SGS Thomson Microelectronics L6000 Datasheet

SINGLECHIP READ & WRITE CHA NNEL
SUPPORTS 9-32Mbit/s DATA RATE OPERA­TION INRLL [1,7] CONSTRAINT
- Data Rate is Programmable SUPPORTS ZONED BIT RECORDING AP-
PLICATIONS LOW POWER OPERATION (500mW TYPI-
CAL @ 5V @ 32Mbits/Sec PROVIDES PROGRAMMABILITY THROUGH
SERIAL MICROPROCESSOR INTERFACE ANDINTERNALREGISTERS
- Bi-directional access to internal registersof pulse detector, filter, servo demodulator, frequencysynthesizerand data separator.
PROGRAMMABLEPOWER DOWN MODES Fullpower-downmode (5mWmax.)
POWER SUPPLYRANGE 4.3 to 5.5V
DESCRIPTION
The L6000 is a 5V single chip read channel IC. It contains all the functions needed to implement a high performance read channel including the
L6000
ADVANCE DATA
TQFP64
(10 x 10)
ORDERING NUMBER: L6000
OPERATING TEMPERATURE: 0°Cto70°C
pulse detector, programmable active filter, servo demodulator, frequency sinthesizer, and data separator, at data rates up to 32 Mbit/s. A single external resistor sets the reference current for the internalDAC which, in turn, fixes thedata rate.
This device is programmed through a serial port and banks of internal registers. It is fully compat­ible with zoned bit recording applications. Exter­nal componentsdo not need to be changed when switching between zones. The L6000 is manufac­turedusing an advancedBiCMOS technology.
PIN CONNECTION (Top view)
LEVEL R EF V CLOCK PATH CLOCK PATH
DATA PATH
FILT NORM OUT FILT NORM OUT
FILT DIFF OUT FILT DIFF OUT
FILTER IN FILTER IN
PTAT R
AGC O UT
SERVO BYP
SERVO REF V
48 47 46 45 44
49 50 51
52 53 54 55 56 57 58 59 60 61 62 63 64
12345
AGC IN
AGC IN
POSITION OUT
DATA BYP
HOLD CAP A
HOLD DATA AGC
DATA TC RES
SERVO TC RES
DAC TP OUT
HOLD CAP B
43 42 41 40 39
678910
PWRDN MODE
VCC CORE DIG
GND PULSE DET
SERIAL DATA I/O
GND CORE DIG
SERVO GATE
38 37 36 35 34
11 12 13 14 15
SERIAL ENABLE
SERIAL CLOCK +
HOLD SRV AGC
REFERENCE FIN
LATCH CAP A
GND FREO SYN
LATCH CAP B
RESET CAP A/B
GND DATA SEP
DS IREFFREQ SYN FLT
33
32LEVEL
DATA SEP FLT
31
DATA SEP FLT
30
VCC DATA SEP
29
READ DATA I/O
28
ADDR MARK DET
27DATA PATH
READ REF CLOCK
26
WRITE CLOCK
25
MULT TP1
24
MULT TP2
23
GND I /O
22VCC PULSE DET
WRITE DATA NR2 IN
21
READ NR 2 OUTPUT
20
WRITE DATA
19
VCC I/O
18
WRITE GATE
17AGC O UT READ GA TE
16
M92L6000-01
FREQ OUT TP
FREQ SYN FLT
VCC FREQ SYN
August 1993
1/24
This isadvanced information on a new product now in development orundergoing evaluation. Details are subject to change without notice.
L6000
Figure1a: Block Diagram (1 of 2)
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Figure1b: BlockDiagram(2 of 2)
L6000
ABSOLUTE MAXIMUMRATINGS
Symbol Parameter Value Unit
Vcc Positive Supply Voltage – 0.5 to 7 V
VoltageApplied to Logic Inputs –0.5 to Vccs + 0.5 V VoltageApplied to All Other Pins – 0.5 to Vccs +0.5 V
Tstg Storage Temperature – 65 to +150
Tj JunctionTemperature 130
o o
C C
3/24
L6000
PIN DESCRIPTION
Pin # Symbol Type Description
POWER SUPPLY
30 Vcc DATA SEP - DATA SEPARATOR: PLL analog 5V supply. 14 Vcc FREQ. SYNTH - FREQUENCY SYNTHESIZER: PLL analog 5V supply.
