M58LW032C is a 32 M bit (2Mb x16) non-volatile
memory that can be read, erased and reprogrammed. These operations can be performed using a single low voltage (2.7V t o 3.6V) core supply.
On power-up the memory defaults to Read mode
with an asynchronous bus where it can be read in
the same way as a non-burst Flash memory.
The memory is divided into 32 blocks of 1Mbit that
can be erased i ndependently so it is poss ible to
preserve valid data while old data is erased. P rogram and Erase commands are written to the
Command Interface of the memory. An on-chip
Program/Erase Controller simplifies the process of
programming or erasing the memory by taking
care of all of the special operations that are required to update the memory contents. The end of
a Program or Erase operation can be detected and
any error conditions identified in the Status Register. The command set required to control the
memory is consistent with JEDEC standards.
The device supports synchronous burst read and
asynchronous read from all blocks of the memory
array; at power-up the device is configured for
asynchronous read. In asynchronous mode an
Address Latch input can be used to latch addresses in Latch Controlled mode. In synchronous burst
mode, data is output on each clock cycle at frequencies of up to 56MHz.
The Write Buffer allows the microprocessor to program from 1 to 16 Words in parallel, both speeding
up the programming and freeing up the microprocessor to perform other work. A Word Program
command is available to program a single Word.
Erase can be suspended in order to perform either
Read or Program in any other block and then resumed. Program ca n be s uspended to Read data
in any other block and then resum ed. Eac h block
can be programmed and erased over 100,000 cycles.
The M58LW032C has several security features to
increase data protection.
■ Block Protection, where each block can be
individually protected against p r ogram or eras e
operations. All blocks are protected during
power-up. The protection of the blocks is nonvolatile; after power-up the protection status of
each block is restored to the state when power
was last removed.
■ Program Erase Enable i nput V
, program or
PEN
erase operations are not possible when the
Program Erase Enable input V
■ Smart Protection, which allows protected blocks
PEN
is low.
to be permanently locked. This feature is not
described in the datasheet for security reasons.
Please contact STMicroelectronics for further
details.
■ 128 bit Protection Regi ster, divided in to two 64
bit segments: the f irst con tains a unique device
number written by ST, the second is user
programmable. The user programmable
segment can be protected.
The Reset/Power-Down pin is used to apply a
Hardware Reset to the memory and to set the device in power-down mode.
The device features an Auto Low Power mode. If
the bus becomes inactive during Asynchronous
Read operations, the device automatically enters
Auto Low Power mode. In this mode the power
consumption is reduced to the Auto Low Power
supply current.
The STS signal is an open drain output that can be
used to identify the Program/Erase Controller status. It can be configured in two modes: Ready/
Busy mode where a static signal indicates the status of the P/E.C, and Status mode where a pulsing
signal indicates the end of a Program or Block
Erase operation. In Status mode it can be used as
a system interrupt signal, useful for saving CPU
time.
The memory is available in TSOP56 (14 x 20 mm)
and TBGA64 (10 x 13mm, 1mm pitch) packages.
6/61
Figure 2. Logi c D iag ramTable 1. Si gn a l Nam es
A1-A21Address inputs
V
V
DDQ
DD
DQ0-DQ15Data Inputs/Outputs
M58LW032C
A1-A21
V
PEN
W
E
RP
E
21
16
DQ0-DQ15
M58LW032C
G
STS
R
L
K
V
V
SS
SSQ
AI06208
G
KClock
L
RValid Data Ready
STSStatus/(Ready/Busy)
RP
V
PEN
W
V
DD
V
DDQ
V
SS
V
SSQ
NCNot Connected Internally
Chip Enable
Output Enable
Latch Enable
Reset/Power-Down
Program/Erase Enable
Write Enable
Supply Voltage
Input/Output Supply Voltage
Ground
Input/Output Ground
7/61
M58LW032C
Figure 3. TSOP56 Connections
V
NC
A21
A20
A19
A18
A17
A16
V
DD
A15
A14
A13
A12
PEN
RP
A11
A10
A9
A8
V
SS
A7
A6
A5
A4
A3
A2
A1
1
R
E
14
M58LW032C
15
2829
56
43
42
NC
W
G
STS
DQ15
DQ7
DQ14
DQ6
V
SS
DQ13
DQ5
DQ12
DQ4
V
DDQ
V
SSQ
DQ11
DQ3
DQ10
DQ2
V
DD
DQ9
DQ1
DQ8
DQ0
NC
K
NC
L
8/61
AI06209
Figure 4. TBGA64 Connections (Top view through package)
M58LW032C
87654321
A
BRA19A2
C
DA16
E
F
G
A1
V
A4A5
K
NC
DQ0
NC
A6V
SS
A7A3
A8
A10A12
A11
DQ10
DQ2
PEN
EA9
RP
DDQ
A13
A14
A15
NCNC
DQ5V
V
DD
NC
NC
NC
NC
DQ6
A20
DQ15STSDQ9DQ8DQ1DQ4DQ3
NC
DQ14
NCA18
A21
A17
GDQ12DQ11
W
H
L
NC
V
DD
V
SS
DQ13
V
SSQ
DQ7
NC
AI06210b
9/61
M58LW032C
Figure 5. Block Addresses
Word (x16) Bus Width
1FFFFFh
1F0000h
1EFFFFh
1E0000h
Total of 32
1 Mbit Blocks
01FFFFh
010000h
00FFFFh
000000h
Note: Also see Appendix A, T able 25 for a full li st i ng of the Block Addresses.
