SGS Thomson Microelectronics STP8NC70ZFP, STP8NC70Z, STB8NC70Z, STB8NC70ZT4, STB8NC70Z-1 Datasheet
1/13December 2002
STP8NC70Z - STP8NC70ZFP
STB8NC70Z - STB8NC70Z-1
N-CHANNEL 700V - 0.90Ω - 6.8A TO-220/FP/D2PAK/I2PAK
Zener-Protected PowerMESH™III MOSFET
(1)ISD≤6.8A,di/dt ≤100A/µs, VDD≤ V
(BR)DSS,Tj≤TJMAX
.
(*)Pulse width Limited by maximum temperature allowed
TO-220
1
2
3
TO-220FP
1
2
3
I2PAK
1
3
D2PAK
■ TYPICAL R
DS
(on) = 0.9 Ω
■ EXTREMELY HIGH dv/dtAND CAPABILITY
GATE-TO- SOURCE ZENER DIODES
■ 100% AVALANCHE TESTED
■ V ER Y LOW GATE INPUT RESISTANCE
■ GAT E CHARGE MINIMIZED
DESCRIPTION
The third generation of MESH OVERLAY™ Power
MOSFETs for very high voltage exhibi ts unsurpassed
on-resistance per unit area w hile integrat ing back-toback Zenerdiodes between gate and source.Such arrangement gives extra ESD capability with higher ruggedness performance as requested by a large variety
of single-switch applications.
APPLICATIONS
■ S INGLE -ENDED S MPS IN MONITORS,
COMPUTER AND INDUSTRIALAPPLICATION
■ WELDING EQUIPMENT
ABSOLUTE MAXIMUM RATINGS
(•)Pulse width limited by safe operating area
TYPE V
DSS
R
DS(on)
I
D
STP8NC70Z/FP 700V < 1.2 Ω 6.8 A
STB8NC70Z/-1 700V < 1.2 Ω 6.8 A
Symbol Parameter Value Unit
STP(B)8NC70Z(-1) STP8NC70ZFP
V
DS
Drain-source Voltage (VGS=0)
700 V
V
DGR
Drain-gate Voltage (RGS=20kΩ)
700 V
V
GS
Gate- source Voltage ± 25 V
I
D
Drain Current (continuous) at TC= 25°C
6.8 6.8(*) A
I
D
Drain Current (continuous) at TC= 100°C
4.3 4.3(*) A
I
DM
(●)
Drain Current (pulsed) 27 27(*) A
P
TOT
Total Dissipation at TC= 25°C
135 40 W
Derating Factor 1.08 0.32 W/°C
I
GS
Gate-source Current (DC) ±50 mA
V
ESD(G-S)
Gate source ESD(HBM-C=100pF, R=15KΩ) 3KV
dv/dt(1) Peak Diode Recovery voltage slope 3 V/ns
V
ISO
Insulation Winthstand Voltage (DC) -- 2000 V
T
stg
Storage Temperature –65 to 150 °C
T
j
Max. Operating Junction Temperature 150 °C
STP8NC70Z - STP8NC70ZFP - S TB8N C 70Z - STB8NC70Z-1
2/13
THERMAL DATA
AVALANCHE CHARACTERISTICS
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
ON (1)
DYNAMIC
TO-220 / D2PAK
I
2
PAK
TO-220FP
Rthj-case Thermal Resistance Junction-case Max 0.93 3.13 °C/W
Rthj-amb Thermal Resistance Junction-ambient Max 62.5 °C/W
T
l
Maximum Lead Temperature For Soldering Purpose 300 °C
Symbol Parameter Max Value Unit
I
AR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by T
j
max)
6.8 A
E
AS
Single Pulse Avalanche Energy
(starting T
j
= 25 °C, ID=IAR,VDD=50V)
354 mJ
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
Drain-source
Breakdown Voltage
ID= 250 µA, VGS= 0 700 V
∆BV
DSS
/∆TJBreakdown Voltage Temp.
Coefficient
ID=1mA,VGS= 0 0.8 V/°C
I
DSS
Zero Gate Voltage
Drain Current (V
GS
=0)
V
DS
= Max Rating
1µA
VDS= Max Rating, TC= 125 °C
50 µA
I
GSS
Gate-body Leakage
Current (V
DS
=0)
V
GS
= ±20V ±10 µA
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
GS(th)
Gate Threshold Voltage
V
DS=VGS,ID
= 250µA
345V
R
DS(on)
Static Drain-source On
Resistance
VGS=10V,ID= 3.75 A
0.90 1.2 Ω
Symbol Parameter Test Conditions Min. Typ. Max. Unit
g
fs
(1) Forward Transconductance VDS>I
D(on)xRDS(on)max,
ID= 3.75A
6S
C
iss
Input Capacitance
V
DS
=25V,f=1MHz,VGS=0
2350 pF
C
oss
Output Capacitance 180 pF
C
rss
Reverse Transfer
Capacitance
22 pF
3/13
STP8NC70Z - STP8NC70ZFP - STB8NC70Z - STB8NC70Z-1
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
SWITCHING OFF
SOURCE DRAIN DIODE
GATE-SOURCE ZENER DIODE
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
3. ∆V
BV
= αT(25°-T)BV
GSO
(25°)
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES
The built-inback-to-back Zener diodeshave specifically beend es igned to enhance not only thedevice’ s
ESD capability, but also to make them safely absorb possible voltage transients that may occasionall y
be applied from gate to sourc e. In t his respect the Zener voltage is appropriate to achieve an efficient
and cost-effective interventionto protectthe device’s integrity. These integrated Zener diodes t hus avoid
the usage of external components.
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
d(on)
Turn-on Delay Time
V
DD
=350V,ID= 37.5 A
RG= 4.7Ω VGS=10V
(see test circuit, Figure 3)
30 ns
t
r
Rise Time 10 ns
Q
g
Total Gate Charge
V
DD
=560V,ID= 7.5 A,
V
GS
=10V
55 77 nC
Q
gs
Gate-Source Charge 14 nC
Q
gd
Gate-Drain Charge 21 nC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
r(Voff)
Off-voltage Rise Time
V
DD
= 560V, ID= 7.5 A,
RG=4.7Ω, VGS= 10V
(see test circuit, Figure 5)
15 ns
t
f
Fall Time 12 ns
t
c
Cross-over Time 20 ns
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
Source-drain Current 6.8 A
I
SDM
(2)
Source-drain Current (pulsed) 27 A
V
SD
(1)
Forward On Voltage
ISD= 6.8 A, VGS=0
1.6 V
t
rr
Reverse Recovery Time
I
SD
= 7.5 A, di/dt = 100A/µs,
V
DD
=30V,Tj= 150°C
(see test circuit, Figure 5)
680 ns
Q
rr
Reverse Recovery Charge 7.1 µC
I
RRM
Reverse Recovery Current 21 A
Symbol Parameter Test Conditions Min. Typ. Max. Unit
BV
GSO
Gate-Source Breakdown
Voltage
Igs=± 1mA (Open Drain) 25 V
αT Voltage Thermal Coefficient T=25°C Note(3) 1.3
10
-4
/°C
Rz Dynamic Resistance
I
D
=50mA,
90 Ω
STP8NC70Z - STP8NC70ZFP - S TB8N C 70Z - STB8NC70Z-1
4/13
Output Characteristics
Safe Operating Area For TO-220FPSafe Operating Area For TO-220/D²PAK/I²PA K
Thermal Impedance For TO-220/D²PAK/I²PA K Thermal Impedance For TO-220FP
Transfer Characteristics
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