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Seagate FireCuda 530 SSD Product Manual, Rev B 5
www.seagate.com
1. Introduction
The Seagate® FireCuda® 530 SSD is a versatile NVMe SSD with PCIe Gen4 x4 interface. It is up to 12x faster than SATA
SSDs and delivers Ultra-fast performance and enhanced endurance for long term use.
Table 1 The FireCuda 530 SSD Features
FeatureDescription
Capacity
(User)
Certifications,
Eco-Compliance
Dimensions
Form Factor
Weight
Endurance
Interface
Compliance
500 GB, 1000 GB, 2000 GB, 4000 GB
CE, UL, FCC, BSMI, KCC, Microsoft WHQL, VCCI, CB
RoHS
500 GB, 1000 GB
Length, Max 80.15 mm
Width, Max 22.15 mm
Height, Max 2.23 mm
2000 GB, 4000 GB
Length, Max 80.15 mm
Width, Max 22.15 mm
Height, Max 3.58 mm
With heatsink
Length, Max 80.15 mm
Width, Max 24.20 mm
Height, Max 10.74 mm
M2 2280-S2-M
M2 2280-D2-M
500 GB: 7.7 g
1000 GB: 8.1 g
2000 GB: 10.0 g
4000 GB: 10.6 g
With heatsink
47 g
Total Bytes Written
500 GB: 640 TB
1000 GB: 1275 TB
2000 GB: 2550 TB
4000 GB: 5100 TB
NVMe 1.4
PCI Express Base 4.0, PCIe Gen 4 x 4 lane, and backward compatible to PCIe Gen3, Gen 2, and Gen 1
See Section 2.5, Reliability/Endurance.
NAND
Operating
Systems
Performance
Random
TLC
Windows 10 (64 bit)
Ubuntu 16.04, 18.04
CentOS 6, 7
Read: Up to 1,000,000 IOPS
Write: Up to 1,000,000 IOPS
Actual performance might vary depending on
use conditions and environment.
See Section 2.2, Performance.
Seagate FireCuda 530 SSD Product Manual, Rev B6
www.seagate.com
Table 1 The FireCuda 530 SSD Features (continued)
Performance
Sequential
Power
Consumption
Power
Management
Reliability
Shock and
Vibration
Temperature
Range
Volta ge
Warran ty
FeatureDescription
Read: Up to 7300MB/s
Write: Up to 6900MB/s
Actual performance might vary depending on
the capacity, use conditions and environment.
Sequential Read/Write is measured while testing 1000 MB five times by
CrystalDiskMark.
2.3Power Consumption
Table 4 Power Consumption
Power Consumption
Capacity
Max Avg
Read
(W)
Max Avg
Write
(W)
Idle PS3
(mW)
L1.2
(mW)
500 GB6.05.94.54.5
1000 GB6.16.16.16.1
2000 GB7.67.67.97.8
4000 GB7.97.98.27.5
NOTEAbout power consumption:
The average value of power consumption is based on 100% conversion
efficiency.
Based on SU6SExxx-series under ambient temperature.
Use CrystalDiskMark 7.0.0, 1GB range, QD=8, Thread=1. Measuring power
consumption during sequential Read and sequential Write.
The measured power voltage is 3.3 V.
Measured under ambient temperature.
Power Consumption can differ with flash configuration and platform.
Power consumption during read and write operation is measured on
Gen4 X570 + 6 Core CPU.
Seagate FireCuda 530 SSD Product Manual, Rev B9
www.seagate.com
2.4Environmental Conditions
Table 5 Temperature, Humidity, Shock
SpecificationValue
Temperature
Operating (case temperature at specific airflow)
Non-operating
Humidity
Operating
Non-operating (storage)
Shock
Non-operating
Vibration
Non-operating
NOTETemperature is measured without condensation. Operating mode
temperature is measured by temperature sensor, SMART Attribute.
