
ADD SUFFIX “T4” FOR ORDERING IN TAPE &
(on) = 0.9
DS
R
DS(on)
I
D
4 A
REEL
DESCRIPTION
Using the latest high voltage MESH OVERLAY™ process, STMicroelectronics has designed an ad­vanced family of power MOSFETs with outstanding performance. The new patented STrip layout cou­pled with the Company’s proprietary edge termina­tion structure, makes it suitable in coverters for lighting applications.
APPLICATIONS
HIGH CURRENT, HIGH SPEED SWITCHING
SWITH MODE POWER SUPPLI ES ( SMPS)
DC-DC CONVERTERS FOR TELECOM,
INDUSTRIAL, AND LIGHTING EQUIPMENT
3
1
DPAK
TO-252
INTERNAL SCHEMATIC DIAGRAM
IPAK
TO-251
3
2
1
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
V
DS
V
DGR
V
GS
I
D
I
D
I
DM
P
TOT
dv/dt (1) Peak Diode Recovery voltage slope 5 V/ns
T
stg
T
j
(•)Pu l se width limited by safe operating area
Drain-source Voltage (VGS = 0) Drain-gate Voltage (RGS = 20 kΩ)
250 V 250 V
Gate- source Voltage ± 20 V
Drain Current (continuos) at TC = 25°C Drain Current (continuos) at TC = 100°C
()
Drain Current (pulsed) 16 A Total Dissipation at TC = 25°C
4A
2.5 A
50 W
Derating Factor 0.4 W/°C
Storage Temperature –65 to 150 °C Max. Operating Junction Temperature 150 °C
(1) I
4A, di/dt≤300 A/µs, V
SD
DD
V
(BR)DSS
, Tj≤T
jMAX
1/9February 2001
STD4NS25
THERMA L D ATA
Rthj-case Thermal Resistance Junction-case Max 2.5 °C/W
Rthj-amb Thermal Resistance Junction-ambient Max 100 °C/W
Rthc-sink Thermal Resistance Case-sink Typ 1.5 °C/W
T
l
AVALANCHE CHARACTERISTICS
Symbol Parameter Max Value Unit
I
AR
E
AS
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED) OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
I
DSS
I
GSS
Maximum Lead Temperature For Soldering Purpose 275 °C
Avalanche Current, Repetitive or Not-Repetitive (pulse width limited by T
max)
j
Single Pulse Avalanche Energy (starting T
Drain-source
= 25 °C, ID = IAR, VDD = 50 V)
j
ID = 250 µA, VGS = 0 250 V
4A
120 mJ
Breakdown Voltage
= Max Rating
Zero Gate Voltage Drain Current (V
GS
Gate-body Leakage Current (V
DS
= 0)
= 0)
V
DS
V
= Max Rating, TC = 125 °C
DS
V
= ±20V ±100 nA
GS
A
10 µA
ON
(1)
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
V
GS(th)
R
DS(on)
Gate Threshold Voltage Static Drain-source On
= VGS, ID = 250µA
DS
VGS = 10V, ID = 2 A
234V
0.9 1.1
Resistance
I
D(on)
On State Drain Current VDS > I
D(on)
x R
DS(on)max,
4A
VGS=10V
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
(1) Forward Transconductance VDS > I
g
fs
C
iss
C
oss
C
rss
Input Capacitance Output Capacitance 64 pF Reverse Transfer
Capacitance
ID=2A
V
DS
D(on)
x R
DS(on)max,
= 25V, f = 1 MHz, VGS = 0
1 3.5 S
355 pF
29.5 pF
2/9
STD4NS25
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
t
d(on)
Q Q Q
t
r
g gs gd
Turn-on Delay Time Rise Time 18 ns Total Gate Charge
Gate-Source Charge 3.2 nC Gate-Drain Charge 7.5 nC
SWITCHING OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
d(Voff)
t
t
r(Voff)
t t
f
f
c
Turn-off- Delay Time Fall Time
Off-voltage Rise Time Fall Time Cross-over Time
SOURCE DRAIN DIODE
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
I
SDM
VSD (1)
t
rr
Q
rr
I
RRM
Note: 1. Pulsed: Pu l se duration = 300 µs, duty cycle 1.5 %.
2. Pulse width li mited by safe operating ar ea.
Source-drain Current 4 A
(2)
Source-drain Current (pulsed) 16 A Forward On Voltage Reverse Recovery Time
Reverse Recovery Charge 0.5 Reverse Recovery Current 7.2 A
= 125 V, ID = 2 A
DD
RG= 4.7Ω VGS = 10 V (see test circuit, Figure 3)
V
= 200V, ID = 4 A,
DD
VGS = 10V
VDD = 125V, ID = 2 A, RG=4.7Ω, V
GS
= 10V
(see test circuit, Figure 3) V
= 200V, ID = 4 A,
clamp
R
=4.7Ω, V
G
GS
= 10V
(see test circuit, Figure 5)
ISD = 4 A, VGS = 0 I
= 4 A, di/dt = 100A/µs
SD
VDD = 30V, Tj = 150°C (see test circuit, Figure 5)
12 ns
19 27 nC
70
10.5
13 10
21.5
1.5 V
124 ns
ns ns
ns ns ns
µ
C
Thermal Imp e danceSafe Operating Area
3/9
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