1 Mbit or
64 KWords
1 Mbit or
64 KWords
1 Mbit or
64 KWords
1 Mbit or
64 KWords
AI06254
10/61
SIGNAL DESCRIPTIONS
See Figure 2, Logic Diagram and Table 11, Signal
Names, for a brief overview of the signals connected to this device.
Address Inputs (A1-A21). The Address Inputs
are used to select the cells to access in the memory array during Bus Read operations either to
read or to program data to. During Bus Write operations they control the commands sent to the
Command Interface of the internal state m ac hine.
Chip Enable and Latch Enable must be low when
selecting the addresses.
The address inputs are latched on the rising edge
of Chip Enable, Write Enable or Latch Enable,
whichever occurs first in a Write operation. The
address latch is transparent when Latch Enable is
low, V
. The address is internally latched in an
IL
Erase or Program operation.
Data Inputs/Outputs (DQ0-DQ15). The Data In-
puts/Outputs output the data stored at the selected
address during a Bus Read operation, or are used
to input the data during a program operation. During Bus Write operations they repres ent the commands sent to the Command Interface of the
internal state machine. When used to input data or
Write commands they are latched on the rising
edge of Write Enable or Chip Enable, whichever
occurs first.
When Chip Enable and Output Enable are both
low, V
, the data bus outputs data from the mem-
IL
ory array, the Electronic Signature, the Block Protection status, the CFI Information or the contents
of the Status Register. The data bus is high impedance when the chip is deselected, Output E nable
is high, V
low, V
or the Reset/Power-Down signal is
IH,
. When the Program/Erase Controller is
IL
active the Ready/Busy status is given on DQ7.
Chip Enable (E
). The Chip Enable, E, input acti-
vates the memory control logic, input buffers, decoders and sense amplifiers. Chip Enable, E
V
deselects the memory and reduces the power
IH
consumption to the Standby level, I
Output Enable (G
). The Output Enable, G, gates
DD1
.
, at
the outputs through the data output buffers during
a read operation. When Output Enable, G
, is at V
IH
the outputs are high impedance. Output Enable,
G
, can be used to inhibit the data ou tput during a
burst read operation.
Write Enable (W
). The Write Enable input, W,
controls writing to the Command Interface, Input
Address and Data latches. Both addresses and
data can be latched on the rising edge of Write Enable (also see Latch Enable, L
Reset/Power-Down (RP
).
). The Reset/PowerDown pin can be used to apply a Hardware Reset
to the me mory.
M58LW032C
A Hardware Reset is achieved by holding Reset/
Power-Down Low, V
Reset/Power-Down is Low, V
ter information is c leared and t he power consumption is reduced to power-down level. The device is
deselected and outputs are high impedance. If Reset/Power-Down goes low, V
Erase, a Write to Buffe r and Program or a Block
Protect/Unprotect the operation is aborted and the
data may be corrupted. In this case the Ready/
Busy pin stays low, V
t
PLPH
+ t
until the completion of the Reset/
PHRH,
Power-Down pulse.
After Reset/Power-Down goes High, V
memory will be ready for Bus Read and Bus Write
operations after t
does not fall during a reset , s ee Rea dy /Busy Ou tput section.
