M58LW128 is a 1 28 Mbit (8Mb x16 or 4Mb x32)
non-volatile memory that can be read, erased and
reprogrammed. These operations can be performed using a single low voltage (2.7V to 3.6V)
core supply. On power-up the memo ry d efaults to
Read mode with an asynchronous bus where it
can be read in the same way as a non-burst Flash
memory.
The memory is divided into 128 blocks of 1Mbit
that can be erased ind ependently so it is possible
to preserve valid data while old data is erased.
Program and Erase command s are written to the
Command Interface of the memory. An on-chip
Program/Erase Controller simplifies the process of
programming or erasing the memory by taking
care of all of the special operations that are required to update the memory contents. The end of
a Program or Erase operation can be detected and
any error conditions identified in the Status Register. The command set required to control the
memory is consistent with JEDEC standards.
The Write Buffer allows the microprocessor to program up t o 16 W ords (or 8 Double Words) in parallel, both speeding up the programming and
freeing up the microprocessor to perform other
work. The minimum buffer size for a program operation is an 8 Word (or 4 Double Word) page. A
page can only be programmed once between
Erase operations.
Erase can be suspended in order to perform either
read or program in any ot her block and then resumed. Program can be suspended to read data in
any other block and then resumed. Each block can
be programmed and erased over 100,000 cycles.
Individual block protection against program or
erase is provided for data security. All blocks are
protected during power-up. Th e protection of the
blocks is non-volatile; after power-up the protec-
tion status of e ach block is restored to the state
when power was last removed. Software commands are provided to allow protection of some or
all of the blocks and to cancel all block protection
bits simultaneously. All program or erase operations are blocked when the Program Erase Enable
input Vpp is low.
The Reset/Power-Down pin is used to apply a
Hardware Reset to the memory and to set the device in Power-Down mode. It can also be used to
temporarily disable the protection mechanism.
In asynchronous mode Chip Enable, Output Enable and Write Enable signals control the bus operation of the memory. An Address Latch input can
be used to latch addresses in Latch Controlled
mode. Together they allow simple , yet powerful,
connection to most microprocessors, often without
additional logic.
In synchronous mode all Bus Read operations are
synchronous with the Clock. Chip Enable and Output Enable select the Bus Read operation; the address is Latched using the Latch Enable inputs
and the address is advanced using Burst Address
Advance. The signals are compatible with most
microprocessor burst interfaces.
A One Time Programmable (OTP) area is included
for security purposes. Either 512 Words (x16 Bus
Width) or 512 Double-Words (x32 Bus Width) is
available in the OTP area. The process of reading
from and writing to the OTP area is not published
for security purposes; contact STMicroelectronics
for details on how to use the OTP area.
The memory is offered in various packages . The
M58LW128A is available in TSOP56 (14 x 20 mm)
and TBGA64 (1mm pitch). The M58LW128B is
available in TBGA80 (1mm pitch).
6/65
M58LW128A, M58LW128B
Figure 2. Logic Diagram
V
V
DD
23
A1-A23
V
PP
W
E
G
RP
L
B
K
(1)
WORD
Note: 1. M58LW12 8B onl y.
M58LW128A
M58LW128B
V
V
SS
DDQ
SSQ
16
DQ0-DQ15
16
DQ16-DQ31
RB
R
AI04314
Table 1. Signal Names
A1Address Input (x16 Bus Width only)
A2-A23Address inputs
DQ0-DQ15Data Inputs/Outputs
DQ16-DQ31
B
(1)
E
G
KClock
L
RValid Data Ready
RB
RP
V
PP
W
WORD
V
DD
V
DDQ
V
SS
V
