Engineering and Testing for EMC and Safety Compliance
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ACA CLASS B COMPLIANCE REPORT
SanDisk Corporation
7 Atir Yeda Street
Kfar Saba, Israel
972-9-7644908
Contact: Eitan Chalfon
SanDisk SSD UATA 5000 1.8”
February 7, 2007
Report Prepared By:
EMC Lab Coordinator: Jon Wilson
Rhein Tech Laboratories, Inc.
DOCUMENT NUMBER: 2006137
LIENT REFERENCE NUMBER: QRTL06-334
C
This report may not be reproduced, except in full, without the written approval of Rhein Tech Laboratories, Inc
Phone: 703-689-0368; Fax: 703-689-2056; Metro: 703-471-6441
360 Herndon Parkway, Suite 1400
Herndon, VA 20170
RHEIN TECH LABORATORIES, INC.
A
COMPLIANCE FOLDER
STATEMENT OF COMPLIANCE
For full test results refer to Rhein Tech Laboratories, Inc. endorsed
TEST REPORT No.: 2006137
Client: SanDisk Corporation, Inc.
Address: 7 Atir Yeda Street Kfar Saba, Israel 972-9-7644908
Equipment Identification
Type of Equipment: Information Technology Equipment
Equipment Models: SanDisk SSD UATA 5000 1.8”
Equipment Serial Number: N/A
Equipment Description: ATA Storage Device
Supplier/Manufacturer: SanDisk Corporation, Inc.
Relevant standards against which equipment was tested: AS/NZS CISPR22:2004 Class B
Exclusions: None
The Rhein Tech Laboratories, Inc. test house, AUSTEL listing number A97/TH/0107, states that the
customer equipment referred to in the above mentioned Test Report complies in all respects with the
appropriate requirements of standards listed above. The conditions in relation to the Degrees of
Uncertainty as accepted by NVLAP (National Voluntary Laboratory Accreditation Program) has been
noted and taken into account in making this statement.
Relevant Advice to Industry
DATED: February 7, 2007 already supplied to the client
I, being the NVLAP registered signatory for test reports prepared against the above standards, and
therefore the authorized signatory to the Test Report, declare that the information given is true and
correct. This Statement of Compliance is issued in accordance with the terms of our accreditation. No
modifications were made during testing.
Signed:
Jon Wilson, EMC Lab Coordinator
®
ccredited by the National Voluntary Accreditation Program for the specific scope of accreditation under Lab Code 20061-0.
Dated: February 7, 2007
DECLARATION OF CONFORMITY
WITH AUSTEL TECHNICAL STANDARDS
NUMBER: 2006137
I/We (name of company representative responsible for the permit)
of (Australian Company or Agent Name)
Australian Company Name (ACN)________________________________
hereby declare, under our sole responsibility, that all product supplied by this
organization
is customer equipment of the same type as that for which the permit/verification of
permit was issued.
I/We agree to allow ACA access to, and removal of, the Compliance Folder for
ongoing compliance audit purposes, in accordance with agreed administrative
process.
Information about the person making this Declaration.
(The person making this Declaration must hold a suitably responsible position in
the above organization)
(Signature of the person making this Declaration)
(Full Name of the Above Person)
(Position held in the company)
(Date of Declaration)
Sample ACA Certificate
Company Name: Sandisk Corporation
Client Reference Number: QRTL06-334
Work Order Number: 2006137
Eut: SanDisk SSD UATA 5000 1.8”
TABLE OF CONTENTS
1 GENERAL INFORMATION/TEST FACILITY AND METHODOLOGY ................................................5
1.1 DEVIATIONS......................................................................................................................................5
1.2 ACCREDITATION STATEMENTS...........................................................................................................5
2 SYSTEM TEST CONFIGURATION ......................................................................................................6
2.1 PRODUCT DESCRIPTION....................................................................................................................6
2.2 MODIFICATIONS ................................................................................................................................6
2.3 TESTED SYSTEM DETAILS .................................................................................................................7
2.4 CONFIGURATION PHOTOGRAPH OF SYSTEM UNDER TEST ...................................................................8
2.5 EUT EXERCISE DESCRIPTION............................................................................................................8
2.6 SPECIAL ACCESSORIES.....................................................................................................................8
3 PRODUCT LABELING..........................................................................................................................9
3.1 C-TICK MARK ...................................................................................................................................9
3.2 LABEL LOCATION.............................................................................................................................10
4 MEASUREMENT PHOTOGRAPHS ...................................................................................................11
4.1 CONDUCTED MEASUREMENT PHOTOGRAPHS ...................................................................................11
4.2 RADIATED MEASUREMENT PHOTOGRAPHS.......................................................................................12
5 CONDUCTED EMISSIONS.................................................................................................................13
6 RADIATED EMISSIONS .....................................................................................................................14
6.1 RADIATED EMISSIONS TEST RESULTS..............................................................................................14
6.2 FIELD STRENGTH CALCULATION.......................................................................................................15
7 EQUIPMENT LIST...............................................................................................................................16
8 USER’S MANUAL...............................................................................................................................16
9 CONDUCTED AND RADIATED TEST METHODOLOGY.................................................................17
9.1 CONDUCTED EMISSIONS MEASUREMENTS........................................................................................17
9.2 RADIATED EMISSIONS MEASUREMENTS............................................................................................17
Compliance Report Page 4 of 17
Company Name: Sandisk Corporation
Client Reference Number: QRTL06-334
Work Order Number: 2006137
Eut: SanDisk SSD UATA 5000 1.8”
1 GENERAL INFORMATION/TEST FACILITY AND METHODOLOGY
The following Class B Application for ACA Compliance is prepared on behalf of SanDisk
Corporation, Inc.. in accordance with AS/NZS CISPR22:2002. The Equipment Under Test
(EUT) was the SanDisk SSD UATA 5000 1.8”. The test results reported in this document
relate only to the item that was tested.