Airflow is suggested. Airflow allows the device to be operated at the
appropriate temperature for each component during heavy workloads
environments.
0°C to 70°C
-40°C to 85°C
1,500 G, duration 0.5 ms
1.52 G
(20Hz to 80Hz, Frequency)
RMS,
90%
93%
Shock and vibration results assume that the SSD is mounted securely with
the input vibration applied to the SSD mounting. These specifications do not
cover connection issues that may result from testing at this level. The
measured specification is in root mean square (RMS) form.
Non-operating Shock. The limits of non-operating shock applies to all
conditions of handling and transportation. This includes both isolated
SSD and integrated SSDs. Shock may be applied in the X, Y, or Z-axis.
Non-Operating Vibration. The limits of non-operating vibration shall
apply to all conditions of handling and transportation. This includes both
isolated SSD and integrated SSDs. Vibration may be applied in the X, Y, or
Z-axis.
Seagate FireCuda 530 SSD Product Manual, Rev B10
www.seagate.com
2.5Reliability/Endurance
Table 6 Reliability/Endurance
SpecificationValue
Mean time between failures (MTBF)1.9 million hours
Bit Error Rate
EnduranceTotal Bytes Written
NOTEAbout endurance:
The SSD achieves the specified MTBF in an operational environment that
complies with the operational temperature range specified in this manual.
Operating temperatures are measured by temperature sensor.
Endurance rating valid for SSD Life Remaining > 1%.
1 error in 10
500 GB: 640 TB
1000 GB: 1275 TB
2000 GB: 2550 TB
4000 GB: 5100 TB
16
bits read
Seagate FireCuda 530 SSD Product Manual, Rev B11
www.seagate.com
3. Mechanical Dimensions and Drawings
This section includes, weight, dimensions, and mechanical drawings.
PCIe TX Differential signal defined by the PCI Express M.2 spec
No connect
PCIe TX Differential signal defined by the PCI Express M.2 spec
No connect
Ground
Open drain, active low signal. These signals are used to allow the add- in card to provide status
indicators via LED devices that will be provided by the system.
11PERn3
123.3V
13PERp3
143.3V
15GND
163.3V
17PETn2
183.3V
19PETp2
20N/C
21GND
22N/C
23PERn2
24N/C
25PERp2
26N/C
27GND
28N/C
29PETn1
30N/C
PCIe RX Differential signal defined by the PCI Express M.2 spec
3.3V source
PCIe RX Differential signal defined by the PCI Express M.2 spec
3.3V source
Ground
3.3V source
PCIe TX Differential signal defined by the PCI Express M.2 spec
3.3V source
PCIe TX Differential signal defined by the PCI Express M.2 spec
No connect
Ground
No connect
PCIe RX Differential signal defined by the PCI Express M.2 spec
No connect
PCIe RX Differential signal defined by the PCI Express M.2 spec
No connect
Ground
No connect
PCIe TX Differential signal defined by the PCI Express M.2 spec
No connect
Seagate FireCuda 530 SSD Product Manual, Rev B16
www.seagate.com
Table 9 Pin Descriptions (continued)
Pin No.PCIe PinDescription
31PETp1
32N/C
33GND
34N/C
35PERn1
36N/C
37PERp1
38N/C
39GND
40SMB_CLK (I/O)(0/1.8V)
41PETn0
42SMB_DATA (I/O)(0/1.8V)
43PETp0
44ALERT#(O) (0/1.8V)
PCIe TX Differential signal defined by the PCI Express M.2 spec
No connect
Ground
No connect
PCIe RX Differential signal defined by the PCI Express M.2 spec
No connect
PCIe RX Differential signal defined by the PCI Express M.2 spec
No connect
Ground
SMBus Clock; Open Drain with pull-up on platform
PCIe TX Differential signal defined by the PCI Express M.2 spec
SMBus Data; Open Drain with pull-up on platform.