SSQ
NCNot Connected Internally
Data Inputs/Outputs (x32 Bus Width of
M58LW128B only)
Burst Address Advance
Chip Enable
Output Enable
Latch Enable
Ready/Busy
Reset/Power-Down
Program/Erase Enable
Write Enable
Word Organization (M58LW128B only)
Supply Voltage
Input/Output Supply Voltage
Ground
Input/Output Ground
7/65
M58LW128A, M58LW128B
Figure 3. TSOP56 Connections
A22
A21
A20
A19
A18
A17
A16
V
A15
A14
A13
A12
V
A11
A10
V
DD
PP
RP
A9
A8
SS
A7
A6
A5
A4
A3
A2
A1
1
R
E
14
M58LW128A
15
2829
56
43
42
NC
W
G
RB
DQ15
DQ7
DQ14
DQ6
V
SSQ
DQ13
DQ5
DQ12
DQ4
V
DDQ
V
SS
DQ11
DQ3
DQ10
DQ2
V
DD
DQ9
DQ1
DQ8
DQ0
B
K
A23
L
AI04315
8/65
M58LW128A, M58LW128B
Figure 4. TBGA64 Connections for M58LW128A (Top view through package)
87654321
A
BRA19A2
C
DA16
E
F
G
A1
V
A4A5
K
A23
DQ0
A6V
SS
A7A3
A8
A10A12
A11
DQ10
DQ2B
PP
EA9
RP
DDQ
A13
A14
A15
NCNC
DQ5V
V
DD
NC
NC
NC
NCNC
DQ6
DQ15RBDQ9DQ8DQ1DQ4DQ3
DQ14
A20
A22A18
A21
A17
GDQ12DQ11
W
H
L
NC
V
DD
V
SS
DQ13
V
SSQ
DQ7
NC
AI04316
9/65
M58LW128A, M58LW128B
Figure 5. TBGA80 Connections for M58LW128B (Top view through package)
87654321
A
BRA19A2
C
DNC
E
F
G
A1
A4A5
DQ24
A8A22A18
A7
A6A3
DQ25
DQ18
V
SS
A10
A11
DQ27
LDQ17DQ26DQ30DQ5DQ3
E
A12A9
V
PP
RP
A13
A14
A15
A23
DQ6WORD
V
DD
A16
A17
NC
DQ28
DQ20DQ29
WDQ21
A20
DQ22DQ31DQ19DQ16
A21
NC
DQ23DQ13DQ10
10/65
H
J
K
KDQ15DQ2DQ12BDQ11GRB
DQ0
DQ8
DQ1
DQ9DQ14
V
DD
V
DD
SS
V
SS
DQ4V
V
DDQ
V
V
SSQ
DDQ
V
V
SSQ
DDQ
DQ7
AI04318
Figure 6. Block Addresses
M58LW128A, M58LW128B
M58LW128A, M58LW128B
Word (x16) Bus Width
Address lines A1-A23
7FFFFFh
7F0000h
7EFFFFh
7E0000h
01FFFFh
010000h
00FFFFh
000000h
Note: A l so see Appe ndi x A, Table 28 for a full listing of the Block Addresses
1 Mbit or
64 KWords
1 Mbit or
64 KWords
Total of 128
1 Mbit Blocks
1 Mbit or
64 KWords
1 Mbit or
64 KWords
SIGNAL DESCRIPTIONS
See Figure 2, Logic Diagram and Table 1, Signal
Names, for a brief overview of the signals connected to this device.
Address Inputs (A1-A23). The Address Inputs
are used to select the cells to access in the memory array during Bus Read operations either to
read or to program data to. During Bus Write operations they control the commands sent to the
Command Interface of the internal state m ac hine.
Chip Enable must be low when selecting the addresses.
The address inputs are latched on the rising edge
of Chip Enable, Write Enable or Latch Enable,
whichever occurs first in a write operation. The address latch is transparent when Latch Enable is
low, V
. The address is internally latched in a pro-
IL
gram or erase operation.
With a x32 Bus Width, WORD
= VIH, Address Input
A1 is ignored; the Least Significant Word is output
on DQ0-DQ15 and the Most Significant Word is
output on DQ16-DQ31. With a x16 Bus Width,
WORD
on DQ0-DQ15 when A1 is lo w, V
= VIL, the Least Significant Word is ou tput
and the Most
IL,
Significant Word is output on DQ0-DQ15 when A1
is high, V
.
IH
Data Inputs/Outputs (DQ0-DQ31). The Data Inputs/Outputs output the data stored at the selected
address during a Bus Read operation, or are used
to input the data during a Program operation. During Bus Write operations they repres ent the commands sent to the Command Interface of the
internal state machine. When used to input data or
write commands they are latched on the rising
edge of Write Enable or Chip Enable, whichever
occurs first.
When Chip Enable and Output Enable are both
low, V
ory array, the Electronic Signature, the Block Protection status, the CFI Information or the contents
of the Status Register. The data bus is high impedance when the chip is deselected, Output E nable
is High, V
Low, V
active the Ready/Busy status is given on DQ7
while DQ0-DQ6 and DQ8-DQ 31 are high impedance.
With a x16 Bus Width, WORD
are not used and are high impedance.