7 Vcc CORE DIG - Internal ECL, CMOS logic digital supply. 19 Vcc I/O TTL BUFFER I/O5V SUPPLY. 59 Vcc PULSE DET - Pulse Detector/Servo Demodulator/Filter analog5V supply. 34 GND DATA SEP - DATA SEPARATOR: PLL analog5V ground. 12 GND FREQ SYN - FREQUENCY SYNTHESIZERl: PLL analog 5Vground. 40 GND CORE DIG - Internal ECL, CMOS logic digital ground. 23 GND I/O - TTL Buffer I/O digital ground.
5 GND PULSE DET - Pulse Detector/Servo Demodulator/Filter analog circuit ground.
INPUT
2, 1 AGC IN,
AGCIN
53, 54 DATA PATH,
DATA PATH
51, 52 CLOCK PATH,
CLOCK PATH
6 PWRDN MODE I PWRDN MODE CONTROL: TTL compatible power control pin. Assertion shuts
4 HOLD DATA AGC I HOLD DATA AGC CONTROL INPUT: TTL compatible power control pin.
38 HOLD SRVAGC I HOLD DATA AGC CONTROL INPUT: TTL compatible control pin.Assertion
47 SERVO REF V I SERVO REFERENCE .VOLTAGE INPUT: This voltage is set to half of the Vcc
37 LATCH CAP A I LATCH CONTROL INPUT: TTL compatible input. Switcheschannel A into
36 LATCH CAP B I LATCH CONTROL INPUT: TTL compatible input. Switcheschannel B into
35 RESET CAP A/B I RESET CONTROL INPUT: TTL compatible input. Enables the discharge of
60, 61 FILTER IN,
FILTER IN
11 REFERENCE FIN I REFERENCE FREQUENCY INPUT: TTL input. Pin REFERENCE FIN has an
22 WRT DATANRZ
IN
17 READ GATE I READ GATE : See clocks and Modes. 26 WRITE CLOCK I WRITE CLOCK: TTL input Write mode clock. Must be synchronous with the
18 WRITE GATE I WRITE GATE: TTLinput. Enables the write mode. See Clocks and Modes. 39 SERVO GATE I SERVO GATE: TTL input. Enables the servo read mode. Active low.
| AGC AMPLIFIER INPUTS: Differential AGC amplifier input pins.
I ANALOG INPUTS FOR DATA PATH: Differentialanalog inputs to data
comparators, full-wave rectifier, and servo demodulator.
I ANALOG INPUTS FOR CLOCK PATH: Differential analog inputsto the clock
comparator.
down all circuitry, except the serialport. Deassertion and the appropriate bit set in PD register shuts down the selected circuitry. Active low.
Assertion disables the AGC charge pump and holds the input AGC amplifier gain. Active low.
disables the SERVO charge pump. Active low.
PULSE DET voltage
peak acquisitionmode when low. Cap voltage doesn’t change when high.
peak acquisitionmode when low. Cap voltage doesn’t change when high.
channel A & B hold capacitors when asserted. Active low.
I FILTER SIGNAL INPUTS: Self biased differential input signals to activefilter.
internal pull up resistor. In the test mode, when frequency synthesizer is bypassed, the REFERENCE FIN frequency requiredis 3 times the data rate. REFERENCE FIN may be driven by a direct coupled TTL signal.
I WRITE DATA NRZ INPUT. TTL input. Connected to the READ NRZ OUTPUT
pin toform a bidirectional data port. Pin WRT DATA NRZ IN has an internal pull up resistor.
Write Data NRZ input. For short cable delays, WRITE CLOCK may be connected directly to pin READ REF CLOCK. For long cable delays,WRITE CLOCK should be connected to a READ REF CLOCK return line matched to the NRZ data bus line delay.