PCIe TX Differential signal defined by the PCI Express M.2 spec
Alert notification to master; Open Drain with pull-up on platform;
Active low.
45GND
46N/C
47PERn0
48N/C
49PERp0
50PERST#(I)(0/3.3V)
51GND
52CLKREQ#(I/O)(0/3.3V)
53REFCLKn
54PEWAKE#(I/O)(0/3.3V )
55REFCLKp
56Reserved for MFG DATA
Ground
No connect
PCIe RX Differential signal defined by the PCI Express M.2 spec
No connect
PCIe RX Differential signal defined by the PCI Express M.2 spec
PE-Reset is a functional reset to the card as defined by the PCIe Mini
CEM specification.
Ground
Clock Request is a reference clock request signal as defined by the
PCIe Mini CEM specification; Also used by L1 PM Sub-states.
PCIe Reference Clock signals (100 MHz)
defined by the PCI Express M.2 spec.
PCIe PME Wake.
Open Drain with pull up on platform; Active Low.
PCIe Reference Clock signals (100 MHz)
defined by the PCI Express M.2 spec.
Manufacturing Data line. Used for SSD manufacturing only.
Not used in normal operation.
Pins should be left N/C in platform Socket.
Seagate FireCuda 530 SSD Product Manual, Rev B17
www.seagate.com
Table 9 Pin Descriptions (continued)
Pin No.PCIe PinDescription
57GND
Ground
58Reserved for MFG
CLOCK
59Module Key M
60Module Key M
61Module Key M
62Module Key M
63Module Key M
64Module Key M
65Module Key M
66Module Key M
67N/C
68
69N/C
703.3V
71GND
723.3V
73GND
743.3V
75GND
SUSCLK(32KHz)
(I)(0/3.3V)
Manufacturing Clock line. Used for SSD manufacturing only.
Not used in normal operation.
Pins should be left N/C in platform Socket.
Module Key
No connect
32.768 kHz clock supply input that is provided by the platform chipset to reduce power and cost
for the module.
PEDET (NC-PCIe)
3.3V source
Ground
3.3V source
Ground
3.3V source
Ground
Seagate FireCuda 530 SSD Product Manual, Rev B18
www.seagate.com
5. NVMe Commands
Table 10 Admin Commands
IdentifierO/MCommand DescriptionSupported
00hMDelete I/O Submission QueueSupported
01hMCreate I/O Submission QueueSupported
02hMGet Log PageSupported
04hMDelete I/O Completion QueueSupported
05hMCreate I/O Completion QueueSupported
06hMIdentifySupported
08hMAbortSupported
09hMSet FeatureSupported
0AhMGet FeatureSupported
0ChMAsynchronous Event RequestSupported
10hOFirmware CommitSupported
11hOFirmware Image DownloadSupported
14hODevice Self-testSupported
80hOFormat NVMSupported
81hOSecurity SendSupported
82hOSecurity ReceiveSupported
84hOSanitizeSupported
Table 11 I/O Commands
IdentifierO/MCommand DescriptionSupported
00hOFlushSupported
01hOWriteSupported
02hOReadSupported
04hOWrite UncorrectableNot Supported
05hOCompareSupported
08hOWrite ZeroesSupported
09hODataset ManagementSupported
Table 12 Set Feature Commands
IdentifierO/MCommand DescriptionSupported
00hReserved
01hMArbitrationSupported
02hMPower ManagementSupported
03hOLBA Range TypeNot Supported
04hMTemperature ThresholdSupported
Seagate FireCuda 530 SSD Product Manual, Rev B19
www.seagate.com
Table 12 Set Feature Commands
05hMError RecoverySupported
06hOVolatile Write CacheSupported
07hMNumber Of QueuesSupported
08hMInterrupt CoalescingSupported
09hMInterrupt Vector ConfigurationSupported
0AhMWrite Atomicity NormalSupported
0BhMAsynchronous Event ConfigurationSupported
0ChOAutonomous Power State TransitionSupported
0DhOHost Memory BufferNot Supported
0EhOTimestampSupported
10hOHost Controlled Thermal ManagementSupported
11hONon-Operational Power State ConfigSupported
0Eh - 7DhReserved
80hOSoftware Progress MarkerSupported
Table 13 Get Log Page Commands
IdentifierO/MCommand DescriptionSupported
00hReserved
01hMError InformationSupported
02hMSMART / Health InformationSupported
03hMFirmware Slot InformationSupported
04hOChanged Namespace ListSupported
06hODevice Self-testSupported
09h - 7FhReserved
81hOSanitize StatusSupported
82h - FFhReserved
Seagate FireCuda 530 SSD Product Manual, Rev B20
www.seagate.com
6. SMART Support
The FireCuda 530 SSD supports the SMART command set.
