The 74LVX373 is a low voltage CMOS OCTAL
D-TYPE LATCH with 3 STATE OUTPUT NON
INVERTING fabricated with sub-micron silicon
gate and double-layer metal wiring C
2
MOS
technology. It is ideal for low power, battery
operated and low noise 3.3V applications.
This 8 bit D-Type latch is controlled by a latch
enable input (LE) and an output enable input (OE
While the LE in put is held at a high level, the Q
outpu ts w ill f ollo w t he da ta input precisely .
PIN CONNECTION AND IEC LOGIC SYMBOLS
TSSOPSOP
ORDER CODES
PACKAGETUBET & R
SOP74LVX373M74LVX373MTR
TSSOP74LVX373TTR
When the LE i s taken low, the Q outputs will be
latched precisely at the logic level of D input data.
While the (OE
) input is low, the 8 outputs will be in
a normal logic state (high or low logic level) and
while high level the outputs will be in a high
impedance state.
Power down protection is provided on all inputs
and 0 to 7V can be accepted on inputs with no
regard to the supply voltage.
This device can be used to interface 5V to 3V. It
combines high speed performance with the true
CMOS low power consumption.
All inputs and outputs are equipped with
protection circuits against stat ic discharge, giving
).
them 2KV ESD immunity and transient excess
voltage.
1/10July 2001
74LVX373
INPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
PIN NoSYMBOLNAME AND FUNCTION
1OE
3, 4, 7, 8, 13,
14, 17, 18
2, 5, 6, 9, 12,
15, 16,19
11LELatch Enable Input
10GNDGround (0V)
20V
TRUTH TABLE
INPUTSOUTPUT
D0 to D7 Data Inputs
Q0 to Q7 3-State Outputs
CC
3 State Output Enable
Input (Active LOW)
Positive Supply Voltage
OE
LEDQ
HXXZ
LLXNO CHANGE*
LHLL
LHHH
X : Don’t Care
Z : High Impedance
* : Q Outputs are Latched at the time when the LE INPUT is taken low logic level
LOGIC DIAGRAM
This log i c diagram has not be used to estimat e propagation del ays
2/10
74LVX373
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
V
V
V
I
I
OK
I
I
or I
CC
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied
RECOMMENDED OPERATING CONDITIONS
SymbolParameterValueUnit
V
V
V
T
dt/dv
1) Truth T abl e guaranteed: 1.2V to 3.6V
2) V
from 0.8V to 2.0V
IN
Supply Voltage
CC
DC Input Voltage
I
DC Output Voltage-0.5 to VCC + 0.5
O
DC Input Diode Current
IK
DC Output Diode Current
DC Output Current
O
DC VCC or Ground Current
GND
Storage Temperature
stg
Lead Temperature (10 sec)
L
Supply Voltage (note 1)
CC
Input Voltage
I
Output Voltage0 to V
O
Operating Temperature
op
Input Rise and Fall Time (note 2) (V
CC
= 3V)
-0.5 to +7.0V
-0.5 to +7.0V
- 20mA
± 20mA
± 25mA
± 50mA
-65 to +150°C
300°C
2 to 3.6V
0 to 5.5V
CC
-55 to 125°C
0 to 100ns/V
V
V
DC SPECIFICATIONS
SymbolParameter
V
V
V
V
I
I
High Level Input
IH
Voltage
Low Level Input
IL
Voltage
High Level Output
OH
Voltage
Low Level Output
OL
Voltage
High Impedance
OZ
Output Leakage
Current
I
Input Leakage
I
Current
Quiescent Supply
CC
Current
Test ConditionValue
V
(V)
CC
= 25°C
A
Min.Typ. Max.Min.Max. Min. Max.