In an application, it is recommended to associate
Reset/Power-Down pin, RP
of the microprocessor. Otherwise, if a reset operation occurs while the memory is performing an
Erase or Program operation, the memory may output the Status Register information inst ead of being initialized to the default Asynchronous
Random Read.
Latch Enable (L
ured to latch the Address Inputs on the rising edge
of Latch Enable, L
the address is latched on the active edge of the
Clock when Latch Enable is Low, V
ing of Latch Enable, whichever occurs first. Once
latched, the addresses may change without affecting the address used by the memory. When Latch
Enable is Low, V
Clo c k (K). The Clock, K, is used to synchronize
the memory with the external bus during Synchronous Bus Read operations. The Clock can be configured to have an active rising or falling edge. Bus
signals are latched on the active edge of the Clock
during synchronous bus operations. In Synchronous Burst Read m ode the address is latched on
the first active clock edge when Latch Enable is
low, VIL, or on the rising edge of Latch Enable,
whichever occurs first.
During asynchronous bus operations the Clock is
not used.
Valid Data Ready (R). The Valid Data Ready
output, R, is an open drain output that can be used
to identify if the memory is ready to output data or
not. The Valid Data Ready output is only active
during Synchronous Burst Read operat ions when
the Burst Length is set to Continuous. The Valid
Data Ready output can be configured to be active
on the clock edge of the invalid data read cycle or
one cycle before. Valid Data Ready Low, V
, for at least t
IL
, for a ma ximum timin g of
IL
. Note that Ready/Busy
PHQV
, the Status Regis-
IL
,during a Block
IL
PLPH
. When
, the
IH
, with the reset sig nal
). The Bus Interface is config-
. In synchronous bus operations
or on the ris-
IL
, the latch is transparent.
IL
, in-
OL
11/61
M58LW032C
dicates that the data is not, or will not be valid. Valid Data Ready in a high-impedance state indicates
that valid data is or will be available.
Unless Synchronous Burst Read has been selected, Valid Data Ready is high-impedance. It may be
tied to other components with the same Valid Data
Ready signal to create a unique System Ready
signal.
The Valid Data Ready, R, output has an internal
pull-up resistor of approximately 1 MΩ powered
from V
, designers should use an external pull-
DDQ
up resistor of the correct value to meet the external
timing requirements for Valid Data Ready rising.
Refer to Figure 19.
Status/(Ready/Busy) (STS). The STS signal is
an open drain output t hat can be used to id entify
the Program/Erase Controller status. It can be
configured in two modes:
■ Ready/Busy - the pin is Low, V
, during
OL
Program and Erase operations and high
impedance when the memory is ready for any
Read, Program or Erase operation.
■ Status - the pin gives a pulsing signal to indicate
the end of a Program or Block Erase operation.
After power-up or reset the STS pin i s configured
in Ready/Busy mode. T he pin can be co nfigured
for Status mode using the Configure STS command.
When the Program/Erase Controller is idle, or suspended, STS can float High through a pul l-up resistor. The use of an open-drain output allows the
STS pins from several memo ries to be c onnect ed
to a single pull-up resistor (a Low will indicate that
one, or more, of the memories is busy).
STS is not Low during a reset unless the reset was
applied when the Program/Erase controller was
active. Ready/Busy can rise before Reset/PowerDown rises.
Program/Erase Enable (V
Erase Enable input, V
PEN,
). The Program/
PEN
is used to protect all
blocks, preventing Program and Erase operations
from affecting their data.
Program/Erase Enable must be kept High during
all Program/Erase Controller operations, otherwise the operations is not guaranteed to suc ceed
and data may become corrupt.
V
Supply Voltage. VDD provides the power
DD
supply to the internal core of the memory device.
It is the main power supply for all operations
(Read, Program and Erase).
Supply Voltage. V
V
DDQ
provides the power
DDQ
supply to the I/O pins and enables all Outputs to
. V
be powered independently from V
tied to V
or can use a separate supply.
DD
DD
DDQ
can be
It is recommended to power-up and power-down
V
DD
and V
together to avoid any condition that
DDQ
would result in data corruption.
Ground. Ground, V
V
SS
is the reference for
SS,
the core power supply. It must be connected to the
system ground.
V
Ground. V
SSQ
the input/output circuitry driven by V
ground is the reference for
SSQ
DDQ
. V
SSQ
must be connected to VSS.
