M54HC X XXF 1 RM74H CXXXM1 R
M74HC X XXB1RM74H CXXXC1R
F1R
(CeramicPackage)
C1R
(Chip Carrier)
DESCRIPTION
The M54/74HC367 andtheM54/74HC368are high
speedCMOS HEXBUS BUFFER (3-STATE) fabricatedin silicongateC2MOStechnology. Theyhave
the same high speed performance of LSTTL combined with true CMOS low power consumption.
These devices contain six buffers, fourbuffers are
controlledbyan enableinput (G1)and theother two
buffers are controlled by the other enable input
(G2); theoutputs of each buffer groupare enabled
when G1 and/or G2 inputs are held low, and
when held high these outputs are disabled to be
high-impedance.
Theseoutputs arecapable ofdrivingupto15LSTTL
loads. The designer has a choice of non-inverting
outputs (HC367) and inverting outputs (HC368).
All inputs are equipped with protection circuits
against static discharge and transient excess voltage.
Supply Voltage-0.5 to +7V
DC Input Voltage-0.5 to VCC+ 0.5V
I
DC Output Voltage-0.5 to VCC+ 0.5V
DC Input Diode Current± 20mA
DC Output Diode Current± 20mA
DC Output Source Sink CurrentPer OutputPin± 35mA
DC VCCor Ground Current± 70mA
GND
Power Dissipation500 (*)mW
Storage Temperature-65 to +150
Lead Temperature (10 sec)300
L
o
C
o
C
RECO MM ENDED OPERATIN G CONDITI O NS
SymbolParameterValueUnit
V
T
t
V
V
r,tf
Supply Voltage2 to 6V
CC
Input Voltage0 to V
I
Output Voltage0 to V
O
Operating Temperature: M54HC Series
op
M74HC Series
CC
CC
-55 to +125
-40 to +85
Input Rise and Fall TimeVCC= 2 V0 to 1000ns
V
= 4.5 V0 to 500
CC
= 6 V0 to 400
V
CC
V
V
o
C
o
C
3/11
M54/M74HC367/368
DC SPECIFICA TIONS
SymbolParameter
V
V
V
V
I
I
High Level Input
IH
Voltage
Low Level Input
IL
Voltage
High Level
OH
Output Voltage
Low Level Output
OL
Voltage
I
Input Leakage
I
Current
3 State Output
OZ
Off State Current
Quiescent Supply
CC
Current
Test ConditionsValue
V
(V)
CC
=25oC
A
54HC and 74HC
Min.Typ.Max.Min.Max.Min.Max.
-40 to 85oC
74HC
-55 to 125oC
54HC
Unit
T
2.01.51.51.5
4.53.153.153.15
6.04.24.24.2
2.00.50.50.5
4.51.351.351.35
6.01.81.81.8
2.0
4.54.44.54.44.4
6.05.96.05.95.9
4.5I
6.0I
2.0
4.50.00.10.10.1
6.00.00.10.10.1
4.5I
6.0I
6.0
6.0
=
V
I
IO=-20 µA
V
IH
or
V
IL
=-6.0 mA 4.184.314.134.10
O
=-7.8 mA 5.685.85.635.60
O
=
V
I
IO=20µA
V
IH
or
V
IL
= 6.0 mA0.170.260.330.40
O
= 7.8 mA0.180.260.330.40
O
VI=VCCor GND±0.1±1±1µA
VI=VIHor V
VO=VCCor GND
1.92.01.91.9
0.00.10.10.1
IL
±0.5±5±10µA
6.0 VI=VCCor GND44080µA
V
V
V
V
4/11
M54/M74HC367/368
AC ELECTRICAL CHARACTERISTICS (CL=50pF,Inputtr=tf=6ns)
Test ConditionsValue
T
=25oC
SymbolParameter
t
t
TLH
THL
Output Transition
Time
V
C
CC
(V)
L
(pF)
2.0
50
4.57121518
A
54HC and 74HC
Min.Typ.Max.Min.Max.Min.Max.
25607590
6.06101315
t
PLH
t
PHL
Propagation
Delay Time
2.0
50
4.510172126
3085105130
6.09141822
2.0
150
4.514212632
42105130160
6.012182227
t
t
PZH
PZL
Output Enable
Time
2.0
50RL=1KΩ
4.511182327
3690115135
6.09152023
2.0
150 R
4.515222833
=1KΩ
L
49110140165
6.013192428
t
t
PHZ
PLZ
Output Disable
Time
2.0
50RL=1KΩ
4.514192429
3295120145
6.012162025
C
C
PD
Input Capacitance5101010pF
IN
(*)Power Dissipation
33
Capacitance
(*) CPDisdefined as the value ofthe IC’sinternal equivalent capacitance which is calculated fromthe operatingcurrent consumption without load.
(Referto Test Circuit).Average operting current canbe obtained bythe followingequation. ICC(opr) = CPD•VCC•fIN+ICC/6(per Channel)
-40 to 85oC
74HC
-55 to 125oC
54HC
Unit
ns
ns
ns
ns
ns
ns
pF
TEST CIRCUIT ICC(Opr.)
INPUT WAVEFORM IS THE SAME AS THAT IN CASE OF
SWITCHINGCHARACTERISTICSTEST.
CPDCALCULATION
CPDis to be calculated with the following
formula by using the measured value of
ICC(opr.) in the testcircuit opposite.
I
(
opr
CPD=
f
CC
IN
)
×
V
CC
In determining the typicalvalue of CPD,a
relatively highfrequency of 1MHzwasappliedto fIN, in order to eliminate any error
causedby the quiescent supplycurrent.
5/11
M54/M74HC367/368
SWITCHING CHARACTERISTICS TEST WAVEFORM
GND
V
CC
Note:Such a logic levelshall be appliedto eachinput that the output voltage stays in theapposite side to the switchconnection level,when
the outputis enable.
Information furnishedis believed to be accurate and reliable.However, SGS-THOMSON Microelectronics assumes no responsabilityfor the
consequences of useof such information norfor any infringementof patents or other rights of third parties which may results from its use. No
license is granted byimplication or otherwiseunder any patentor patent rightsof SGS-THOMSON Microelectronics.Specificationsmentioned
in thispublication are subjectto change without notice.This publication supersedes and replaces all information previouslysupplied.
SGS-THOMSON Microelectronicsproducts are not authorized foruse ascritical componentsin life supportdevices or systemswithout express
written approval ofSGS-THOMSON Microelectonics.
1994SGS-THOMSON Microelectronics- All Rights Reserved
Australia -Brazil - France- Germany- HongKong - Italy- Japan - Korea - Malaysia- Malta - Morocco -The Netherlands-
Singapore -Spain - Sweden - Switzerland -Taiwan -Thailand - United Kingdom -U.S.A
SGS-THOMSON Microelectronics GROUP OFCOMPANIES
11/11
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