6.1SMART Attributes
The following table lists SMART Attributes and Descriptions.
Table 14 SMART Attributes (Log Identifier 02h)
Bytes IndexBytesDescription
[0]1
[2:1]2
[3]1
[4]1
[5]1
[31:6]26
[47:32]16
[63:48]16
[79:64]16
[95:80]16
[111:96]16
[127:112]16
[143:128]16
[159:144]16
[175:160]16
[191:176]16
[195:192]4
[199:196]4
[201:200]2
[203:202] 2Temperature Sensor 2 (N/A)
[205:204]2Temperature Sensor 3 (N/A)
[207:206] 2Temperature Sensor 4 (N/A)
[209:208] 2Temperature Sensor 5 (N/A)
[211:210]2Temperature Sensor 6 (N/A)
[213:212] 2Temperature Sensor 7 (N/A)
[215:214]2Temperature Sensor 8 (N/A)
[511:216] 296Reserved
Critical Warning
Composite Temperature
Available Spare
Available Spare Threshold
Percentage Used
Reserved
Data Units Read
Data Units Written
Host Read Commands
Host Write Commands
Controller Busy Time
Power Cycles
Power On Hours
Unsafe Shutdowns
Media and Data Integrity Errors
Number of Error Information Log Entries
Warning Composite Temperature Time
Critical Composite Temperature Time
Temperature Sensor 1 (Current Temperature)
Seagate FireCuda 530 SSD Product Manual, Rev B21
www.seagate.com
NOTESFor (Log Identifier 02h:
"Critical Warning [Byte 0]"
This field indicates critical warnings for the state of the controller.
•Bit#0: Available spare is below threshold
•Bit#1: Temperature exceeded threshold or below an under temperature threshold
•Bit#2: Reliability is degraded due to excessive media or internal errors
consumed VB caused by early, later bad)/ total reserved VB]
"Percentage Used [Byte 5]"
Value (percentage) = 100* (total VB erase count/ PE cycle for total VB)
Seagate FireCuda 530 SSD Product Manual, Rev B22
www.seagate.com
Table 15 SMART Attributes (Log Identifier C0h)
Bytes IndexBytesDescription
[7:0]8Device Capacity
[15:8]8User Capacity
[23:16]8NAND Read
[31:24]8NAND Write
[39:32]8NAND Erase Sector
[47:40]8SSD Life Remaining Percent D3
[55:48]8SSD Life Used Percent D3
[56]1WP Water Mark
[58:57]2Highest temperature
[62:59]4Flash UNC Error Count
[67:63]5Data E3D Error
[70:67]4PHY Error Count
[74:71]4Total Bad Block Count
[78:75]4Total Early Bad Block Count
[82:79]4Total Later Bad Block Count
[86:83]4Read Fail Count
[90:87]4Program Fail Count
[94:91]4Erase Failure Count
[102:95]8System Table Copy Count
[110:103]8Read Move Table Count
[114:111]4Data read retry count
[118:115]4RAID ECC retry count
[122:119]4RAID ECC failed count
[130:123]8Total Erase Count
[134:131]4Max Erase Count
[138:135]4Average Erase Count
[142:139]4Min Erase Count
[150:143]8Background read count
[154:151]4Host Write Uncorrectable Sector Count
[158:155]4PS3 Enter Success
[162:159]4PS4 Enter Success
[166:163]4Wear Leveling Count
[167]1Chip internal temperature
[169:168]2Thermal throttling
[171:170]2Thermal throttling time
[179:172]8FW Code Update Count
[511:181]331RSV
Seagate FireCuda 530 SSD Product Manual, Rev B23
www.seagate.com
NOTESFor Log Identifier C0h:
"SSD Life Remaining Percent D3 [Byte 47:40]"
•Value (percentage) = 100 *[1 - (Average of the Flash's block erase count / NAND EOL
erase count)]
"SSD Life Used Percent [Byte 55:48]"
•Value (percentage) = 100 *(Average of the Flash's block erase count / NAND EOL erase
count)
Seagate FireCuda 530 SSD Product Manual, Rev B24
www.seagate.com
