IRF044SMD
Prelim. 7/00
LAB
SEME
Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: sales@semelab.co.uk
Website: http://www.semelab.co.uk
Parameter Test Conditions Min. Typ. Max. Unit
VGS= 0 ID= 1mA
Reference to 25°C
ID= 1mA
VGS= 10V ID= 21A
VGS= 10V ID= 34A
VDS= V
GS
ID= 250mA
VDS³
15V IDS= 21A
VGS= 0 VDS= 0.8BV
DSS
TJ= 125°C
VGS= 20V
VGS= –20V
VGS= 0
VDS= 25V
f = 1MHz
VGS= 10V ID= 34A
VDS= 0.5BV
DSS
ID= 34A
VDS= 0.5BV
DSS
VDD= 30V
I
D
= 34A
RG= 9.1
W
IS= 34A TJ= 25°C
V
GS
= 0
I
F
= 34A TJ= 25°C
di/ dt£
100A/msVDD£
50V
ELECTRICAL CHARACTERISTICS (T
amb
= 25°C unless otherwise stated)
Drain – Source Breakdown Voltage
Temperature Coefficient of
Breakdown Voltage
Static Drain – Source On–State
Resistance
1
Gate Threshold Voltage
Forward Transconductance
1
Zero Gate Voltage Drain Current
Forward Gate
– Source Leakage
Reverse Gate
– Source Leakage
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Total Gate Charge
1
Gate – Source Charge
1
Gate – Drain (“Miller”) Charge
1
Turn–On Delay Time
Rise Time
Turn–Off Delay Time
Fall Time
Continuous Source Current
Pulse Source Current
2
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
Forward Turn–On Time
60
0.68
0.040
0.050
24
17
25
250
100
–100
2400
1100
230
39 88
6.7 15
18 52
23
130
81
79
34
136
2.5
220
1.6
Negligible
0.8
2.8
V
V/°C
W
V
S(
W
m
A
nA
pF
nC
nC
ns
A
V
ns
m
C
nH
BV
DSS
D
BV
DSS
D
T
J
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
I
GSS
C
iss
C
oss
C
rss
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
L
D
L
S
STATIC ELECTRICAL RATINGS
Notes
1) Pulse Test: Pulse Width £300ms, d£2%
2) Repetitive Rating – Pulse width limited by maximum junction temperature.
DYNAMIC CHARACTERISTICS
SOURCE – DRAIN DIODE CHARACTERISTICS
Internal Drain Inductance
(from centre of drain pad to die)
Internal Source Inductance (from centre of source pad to end of source bond wire)
PACKAGE CHARACTERISTICS
(W)