All measurements contained in this Application were conducted in accordance with AS/NZS
CISPR22:2002. The instrumentation utilized for the measurements conforms with the CISPR
22 Specification for Radio Disturbance and Immunity Measuring Apparatus and Methods.
Some accessories are used to increase sensitivity and prevent overloading of the measuring
instrument. These are explained in the appendix of this report. Calibration checks are
performed regularly on the instruments, and all accessories including the high pass filter,
preamplifier and cables.
All radiated and conducted emissions measurements were performed manually at Rhein Tech
Laboratories, Inc. The radiated emissions measurements required by the rules were performed
on the ten meter, open field, test range maintained by Rhein Tech Laboratories, Inc., 360
Herndon Parkway, Suite 1400, Herndon, Va., 20170. Complete description and site attenuation
measurement data have been placed on file with the Federal Communications Commission
(FCC) and the National Voluntary Laboratory Association Program (NVLAP). The power line
conducted emission measurements were performed in a shielded enclosure also located at the
Herndon, Virginia facility.
1.1 DEVIATIONS
There were no deviations from the test standard(s) and/or methods.
1.2 ACCREDITATION STATEMENTS
• NVLAP (USA): Accreditation under NVLAP Lab Code: 200061-0
• US CAB: Recognition as of U.S. Conformity Assessment Body (CAB) for EMC testing under US-EU and US-
APEC MRA; IC accepted CAB under Phase I of APEC Telecommunication MRA. Identification number
US0079.
• FCC (USA): Listing of test sites, Registration # 90902
• IC (Canada): Listing of test sites, IC 2956-1 and IC 2956-2
• US TCB (ATCB): Certification of cooperation, granted in 2005
• CE Notified Body: Rhein Tech Laboratories, Inc. has been approved by TNO Certification B.V. to provide EMC
Test Reports and Technical Construction Files to TNO Certification B.V. Rheintech Certification number:
10118957
• AUSTEL (Australia): Acceptance as of a Listed Test House, A97/TH/0107
• ANATEL (Brazil, telecommunication): NCC certification for performing tests
• Ministry of Commerce (New Zealand): Approval of a test laboratory: ECR 3-9 BAE
• VCCI (Japan): Approval and registration of RTL test sites as R-1113 and C-1172
• BSMI Rhein Tech Labs has been validated by the Chinese Taipei Bureau of Standards, Metrology, and
Inspection (BSMI) under the Asia Pacific Economic Cooperation Mutual Recognition Arrangement (APEC
MRA). BSMI number: SL2-IN-E-055R.
• RTL’s testing sites are recognized by the VCCI and registered under Numbers R-1113 and C-1172
Compliance Report Page 5 of 17
Company Name: Sandisk Corporation
Client Reference Number: QRTL06-334
Work Order Number: 2006137
Eut: SanDisk SSD UATA 5000 1.8”
2 SYSTEM TEST CONFIGURATION
2.1 PRODUCT DESCRIPTION
SanDisk SSD UATA 5000 1.8” is a drop-in replacement for the hard disk drive. It has no moving/
mechanical parts.
Small form factor
o 1.8" small form factor supporting unformatted capacity of 32GB
o 8mm case height
o Zero Insertion Force (ZIF) connector
Interface to host
o Standards: ATA-2/ATA-3/ATA-4/ATA-5/ATA-6/ATA-7
High performance
o Host transfer rate: 100MB/s
o Internal transfer read rate: 62MB/s
o Internal transfer write rate: 36MB/s
o Average access time: 0.11msec
Low power consumption
o Supply voltage: 3.3Vdc
o Typical read/write: 140mA
o Typical idle: 65mA
o Typical standby: 20mA
o Typical sleep: 10mA
Reliability
o Mean time between failure (MTBF): 2,000,000 hours, based on RDT per Weibull
method
o Operating shock: 1,500G, 0.5msec half sine
o Operating vibration: 2.17G, 7-800 Hz
o Operating temperature: 0°C to 70°C
o Non operating temperature and storage: -55°C to 95°C
2.2 MODIFICATIONS
None
Compliance Report Page 6 of 17
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