SGS Thomson Microelectronics HCF4556B, HCF4555B Datasheet
DUAL BINARY TO 1 OF 4 DECODER/DEMULTIPLEXERS
455 5B O UTPUTS HIGH ON SELECT
4556B OUTPUTS LO W ON SELECT
. EXPANDABLE WITH MULTIPLE PACKAGES
.STANDARD,SYMMETRICAL OUTPUTCHAR-
ACTERISTICS
.QUIESCENT CURRENT SPECIFIED TO 20V
FOR HCC DEVICE
.5V, 10V,AND 15VPARAMETRIC RATINGS
.INPUT CURRENTOF100nA AT18VAND25°C
FOR HCC DEVICE
.100% TESTEDFOR QUIESCENTCURRENT
.MEETSALLREQUIREMENTSOFJEDECTEN-
TATIVE STANDARD No. 13A, ”STANDARD
SPECIFICATIONS FOR DESCRIPTIONOF ”B”
SERIESCMOS DEVICES”
HCC/H CF4 55 5B
HCC/HCF4556B
EY
(Plastic Package)
M1
(MicroPackage)
ORDER CODES:
HCC45XXBF HCF45XXBM1
HCF45XXBEY HCF45XXBC1
(CeramicFrit Seal Package)
F
C1
(Plastic Chip Carrier)
DESCRI PTIO N
The HCC4555B, HCC4556B (extended temperature range) and the HCF4555B, HCF4556B (intermediate temperature range) are monolithic
integrated circuits available in 16-lead dual in-line
plastic or ceramic package and plastic micropackage.
The HCC/HCF4555B and HCC/HCF4556B are
dual one-of-four decoders/demultiplexers. Each
decoderhastwo select inputs (A and B), an Enable
input (E), and four mutually exclusive outputs. On
theHCC/HCF4555B theoutputsarehigh on select;
on the HCC/HCF4556B the outputs are low on select. When the Enable input is high, the outputs of
the HCC/HCF4555B remain low and the outputs of
the HCC/HCF4556B remain highregardless of the
stateof the selectinputs A and B.
PIN CON NEC TI O NS
4555B
4556B
June 1989
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HCC/HCF4555B/4556B
FUN CTIONAL DIAGRAMS
4555B 4556B
ABSOLUTE M AXI MUM RATING S
Symbol Parameter Value Unit
V
* Supply Voltage : HC C Types
DD
HCF Types
V
Input Voltage – 0.5 to VDD+ 0.5 V
i
I
DC Input Current (any one input) ± 10 mA
I
P
Total Power Dissipation (per package)
tot
Dissipation per Output Transistor
for Top= Full Package-temperature Range
T
Operating Temperature : HCC Types
op
HCF Types
T
Stresses above those listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for external periods may affect device
reliability.
* All voltagesvaluesare referredto V
Storage Temperature – 65 to + 150 °C
stg
pinvoltage.
SS
– 0.5 to + 20
– 0.5 to + 18
200
100
– 55 t o + 125
–40to+85
V
V
mW
mW
°C
°C
RECO MM END ED OPERATING CO N D IT IONS
Symbol Parameter Valu e Unit
V
T
2/14
Supply Voltage : HCC Types
DD
HCF Types
V
Input Voltage 0 to V
I
Operating Temperature : HCC Types
op
HCF Types
3to18
3to15
DD
–55to+125
–40to+85
°C
°C
V
V
V
LOGIC DIAGRAMS
HCC/HCF4555B/4556B
4555B 4556B
TRUTH TABLE
Inputs Enable Select Outputs 4555B Outputs 4556B
E B A Q3Q2Q1Q0Q3Q2Q1Q0
0 0 0 00011110
0 0 1 00101101
0 1 0 01001011
0 1 1 10000111
1 X X 00001111
X = DON’T CARE, LOGIC 1 = HIGH, LOGIC 0 = LOW.