Note: Each device in a system should have
V
DD
and V
decoupled with a 0.1µF ceramic
DDQ
capacitor close to the pin (high frequency, inherently low inductance ca pacitors should b e
as close as possible to the package). See Figure 10, AC Measurement Load Circuit.
12/61
BUS OPERATIONS
There are six standard bus operations that control
the device. These are Address Latch, B us Read,
Bus Write, Output Disable, Power-Down and
Standby. See Table 2, Bus Operations, for a summary.
Typically glitches of less than 5ns on Chip Enable
or Write Enable are ignored by the memory and do
not affect Bus Write operations.
A valid bus operation i nvolves set ting the des ired
address on the Address Inputs, setting Chip Enable and Latch Enable Low, V
Enable High, V
; the address is latched on the ris-
IH
and keeping Write
IL
ing edge of Address Latch.
Bus Read. Bus Read operations are used to out-
put the contents of the Memory Array, the Electronic Signature, the Status Register, the Common
Flash Interface and the Block Protection Status.
A valid bus operation i nvolves set ting the des ired
address on the Address Inputs, applying a Low
signal, V
Latch Enable and keeping Write Enable High, V
, to Chip Enable, Output Enable and
IL
IH
The data read depends on the previous command
written to the memory (see Command Interface
section). See Figures 11, 12, 13, 18 and 19 Read
AC Waveforms, and Tables 15, 16, 17 and 20
Read AC Characteristics, for details of when the
output becomes valid.
Bus Write. Bus Write operations write Commands to the memory or latch addresses and input
data to be programmed.
M58LW032C
A valid Bus Write operation begin s by setting the
desired address on the Address Inputs and setting
Latch Enable Low, V
latched by the Command Interface on the rising
edge of Chip Enable or Write Enable, whichever
occurs first. The Data Inputs/Outputs are latched
by the Command Interface on the rising edge of
Chip Enable or Write Enable, whichever occurs
first. Output Enable must remain High, V
the Bus Wr ite operation.
See Figures 14, 15, 16 and 17, Write AC Waveforms, and Tables 18 and 19, Write AC Characteristics, for details of the timing requirements.
Output Disa bl e . The The Data Inputs/Outputs
are high impedance when the Out put Enable i s at
.
V
IH
Power-Down. The memory is in Power-Down
mode when Reset/Power-Down, RP
power consumption is reduced to the Power-Down
level, I
, and the out puts are high impedance,
DD2
independent of Chip Enable, Output Enable or
Write Enable.
Standby. Stan dby disables most of the inte rnal
.
circuitry, allowing a substantial reduction of the
current consumption. The memory is in standby
when Chip Enable is at V
tion is reduced to the standby level I
outputs are set to high impedance, independently
from the Output Enable or Write Enable inputs.
If Chip Enable switches to V
erase operation, the d ev ice en ters Standby mode
when finished.
. The Address Inputs are
IL
, is Low. The
. The power consump-
IH
during a program or
IH
DD1
, during
IH
and the
Table 2. Bus Operations
OperationEGWRPLA1-A21DQ0-DQ15
Address Latch
Bus Read
Bus Write
Output Disable
Power-DownXXX
Standby
Note: 1. X = Don’t Care VIL or VIH.
2. Depends on G
V
IL
V
IL
V
IL
V
IL
V
IH
X
V
IL
V
IH
V
IH
XX
V
IH
V
IH
V
IL
V
IH
V
IH
V
IH
V
IH
V
IH
V
IL
V
IH
V
IL
V
IL
V
IL
XXHigh Z
XXHigh Z
XXHigh Z
Address
AddressData Output
AddressData Input
Data Output or Hi-Z
(2)
13/61
M58LW032C
READ MODES
Read operations can be performed in two different
ways depending on the settings in the Configura-
tion Register. If the clock signal is ‘d on’t care’ for
the data output, the read operation is asynchronous; if the data output is synchronized with clock,
the read operation is synchronous.
The read mode and f ormat of the data output are
determined by the Configuration Register. (See
Configuration Register section for details).
On Power-up or after a Hardware Reset the memory defaults to Asynchronous Read mode.
Asynchronous Read Modes
In Asynchronous Read operations the clock signal
is ‘don’t care’. The device outpu ts the dat a corresponding to the address latched, that is the mem ory array, Status Register, Common Flash
Interface, Electronic Signature or Block Protection
Status depending on the comma nd issued. CR15
in the Configuration Register must be set to ‘1’ for
asynchronous operations.
