WITH 3 STATE OUTPUT NON INVERTING
■ HIGHSPEED:
=220MHz(TYP.)atVCC=5V
f
MAX
■ LOWPOWERDISSIPATION:
=8 µA (MAX.)at TA=25oC
I
CC
■
HIGHNOISEIMMUNITY:
V
NIH=VNIL
■ 50Ω TRANSMISSIONLINEDRIVING
CAPABILITY
■ SYMMETRICALOUTPUTIMPEDANCE:
|=IOL=24mA (MIN)
|I
OH
■
BALANCEDPROPAGATIONDELAYS:
≅ t
t
PLH
■ OPERATINGVOLTAGERANGE:
V
(OPR)= 2V to 6V
CC
■ PINANDFUNCTION COMPATIBLEWITH
74SERIES 574
■
IMPROVEDLATCH-UPIMMUNITY
DESCRIPTION
The AC574 is an advanced high-speed CMOS
OCTAL D-TYPE FLIP FLOP with 3 STATE
OUTPUT NON INVERTING fabricated with
sub-micron silicon gate and double-layer metal
wiringC
These 8 bit D-Type flip-flops are controlled by a
clockinput (CK)and anoutput enableinput (OE).
On the positive transition of the clock, the Q
=28%VCC(MIN.)
PHL
2
MOStechnology.
74AC574
OCTAL D-TYPE FLIP FLOP
DIP
ORDER CODES
PACKAGE TUBE T & R
DIP M74AC574B
SOP M74AC574M M74AC574MTR
TSSOP M74AC574TTR
outputs will be set to logic state that were setup
at the D inputs.
While the (OE) input is low, the 8 outputs will be
in a normal logic state (high or low logic level)
and while high level the outputs will be in a high
impedancestate.
The output control does not affect the internal
operation of flip flop; that is, the old data can be
retained or the new data can be entered even
whilethe outputsare off.
All inputs and outputs are equipped with
protection circuits against static discharge, giving
them 2KV ESD immunity and transient excess
voltage.
SOP
TSSOP
PIN CONNECTION AND IEC LOGICSYMBOLS
February 2000
1/11
74AC574
INPUT AND OUTPUT EQUIVALENTCIRCUIT PIN DESCRIPTION
PI N No SYMB OL NAME AND F U NCTI ON
1 OE 3 State Output Enable
2, 3, 4,
5, 6, 7,
8, 9
12, 13, 14,
15, 16, 17,
18, 19
11 CLOCK Clock Input (LOW to
10 GND Ground (0V)
20 V
TRUTH TABLE
INPUTS OUTPUTS
OE CK D Q
HXXZ
L X NO CHANGE
LLL
LHH
D0 to D7 Data Inputs
Q0 to Q7 3 State Outputs
CC
Input (Active LOW)
HIGH, edge triggered)
Positive Supply Voltage
LOGICDIAGRAM
2/11
74AC574
ABSOLUTE MAXIMUM RATINGS
Symb o l Parameter Val u e Uni t
V
V
V
I
I
OK
I
or I
I
CC
T
T
AbsoluteMaximumRatingsarethosevalues beyond whichdamage tothedevicemayoccur. Functionaloperationunderthesecondition isnotimplied.
RECOMMENDEDOPERATINGCONDITIONS
Symb o l Parameter Value Un it
V
V
V
T
dt/dv Input Rise and Fall Time V
1)VINfrom30%to70%ofV
Supply Voltage -0.5 to +7 V
CC
DC Input Voltage -0.5 to VCC+ 0.5 V
I
DC Output Voltage -0.5 to VCC+ 0.5 V
O
DC Input Diode Current ± 20 mA
IK
DC Output Diode Current ± 20 mA
DC Output Current
O
DC VCCor Ground Current
GND
Storage Temperature -65 to +150
stg
Lead Temperature (10 sec) 300
L
Supply Voltage 2 to 6 V
CC
Input Voltage 0 to V
I
Output Voltage 0 to V
O
Operating Temperature: -40 to +85
op
= 3.0, 4.5 or 5.5 V(note 1) 8 ns/V
CC
CC
50 mA
±
400 mA
±
CC
CC
o
C
o
C
V
V
o
C
3/11
74AC574
DC SPECIFICATIONS
Symbol Parameter Test Conditions Value Unit
T
V
CC
(V)
High Level Input Voltage 3.0 VO= 0.1 V or
V
IH
4.5 3.15 2.25 3.15
-0.1 V
V
CC
5.5 3.85 2.75 3.85
Low Level Input Voltage 3.0 VO= 0.1 V or
V
IL
4.5 2.25 1.35 1.35
V
-0.1 V
CC
5.5 2.75 1.65 1.65
High Level Output
V
OH
Voltage
Low Level Output
V
OL
Voltage
Input Leakage Current 5.5 VI=VCCor GND ±0.1 ±1 µA
I
I
3-State Output Off-state
I
OZ
Current
I
Quiescent Supply
CC
3.0
4.5 I
5.5 I
V
V
3.0 I
4.5 I
5.5 I
3.0
4.5 I
5.5 I
V
V
3.0 I
4.5 I
5.5 I
IO=-50 µA 2.9 2.99 2.9
(*)
I
IH
V
IL
=-50 µA 4.4 4.49 4.4
O
=
=-50 µA 5.4 5.49 5.4
or
O
=-12 mA 2.56 2.46
O
=-24 mA 3.86 3.76
O
=-24 mA 4.86 4.76
O
IO=50 µA 0.002 0.1 0.1
(*)
I
IH
V
IL
=50 µA 0.001 0.1 0.1
O
=
=50µA 0.001 0.1 0.1
or
O
=12 mA 0.36 0.44
O
=24 mA 0.36 0.44
O
=24 mA 0.36 0.44
O
5.5 VI=VCCor GND
V
O=VCC
V
I(OE)=VIH
or GND
5.5 VI=VCCor GND 8 80 µA
Current
Dynamic Output Current
I
OLD
OHD
(note 1, 2)
I
1) Maximum test duration 2ms,one output loaded at time
2)Incidentwave switchingis guaranteedon transmission lines withimpedances aslowas50 Ω.
(*)All outputs loaded.
5.5 V
= 1.65 V max 75 mA
OLD
V
= 3.85 V min -75 mA
OHD
=25oC -40 to 85oC
A
Min. Typ. Max. Min. Max.
2.1 1.5 2.1
1.5 0.9 0.9
0.5
±
5
±
µ
V
V
V
V
A
4/11