74LVQ04
HEX INVERTER
■ HIGHSPEED:t
■
COMPATIBLEWITHTTLOUTPUTS
■ LOW POWERDISSIPATION:
I
=2µA (MAX.)at TA=25oC
CC
■ LOWNOISE:
V
=0.3 V (TYP.)at VCC=3.3V
OLP
■
75ΩTRANSMISSIONLINEDRIVING
=4.5ns(TYP.)atVCC=3.3V
PD
CAPABILITY
■ SYMMETRICALOUTPUTIMPEDANCE:
|I
|=IOL=12mA(MIN)
OH
■ PCIBUSLEVELSGUARANTEEDAT 24mA
■
BALANCEDPROPAGAT IONDELAYS:
t
≅ t
PLH
PHL
■ OPERATINGVOLTAGERANGE:
V
(OPR)= 2Vto3.6V(1.2VDataRetention)
CC
■ PINANDFUNCTION COMPATIBLEWITH
74SERIES04
■ IMPROVEDLATCH-UP IMMUNITY
DESCRIPTION
The LVQ04 is a low voltage CMOS HEX
INVERTER fabricated with sub-micron silicon
gate and double-layer metal wiring C
2
MOS
M
(Micro Package)
(TSSOPPackage)
T
ORDERCODES :
74LVQ04M 74LVQ04T
technology.Itis ideal for low power and low noise
3.3Vapplications.
The internal circuit is composed of 3 stages
including buffer output, which enableshigh noise
immunityand stableoutput.
It has better speed performance at 3.3V than 5V
LS-TTL family combined with the true CMOS low
powerconsumption.
All inputs and outputs are equipped with
protection circuits against static discharge, giving
them 2KV ESD immunity and transient excess
voltage.
PIN CONNECTION ANDIECLOGICSYMBOLS
February 1999
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74LVQ04
INPUT AND OUTPUTEQUIVALENT CIRCUIT
PIN DESCRIPTION
PI N No SYMB OL NAME AND FU NCTION
1, 3, 5, 9,
1A to 6A Data Inputs
11, 13
2, 4, 6, 8,
1Y to 6Y Data Outputs
10, 12
7 GND Ground (0V)
14 V
CC
Positive Supply Voltage
TRUTH TABLE
AY
LH
HL
ABSOLUTE MAXIMUM RATINGS
Symb o l Para met er Val u e Uni t
V
V
V
I
I
OK
I
or I
I
CC
T
T
AbsoluteMaximumRatingsarethosevaluesbeyond whichdamagetothedevice mayoccur. Functionaloperationunderthesecondition isnotimplied.
Supply Voltage -0.5 to +7 V
CC
DC Input Voltage -0.5 to VCC+ 0.5 V
I
DC Output Voltage -0.5 to VCC+ 0.5 V
O
DC Input Diode Current
IK
DC Output Diode Current
DC Output Current ± 50 mA
O
DC VCCor Ground Current ± 300 mA
GND
Storage Temperature -65 to +150
stg
Lead Temperature (10 sec) 300
L
20 mA
±
20 mA
±
o
C
o
C
RECOMMENDED OPERATINGCONDITIONS
Symb o l Para met er Value Un it
V
V
V
T
dt/dv Input Rise and Fall Time (V
1) TruthTable guaranteed: 1.2V to 3.6V
from0.8V to 2V
2)V
IN
2/8
Supply Voltage (note 1) 2 to 3.6 V
CC
Input Voltage 0 to V
I
Output Voltage 0 to V
O
Operating Temperature: -40 to +85
op
= 3V) (note 2) 0 to 10 ns/V
CC
CC
CC
V
V
o
C
74LVQ04
DC SPECIFICATIONS
Symbol Parameter Test Conditions Value Unit
T
V
CC
(V)
High Level Input Voltage
V
IH
Low Level Input Voltage 0.8 0.8 V
V
IL
High Level Output
V
OH
Voltage
Low Level Output
V
OL
Voltage
Input Leakage Current
I
I
Quiescent Supply
I
CC
3.0 to
3.6
3.0
3.0
3.6
V
V
IO=-50 µA 2.9 2.99 2.9
(*)
=
I
V
IL
(*)
I
V
IH
=-12 mA 2.58 2.48
I
O
=-24 mA 2.2
I
O
IO=50 µA 0.002 0.1 0.1
=
=12 mA 0 0.36 0.44
I
O
=24 mA 0.55
I
O
VI=VCCor GND ±0.1 ±1 µA
3.6 VI=VCCor GND 2 20
Current
Dynamic Output Current
I
OLD
OHD
(note 1, 2)
I
1) Maximumtest duration 2ms, one output loaded attime
2)Incident waveswitchingisguaranteed ontransmission lines withimpedances aslowas50 Ω.
(*)All outputs loaded.
3.6 V
= 0.8 V max 36 mA
OLD
V
= 2 V min -25 mA
OHD
=25oC -40 to 85oC
A
Min. Typ. Max. Min. Max.
2.0 2.0
µ
V
V
V
A
DYNAMICSWITCHING CHARACTERISTICS
Symbol Parameter Test Conditions Value Unit
T
V
CC
(V)
V
V
V
Dynamic Low Voltage
OLP
Quiet Output (note 1, 2)
OLV
Dynamic High Voltage
IHD
3.3
3.3 2
C
L
=50pF
Input (note 1, 3)
V
Dynamic Low Voltage
ILD
3.3 0.8
Input (note 1, 3)
1)Worstcasepackage.
2)Maxnumberofoutputsdefined as(n).Datainputs aredriven0Vto3.3V,(n -1)outputs switchingandoneoutput atGND.
3)Maxnumberofdatainputs (n)switching.(n-1)switching0Vto3.3V.Inputs undertestswitching: 3.3Vtothreshold (V
=25oC -40 to 85oC
A
Min. Typ. Max. Min. Max.
0.3 0.8
-0.8 -0.3
),0Vtothreshold(V
ILD
).,f=1MHz.
IHD
V
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