4/24
PIN DESCRIPTION(continued)
Pin # Symbol Type Description
OUTPUT
64, 63 AGC OUT,
AGC OUT
29 READ DATA I/O I/O READ DATA I/O: Bi-directional TTL pin. Output is active in the servo mode or
46 POSITION OUT O POSITION ERROR SIGNAL: A Position errorsignal of A minus B output which
56, 55 FILT NORM OUT,
FILT NORM OUT
58, 57 FILT DIFF OUT,
FILT DIFF OUT
28 ADDR MARK DET O ADDRESS MARK DETECT: Tristate output pin with TTL output levels. It is in
25 MULT TP1 O MULTIPLEXED TEST POINTOUTPUT:An open emitterECLoutputtest point.
21 READ NRZ
OUTPUT
27 READ REF CLOCK 0 READ REFERENCE CLOCK: TTL output. A multiplexed clock source used by
24 MULT TP2 O MULTIPLEXED TEST POINT OUTPUT: An open emitter ECL output test point.
20 WRITE DATA O WRITE DATA: TTL output. Encoded write data output. The data is
13 FREQ OUT TP O REFERENCE FREQUENCY OUTPUT: An open emitter ECL output test point.
O AGC AMPLIFIER OUTPUT: DifferentialAGC amplifier output pins.
when both READ GATE andWRITE GATE aredeasserted. In test mode, this is a TTL input used to drive the data separator. The TTL input is enabled by setting RDI in the control register CB.
is referenced to SERVO REF V.
O FILTER DIFFERENTIAL NORMAL OUTPUTS: Low pass & boosted filter
output signals.Must be AC coupled to the next stage nominally DATA PATH.
O FILTER DIFFERENTIAL DIFFERENTIADED OUTPUTS: Differentiated filter
outputs should be AC coupled to the next stagenominally CLOCK PATH.
its high impedance state when WRITE GATE is asserted. When READ GATE is asserted and the register bit is set for soft sector,an address mark search is initiated in the soft sector operation. This output is latched low (true) when an address mark hasbeen detected. Deasserting pin READ GATE deasserts pin ADDR MARK DET.
The testpoint output is enabled by Setting ED inthe control registerCB. The controllingsignal is PD_TEST in thecontrol register CA. WhenPD_TEST is low , thetestpointoutput is the delayed read dataDRD. Theposistive edges of this signalindicate thedata bit position. The positive edges of theDRD and VCOREF outputs can be used to estimatewindow centering. The time jitterof DRD’s positive edge is an indication of media bit jitter.When PD_TESTishigh the test pointout is the comparator of the pulse qualifier. The positive edge indicatesthat theinput signal hasexceeded thepositive threshold while a negative edge indicates that the input signal has gone belowthenegative threshold. Two external resistors are required to use thispin. Theyshould be removed during normal operation toreduce power dissipation.
O NRZ OUTPUT DATA: Tristate ouput pin with TTL output levels. It is in its high
impedance state when READ GATE is deasserted. Readdata output when READ GATE is asserted.
the controller, see Clocksand Modes. During a modechange, no glitchesare generated and no more than one lost clock pulse will occur. READ REF CLOCK remains Fout/3 after READ GATE is asserted, until after synchronized bits are detected.
This test point output is enabled by using the same control bit enabling the MULT TP1 output. When the controlling signal, PD_TEST is desserted, the test point output is the VCO reference input (VCOREF) to the phase detector.The positive edges are phase locked to Delayed Read Data (DRD). The negative edges of this open emitter output signal indicate the edges of the decode window. When PD_TEST is high, the test point output represents the state of the clock comparator in thepulse qualifier. The signal transitions indicate zero crossing of the differentiated signal from the electronic filter. Two external resistor are required to use this pin. They should be removed during normal operation to reduce power dissipation.
automatically resynchronized (independent of the delay between READ REF CLOCK and WRITE CLOCK) to the reference clock FSout. Falling edge of the WRITE DATA is the data edge.
The frequency is the frequency synthesizer output frequency. This output is enabled by control register CA. Two external resistors are required to use this pin. They should be removed during normal operation to reduce power dissipation.
