Seme D2006UK Datasheet

MECHANICAL DATA
TetraFET
D2006UK
METAL GATE RF SILICON FET
GOLD METALLISED
MULTI-PURPOSE SILICON
B
(
2 pls
PIN 1 SOURCE (COMMON) PIN 3 DRAIN 2 PIN 5 GATE 1
DIM mm Tol. Inches Tol.
A 6.45 0.13 0.254 0.005 B 1.65R 0.13 0.065R 0.005 C 45° 45° 5° D 16.51 0.76 0.650 0.03 E 6.47 0.13 0.255 0.005 F 18.41 0.13 0.725 0.005 G 1.52 0.13 0.060 0.005 H 4.82 0.25 0.190 0.010
I 24.76 0.13 0.975 0.005
J 1.52 0.13 0.060 0.005 K 0.81R 0.13 0.032R 0.005 M 0.13 0.02 0.005 0.001 N 2.16 0.13 0.085 0.005
C
)
1
E
JIH
A
3
2
5
4
G (4 pls
F
DK
PIN 2 DRAIN 1 PIN 4 GATE 2
K
)
DMOS RF FET
D
15W – 28V – 1GHz
PUSH–PULL
FEATURES
• SIMPLIFIED AMPLIFIER DESIGN
M
N
• SUITABLE FOR BROAD BAND APPLICATIONS
• VERY LOW C
rss
• SIMPLE BIAS CIRCUITS
• LOW NOISE
• HIGH GAIN – 13 dB MINIMUM
APPLICATIONS
HF/VHF/UHF COMMUNICATIONS
from DC to 2 GHz
ABSOLUTE MAXIMUM RATINGS (T
P
D
BV BV I
D(sat)
T
stg
T
j
DSS GSS
Power Dissipation Drain – Source Breakdown Voltage * Gate – Source Breakdown Voltage * Drain Current * Storage Temperature Maximum Operating Junction Temperature
= 25°C unless otherwise stated)
case
* Per Side
Semelab plc. Telephone (01455) 556565. Telex: 341927. Fax (01455) 552612.
70W
65V
±20V
3A
–65 to 150°C
200°C
Prelim. 1/96
D2006UK
ELECTRICAL CHARACTERISTICS (T
Parameter Test Conditions Min. Typ. Max. Unit
BV
I
DSS
I
GSS
V
GS(th)
g
fs
G
PS
η Drain Efficiency VSWR Load Mismatch Tolerance
C
iss
C
oss
C
rss
Drain–Source
DSS
Breakdown Voltage Zero Gate Voltage Drain Current Gate Leakage Current Gate Threshold Voltage * Forward Transconductance *
Common Source Power Gain
Input Capacitance Output Capacitance Reverse Transfer Capacitance
VDS= 0 VGS= –5V f = 1MHz VDS= 28V VGS= 0 f = 1MHz VDS= 28V VGS= 0 f = 1MHz
= 25°C unless otherwise stated)
case
PER SIDE
VGS= 0 ID= 10mA
VDS= 28V VGS= 0 VGS= 20V VDS= 0
ID= 10mA VDS= V VDS= 10V ID= 0.6A
GS
TOTAL DEVICE
PO= 15W VDS= 28V IDQ= 0.6A f = 1GHz
PER SIDE
65
0.6 1
17
0.54
13 40
20:1
36 18
1.5
V
mA
µA
V S
dB
% —
pF pF pF
* Pulse Test: Pulse Duration = 300 µs , Duty Cycle 2%
HAZARDOUS MATERIAL WARNING
The ceramic portion of the device between leads and metal flange is beryllium oxide. Beryllium oxide dust is highly toxic and care must be taken during handling and mounting to avoid damage to this area.
THESE DEVICES MUST NEVER BE THROWN AWAY WITH GENERAL INDUSTRIAL OR DOMESTIC WASTE.
THERMAL DATA
R
THj–case
Thermal Resistance Junction – Case Max. 2.5°C / W
Semelab plc. Telephone (01455) 556565. Telex: 341927. Fax (01455) 552612.
Prelim. 1/96
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