SGS Thomson Microelectronics HCF4724B Datasheet

.SERIAL DATA INPUT - ACTIVE PARALLEL
OUTPUT
.STORAGEREGISTERCAPABILITY-MASTER
CLEAR
.CAN FUNCTIONAS DEMULTIPLEXER
.STANDARDIZED, SYMMETRICAL OUTPUT
CHARACTER
.100% TESTED FOR QUIESCENT CURRENT
AT 20V
.MAXIMUM INPUT CURRENT OF 1µA AT 18V
(fullpackage-temperature range), 100nA AT18V AND 25oC
.NOISE MARGIN (full package-temperature
range)= 1VATVDD=5V, 2VATVDD=10V,2.5V AT VDD=15V
.5V, 10V,AND 15V PARAMETRIC RATINGS
.MEETSALLREQUIREMENTSOFJEDECTEN-
TATIVE STANDARD N. 13A, ” STANDARD SPECIFICATIONS FOR DESCRIPTION OF ’ B ’ SERIES CMOS DEVICES”
APPLICATION
HCC4724B
HCF4724B
8 BIT ADDRESSABLE LATCH
EY
(PlasticPackage)
M1
(MicroPackage)
ORDER CODES :
(CeramicPackage)
F
C1
(Chip Carrier)
.MULTI-LINEDECODERS
.A/D CONVERTERS
DESCRIPTION
The HCC/HCF4724B 8-bit addressable latch is a serial-input,parallel-output storageregisterthatcan perform avariety of functions.
Dataare inputted toa particular bitin thelatchwhen thatbitis addressed(bymeansofinputsA0,A1,A2) and when WRITE DISABLE is at low level. When WRITE DISABLE is high, data entry is inhibited however, all 8 outputscan be continuously read in­dependent ofWRITEDISABLE andaddress inputs.
A masterRESET input is available, whichresets all bits to a logic” 0” levelwhen RESET and WRITE DISABLE are at a highlevel.When RESETis at a highlevel, andWRITEDISABLE isata lowlevel,the latch acts as a 1-of-8 demultiplexer ; the bit that is addressed has an active output which follows the data input, while allunaddressed bits areheld to a logic ” 0” level.
PIN CONNECTIONS
September 1988
1/14
HCC/HCF4724B
FUN CTION AL DIAG R A M
ABSOLU TE M AXIMU M R AT ING
Symbol Parameter Value Unit
V
* Supply Voltage: HCC Types
DD
HCF Types
V
P
Input Voltage -0.5 to VDD+ 0.5 V
i
I
DC Input Current (any oneinput) ± 10 mA
I
Total Power Dissipation (per package)
tot
Dissipation per Output Transistor for Top = Full Package Temperature Range
T
Operating Temperature: HCC Types
op
HCF Types
T
Stressesabove those listedunder”Absolute Maximum Ratings”maycausepermanent damagetothedevice. Thisisa stressratingonlyand functional operation of the device atthese oranyotherconditions above thoseindicated in theoperational sections of thisspecification is not implied.Exposure to absolute maximum ratingconditions forexternal periodsmay affectdevice reliability.
* All voltagevalues are referred toVSSpinvoltage.
Storage Temperature -65 to +150
stg
-0.5 to +20
-0.5 to +18
200 100
-55 to +125
-40 to +85
V V
mW mW
o
C
o
C
o
C
RECO MM ENDED OPERAT I N G CO NDI TIONS
Symbol Parameter Value Unit
V
V
T
2/14
Supply Voltage: HCC Types
DD
HCF Types
Input Voltage 0 to V
I
Operating Temperature: HCC Types
op
HCF Types
3to18 3to15
DD
-55 to +125
-40 to +85
V V
V
o
C
o
C
LOGI C DI AGRAM
HCC/HCF4724B
Defini ti on o f WRITE DISA BL E ON Ti me
MODE SELECTION
TYPE WD R
A 0 0 Follows Data Hold Previous
B 0 1 Follows Data
C 1 0 Hold Previous State D 1 1 Reset to ”0” Reset to ”0”
WD = WRITE DISABLE R= RESET
Addressed
Latch
(Active High
8-Channel
Demultiplexer)
Unaddressed
Latch
State
Reset to ”0”
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HCC/HCF4724B
STATI C ELE CT RIC AL CHA R ACTE R ISTI CS (ove r recom mended oper a ting co ndi tions )
Test Conditios Value
Symbol Parameter
Quiescent
I
L
Current
HCC Types
V
(V)
V
I
(V)
|IO|
(µA)
V
(V)
O
T
DD
*25
LOW
Min. Max. Min. Typ. Max. Min. Max.