During Asynchronous Read operations, if the bus
is inactive for a time equivalent to t
vice automatically enters Auto Low Power mode.
In this mode the internal supply current is reduced
to the Auto Low Power supply current, I
Data Inputs/Outputs will still output data if a Bus
Read operation is in progress.
Automatic Low Power is only available in Asynchronous Read modes.
Asynchronous Read operations can be performed
in three different ways, Asynchronous Latch Controlled Read, Asynchronous Random Read and
Asynchronous Page Read.
Asynchronous Latch Controlled Read.
In Asynchronous Latch Controlled Read operations read the address is latched in the me mory
before the value is output on the data bus, allowing
the address to change during the cycle without affecting the address that the memory uses.
A valid bus operation i nvolves set ting the des ired
address on the Address Inputs, setting Chip Enable and Latch Enable Low, V
Enable High, V
; the address is latched on the ris-
IH
and keeping Write
IL
ing edge of Address L atch. Once latched, the Address Inputs can change. Set Output Enable Low,
, to read the data on the Data Inputs/Outputs;
V
IL
see Figure 12, Asynchronous Latch Controlled
Read AC Waveforms and Table 16, Asynchronous Latch Controlled Read AC Characteristics for
details on when the output becomes valid.
See Figures 12, Asynchronous Latch Controlled
Read AC Waveforms, and Table 16, Asynchronous Latch Controlled Read AC Characteristics,
for details.
AVQV
, the de-
. The
DD5
Asynchro nous Random R ead. As th e Lat ch En able input is transparent when set Low, V
, Asyn-
IL
chronous Random Read operations can be
performed by holding Latch Enable Low, V
throughout the bus operation.
See Figures 11, Asynchronous Random Read AC
Waveforms, and Table 15, Asynchronous Random Read AC Characteristics, for details.
Asynchro nous Page Read . In Asynchronous
Page Read mode a Page of data is internally read
and stored in a Page Buffer. Each memory page is
4 Words and has th e same A3-A22, only A 1 and
A2 may change.
The first read operation within the Page has the
normal access time (t
), subsequent reads
AVQV
within the same Page have much sho rter access
times (t
). If the Page changes then the nor-
AVQV1
mal, longer timings apply again.
See Figures 13, Asynchronous Page Read AC
Waveforms, and Table 17, Asynchronous Page
Read AC Characteristics, for details.
Synchronous Read Mo de s
In Synchronous Read mode the data output is synchronized with the clock. CR15 in the Configuration Register must be set to ‘0’ for synchronous
operations.
Synchronous Burst Read. In Synchronous
Burst Read mode the data is output in bursts synchronized with the clock. It is possible to perform
burst reads across bank boundaries.
Synchronous Burst Read mode can onl y be used
to read the memory array. For other read operations, such as Read Status Register, Read CFI,
Read Electronic Signature and Block Protection
Status, Single Synchronous Read or Asynchronous Read must be used.
In Synchronous Burst Read mode the flow o f the
data output depends on param eters that are configured in the Configuration Register.
A valid Synchronous Burst Read operation begins
when the address is set on the Address Inputs,
Write Enable is High, V
Latch Enable are Low, V
, and Chip Enable and
IH
, during the active edge
IL
of the Clock. The address is latched on the first active clock edge when Latch Enable i s low, or on
the rising edge of Latch Enable, whichever occurs
first. The data becomes available for output after
the X-latency specified in the Burst Control Register has expired. The output buffers are activated
by setting Output Enable Low, V
. See Figures 6
IL
and 7 for examples o f Synchronous Burst Read
operations.
The number of Words to be out put during a Synchronous Burst Read operation can be configured
as 4 Words, 8 Words or Continuous (Burst Length
IL
14/61
M58LW032C
bits CR2-CR0). In Synchronous Continuous Burst
Read mode one Burst Read operation can access
the entire memory sequ entially. If the starting address is not associated with a page (4 Word)
boundary the Valid Data Ready, R, output goes
Low, V
, to indicate that the data will not be ready
IL
in time and additional wait-states are required. The
Valid Data Ready output timing (bit CR8) can be
changed in the Configuration Register.
The order of the data output can be modified
through the Burst Type bit in the Configuration
Register. The burst sequence can be sequential or
interleaved.
See Table 20, Synchronous Read AC Characteristics and Figure 18 a nd 19, Synchronous Burst
Read AC Waveform for details.