7. Feature Details
7.1Flash Management
7.1.1Error Correction Code (ECC)
Flash memory cells will deteriorate with use, which might generate random bit errors in the stored data. Thus,
FireCuda 530 SSD applies the fourth generation LDPC(Low Density Parity Check) of ECC algorithm, which can detect
and correct errors that occur during read process, ensure data has been read correctly, as well as protect data from
corruption.
7.1.2Wear Leveling
NAND flash devices can only undergo a limited number of program/erase cycles, and in most cases, the flash media
are not used evenly. If some areas get updated more frequently than others, the lifetime of the device would be
reduced significantly. Thus, Wear Leveling is applied to extend the lifespan of NAND Flash by evenly distributing write
and erase cycles across the media.
Seagate provides advanced Wear Leveling algorithm, which can efficiently spread out the flash usage through the
whole flash media area. Moreover, by implementing both dynamic and static Wear Leveling algorithms, the life
expectancy of the NAND flash is greatly improved.
7.1.3Bad Block Management
Bad blocks are blocks that do not function properly or contain more invalid bits causing stored data to become
unstable, and their reliability is not guaranteed. Blocks that are identified and marked as bad by the manufacturer are
referred to as “Early Bad Blocks”. Bad blocks that are developed during the lifespan of the flash are named “Later Bad
Blocks”. Seagate implements an efficient bad block management algorithm to detect the factory- produced bad
blocks and manages bad blocks that appear with use. This practice prevents data being stored into bad blocks and
further improves the data reliability.
7.1.4TRIM
TRIM is a feature which helps improve the read/write performance and speed of solid-state drives (SSD). Unlike hard
disk drives (HDD), SSDs are not able to overwrite existing data, so the available space gradually becomes smaller with
each use. With the TRIM command, the operating system can inform the SSD which blocks of data are no longer in use
and can be removed permanently. Thus, the SSD will perform the erase action, which prevents unused data from
occupying blocks all the time.
7.1.5SMART
SMART, an acronym for Self-Monitoring, Analysis and Reporting Technology, is an open standard that allows a hard
disk drive to automatically detect its health and report potential failures. When a failure is recorded by SMART, users
can choose to replace the drive to prevent unexpected outage or data loss. Moreover, SMART can inform users of
impending failures while there is still time to perform proactive actions, such as copy data to another device.
Seagate FireCuda 530 SSD Product Manual, Rev B25
www.seagate.com
7.1.6Over Provisioning
Over Provisioning refers to the inclusion of extra NAND capacity in a SSD, which is not visible and cannot be used by
users. With Over Provisioning, the performance and IOPS (Input/output Operations per Second) are improved by
providing the controller additional space to manage P/E cycles, which enhances the reliability and endurance as well.
Moreover, the write amplification of the SSD becomes lower when the controller writes data to the flash.