0/5 5 5 0.04 5 150 0/10 10 10 0.04 10 300 0/15 15 20 0.04 20 600
o
CT
0/20 20 100 0.08 100 3000
HCF Types
0/5 5 20 0.04 20 150 0/10 10 40 0.04 40 300 0/15 15 80 0.04 80 600
OH
Output High
V
Voltage
0/5 < 1 5 4.95 4.95 4.95 0/10 < 1 10 9.95 9.95 9.95 0/15 < 1 15 14.95 14.95 14.95
OL
Output Low
V
Voltage
5/0 < 1 5 0.05 0.05 0.05 10/0 < 1 10 0.05 0.05 0.05 15/0 < 1 15 0.05 0.05 0.05
IH
Input High
V
Voltage
0.5/4.5 < 1 5 3.5 3.5 3.5 1/9 < 1 10 7 7 7
1.5/13.5 < 1 15 11 11 11
IL
Input Low
V
Voltage
4.5/0.5 < 1 5 1.5 1.5 1.5 9/1 < 1 10 3 3 3
13.5/1.5 < 1 15 4 4 4
OH
Output Drive Current
HCC Types
I
0/5 2.5 5 -2 -1.6 -3.2 -1.15
0/5 4.6 5 -0.64 -0.51 -1 -0.36 0/10 9.5 10 -1.6 -1.3 -2.6 -0.9 0/15 13.5 15 -4.2 -3.4 -6.8 -2.4
0/5 2.5 5 -1.8 -1.6 -3.2 -1.3
HCF Types
0/5 4.6 5 -0.61 -0.51 -1 -0.42 0/10 9.5 10 -1.5 -1.3 -2.6 -1.1 0/15 13.5 15 -4 -3.4 -6.8 -2.8
I
OL
Output Sink Current
HCC Types
HCF Types
0/5 0.4 5 0.64 0.51 1 0.36 0/10 0.5 10 1.6 1.3 2.6 0.9 0/15 1.5 15 4.2 3.4 6.8 2.4
0/5 0.4 5 0.61 0.51 1 0.42 0/10 0.5 10 1.5 1.3 2.6 1.1 0/15 1.5 15 4 3.4 6.8 2.8
I
IH,IIL
C
*T
LOW
*T
HIGH
TheNoiseMargin for both”1” and”0” levelis: 1V min.withVDD=5V, 2V min.with VDD=10 V,2.5 Vmin. withVDD=15V
Input Leakage Current
Input Capacitance Any Input 5 7.5 pF
I
=-55oCforHCCdevice: -40oC for HCF device.
=+125oCforHCC device: +85oC for HCFdevice.
0/18 Any Input 18 ±0.1 ±10
-5
±0.1 ±1 µA
HIGH
Unit
*
µA
V
V
V
V
mA
mA
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HCC/HCF4724B
DYNAMIC ELECTRICAL CHARACTERISTICS (T
=25oC, CL=50pF,RL= 200 K,
amb
typic al temperatur e coeff i c ent for all VDDvalues is 03 %/oC, all input ri s e and fall ti mes = 20 ns)
Symbol Parameter
t t
t t
t
PLH PHL
PLH PHL
PHL
Propagation Delay Time Data to Output
Propagation Delay Time Write Disable to Output
Propagation Delay Time Reset to Output
t t
t t
PLH PHL
TLH THL
t
Propagation Delay Time Address to Output
Transition Time Any Output 5 100 200
Minimum Pulse Width
W
Data
Minimum Pulse Width Address
Minimum Pulse Width Reset
Minimum Setup Time
t
s
Data to Write Disable
t
Minimum Holf Time
H
Data to Write Disable
C
Input Capacitance Any
IN
Test Conditions Value
(V) Min. Typ. Max.
V
DD
(See Figure 1) 5 200 400
10 75 150 15 50 100
(See Figure 1) 5 200 400
10 80 160 15 60 120
(See Figure 1) 5 175 350
10 80 160 15 65 130
(See Figure 1) 5 225 450
10 100 200 15 75 150
10 50 100 15 40 80
(See Figure 1) 5 100 200
10 50 100 15 40 80
(See Figure 1) 5 200 400
10 100 200 15 65 125
(See Figure 1) 5 75 150
10 40 75 15 25 50
(See Figure 1) 5 50 100
10 25 50 15 20 35
(See Figure 1) 5 75 150
10 40 75 15 25 50
5 7.5 pF
Input
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
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