IRF150SMD
Prelim. 7/00
LAB
SEME
Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: sales@semelab.co.uk
Website: http://www.semelab.co.uk
Parameter Test Conditions Min. Typ. Max. Unit
VGS= 0 ID= 1mA
Reference to 25°C
ID= 1mA
VGS= 10V ID= 19A
VGS= 10V ID= 27A
VDS= V
GS
ID= 250mA
VDS³
15V IDS= 19A
VGS= 0 VDS= 0.8BV
DSS
TJ= 125°C
VGS= 20V
VGS= –20V
VGS= 0
VDS= 25V
f = 1MHz
VGS= 10V ID= 27A
VDS= 0.5BV
DSS
ID= 27A
VDS= 0.5BV
DSS
VDD= 50V
I
D
= 27A
RG= 2.35
W
IS= 27A TJ= 25°C
V
GS
= 0
I
F
= 27A TJ= 25°C
di/ dt£
100A/msVDD£
50V
ELECTRICAL CHARACTERISTICS (T
amb
= 25°C unless otherwise stated)
Drain – Source Breakdown Voltage
Temperature Coefficient of
Breakdown Voltage
Static Drain – Source On–State
Resistance
1
Gate Threshold Voltage
Forward Transconductance
1
Zero Gate Voltage Drain Current
Forward Gate
– Source Leakage
Reverse Gate
– Source Leakage
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Total Gate Charge
1
Gate – Source Charge
1
Gate – Drain (“Miller”) Charge
1
Turn–On Delay Time
Rise Time
Turn–Off Delay Time
Fall Time
Continuous Source Current
Pulse Source Current
2
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
Forward Turn–On Time
100
0.13
0.070
0.081
24
9
25
250
100
–100
3700
1100
200
50 125
822
15 65
35
190
170
130
27
108
1.8
500
2.9
Negligible
0.8
2.8
V
V/°C
W
V
S(
W
m
A
nA
pF
nC
nC
ns
A
V
ns
m
C
nH
BV
DSS
D
BV
DSS
D
T
J
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
I
GSS
C
iss
C
oss
C
rss
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
L
D
L
S
STATIC ELECTRICAL RATINGS
Notes
1) Pulse Test: Pulse Width £300ms, d£2%
2) Repetitive Rating – Pulse width limited by maximum junction temperature.
DYNAMIC CHARACTERISTICS
SOURCE – DRAIN DIODE CHARACTERISTICS
Internal Drain Inductance
(from centre of drain pad to die)
Internal Source Inductance (from centre of source pad to end of source bond wire)
PACKAGE CHARACTERISTICS
(W)