Single Synchronous Read. Single Synchronous Read operations are similar to S ync hronous
Burst Read operations except that only the first
data output after the X latency is valid. Single Synchronous Reads are used to read the Status Register, CFI, Electronic Signature and Block
Protection Status.
15/61
M58LW032C
CONFIGURATION REGISTER
The Configuration Register is used to configure
the type of bus access that the memory will perform. The Configuration Register bits are described in Table 3. They specify the selection of
the burst length, burst type, burst X and Y latencies and the Read operation. See figures 6 and 7
for examples of Synchronous Burst Read configurations.
The Configuration Register is set through the
Command Interface and will retain its information
until it is re-configured, the device is reset, or the
device goes into Reset/Power-Down mode. The
Configuration Register is read using the Read
Electronic Signature Command at address 05h.
Read Select Bit (CR15). The Read Select bit,
CR15, is used to switch between asynchronous
and synchronous Bus Read operations. When the
Read Select bit is set to ’1’, Bus Read operations
are asynchronous; when the Read Select but is
set to ’0’, Bus Read operations are synchronous.
On reset or power-up the Read Select bit is set to
’1’ for asynchronous access.
X-Latency Bits (CR13-CR11). The X-Latency
bits are used during Synchronous Bus Read operations to set the number of clock cy cles between
the address being latched and the first data becoming available. For correct operation the X-Latency bits can only assume the values in Table 3,
Configuration Register.
Internal Clock Divider Bit (CR10). The Internal
Clock Divider Bit is used to divide the internal clock
by two. When CR10 is set to ‘1’ the internal clock
is divided by two, which effectively means that the
X and Y-Latency values are multiplied by two, that
is the number of clock cycles between the address
being latched and the first data becoming available will be twice the value set in CR13-CR11, and
the number of clock cycles between consecutive
reads will be twice the value set in CR9. For example 8-1-1-1 will be come 16-2-2-2. When C R10 is
set to ‘0’ the internal clock runs normally and the X
and Y-Latency values are those set in CR13-CR11
and CR9.
Y-Latency Bit (CR9). The Y-Latency bit is used
during Synchronous Bus Read operations to set
the number of clock cycles between consecutive
reads. The Y-Latency value depends on both the
X-Latency value and the setting in CR9.
When the Y-Latency is 1 the data changes each
clock cycle; when the Y-Latency is 2 the data
changes every seco nd clock cycle. See Tab le 3,
Configuration Register for valid combinations of
the Y-Latency, the X-Latency and the Clock frequency.
Valid Data Ready Bit (CR8). The Valid Data
Ready bit controls the timing of the Valid Data
Ready output pin, R. When the Valid Data Ready
bit is ’0’ the Valid Data Ready output pin is driven
Low for the active clock edge when invalid data is
output on the bus. When the Valid Data Ready bit
is ’1’ the Valid Data Ready output pin is driven Low
one clock cycle prior to invalid data being output
on the bus.
Burst Type Bit (CR7). The Burst Type bit is used
to configure the sequence of addresses read as
sequential or interleaved. When the Burst Type bit
is ’0’ the memory outputs from interleaved addresses; when the Burst Type bit is ’1’ the memory
outputs from sequential addresses. See Tables 4,
Burst Type Definition, for the sequence of addresses output from a given starting address in
each mode.
Valid Clock Edge Bit (CR6). The Valid Clock
Edge bit, CR6, is used to configure the active edge
of the Clock, K, during Synchronous Burst Read
operations. When the Valid Clock Edge bit is ’0’
the falling edge of the Clock is the active edge;
when the Valid Clock Edge bit is ’1’ the rising edge
of the Clock is active.
Burst Length Bit (CR2-CR0). The Burst Length
bits set the maximum number of Words that can
be output during a Synchronous Burst Read operation.
Table 3, Configuration Register gives the valid
combinations of the Burst Length bits that the
memory accepts; Tables 4, Burst Type Definition,
give the sequence of addresses output from a given starting address for each length.
CR5 CR4 and CR3 are reserved for future use.
16/61
Table 3. Configuration Register
Address
Bit
MnemonicBit Name
16CR15Read Select1
15CR14Reserved
Reset
Value
ValueDescription
0Synchronous Burst Read
1Asynchronous Bus Read (default at power-up)
001Reserved
010
X-Latency = 4, 4-1-1-1 (use only with Y-Latency = 1)