7.1.7Firmware Upgrade
Firmware can be considered as a set of instructions on how the device communicates with the host. Firmware will be
upgraded when new features are added, compatibility issues are fixed, or read/write performance gets improved.
7.1.8Thermal Throttling
The purpose of thermal throttling is to prevent any components in a SSD from over-heating during read and write
operations. The device is designed with an on-die and an on-board thermal sensor, and with its accuracy, firmware can
apply different levels of throttling to achieve the purpose of protection efficiently and proactively via SMART reading.
Table 16 Current version: Thermal Throttling 2.0
ItemContent
Reference of temp. readingOn-board thermal sensor, Controller on-die thermal sensor
tmt1 threshold (PE < 500)82°C per Smart reported
tmt2 threshold (PE < 500)85°C per Smart reported
tmt1 threshold (PE > 500)68°C per Smart reported
tmt2 threshold (PE > 500)70°C per Smart reported
Protect controller threshold115°C from on-die thermal sensor
Fatal threshold120°C from on-die thermal sensor
Resume performance threshold
(PE < 500)
Resume performance threshold
(PE > 500)
Temperature polling frequencyEvery 1 sec
TMT1_state impact±10% CE
TMT2_state impact-20% CE
78°C per Smart reported
64°C per Smart reported
NOTEFor optimal performance:
Provide sufficient airflow and cooling.
Seagate FireCuda 530 SSD Product Manual, Rev B26
www.seagate.com
7.2Advanced Device Security Features
7.2.1NVMe format
Secure Erase is a standard NVMe format command and it writes all “0xFF” to fully wipe all the data on the SSDs. When
this command is issued, the SSD controller erases its storage blocks and returns the drive to its factory default settings.
7.2.2Sanitize Operation
The Sanitize feature is an alternative to the existing secure erase capabilities through the Format NVM command and
makes a robust data security by ensuring the user data from the drive's media, caches and the Controller Memory
Buffer are all wiped by the block erase operations, overwriting or destroying the encryption key. The following table
illustrates the types of Sanitize Operations supported.
Table 17 Supported Sanitize Operations
Sanitize Operation
Drive Security Type
Overwrite Block Erase
Non-SEDYesYesNo
Crypto
Erase
NOTESanitize Overwrite command completion takes at least one hour per terabyte
per pass. The number of passes is drive-selectable. The NVMe spec default is 16
passes. Contact Seagate Support for more detailed information.
Seagate FireCuda 530 SSD Product Manual, Rev B27
www.seagate.com
7.3SSD Lifetime Management
7.3.1Total Bytes Written (TBW)
TBW (total bytes written) is a measurement of the SSDs’ expected lifespan, which represents the amount of data
written to the device. To calculate the TBW of a SSD, the following equation is applied:
TBW = [(NAND Endurance) x (SSD Capacity)] / WAF
NAND Endurance: NAND endurance refers to the P/E (Program/Erase) cycle of a NAND flash. SSD Capacity: The SSD
capacity is the specific capacity in total of a SSD.
WAF: Write Amplification Factor (WAF) is a numerical value representing the ratio between the amount of data that a
SSD controller needs to write and the amount of data that the host’s flash controller writes. A better WAF, which is near
1, guarantees better endurance and lower frequency of data written to flash memory.
7.3.2Media Wear Indicator
Actual life indicator reported by SMART Attribute byte index [5], Percentage Used, recommends User to replace drive
when reaching to 100%.
7.3.3Read Only Mode (End of Life)
When drive is aged by cumulated program/erase cycles, media worn- out may cause increasing numbers of later bad
block. When the number of available spare is less the threshold(5%, SMART attribute log ID 02h Byte4), the drive will
notify Host through AER event and Critical Warning to enter Read Only Mode to prevent further data corruption. User
should start to replace the drive with another one immediately.