-40 to 85°C -55 to 125°C
T
2.01.51.51.5
2.02.02.0
3.6
2.42.42.4
2.00.50.50.5
3.60.80.80.8
2.0
3.0
2.0
3.0
3.6
3.6
3.6
IO=-50 µA
I
=-50 µA
O
I
=-4 mA
O
IO=50 µA
I
=50 µA
O
I
=4 mA
O
= VIH or V
V
I
IL
VO = VCC or GND
= 5V or GND
V
I
= VCC or GND
V
I
1.92.01.91.9
2.93.02.92.9
2.582.482.4
0.00.10.10.1
0.00.10.10.1
0.360.440.55
±0.25± 2.5± 5µA
± 0.1± 1± 1µA
44040µA
Unit
V3.0
V3.00.80.80.8
V3.0
V3.0
3/10
74LVX373
DYNAMIC SWITCHING CHARACTERISTICS
Test ConditionValue
T
SymbolParameter
V
V
Dynamic Low
OLP
Voltage Quiet
OLV
Output (note 1, 2)
V
CC
(V)
3.3
= 25°C
A
Min.Typ. Max.Min.Max. Min. Max.
0.30.8
-0.8-0.3
Dynamic High
V
IHD
Voltage Input
3.32.0
= 50 pF
C
L
(note 1, 3)
Dynamic Low
V
ILD
Voltage Input
3.30.8
(note 1, 3)
1) Worst c ase package.
2) Max number of output s defined as (n). Dat a i nputs are driven 0V to 3.3V, (n -1) outputs switc hi ng and one out put at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 3.3V. Inputs under test switching: 3.3V to threshold (V
(V
), f=1MHz.
IHD
AC ELECTRICAL CHARACTERISTICS (Input tr = tf = 3ns)
Test ConditionValue
T
SymbolParameter
t
Propagation Delay
PLH
PHL
Time
LE to Q
t
3.3
3.3
t
t
Propagation Delay
PLH
Time
PHL
D to Q
3.3
3.3
PZL
PZH
Output Enable
Time
t
t
3.3
3.3
t
t
t
OSLH
t
OSHL
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs of the same device switching in the same directio n, either HIGH or LO W
2) Param eter guarante ed by design
(*) Vol tage rang e i s 3.3V ±
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I
TEST CIRCUIT
-40 to 85°C -55 to 125°C
= CPD x VCC x fIN + ICC/8 (per c ircuit )
CC(opr)
Unit
TESTSWITCH
t
, t
PLH
PHL
, t
t
PZL
PLZ
t
, t
PZH
PHZ
CL =15/50pF or equivalent (includes jig and probe capacitance)
= R1 = 1KΩ or equivalent
R
L
= Z
R
of pulse generator (typically 50Ω)
T
OUT
Open
V
CC
GND
5/10
74LVX373
WAVEFORM 1 : LE TO Qn PROPAGATION DELAYS, LE MINIMUN PULSE WIDTH, Dn TO LE SETUP
AND HOLD TIMES (f=1MHz; 50% duty cycle)
WAVEFORM 2 : OUTPUT ENABLE AND DISABLE TIMES (f=1MHz; 50% duty cycle)
6/10
WAVEFORM 3 : PROPAGATION DELAY TIME (f=1MHz; 50% duty cycle)
74LVX373
7/10
74LVX373
SO-20 MECHANICAL DATA
DIM.
MIN.TYPMAX.MIN.TYP.MAX.
A2.650.104
a10.10.20.0040.008
a22.450.096
b0.350.490.0140.019
b10.230.320.0090.012
C0.50.020
c145° (typ.)
D12.6013.000.4960.512
E10.0010.650.3930.419
e1.270.050
e311.430.450
F7.407.600.2910.300
L0.501.270.0200.050
M0.750.029
S8° (max.)
mm.inch
8/10
PO13L
74LVX373
TSSOP20 MECHANICAL DATA
mm.inch
DIM.
MIN.TYPMAX.MIN.TYP.MAX.
A1.20.047
A10.050.150.0020.0040.006
A20.811.050.0310.0390.041
b0.190.300.0070.012
c0.090.200.0040.0089
D6.46.56.60.2520.2560.260
E6.26.46.60.2440.2520.260
E14.34.44.480.1690.1730.176
e0.65 BSC0.0256 BSC
K0°8°0°8°
L0.450.600.750.0180.0240.030
A2
A
A1
b
e
K
c
L
E
D
E1
PIN 1 IDENTIFICATION
1
0087225C
9/10
74LVX373
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