L6000
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L6000
PIN DESCRIPTION(continued)
Pin # Symbol Type Description
ANALOG
50 LEVEL REF V O REFERENCE VOLTAGE: Reference voltage output for LEVEL. LEVEL REF V
62 EF IREF I REFERENCE RESISTOR INPUT: An external 1% resistor (RX) is connected
3 DATA BYP AGC INTEGRATING CAPACITOR: Connected between DATA BYP and Vcc
48 SERVO BYP AGC INTEGRATING CAPACITOR FOR SERVO: Connected betweenSERVO
45 HOLD CAP A PEAK HOLDING CAPACITOR A: Tied from this pin to GND PULSE DET. 44 HOLD CAP B PEAK HOLDING CAPACITOR B: Tied from this pin to GND PULSE DET. 49 LEVEL O HYSTERESIS LEVEL: An NPN emitter output that provides a full-wave
33 DS IREF I REFERENCE RESISTOR INPUT: An external 1% resistor (RR) is connected
42 SERVO TC RES I SERVO TIME CONSTANT RESISTOR INPUT: An external resistor is
15, 16 FREQ SYN FLT,
FREQ SYN FLT
32, 31 DATA SEP FLT,
DATA SEPFLT
41 DAC TP OUT O DAC OUTPUT: A testpoint for some of the on-chip DACs. The output of an
SERIAL PORT
10 SERIAL ENABLE I SERIAL DATA ENABLE: Active high input pin to enablethe serial port CMOS
8 SERIAL DATA I/O I/O SERIAL DATA: Input/Output pin for serial data; 8 instruction/address bits are
9 SERIAL CLOCK+ I SERIAL DATA CLOCK: Positive edgetriggered clock input for the serial data
is derived by referencing VRG (an internal signal) to Vcc PULSE DET.
from this pin to ground to establish a precise reference current for the filter.
PULSE DET. This pin is used when data read mode.
BYP and Vcc PULSE DET. This pin is used whenin servo read mode
rectified signal from LEVEL to LEVEL REF V toset the hysteresis threshold time constant in conjunction with SERVO TC RES and DATA TC RES. This level used in VTHRESHOLD DAC.
to this pin to establish a precise internalreference current for the data separator and Frequency Synthesizer.
connected from this pin to LEVEL to establish the hysteresis threshold time constant when not in Servo mode.
PLL FILTER: The two connection points for the frequency synthesizer PLL
differential filter components.
PLL FILTER: THE Two connectionpoints for the data separatorPLL differential
filter components.
internal DAC is selected bythe values of TDAC1 (MSB) and TDACO (LSB) in the WS register. The selected DAc output and its corresponding select bits are as follows: FC_DAC (00), VTH_DAC (0 1), WS_DAC (1 0), andWP_DAC (1
1). When not using the DAC TP OUT pin, the preferred setting is to select the FC_DAC.
input levels.
sent first followed by 8 data bits. CMOS Input/Output levels.
CMOS input levels. The pin has an internal pull-up resistor.
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L6000
SYSTEM DESCRIPTION PulseDetector Section
Fast attack/decaymodes for rapid AGC recovery. Dual rate chargepump for fasttransient recovery. Low Drift AGC hold circuitry supportsprogramma­ble gain, non-AGC operation. Temperature com­pensated,exponential control AGC. Shorted input switch for transient recovery, during Power down & Write to read & Idle mode transitions. Wide Bandwidth, high precision full-wave rectifier. Dual mode pulse qualification circuitry allows either in­dependent positive and negativethreshold qualifi­cation to suppresserror propagation or hysteresis comparison wich implements alternating polari­ties. Differential qualifier comparator. TTL READ DATA I/O signal output available during servo and idle modes. Timing for shorted inputs and fast decay functions set internally. 0.5 ns max. pulse pairing with sine wave input.
Embedded ServoDemodulatorSection
Dual servo burst (A/B) capturewith PositionError Signal Output. ServoAGCmode which holds sum of A and B bursts constant. Provision for on-chip switching of the hysteresis threshold time con­stant.
Programmable Filter Section
Programmable filter cutoff frequency (fc = 6 to 18 MHz). Programmablepulse slimming equalization (0 to 9 dB Boost at the filter cutoff frequency). Matched path timing normal and differential low­pass outputs. Differential filter input and outputs for noise rejection ±10% cutoff frequency accu­racy. ±2% maximum group delay variation in the passband maintained over the cutoff frequency tuning range ( fc=6 to 18 MHz ). Total harmonic distortion less than 1.5 %. No external filter com­ponents required. Shorted input switch for tran­sient recovery, during Power down & Write to Read & Idle mode transitions.
