Semelab Plc IRF430 Datasheet

IRF430
Prelim. 6/00
Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: sales@semelab.co.uk
Website: http://www.semelab.co.uk
V
GS
Gate – Source Voltage
I
D
Continuous Drain Current (VGS= 0 , T
case
= 25°C)
I
D
Continuous Drain Current (VGS= 0 , T
case
= 100°C)
I
DM
Pulsed Drain Current
1
P
D
Power Dissipation @ T
case
= 25°C
Linear Derating Factor
E
AS
Single Pulse Avalanche Energy
2
I
AR
Avalanche Current
2
dv/dt Peak Diode Recovery
3
TJ, T
stg
Operating and Storage Temperature Range
T
L
Lead Temperature 1.6mm (0.63”) from case for 10 sec.
±20V
4.5A 3A
18A
75W
0.6W/°C
1.1mJ
4.5A
3.5V/ns
-55 to +150°C 300°C
MECHANICAL DATA
Dimensions in mm (inches)
N–CHANNEL
POWER MOSFET
ABSOLUTE MAXIMUM RATINGS (T
case
= 25°C unless otherwise stated)
FEATURES
• HERMETICALLY SEALED TO–3 METAL PACKAGE
• SIMPLE DRIVE REQUIREMENTS
• SCREENING OPTIONS AVAILABLE
TO–3 Metal Package
Pin 1 – Gate Pin 2 – Source Case – Drain
Notes
1) Pulse Test: Pulse Width £300ms, 2%
2) @ V
DD
= 50V , L ³100mH , RG= 25W, Peak IL= 4.5A , Starting TJ= 25°C
3) @ ISD£
4.5A , di/dt £75A/ms , VDD£
BV
DSS
, TJ£
150°C , Suggested RG= 7.5
W
V
DSS
500V
I
D(cont)
4.5A
R
DS(on)
1.5
WW
WW
40.01 (1.575) Max.
22.23 (0.875) Max.
30.40 (1.197)
29.90 (1.177)
11.18 (0.440)
10.67 (0.420)
2
1
26.67
(1.050)
Max.
2 Pls.
11.43 (0.450)
16.97 (0.668)
16.87 (0.664)
IRF430
Prelim. 6/00
Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: sales@semelab.co.uk
Website: http://www.semelab.co.uk
Parameter Test Conditions Min. Typ. Max. Unit
500
0.78
1.5
1.8
24
2.7 25
250 100
–100
610 135
65
16 40
26 820
30 40 80 30
4.5 18
1.4
900
7
Negligible
5.0 13
1.67
0.12 30
VGS= 0 ID= 1mA Reference to 25°C ID= 1mA VGS= 10V ID= 3A VGS= 10V ID= 4.5A VDS= V
GS
ID= 250mA
VDS³
15V IDS= 3A
VGS= 0 VDS= 0.8BV
DSS
TJ= 125°C VGS= 20V VGS= –20V
VGS= 0 VDS= 25V f = 1MHz VGS= 10V ID= 4.5A VDS= 0.5BV
DSS
VDD= 250V ID= 4.5A R
G
= 7.5
W
IS= 4.5A TJ= 25°C VGS= 0 IF= 4.5A TJ= 25°C di/ dt£
100A/msVDD£
50V
ELECTRICAL CHARACTERISTICS (T
case
= 25°C unless otherwise stated)
Drain – Source Breakdown Voltage Temperature Coefficient of Breakdown Voltage Static Drain – Source On–State Resistance
1
Gate Threshold Voltage Forward Transconductance
1
Zero Gate Voltage Drain Current Forward Gate
– Source Leakage
Reverse Gate
– Source Leakage
Input Capacitance Output Capacitance Reverse Transfer Capacitance Total Gate Charge Gate – Source Charge Gate – Drain (“Miller”) Charge Turn–On Delay Time Rise Time Turn–Off Delay Time Fall Time
Continuous Source Current Pulse Source Current
2
Diode Forward Voltage
1
Reverse Recovery Time Reverse Recovery Charge
1
Forward Turn–On Time
V
V/°C
W
V
S (É)
m
A
nA
pF
nC
ns
A
V
ns
m
C
nH
°C/W
BV
DSS
D
BV
DSS
D
T
J
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
I
GSS
C
iss
C
oss
C
rss
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
L
D
L
S
R
q
JC
R
q
CS
R
q
JA
STATIC ELECTRICAL RATINGS
Notes
1) Pulse Test: Pulse Width £300ms, 2%
2) Repetitive Rating – Pulse width limited by maximum junction temperature.
DYNAMIC CHARACTERISTICS
SOURCE – DRAIN DIODE CHARACTERISTICS
Internal Drain Inductance
(measured from 6mm down drain lead to centre of die)
Internal Source Inductance (from 6mm down source lead to source bond pad)
Thermal Resistance Junction – Case Thermal Resistance Case – Sink Thermal Resistance Junction – Ambient
PACKAGE CHARACTERISTICS
THERMAL CHARACTERISTICS
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