Chip Enable (E
vates the memory control logic, input buffers, decoders and sense amplifiers. Chip Enable, E
V
consumption to the Standby level, I
Output Enable (G
the outputs through the data output buffers during
a read operation. When Output Enable, G
M58LW128B
Double-Word (x32) Bus Width
Address lines A2-A23
(A1 is Don't Care)
3FFFFFh
3F8000h
3F7FFFh
3F0000h
00FFFFh
008000h
007FFFh
000000h
, the data bus outputs data from the mem-
IL
IH,
. When the Program/Erase Controller is
IL
1 Mbit or
32 KDouble-Words
1 Mbit or
32 KDouble-Words
1 Mbit or
32 KDouble-Words
1 Mbit or
32 KDouble-Words
AI06130
or the Reset/Power-Down signal is
= VIL, DQ16-DQ31
). The Chip Enable, E, input acti-
deselects the memory and reduces the power
IH
DD1
.
). The Output Enable, G, gates
, is at V
, at
IH
11/65
M58LW128A, M58LW128B
the outputs are high impedance. Output Enable,
G
, can be used to inhibit the data ou tput during a
burst read operation.
Write Enable (W
). The Write Enable input, W,
controls writing to the Command Interface, Input
Address and Data latches. Both addresses and
data can be latched on the rising edge of Write Enable (also see Latch Enable, L
Reset/Power-Down (RP
).
). The Reset/PowerDown pin can be used to apply a Hardware Reset
to the memory or to temporarily unprotect all
blocks that have been prot e cte d .
A Hardware Reset is achieved by holding Reset/
Power-Down Low, V
, for at least t
IL
Reset/Power-Down is Low, V
, the Status Regis-
IL
PLPH
. When
ter information is cleared and the current is reduced to I
(refer to Table 16, DC
DD2
Characteristics). The device is deselected and
outputs are high impedance. If Reset/PowerDown goes low, V
,during a Block Erase, a Write
IL
to Buffer and Program or a Block Protect/Unprotect the operation is aborted and the data may be
corrupted. In this case the Ready/Bu sy pin stays
low, V
After Reset/Power-Down goes High, V
, for a maximum timing of t
IL
PLPH
+ t
PHRH
, the
IH
.
memory will be ready for Bus Read and Bus Write
operations after t
. Note that Ready/Busy does
RHEL
not fall during a reset, see Ready/Busy Output
section.
During power-up Reset/Power-Down must be held
Low, V
Furthermore it must stay low for t
IL.
VDHPH
after the Supply Voltage inputs become stable.
The device will then be configured in Asynchronous Random Read mode.
See Table 23 and F igure 21, Reset, Power-Down
and Power-up Characteristics, for more details.
Holding RP
at VHH will temporarily unprotect the
protected blocks in the memory. Program and
Erase operations on all blocks will be possible.
In an application, it is recommended to associate
Reset/Power-Down pin, RP
, with the reset sign al
of the microprocessor. Otherwise, if a reset operation occurs while the memory is performing a program or erase operation, the memory may output
the Status Register information instead of being
initialized to the default Asynchronous Random
Read.
Latch Enable (L
). The Bus Interface can be con-
figured to latch the Address Input s on the rising
edge of Latch Enable, L
. In synchronous bus operations the address is latched on the active edge of
the Clock when Latch Enable is Low, V
. Once
IL
latched, the addresses may change without affecting the address used by the memory. When Latch
Enable is Low, V
, the latch is transparent.
IL
Clo c k (K). The Clock, K, is used to synchronize
the memory with the external bus during Synchro-
nous Bus Read operations. The Clock can be configured to have an active rising or falling edge. Bus
signals are latched on the active edge of the Clock
during synchronous bus operations. In Synchronous Burst Read m ode the address is latched on
the first active clock edge when Latch Enable is
low, V
, or on the rising edge of Latch Enable,
IL
whichever occurs first.
During Asynchronous Bus operations the Clock is
not used.
Burst Address Advance (B
Advance, B
, controls the advancing of the address
). The Burst Address
by the internal address counter during synchronous bus operations.
Burst Address Advance, B
, is only sampled on the
active clock edge of the Clock when the X- or Y latency time has expired. If Burst Address Advance is Low, V
vances. If Burst Address Advance is High, V
, the internal address counter ad-
IL
IH
, the
internal address counter does not change; the
same data remains on the Data Inputs/Outputs
and Burst Address Advance is not sampled until
the Y-latency expires.
The Burst Address Advance, B
, may be tied to VIL.