Frequency Synthesizer and Data Separator Section
1% frequency resolution. Data synchronizer and
1.7 RLL ENDEC. Fast acquisition phase lock loop with zero phase restart both to data and synthe­sizer. Fully integrated data separator. No external delaylines or activedevices required. No external active PLL components required. Active window centering symmetry control via serial port. Win­dow shift control ±30%. Includes delayed read data and VCO clock monitor tests points. Pro­grammablewrite precompensation.Hard and soft sectoroperation.
THERMAL DATA
Symbol Parameter Value Unit
Rth
R
th j-case
j-amb
Thermal Resistance Junction-Ambient 100 °C/W Thermal Resistance Junction-Case 20 °C/W
RECOMMENDED OPERATINGCONDITIONS
Vccn SupplyVoltage 4.3 to 5.5 V
T
amb
T
j
Operating Ambient temperature 0 to 70 °C JunctionTemperature 25 to 125 °C
7/24
L6000
ELECTRICAL CHARACTERISTICS: V
= 5V + 10% - 14%, T
CCn
= 0 to 70 °C, Tj= 25 to 125°C, un-
amb
less otherwisespecified.
Symbol Parameter Test Condition Min. Typ. Max. Unit
POWER SUPPLY CURRENT AND POWER DISSIPATION
Icc Power Supply Current Outputsandtestpoint pins open; Pd Power Dissipation 500 660 mW
Tamb= 27°C, 32Mbits/sec
100 120 mA
DIGITAL INPUTS AND OUTPUTS
V
IL
V
IH
Low Level Input Voltage – 0.3 0.8 V High Level Input Voltage 2.0 V
CC
I/O+0.3
I
IL
I
IH
V
OL
V
OH
Low Level Input Current VIL= 0.4V – 0.4 mA Low Level Input Current VIH= 2.4V 100 µA Low Level Output Voltage IOL= 4.0mA 0.5 V High Level Output Voltage IOH= –400µA 2.4 V
CMOS INPUTS: SERIAL ENABLE, SERIAL DATA AND SERIAL CLOCK
V
IL
V
IH
t
r
t
f
Low level Input Voltage 5V and 25°C 0.5 V High Level Input Voltage 4.5 V Rise Time 4.3V, 70°C and C = 5pF 5.0 ns Fall Time 4.5 ns
CMOS OUTPUTS: SERIAL DATA I/O
V
OL
V
OH
t
r
t
f
Low Level Output Voltage 5V and 25°C; IOL= 4.07mA 0.5 V High Level Output Voltage 5V and 25°C; IOH= +4.83mA 4.5 V Rise Time 4.3V, 70°C and C = 15pF 5.5 ns Fall Time 5.0 ns
TEST POINT OUTPUT LEVELS
V
IL
Test Point High Level Output
261to Vcc DATA SEP
Vcc
–V
DATA
SEP-
1.02 – Vcc
V
IH
(MTP1, MTP2, FOUT)
Test Point Low Level Output
402to GND DATA SEP, Vcc DATA SEP = 5V
261to Vcc DATA SEP
DATA
(MTP1, MTP2, FOUT)
402to GND DATA SEP, Vcc DATA SEP = 5V
SEP-
1.62
PULSEDETECTOR AND SERVO DEMODULATOR CHARACTERISTICS
V
V
Symbol Parameter Test Condition Min. Typ. Max. Unit
AGC Amplifier Section
The input signals are AC coupled to AGC IN and AGC IN. AGC OUT and AGC OUTare AC coupled to FILTER IN and FILTER IN.FILT NORM OUT and FILT NORM OUT are AC coupled to DATA PATH and DATA PATH. IntegratingcapacitorCa = 1000pF is connected between DATABYP andVcc PULSE DET. Unless otherwise specified, theoutput is measured differentially at AGC OUTand AGC OUT,Fin =4MHz,andthe filter boostat FB = 0dB.
Input range Filter Boost at FC = 0dB
22 240 mVpp (bench testcondition = 2.2 to 18MHz)
Input range Filter Boost at FB = 9dB
14 100 mVpp Fin = FC = 18MHz (bench test condition = 6 to 18MHz)
DATAPATH/
Voltage AGC IN-AGC IN= 0.1Vpp 0.945 1.05 1.155 Vpp
DATAPATH
Voltage Variation 22mV < AGC IN = AGC IN <
–8.0 +8.0 %
240mV
Gain Range 1.9 22 V/V
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