Duallineprogrammabletransientsuppressor
Widenegative firingvoltagerange: V
Lowdynamicswitching voltages: V
FP
Lowgatetriggeringcurrent : IGT=5mAmax
Peakpulse current: I
Holdingcurrent: I
= 15 A (10/1000µs)
PP
>150mA
H
DESCRIPTION
TheLCDP1511Disaduallineprotectorwhichprotects subscriber line interface circuits (SLIC)
againsttransientovervoltages.
Positiveovervoltagesareclamped with diodes towards GND, while negative overvoltages are suppressed by thyristors connected to GND. The
breakdownvoltage of the thyristorsis determined
by the voltageapplied to the gate, generally -V
Gate triggering current
Holding current
Reverse leakage current LINE / GND
Reverse leakage current GATE / LINE
Reverse voltage LINE / GND
Gate triggering voltage
Forward drop voltage LINE / GND
F
Peak forward voltage
Dynamic switching voltage GATE / LINE
GATE / GND voltage
Reverse voltage GATE / LINE
Capacitance LINE / GND
VDGL
VRMVR
VF
IRM
IR
I
I
H
PP
V
V
V
V
V
V
I
GT
I
H
I
RM
I
RG
RM
GT
V
FP
DGL
GATE
RG
C
°
C/W
2/6
LCDP1511D
PARAMETERSRELATED TOTHE DIODE LINE / GND(T
amb
=25°C)
SymbolTestconditionsMaxUnit
V
F
V
FP
(note1)
note1 : see test circuit for VFP,RPisthe protection resistor located on the linecard
Square pulse : tp=500µsIF=1A
10/700µs
1.2/50µs
2/10µs
1kV
1.5kV
2.5kV
RP=60Ω
R
=60Ω
P
= 245
R
P
I
PP
I
PP
Ω
I
PP
PARAMETERSRELATED TOTHE PROTECTIONTHYRISTOR(T
= 10A
= 15A
= 10A
amb
=25°C)
2V
5
10
20
SymbolTestconditionsMinMaxUnit
V
I
GT
I
H
V
GT
I
RG
V
DGL
GND / LINE
V
GATE
at I
VRG= -75V
V
GATE
10/700µs
1.2/50µs
2/10µs
note2 : see functional holding current test circuit
note3 : See testcircuit for V
The oscillations with a timeduration lower than 50ns are not takeninto account
PARAMETERSRELATEDTO LINE/ GND
= -48V
=-48V (see note 2)
GT
=-48V (see note 3)
1kV
1.5kV
2.5kV
DGL
R
R
R
P
P
P
=60
=60
=245
(T
Ω
Ω
Ω
amb
I
= 10A
PP
I
= 15A
PP
I
= 10A
PP
=25°C)
5mA
150mA
2.5V
5µA
7
15
20
V
V
SymbolTest conditionsMaxUnit
I
Fig.1:
V
RM
C
GATE/ LINE
VR= -3VF = 1MHz
V
= -48V F = 1MHz
R
Surgepeakcurrentversusoverloadduration.
= -1VVRM= -75V
Fig. 2:
5µA
200
100
Relativevariation of holding current versus
junctiontemperature.
ITSM(A)
7
6
5
4
3
2
1
0
0.010.101.0010.00100.001000.00
t(s)
F=50Hz
Tj initial=25°C
IH[Tj] / IH[Tj=25°C]
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
-40-20020406080100120
Tj(°C)
pF
3/6
LCDP1511D
FUNCTIONALHOLDING CURRENT (IH) TEST CIRCUIT : GO-NOGO TEST
Informationfurnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for theconsequences of
use of such informationnor for any infringement of patentsor other rightsof third parties which may result from its use. No license is granted by
implication orotherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publicationare subject to
change without notice. This publication supersedes and replaces all information previouslysupplied.
STMicroelectronicsproducts are not authorized for use ascritical components in lifesupport devices or systems without express written approval of STMicroelectronics.
The ST logo is a registeredtrademark ofSTMicroelectronics
1999 STMicroelectronics - Printed inItaly -All rights reserved.
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