SGS Thomson Microelectronics 74LVQ32 Datasheet

74LVQ32

QUAD 2-INPUT OR GATE

■ HIGHSPEED:t

■ COMPATIBLEWITHTTLOUTPUTS

■ LOW POWERDISSIPATION:

I

=2 µA (MAX.)at TA=25oC

CC

■ LOWNOISE:

V

=0.3 V (TYP.)at VCC=3.3V

OLP

■ 75ΩTRANSMISSIONLINEDRIVING

=5 ns(TYP.)atVCC=3.3V

PD

CAPABILITY

■ SYMMETRICALOUTPUTIMPEDANCE:

|I

|=IOL=12mA(MIN)

OH

■ PCIBUSLEVELSGUARANTEEDAT 24mA

■ BALANCEDPROPAGAT IONDELAYS:

≅ t

t

PLH

PHL

■ OPERATINGVOLTAGERANGE:

V

(OPR)= 2Vto3.6V(1.2VDataRetention)

CC

■ PINANDFUNCTION COMPATIBLEWITH

74SERIES32

■ IMPROVEDLATCH-UP IMMUNITY

DESCRIPTION

The LVQ32 is a low voltage CMOS QUAD
2-INPUT OR GATE fabricated with sub-micron
silicon gate and double-layermetal wiring C

2

MOS

M

(Micro Package)

(TSSOPPackage)

T

ORDERCODES :

74LVQ32M 74LVQ32T

technology.Itis ideal for low power and low noise

3.3Vapplications.
The internal circuit is composed of 2 stages

including buffer output, which enables high noise
immunityand stableoutput.

It has better speed performance at 3.3V than 5V
LS-TTL family combined with the true CMOS low
powerconsumption.

All inputs and outputs are equipped with
protection circuits against static discharge, giving
them 2KV ESD immunity and transient excess
voltage.

PIN CONNECTION AND IEC LOGICSYMBOLS

February 1999

1/8

74LVQ32

INPUT AND OUTPUTEQUIVALENT CIRCUIT

PIN DESCRIPTION

PI N No SYMB OL NAME AND FUNCTI O N

1, 4, 9, 12 1A to 4A Data Inputs

2, 5, 10, 13 1B to 4B Data Inputs

3, 6, 8, 11 1Y to 4Y Data Outputs

7 GND Ground (0V)

14 V

CC

Positive Supply Voltage

TRUTH TABLE

ABY

LLL

LHH
HLH
HHH

ABSOLUTE MAXIMUM RATINGS

Symb o l Para met er Val u e Uni t

V

V

V

I

I

OK

I

or I

I

CC

T

T

AbsoluteMaximumRatingsarethosevaluesbeyond whichdamagetothedevicemayoccur. Functionaloperation underthese conditionisnotimplied.

Supply Voltage -0.5 to +7 V

CC

DC Input Voltage -0.5 to VCC+ 0.5 V

I

DC Output Voltage -0.5 to VCC+ 0.5 V

O

DC Input Diode Current ± 20 mA

IK

DC Output Diode Current
DC Output Current ± 50 mA

O

DC VCCor Ground Current ± 200 mA

GND

Storage Temperature -65 to +150

stg

Lead Temperature (10 sec) 300

L

20 mA

±

o

C

o

C

RECOMMENDED OPERATINGCONDITIONS

Symb o l Para met er Value Un it

V

V

V

T

dt/dv Input Rise and Fall Time (V

1) TruthTable guaranteed: 1.2V to 3.6V

2)V

from0.8V to 2V

IN

2/8

Supply Voltage (note 1) 2 to 3.6 V

CC

Input Voltage 0 to V

I

Output Voltage 0 to V

O

Operating Temperature: -40 to +85

op

= 3V) (note 2) 0 to 10 ns/V

CC

CC
CC

V
V

o

C

74LVQ32

DC SPECIFICATIONS

Symbol Parameter Test Conditions Value Unit

=25oC -40 to 85oC

V

CC

(V)

High Level Input Voltage

V

IH

Low Level Input Voltage 0.8 0.8 V

V

IL

High Level Output

V

OH

Voltage

Low Level Output

V

OL

Voltage

Input Leakage Current

I

I

Quiescent Supply

I

CC

3.0 to

3.6

3.0

3.0 V

3.6

(*)

IO=-50 µA 2.9 2.99 2.9

=

V

I

V

or

IH

V

IL

(*)

I

V

IL

=-12 mA 2.58 2.48

I

O

=-24 mA 2.2

I

O

=

IO=50 µA 0.002 0.1 0.1

=12 mA 0 0.36 0.44

I

O

=24 mA 0.55

I

O

VI=VCCor GND

3.6 VI=VCCor GND 2 20 µA

Current
Dynamic Output Current

I

OLD

OHD

(note 1, 2)

I

1) Maximumtest duration 2ms, one output loaded attime

2)Incident waveswitchingisguaranteedontransmissionlines withimpedances aslowas50 Ω.
(*)All outputs loaded.

3.6 V

= 0.8 V max 36 mA

OLD

V

= 2 V min -25 mA

OHD

T

A

Min. Typ. Max. Min. Max.

2.0 2.0 V

0.1

±

1

±

µ

V

V

A

DYNAMICSWITCHING CHARACTERISTICS

Symbol Parameter Test Conditions Value Unit

T

V

CC

(V)

V
V

V

Dynamic Low Voltage

OLP

Quiet Output (note 1, 2)

OLV

Dynamic High Voltage

IHD

3.3

3.3 2

C

L

=50pF

Input (note 1, 3)

V

Dynamic Low Voltage

ILD

3.3 0.8

Input (note 1, 3)

1)Worstcasepackage.

2)Maxnumberofoutputsdefined as(n).Datainputs aredriven0Vto3.3V,(n -1)outputs switching andoneoutputatGND.

3)Maxnumberofdatainputs (n)switching.(n-1)switching0Vto3.3V.Inputs undertestswitching:3.3Vtothreshold(V

=25oC -40 to 85oC

A

Min. Typ. Max. Min. Max.

0.3 0.8

-0.8 -0.3

),0Vtothreshold(V

ILD

).,f=1MHz.

IHD

V

3/8