3/14
HCC/HCF4555B/4556B
STATIC ELECTRICAL CHARACTERISTICS (over recommended operatingconditions)
Test Conditions Valu e
Symbol Parameter
I
Quiescent
L
Current
HCC
Types
(V) (V) (µA) (V)
0/ 5 5 5 0.04 5 150
0/10 10 10 0.04 10 300
0/15 15 20 0.04 20 600
V
V
I
O
|IO|V
DD
T
* 25°CT
Low
High
Min. Max. Min. Typ. Max. Min. Max.
0/20 20 100 0.08 100 3000
0/ 5 5 20 0.04 20 150
HCF
Types
0/10 10 40 0.04 40 300
0/15 15 80 0.04 80 600
V
OH
Output High
Voltage
0/ 5 < 1 5 4.95 4.95 4.95
0/10 < 1 10 9.95 9.95 9.95
0/15 < 1 15 14.95 14.95 14.95
V
OL
Output Low
Voltage
5/0 < 1 5 0.05 0.05 0.05
10/0 < 1 10 0.05 0.05 0.05
15/0 < 1 15 0.05 0.05 0.05
V
IH
Input High
Voltage
0.5/4.5 < 1 5 3.5 3.5 3.5
1/9 < 1 10 7 7 7
1.5/13.5 < 1 15 11 11 11
V
IL
Input Low
Voltage
4.5/0.5 < 1 5 1.5 1.5 1.5
9/1 < 1 10 3 3 3
13.5/1.5 < 1 15 4 4 4
I
OH
Output
Drive
Current
HCC
Types
0/ 5 2.5 5 – 2 – 1.6 – 3.2 – 1.15
0/ 5 4.6 5 – 0.64 – 0.51 – 1 – 0.36
0/10 9.5 10 – 1.6 – 1.3 – 2.6 – 0.9
0/15 13.5 15 – 4.2 – 3.4 – 6.8 – 2.4
0/ 5 2.5 5 – 1.53 – 1.36 – 3.2 – 1.1
HCF
Types
0/ 5 4.6 5 – 0.52 – 0.44 – 1 – 0.36
0/10 9.5 10 – 1.3 – 1.1 – 2.6 – 0.9
0/15 13.5 15 – 3.6 – 3.0 – 6.8 – 2.4
I
OL
Output
Sink
Current
HCC
Types
0/ 5 0.4 5 0.64 0.51 1 0.36
0/10 0.5 10 1.6 1.3 2.6 0.9
0/15 1.5 15 4.2 3.4 6.8 2.4
0/ 5 0.4 5 0.52 0.44 1 0.36
HCF
Types
0/10 0.5 10 1.3 1.1 2.6 0.9
0/15 1.5 15 3.6 3.0 6.8 2.4
I
IH,IIL
(*) T
(*) T
The Noise Margin for both ”1” and ”0” level is : 1V min. with VDD= 5V, 2V min. with VDD= 10V, 2.5V min. with VDD=15V.
Input
Leakage
Current
C
Input Capacitance Any Input 5 7.5 pF
I
=–55°C for HCC device : – 40°CforHCF device.
LOW
= + 125°CforHCC device : + 85°CforHCF device.
HIGH
HCC
Types
HCF
Types
0/18
0/15
Any Input
18 ± 0.1 ±10
15 ± 0.3 ±10
–5
± 0.1 ± 1
–5
± 0.3 ± 1
Unit
*
µA
V
V
V
V
mA
mA
µA
4/14
HCC/HCF4555B/4556B
DYNAMIC ELECTRICAL CHARACTERISTICS (T
=25°C, CL= 50pF, RL= 200kΩ,
amb
typical temperature coefficientfor all VDDvalues is 0.3%/°C, all input rise and fall times = 20ns)
Symbol Parameter
t
,
Propagation Delay Time
(A or B input to any output)
Propagation Delay Time
(E input to any output)
,
Transition Time 5 100 200
t
t
t
PLH
PHL
TLH
THL
TypicalOutputLow (sink) Current Characteristics.
Test Conditions Value
V
(V) Min. Typ. M ax.
DD
5220440
10 95 190
15 70 140
5200400
10 85 170
15 65 130
10 50 100
15 40 80
Minimum Output Low(sink) Current Characteristics.
Unit
ns
ns
ns
TypicalOutputHigh (source) Current Characteristics.
Minimum Output High (source)Current Characteristics.
5/14
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