Valid Data Ready (R). The Valid Data Ready
output, R, is an open drain output that can be used
to identify if the memory is ready to output data or
not. The Valid Data Ready output is only active
during Synchronous Burst Read operat ions when
the Burst Length is set to Continuous. The Valid
Data Ready output can be configured to be active
on the clock edge of the invalid data read cycle or
one cycle before. Valid Data Ready Low, VOL, indicates that the data is not, or will not be valid. Valid Data Ready in a high-impedance state indicates
that valid data is or will be available.
Unless the Burst Length is set to Cont inuous and
Synchronous Burst Read has been selected, Valid
Data Ready is high-impedance. It may be tied t o
other components with the same Valid Data
Ready signal to create a unique System Ready
signal.
When the system clock frequency is between
33MHz and 50MHz and the Y latency is set to 2,
values of B
sampled on odd clock cycles, starting
from the first read are not considered.
Designers should use an external pull-up resistor
of the correct value to meet the external timing requirements for Valid Data Ready rising. Refer to
Figure 20.
Word Organization (WORD
zatio n inpu t, WORD
, selects the x16 or x32 B us
). The Word Organi-
Width on the M58L W128B. The Word Organization input is not available on the M58LW128A.
When WORD
is Low, VIL, Word-wide x16 Bus
Width is selected; data is read and written to DQ0DQ15; DQ16-DQ31 are at high impedance and A1
12/65
M58LW128A, M58LW128B
is the LSB of the address bus. When WORD is
High, V
, the Double-Word wide x32 Bus Width is
IH
selected and the data is read and written to on
DQ0-DQ31; A2 is the LSB of the address bus and
A1 is don’t care.
Ready/Busy (RB
). The Ready/Busy output, RB,
is an open-drain output that can be used to identify
if the Program/Erase Controller is currently active.
When Ready/Busy is high impedance, the mem ory is ready for any read, program or erase operation. Ready/Busy is Low, V
, during program and
OL
erase operations. When the de vice is busy it will
not accept any additional Program or Erase commands except Program/Erase Suspend. When the
Program/Erase Controller is idle, or suspended,
Ready Busy can float High through a pull-up resistor.
The use of an open-drain output allows the Ready/
Busy pins from several memories to be connected
to a single pull-up resistor. A Low will then indicate
that one, or more, of the memories is busy.
Ready/Busy is not Low during a reset unless the
reset was applied when the Program/Erase Controller was active; Ready/Busy can rise before Reset/Power-Down rises.
Program/Erase Enable (V
Erase Enable input, V
). The Program/
PP
is used to protect all
PP,
blocks, preventing Program and Erase operations
from affecting their data.
When Program/Erase Enable is Low, V
, any pro-
IL
gram or erase operation sent to the Command Interface will cause the V
Status bit (bit3) in the
PP
Status Register to be set. When Program/Erase
Enable is High, V
, program and erase operations
IH
can be performed on unprotected blocks. Program/Erase Enable must be kept High during all
Program, Erase, Block P rotect and Block Unpro-
tect operations, otherwise the operation is not
guaranteed to succeed and data may become corrupt.
V
Supply Voltage. The Supply Voltage, VDD,
DD
is the core power supply. Al l internal c ircuits draw
their current from the V
pin, including the Pro-
DD
gram/Erase Controller.
A 0.1µF capacitor should be connec ted between
the Supply Voltage, V
, and the Ground, VSS, to
DD
decouple the current surges from the power supply. The PCB track widths must be sufficient to
carry the currents required during all operations of
the parts, see Table 16, DC Characteristics, for
maximum current supply requirements.
Input/Output Supply Voltage (V
put/Output Supply Voltage, V
DDQ
). The In-
DDQ
, is the input/output buffer power supply. All input and output pins
and voltage references are powered and measured relative to the Input /Output Suppl y Voltage
pin, V
The Input/Output Supply Volt age, V
ways be equal or less than the V
DDQ
.
, mus t al-
DDQ
Supply Volt-
DD
age, including during Power-Up.
A 0.1µF capacitor should be connec ted between
the Input/Output Supply Voltage, V
Ground, V
from the power supply. If V
, to decouple the current surges
SSQ
and VDD are con-
DDQ
DDQ
, and the
nected together then onl y one decoupling capac itor is required.
Ground (V
). Ground, V
SS
is the reference for
SS,
all core power supply voltages.
Ground (V
). Ground, V
SSQ
is the reference
SSQ,
for input/output voltage measurements. It is essential to connect V
ground
.
SS
and V
to the same
SSQ
13/65
M58LW128A, M58LW128B
BUS OPERATIONS
The bus operations that control the memory are
described in this section, see Tables 2 and 3, Bus
Operations, for a summary. The bus operation is
selected through the Burst Configuration Register;
the bits in this register are described at the end of
this secti on.
