SGS Thomson Microelectronics STD30PF03L, STD30PF03L-1 Datasheet

STD30PF03L
STD30PF03L-1
P-CHANNEL 30V - 0.025- 24A DPAK/IPAK
STripFET™ II POWER MOSFET
PRELIMINARY DATA
TYPE V
STD30PF03 L STD30PF03 L-1
TYPICAL R
STANDARD OUTLI N E FOR EAS Y
DS(on)
DSS
30 V 30 V
= 0.025
R
DS(on)
< 0.028 < 0.028
I
D
24 A 24 A
AUTOMATED SURFACE MOUNT ASSEMBLY
LOW THRESHOLD DRIVE
LOW GATE CHARGE
EXTREMELY LOW FIGURE OF MERIT
(R
DS(on) * Qg
)
DESCRIPTION
This Power MOSFET is the latest dev elo pment of
STMicroelectronics unique “Single Feature Size™” strip-based process. The resulting transis­tor shows extremely high packing density for low on-resistance and low gate charge.
APPLICATIONS
DC-DC CONVERTERS
3
DPAK
1
IPAK
1
INTERNAL SCHEMATIC DIAGRAM
3
2
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
V
DS
V
DGR
V
GS
I
(#) Drain Current (continuous) at TC = 25°C
D
ID (#) Drain Current (continuous) at TC = 100°C
I
DM
P
TOT
T
stg
T
j
() Pulse width limited by safe operating area (#) Curre nt lim i ted by wire bonding
May 2002
Drain-source Voltage (VGS = 0) Drain-gate Voltage (RGS = 20 k) Gate- source Voltage ± 16 V
(l)
Drain Current (pulsed) 96 A Total Dissipation at TC = 25°C Derating Factor 0.47 W/°C Storage Temperature – 55 to 175 °C Max. Operating Junction Temperature 175 °C
Note:For the P-CHANNEL MOSFET actual polarity of voltages and
30 V 30 V
24 A 24 A
70 W
1/8
STD30PF03L - STD30PF03L-1
THERMA L D ATA
Rthj-case Thermal Resistance Junction-case Max 2.14 °C/W
Rthj-amb Thermal Resistance Junction-ambient Max 100 °C/W
T
j
AVALANCHE CHARACTERISTICS
Symbol Parameter Max Value Unit
I
AR
E
AS
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED) OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
I
DSS
I
GSS
Maximum Operating Junction Temperature 275 °C
Avalanche Current, Repetitive or Not-Repetitive (pulse width limited by T
max)
j
Single Pulse Avalanche Energy (starting T
Drain-source
= 25 °C, ID = IAR, VDD = 25 V)
j
ID = 250 µA, VGS = 0 30 V
24 A
350 mJ
Breakdown Voltage Zero Gate Voltage
Drain Current (V
GS
Gate-body Leakage Current (V
DS
= 0)
= 0)
V
= Max Rating
DS
V
= Max Rating, TC = 125 °C
DS
V
= ± 16 V ±100 nA
GS
A
10 µA
ON
(1)
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
GS(th)
R
DS(on)
Gate Threshold Voltage Static Drain-source On
Resistance
V
= VGS, ID = 250µA
DS
VGS = 10 V, ID = 12 A VGS = 5 V, ID = 12 A
1V
0025 0.028
0.032 0.040
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
(1) Forward Transconductance VDS = 15 V, ID= 12 A 23 S
g
fs
C
iss
C
oss
C
rss
Input Capacitance Output Capacitance 345 pF Reverse Transfer
Capacitance
V
= 25V, f = 1 MHz, VGS = 0
DS
1670 pF
120 pF
2/8
STD30PF03L - STD30PF03L-1
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
t
d(on)
Q Q Q
t
r
g gs gd
Turn-on Delay Time Rise Time 122 ns Total Gate Charge
Gate-Source Charge Gate-Drain Charge
SWITCHING OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
d(off)
t
f
Turn-off-Delay Time Fall Time
SOURCE DRAIN DIODE
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
I
SDM
VSD (1)
t
rr
Q
rr
I
RRM
Note: 1. Pulsed: Pu l se duration = 300 µs, duty c yc l e 1.5 %.
2. Pulse width li mited by safe operating area.
Source-drain Current 24 A
(2)
Source-drain Current (pulsed) 96 A Forward On Voltage Reverse Recovery Time
Reverse Recovery Charge Reverse Recovery Current
= 24 V, ID = 24 A
DD
R
= 4.7 VGS = 4.5V
G
(see test circuit, Figure 3) VDD = 15 V, ID = 24 A,
VGS = 5 V
VDD = 24 V, ID = 24 A, RG=4.7Ω, V
GS
= 4.5V
(see test circuit, Figure 3)
ISD = 24 A, VGS = 0
= 24 A, di/dt = 100 A/µs,
I
SD
VDD = 24 V, Tj = 150 °C (see test circuit, Figure 5)
64 ns
18.5
25 nC
5.5 11
36 26
2.3 V
40 52
2.6
nC nC
ns ns
ns
µC
A
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