SGS Thomson Microelectronics 74ACT00 Datasheet

74ACT00
QUAD 2-INPUT NAND GATE
HIGH SPEED: t
=4µA (MAX.)at TA=25oC
I
CC
COMPATIBLEWITH TTL OUTPUTS
V
=2V(MIN),VIL= 0.8V (MAX)
IH
50TRANSMISSIONLINE DRIVING
=5 ns (TYP.)atVCC=5V
PD
CAPABILITY
SYMMETRICAL OUTPUT IMPEDANCE:
|I
|=IOL=24mA (MIN)
OH
BALANCED PROPAGATIONDELAYS:
t
t
PLH
PHL
OPERATINGVOLTAGERANGE:
V
(OPR)= 4.5V to 5.5V
CC
PIN AND FUNCTION COMPATIBLE WITH
74SERIES00
IMPROVED LATCH-UP IMMUNITY
DESCRIPTION
The ACT00 is an advanced high-speed CMOS QUAD 2-INPUT NAND GATE fabricated with sub-micron silicon gate and double-layer metal wiring C
2
MOS technology. It is ideal for low
power applications mantaining high speed
B
(Plastic Package)
(Micro Package)
M
ORDERCODES:
74ACT00B
operation similar to equivalent Bipolar Schottky TTL. The internal circuit is composed of 3 stages including buffer output, which enables high noise immunityand stable output.
The device is designed to interface directly High Speed CMOS systems with TTL, NMOS and CMOSoutput voltage levels.
All inputs and outputs are equipped with protectioncircuits against static discharge, giving them 2KV ESD immunity and transient excess voltage.
PINCONNECTION AND IEC LOGIC SYMBOLS
April 1997
1/7
74ACT00
INPUTAND OUTPUTEQUIVALENTCIRCUIT
PIN DESCRIPTION
PI N No SYM B O L NAME AN D FUNCT I ON
1, 4, 9, 12 1A to 4A Data Inputs
2, 5, 10, 13 1B to 4B Data Inputs
3, 6, 8, 11 1Y to 4Y Data Outputs
7 GND Ground (0V)
14 V
CC
Positive Supply Voltage
TRUTHTABLE
ABY
LLH
LHH HLH HHL
ABSOLUTE MAXIMUM RATINGS
Symb o l Parame t er Val u e Uni t
V
V
V
I
I
OK
I
orI
I
CC
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these condition is not implied.
Supply Voltage -0.5 to +7 V
CC
DC Input Voltage -0.5 to VCC+ 0.5 V
I
DC Output Voltage -0.5 to VCC+ 0.5 V
O
DC Input Diode Current ± 20 mA
IK
DC Output Diode Current ± 20 mA DC Output Current ± 50 mA
O
DC VCCor Ground Current ± 200 mA
GND
Storage Temperature -65 to +150
stg
Lead Temperature (10 sec) 300
L
o
C
o
C
RECOMMENDED OPERATINGCONDITIONS
Symbol Parameter Valu e Unit
V
V
V
T
dt/dv Input Rise and Fall Time V
1) VINfrom0.8V to2.0V
2/7
Supply Voltage 4.5 to 5.5 V
CC
Input Voltage 0 to V
I
Output Voltage 0 to V
O
Operating Temperature: -40to +85
op
= 4.5 to 5.5V (note 1) 8 ns/V
CC
CC CC
V V
o
C
DC SPECIFICATIONS
74ACT00
Symbol Parameter Test Condit ions Value Unit
T
V
CC
(V)
High Level Input Voltage 4.5 VO= 0.1 V or
V
IH
5.5 2.0 1.5 2.0
Low Level Input Voltage 4.5 VO= 0.1 V or
V
IL
5.5 1.5 0.8 0.8
High Level Output
V
OH
Voltage
4.5
5.5 I
4.5 I
5.5 I
Low Level Output
V
OL
Voltage
4.5
5.5 I
4.5 I
5.5 I
Input Leakage Current
I
I
Max ICC/Input 5.5 VI=VCC-2.1 V 0.6 1.5 mA
I
CCT
Quiescent Supply
I
CC
5.5
5.5 VI=VCCor GND 4 40 µA
V
- 0.1 V
CC
- 0.1 V
V
CC
IO=-50 µA 4.4 4.49 4.4
(*)
=
V
I
V
IH
V
IL
(*)
V
I
V
IH
V
IL
=-50 µA 5.4 5.49 5.4
O
or
=-24 mA 3.86 3.76
O
=-24 mA 4.86 4.76
O
IO=50 µA 0.001 0.1 0.1
=
=50 mA 0.001 0.1 0.1
O
or
=24 mA 0.36 0.44
O
=24 mA 0.36 0.44
O
VI=VCCor GND ±0.1 ±1 µA
=25oC-40to85
A
Min. Typ. Max. Min . Max.
2.0 1.5 2.0
1.5 0.8 0.8
o
C
Current Dynamic Output Current
I
OLD
OHD
(note 1, 2)
I
1) Maximum testduration 2ms, one output loaded at time
2) Incident wave switching is guaranteed on transmission lines with impedances as low as 50 . (*)All outputs loaded.
5.5 V
= 1.65 V max 75 mA
OLD
V
= 3.85 V min -75 mA
OHD
V
V
V
V
AC ELECTRICAL CHARACTERISTICS (CL= 50 pF, RL=500 , Inputtr=tf=3ns)
Symbol Parameter Test Cond itio n Value Unit
t
Propagation Delay Time 5.0
PLH
t
PHL
(*) Voltagerangeis5V± 0.5V
V
(V)
CC
(*)
T
=25oC-40to85
A
Min. Typ. Max. Min . Max.
1.5 5.0 9.0 1.0 9.5 ns
o
C
CAPACITIVE CHARACTERISTICS
Symbol Parameter Test Condit ions Value Unit
=25oC-40to85
T
A
Min. Typ. Max. Min . Max.
4
Input Capacitance
C
IN
Power Dissipation
C
PD
V
CC
(V)
5.0
5.0 31 pF
Capacitance (note 1)
1) CPDis defined as the value ofthe IC’s internal equivalent capacitance which is calculated from the operating current consumption without load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I
(opr) =CPD• VCC•fIN+ICC/n (percircuit)
CC
o
C
pF
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