On Power-up or after a Hardware Reset the memory defaults to Asynchronous Bus Read and Asynchronous Bus Write, n o other bus operation can
be performed until the Burst Control Register has
been configured.
Synchronous Read operations and Latch Controlled Bus Read operations can only be used to
read the memory array. The Electr onic Sign ature,
CFI or Stat us Register will b e read in asynchro nous mode regardless of the Burst Control Register se tt i n gs.
Typically glitches of less than 5ns on Chip Enable
or Write Enable are ignored by the memory and do
not affect bus operations.
Asynchronous Bus Operation s
For asynchronous bus operations refer to Tabl e 3
together with the text below.
Asynchronous Bus Read. Asynchronous Bus
Read operations read from the memory cells, or
specific registers (Electronic Signature, Status
Register, CFI and Block Prot ection Status) in the
Command Interface. A valid bus operation involves setting the desired address on the Address
Inputs, applying a Low sig nal, V
and Output Enable and keeping Write Enable
High, V
. The Data Inputs/Outputs will output the
IH
value, see Figure 12, Asynchronous Bus Read AC
Waveforms, and Table 17, Asynchronous Bus
Read AC Characteristics, for details of when the
output becomes valid.
Asynchronous Latch Controlled Bus Read.
Asynchronous Latch Controlled Bus Read operations read from the m emory cells. T he address is
latched in the memory before the value is ou tput
on the data bu s, allowing the address to cha nge
during the cycle without affecting the address that
the memo r y uses.
A valid bus operation i nvolves set ting the des ired
address on the Address Inputs, setting Chip Enable and Address Latch Low, V
Write Ena ble Hig h, V
; the address is latched on
IH
the rising edge of Address Latch. Once latched,
the Address Inputs can change. Set Output Enable Low, V
, to read the data on the Data Inputs/
IL
Outputs; see Figure 13, Asynchronous Latch Controlled Bus Read AC Waveforms and Table 18,
Asynchronous Latch Controlled Bus Read AC
Characteristics for details on when the out put becomes valid.
, to Chip Enable
IL
and keeping
IL
Note that, since the Latch Enable input is transparent when set Low, V
, Asynchronous Bus Read
IL
operations can be performed when the memory is
configured for Asynchronous Latch Enable bus
operations by holding Latch Enable Low, V
throughout the bus operation.
Asynchronous Page Read. Asynchronous Page
Read operations are used to read from several addresses within the same memory page. Each
memory page is 8 Words or 4 Double-Words and
has the same A 4-A23, only A1, A2 and A3 may
change.
Valid bus operations are the same as Asynchronous Bus Read operations but with different timings. The first read operation within the page has
identical timings, subsequent reads within the
same page have much sh orter access t i mes. If the
page changes then the normal, longer timings apply again. See Figure 14, Asynchronous Page
Read AC Waveforms and Table 19, Asynchronous Page Read AC Characteristics for details on
when the outputs become valid.
Asynchronous Bus Write. Asynchronous Bus
Write operations write to the Command Interface
in order to send commands to the memory or to
latch addresses and in put data to program. Bus
Write operations are asynchronous, the clock, K,
is don’t care during Bus Write operations.
A valid Asynchronous Bus Write operation begins
by setting the desired address on the A ddress I nputs and setting Latch Enabl e Low, V
. The Ad-
IL
dress Inputs are latched by the Command
Interface on the rising edge of Chip Enable or
Write Enable, whichever occurs first. The Data Inputs/Outputs are la tched by the Comm and Interface on the rising edge of Chip Enable or Write
Enable, whichever occurs first. Output Enable
must remain High, V
, during the whole Asyn-
IH
chronous Bus Write operation. See Figures 15,
and 17, Asynchronous Write AC Wavef orms, and
Tables 20 and 21, Asynchronous Write and Latch
Controlled Write AC Characteristics, for details of
the timing requirements.
Asynchronous Latch Controlled Bus Write.
Asynchronous Latch Controlled Bus W rite operations write to the Command Interface in order to
send commands to the memory or to latch addresses and input data t o p rogram . Bus W r ite operations are asynchronous, the clock , K, is don’t
care during Bus Write operations.