Seagate FireCuda 530 SSD Product Manual, Rev B28
www.seagate.com
7.4An Adaptive Approach to Performance Tuning
7.4.1Throughput
Based on the available space of the disk, the drive will regulate the read/write speed and manage the performance of
throughput. When there still remains a lot of space, the firmware will continuously perform read/write action. There is
still no need to implement garbage collection to allocate and release memory, which will accelerate the read/write
processing to improve the performance. Contrarily, when the space is being used up, the drive will slow down the
read/write processing, and implement garbage collection to release memory. Hence, read/write performance will
become slower.
7.4.2Predict & Fetch
Normally, when the Host tries to read data from the PCIe SSD, the PCIe SSD will only perform one read action after
receiving one command. However, the drive applies Predict & Fetch to improve the read speed. When the host issues
sequential read commands to the PCIe SSD, the PCIe SSD will automatically expect that the following will also be read
commands. Thus, before receiving the next command, flash has already prepared the data. Accordingly, this
accelerates the data processing time, and the host does not need to wait so long to receive data.
7.4.3SLC Caching
The firmware design of the device currently adopts dynamic caching to deliver better performance for better
endurance and consumer user experience. The SLC caching size is up to 1/3 of free capacity of the SSD.
Seagate FireCuda 530 SSD Product Manual, Rev B29
www.seagate.com
8. Safety, Standards, and Compliance
Each Hard Drive and Solid State Drive ("device") has a product label that includes certifications that apply to that
specific drive. The following information provides an overview of requirements that may apply to the drive.
NOTEThe most up to date information on Safety, Standards, and Compliance for
this product is available in the Seagate HDD and SSD Regulatory Compliance
and Safety document. You can find this document on the Seagate Support
page here:
https://www.seagate.com/support/
8.1Regulatory Model Numbers
The following regulatory model number represents all features and configurations in the series:
STA025
Seagate FireCuda 530 SSD Product Manual, Rev B30
www.seagate.com
9. FireCuda 530 Installation Precautions
9.1FireCuda 530 SSD Handling Instructions
There are a lot of components assembled on a single SSD device. Handle the drive with care especially when it has any
WLCSP (Wafer Level Chip Scale Packaging) components such as PMIC, thermal sensor or load switch. WLCSP is a
packaging technology widely used for making smaller footprints. However, any bumps or scratches may damage
those ultrasmall parts so you must handle with gentle care. See Figure 9.2, FireCuda 530 SSD Installation Instructions
CAUTION!DO NOT DROP SSD
CAUTION!INSTALL SSD WITH CARE
CAUTION!STORE SSD IN A PROPER PACKAGE
9.2FireCuda 530 SSD Installation Instructions
FireCuda 530 features the PCIe connector with M-key, which is compatible only with the M-key socket. See Use Case 1
in Figure 7, M-Key M.2 Assembly Precautions. As shown in Use Case 2, misuse may cause severe damage to an SSD
including burn-out.
Figure 7 M-Key M.2 Assembly Precautions
9.3Heatsink Disclosures
NOTEAbout Heatsink SSDs.
Heatsinks are pre-installed. Do not remove the heatsink; you can damage
the SSD.
Dimensions exceed standard size specifications for the M.2 without a
heatsink. Please verify that your system has enough space for installation.
SSDs with heatsinks are recommended for M.2 with connectors H3.2 and
above.
Seagate FireCuda 530 SSD Product Manual, Rev B31
Seagate Technology LLC
AMERICAS Seagate Technology LLC 47488 Kato Road, Fremont, California 94538, United States, 510-661-1000
ASIA/PACIFIC Seagate Singapore International Headquarters Pte. Ltd. 90 Woodlands Avenue 7, Singapore 737911, 65-6412-3666
EUROPE, MIDDLE EAST AND AFRICA Seagate Technology (Netherlands) B.V. Koolhovenlaan 1, 1119 NB Schiphol-Rijk, Netherlands, 31-20-316-7300
Publication Number: 200432500, Rev B
May 2021
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