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Prelim. 9/00
LAB
SEME
2N6849
Parameter Test Conditions Min. Typ. Max. Unit
V
W
V
nA
m
A
V
(S É )
pF
nC
ns
A
V
ns
m
C
—
-100
0.30*
-2 -4
-100
100
-250
-1000
- 2.1
2.5 3.5 7.5
500
300
100
25 45
13 23
12 22
30 60
70 140
70 140
70 140
-6.5
-25
4
250
1.8
negligible
VGS= 0 ID= 250mA
VGS= -10V ID= - 4.1A
VDS= V
GS
ID= - 0.25mA
VGS= - 20V
VGS= 20V
VDS= Max rating x 0.8
VGS= 0V TC= -125°C
V
DS
³
I
D(on)RDS(on)max.
VGS= -10V ID= - 6.5A
VDS= -5V ID= - 4.1A
VGS= 0V VDS= - 25V
f = 1.0 MHz
VGS= -15V ID= - 15A
VDS= 08v Max Rating
VDD= - 42V ID= - 4.1A
Zo = 50
W
Modified MOSFETSymbol
showing the integralreverse
P-N Junction rectifier.
VGS= 0 IS= 6.5A TJ= 25°C
I
F
= - 6.5A TJ= 25°C
di
F
/dt = 100 A/ms
ELECTRICAL CHARACTERISTICS (T
case
= 25°C unless otherwise stated)
Drain – Source Breakdown Voltage*
Static Drain – Source On–State
Resistance
1
Gate Threshold Voltage*
Forward Gate
– Source Leakage
Reverse Gate
– Source Leakage
Zero Gate Voltage Drain Current*
On-State Drain Voltage
1
Forward Transconductance
1
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Total Gate Charge
Gate – Source Charge
Gate – Drain (“Miller”) Charge
Turn–On Delay Time
Rise Time
Turn–Off Delay Time
Fall Time
Continous Source Current*
Pulse Source Current |(Body Diode)
2
Diode Forward Voltage
1
Reverse Recovery Time
Reverse Recovery Charge
Forward Turn–On Time
BV
DSS
R
DS(on)
V
GS(th)
I
GSS
I
GSS
I
DSS
V
DS(on)
g
fs
C
iss
C
oss
C
rss
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
STATIC ELECTRICAL RATINGS
SOURCE – DRAIN DIODE CHARACTERISTICS
*JEDEC Registered Value
1 Pulse Test: Pulse Width £300ms, duty cycle £2%
2 Repetitive Rating: Pulse width limited by max. junction temperature
3 V
DD
= 25V starting Tj= 25.°C, L=17.25mH, R
G =
25
W,
Peak IL= 6.5A