A valid Asynchronous Latch Controlled Bus Write
operation begins by setting the desired address on
the Address Inputs and pulsing Latch Enable Low,
V
. The Address Inputs are latched b y the Com-
IL
mand Interface on the rising edge of Latch Enable,
Chip Enable or Write Enable, whichever occurs
IL
14/65
M58LW128A, M58LW128B
first. The Data Inputs/Outputs are latched by the
Command Interface on the rising edge of Chip Enable or Write Enable, whichever occurs first. Ou tput Enable must remain High, V
, during the
IH
whole Asynchronous Bus Write operation. See
Figures 16 and 18 Asynchronous Latch Controlled
Write AC Waveforms, and Tables 20 and 21,
Asynchronous Write and Latch Controlled Write
AC Characteristics, for details of the timing requirements.
Output Disa bl e . The Data Inputs/Outputs are in
the high impedance state when the Output Enable
is High.
Standby. When Chip Enable is High, V
IH
, the
puts/Outputs pins are placed in the high impedance state regardless of Output Enable or Write
Enable. The Supply Current is reduced to the
Standby Supply Current, I
During Program or Erase operations the memory
will continue to use the Program/Erase Supply
Current, I
til the operation completes.
Power-Down. The memory is in Power-Down
mode when Reset/Power-Down, RP
current is reduced to I
high impedance, independent of Chip Enable,
Output Enable or Write Enable.
memory enters Standby mode and the Data In-
Table 2. Asynchronous Bus Operations
Bus OperationStepEGWRP
Asynchronous Bus Read
Asynchronous Latch
Controlled Bus Read
Asynchronous Page Read
Asynchronous Bus Write
Asynchronous Latch
Controlled Bus Write
Output Disable
Standby
Power-DownXXX
Note: 1. X = Don’t Car e VIL or VIH. High = VIH or VHH.
2. M15 = 1, Bit s M15 and M3 are in the Burst Configura tion Register.
For synchronous bus operat ions refer to Table 3
together with the text below.
Synchronous Burst Read. Synchronous Burst
Read operations are used to read from the memory at specific times synchronized to an external reference clock. The burst type, length and latency
can be configured. The different configurations for
Synchronous Burst Read operations are described in the Burst Configuration Register section.
A valid Synchronous Burst Read operation begins
when the address is set on the Address Inputs,
Write Enable is High, V
Latch Enable are Low, V
, and Chip Enable and
IH
, during the active edge
IL
of the Clock. The address is latched on the first active clock edge when Latch Enable i s low, or on
the rising edge of Latch Enable, whichever occurs
first. The data becomes available for output after
the X-latency specified in the Burst Control Register has expired. The output buffers are activated
by setting Output E nable Low, V
. See Figure 7
IL
for an example of a Synchron ous Burst Read operation.
The Burst Address Advance input and the Y-latency specified in the Burst Control Register determine whether the internal address counter is
advanced on the active edge of the Clock. When
the internal address counter is advanced the Data
Inputs/Outputs change to output the v alue for t he
next address.
In Continuous Burst mode (Burst Length Bit M2-
M0 is set to ‘111’), one Burst Read operation can
access the entire m emory sequentially and wrap
at the last address. The Burst Address Advance,
B
, must be kept low , VIL, for the appropriate number of clock cycles. If Burst Address Advance, B
is pulled High, V
, the Burst Read will be sus-
IH
pended.
In Continuous Burst Mode , if the starting addres s
is not associated with a page (4 Word or 2 Double
Word) boundary the Va lid Data Ready, R, ou tput
goes Low, V
, to indicate that the data will not be
IL
ready in time and additional wait-states are required. The Valid Data Ready output timing (bit
M8) can be changed in the Burst Configuration
Register.
When using the x32 Bus Width certain X-latencies
are not valid and must not be used; s ee Table 5,
Burst Configuration Register.
The Synchronous Burst Read timing diagrams
and AC Characteristics a re described in the AC
and DC Parameters section. See Figures 19, 20
and Table 22.
Synchronous Pipelined Burst Read. Synchronous Burst Read operations can be overlapped to
avoid or reduce the X-latency. Pipelined operations should only be used with Burst Configuration
Register bit M9 = 0 (Y-latency setting).
A valid Synchronous Pipelined Burst Read operation occurs during a Sy nchronous Burs t Read operation when the new address is set on the
Address Inputs and a Low pulse is applied to Latch
Enable. The data for the new address becomes
valid after the X-latency specified in the Burst Configuration Register has expired.
For optimum operation the address should be
latched on the correct clock cycle. Table 4 gives
the clock cycle for each valid X- and Y-latency setting. Only these settings are valid, other settings
must not be used. There is always one Y-Latency
period where the data is not valid. If the address is
latched later than the clock cycle s pecified in Tables 4 then additional cycles where the data is not
valid are inserted. See Figure 8 for an example of
a Synchronous Pipelined Burst Read operation.
Here the X-latency is 8, the Y-latency is 1 and the
burst length is 4; the first address is latched on cycle 1 while the next address is latched on cycle 6,
as shown in Table 4.
Synchronous Pipelined Burst Read operations
should only be performed on Burst Lengths of 4 or
8 with a x16 Bus Width or a Burst Length of 4 with
a x32 Bus Width.
Suspending a Pipelined S ynch ronous B urst Read
operation is not recommended.
,
Synchronous Burst Read Suspend. During a
Synchronous Burst Read operation it is possible to
suspend the operation, freeing the data bus for
other higher priority devices.
A valid Synchronous Burst Read operation is suspended when b oth Output Enable an d Burst Address Advance are H igh, V
Advance going High, V
and the Output Enable going High, V
. The Burst Address
IH
, stops the burst counter
IH
IH
data outputs. The Synchronous Burst Read operation can be resumed by setting Output Enable
Low. See Figure 7 for an example o f a Synchronous Burst Read Suspend operation.
, inhibits the
16/65
M58LW128A, M58LW128B
Table 3. Synchronous Burst Read Bus Operation s
Bus OperationStepEGRP
X
VILV
VILV
VILV
VILV
X
V
V
Address Latch
Read (no address advance)
Read (with address advance)
Synchronous Burst Read
Pipelined Synchronous
Burst Read
Read Suspend
Read Resume (no address
advance)
Read Resume (with address
advance)
Read Abort
Note: 1. X = Don’t Care, VIL or VIH.
2. M15 = 0, Bit M 15 i s in the Burs t C onfiguration Register.
3. T = tra nsition, see M6 in the Burst Conf i guration Register for details on the active edge of K.
V
IL
V
IL
V
IL
V
ILVIHVIH
V
IL
V
IL
V
IH
Table 4. Addre s s Lat ch Cycle for Optimum Pipelin ed S ynchronous Burst Read
X-LatencyY-Latency
Burst Length = 4Burst Length = 8
81610
Address Latch Clock Cycle
K
IH
IH
IH
IH
IH
IH
(3)
LB
V
T
IL
TX
TX
XX
TX
TX
XX
A1-A23
DQ0-DQ31
XAddress Input
V
Data Output
IH
V
Data Output
IL
V
IH
V
IH
V
IL
X
High Z
Data Output
Data Output
High Z
91711
1211014
1311115
1521119
17/65
M58LW128A, M58LW128B
Figure 7. Synchronous B urst Re ad Operation
1
0
K
Address
Inputs
L
B
Data Inputs/
Outputs
Note: I n this exa mple t he Bur st Co nfigur ati on Reg ist er is set with M 2-M 0 = 001 (B urst Lengt h = 4 Wo rds or Doubl e Word s) , M6 = 1 (Valid
Clock Edge = Rising Clock Edge), M7 = 0 or 1 (Burst Type = Interleaved or Sequential), M9 = 0 (Y-Latency = 1), M14-M11 = 0011 (X-
Latency = 8) and M15 = 0 (Rea d Se l ect = Synchronous Burst Read), other bi ts are don’t care.
Q1
X-1
X
tBLKH
Q1
X+1
Q2
tBHKH
tBHKH
Q5Q5Q5Q4Q3Q7Q6Q8Q8Q7
tBHKH
AI03454b
Figure 8. Exam pl e Synchronous Pipelined Burst Read Op era ti on
01234567891011121314
K
15
Address
Inputs
L
E
G
B
Data
Inputs/ Outputs
Note: I n this exa mple t he Bur st Co nfigur ati on Reg ist er is set with M 2-M 0 = 001 (B urst Lengt h = 4 Wo rds or Doubl e Word s) , M6 = 1 (Valid
Clock Edge = Rising Clock Edge), M7 = 0 or 1 (Burst Type = Interleaved or Sequential), M9 = 0 (Y-Latency = 1), M14-M11 = 0011 (XLatency = 8) and M15 = 0 (Rea d Se l ect = Synchronous Burst Read), other bi ts are don’t care.
Q1R1S1
Q1
Q2 Q3 Q4 NV R1 R2 R3R4 NV S1S2
NV= Not Valid
S3
AI03455
18/65
M58LW128A, M58LW128B
Figure 9. Example Burst Address Advance and Burst Abort operations
1
0
K
Address
Inputs
L
B
Data Inputs/
Outputs
Note: 1. In this exam pl e the Bur st Co nf igurat ion Reg ister is set with M 2-M 0 = 010 (B urst Lengt h = 8 Words ), M 6 = 1 (V alid C loc k Edg e =
Rising Clock Edge), M 7 = 0 or 1 (Burst Type = In te rl eaved or Se quential) , M9 = 1 (Y-Lat ency = 2), M14-M11 = 0011 (X-Latency =
8) and M15 = 0 (Read Select = Sy nchronous Burst Read ), other bits a re don’t care.
2. Whe n t he system clock fre quency is be tween 33MHz and 50MHz and th e Y latenc y i s set to 2, values of B
cycles, starting from t he first read are not conside red.
Q1
X-2
tBLKH
X
Q1Q2
X+2
tBHKH
X+6X+4X+12X+10X+8
tBHKH
Q3Q4Q4
tBHKH
Q4Q3
AI03457b
sampled on odd clock
19/65
M58LW128A, M58LW128B
Burst Configuration Register
The Burst Configuration Register is used to configure the type of bus access that the memory will
perform.
The Burst Configuration Register is set through
the Command Interface and will retain its information until it is re-configured, the device is reset, or
the device goes into Reset/Power-Down mode.
The Burst Configuration Register bits are described in Table 5. They specify the selection of
the burst length, burst type, burst X and Y latencies and the Read operation.
Read Select Bit (M15). The Read Select bit,
M15, is used to switch between asynchronous and
synchronous Bus Read operations. When the
Read Select bit is set to ’1’, Bus Read operations
are asynchronous; when the Read Select but is
set to ’0’, Bus Read operations are synchronous.
On reset or power-up the Read Sel ect bi t is set
to’1’ for asynchronous accesses.
X-Latency Bits (M14-M11). The X-Latency bits
are used during Synchronous Bus Read operations to set the number of clock cycles between
the address being latched and the first data becoming available. For correct operation the X-Latency bits can only assume the values in Table 5,
Burst Configuration Register. The X -Latency bits
should also be sele cted in con junction with Table
8, Burst Performance to ensure valid settings.
Y-Latency Bit (M9). The Y-Latency bit is used
during Synchronous Bus Read operations to set
the number of clock cycles between consecutive
reads. The Y-Latency value depends on both the
X-Latency value and the setting in M9.
When the Y-Latency is 1 the data changes each
clock cycle; when the Y-Latency is 2 the data
changes every seco nd clock cycle. See Tab le 5,
Burst Configuration Register and Table 8, Burst
Performance, for valid co mbinations of the Y-Latency, the X-Latency and the Clock frequency.
Valid Data Ready Bit (M8). The Valid Data
Ready bit controls the timing of the Valid Data
Ready output pin, R. When the Valid Data Ready
bit is ’0’ the Valid Data Ready output pin is driven
Low for the active clock edge when invalid data is
output on the bus. When the Valid Data Ready bit
is ’1’ the Valid Data Ready output pin is driven Low
one clock cycle prior to invalid data being output
on the bus.
Burst Type Bit ( M7 ). The Burst Type bit is used
to configure the sequence of addresses read as
sequential or interleaved. When the Burst Type bit
is ’0’ the memory outputs from interleaved addresses; when the Burst Type bit is ’1’ the memory
outputs from sequential ad dresses. See Tables 6
and 7, Burst Type Definition, for t he sequence of
addresses output from a give n starting a ddress in
each mode.
Valid Clock Edge Bit (M6). The Valid Clock Edge
bit, M6, is used to configure the active edge of the
Clock, K, during Synchronous Burst Read operations. When the Valid Clock Edge bit is ’0’ the falling edge of the Clock is the active edge; when the
Valid Clock Edge bit is ’1 ’ the rising edge of the
Clock is active.
Latch Enable Bit (M3). The Latch Enable bit is
used to select between Asynchronous Random
Read and Asynchronous La tch Enable Controlled
Read. When the Latch Enable bit is set to ‘0’ Random read is selected; when it is set to ‘1’ Latch Enable Controlled Read is selected. To enable these
Asynchronous Read configuration s M15 must be
set to ‘1’.
Burst Length Bit (M2-M0). The Burst Length bits
set the maximum number of Words or DoubleWords that can be ou tput during a Synchronous
Burst Read operation before the address wraps.
Table 5, Burst Configuration Register gives the
valid combinations of the Burst Length bits that the
memory accepts; Tables 6 and 7, Burst Type Definition, give the sequence of addresses output
from a given starting address for each length.
M10, M5 an d M4 are reserved for future use.
20/65
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