SanDisk 5000 2.5 User Manual
FCC Class B Test Report
For A Class B Digital Device
Client:
SanDisk Corporation
7 Atir Yeda Street
Kfar Saba, Israel
Phone 972-9-7644908
Device Under Test:
SanDisk SSD SATA 5000 2.5”
Document Number: 2007160
Reference Number: QRTL07-033
This report may not be reproduced, except in full, without the written approval of Rhein Tech Laboratories, Inc.
Test Overview:
Model No.:
Manufacturer’s
Name:
Manufacturer’s
Address:
Manufacturer’s
Contact:
Type of Equipment:
Serial No.:
Year of Manufacture:
Location of Testing:
Date of Receipt:
Date(s) of Testing:
Purpose of Testing:
SanDisk SSD SATA 5000 2.5”
SanDisk Corporation
7 Atir Yeda Street
Kfar Saba, Israel
Eitan Chalfon
ITE
713050010
2007
Rhein Tech Laboratories, Inc., Herndon, VA
February 5, 2007
April 10, 2007
FCC Class B Compliance
Standard(s) to which device was tested:
STANDARDS SPECIFIC TESTS
APPLICABILITY
Tested
Not Tested
CFR47 Parts 15.109 and
15.107
Radiated and Conducted Emissions
Test Engineer:
Jon Wilson
Signature:
Report Written By:
Jon Wilson
Signature:
Report Approved By:
Desmond Fraser
Signature:
Report Number:
Report Date:
®
Accredited by the National Voluntary Accreditation Program for the specific scope of accreditation under
Lab Code 20061-0.
Note: This report may not be used by the client to claim product endorsement by NVLAP or any agency of the U.S. Government.
2007160
April 27, 2007
Suite 1400
Herndon, VA 20170
http://www.rheintech.com
360 Herndon Parkway
TABLE OF CONTENTS
1 GENERAL INFORMATION.............................................................................................................................4
1.1 DEVIATIONS ................................................................................................................................................4
1.2 ACCREDITATION STATEMENTS ..................................................................................................................... 4
2 TEST DETAILS................................................................................................................................................ 5
2.1 PRODUCT DESCRIPTION .............................................................................................................................. 5
2.2 MODIFICATIONS...........................................................................................................................................5
2.3 EUT EXERCISE DESCRIPTION...................................................................................................................... 5
2.4 EQUIPMENT UNDER TEST ............................................................................................................................6
2.5 CONFIGURAT I ON OF TESTED SYSTEM...........................................................................................................7
3 PRODUCT LABELLING/ INFORMATION TO THE USER.............................................................................8
3.1 DOC LABEL ON DEVICE...............................................................................................................................8
3.2 DOC STATEMENT IN USER’S MANUAL........................................................................................................... 8
3.3 LOCATION OF LABEL ON EUT....................................................................................................................... 8
4 CONDUCTED EMISSIONS.............................................................................................................................9
4.1 SITE AND TEST DESCRIPTION....................................................................................................................... 9
4.2 CONDUCTED EMISSIONS TEST DATA..........................................................................................................10
4.3 CONDUCTED TEST PHOTOGRAPHS.............................................................................................................11
5 RADIATED EMISSIONS................................................................................................................................12
5.1 SITE AND TEST DESCRIPTION..................................................................................................................... 12
5.2 FIELD STRENGTH CALCULATION.................................................................................................................13
5.3 RADIATED EMISSIONS TEST DATA..............................................................................................................14
5.4 RADIATED TEST PHOTOGRAPHS ................................................................................................................ 15
6 EMISSIONS EQUIPMENT LIST....................................................................................................................16
7 MANUFACTURER’S EQUIPMENT FILE CHECKLIST (PER FCC RULES §2.1075)..................................17
SanDisk Corporation Page 3 of 17
DoC Report
2006137
04/27/07
Suite 1400
Herndon, VA 20170
http://www.rheintech.com
360 Herndon Parkway
1 GENERAL INFORMATION
The following test report for a Class B digital device is prepared on behalf of SanDisk Corporation in
accordance with Part 2, and Part 15, Subparts A and B of the Federal Communications Commissions Rules and
Regulations. The Equipment Under Test (EUT) was the SanDisk SSD SATA 5000 2.5”. The test results
reported in this document relate only to the items that were tested.
All measurements contained in this Application were conducted in accordance with ANSI C63.4 Methods of
Measurement of Radio Noise Emissions, 2003. The instrumentation utilized for the measurements conforms to
the ANSI C63.4 standard for EMI and Field Strength Instrumentation. Some accessories are used to increase
sensitivity and prevent overloading of the measuring instrument. Calibration checks are performed regularly on
all test equipment.
All radiated and conducted emission measurements were performed manually at Rhein Tech Laboratories, Inc.
The radiated emissions measurements were performed on the (three/ten) meter, open field, test range
maintained by Rhein Tech Laboratories, Inc., 360 Herndon Parkway, Suite 1400, Herndon, Va., 20170.
Complete description and site attenuation measurement data has been placed on file with the Federal
Communications Commission. The power line conducted emission measurements were performed in a
shielded enclosure also located at the Herndon, Virginia facility. Rhein Tech Laboratories is accepted by the
FCC as a facility available to do measurement work for others on a contract basis.
1.1 DEVIATIONS
There were no deviations from the test standard(s) and/or methods.
1.2 ACCREDITATION STATEMENTS
• NVLAP (USA): Accreditation under NVLAP Lab Code: 200061-0
• US CAB: Recognition as of U.S. Conformity Assessment Body (CAB) for EMC testing under US-EU and
US-APEC MRA; IC accepted CAB under Phase I of APEC Telecommunication MRA. Identification
number US0079.
• FCC (USA): Listing of test sites, Registration # 90902
• IC (Canada): Listing of test sites, IC 2956-1 and IC 2956-2
• US TCB (ATCB): Certification of cooperation, granted in 2005
• CE Notified Body: Rhein Tech Laboratories, Inc. has been approved by TNO Certification B.V. to provide
EMC Test Reports and Technical Construction Files to TNO Certification B.V. Rheintech Certification
number: 10118957
• AUSTEL (Australia): Acceptance as of a Listed Test House, A97/TH/0107
• ANATEL (Brazil, telecommunication): NCC certification for performing tests
• Ministry of Commerce (New Zealand): Approval of a test laboratory: ECR 3-9 BAE
• VCCI (Japan): Approval and registration of RTL test sites as R-1113 and C-1172
SanDisk Corporation Page 4 of 17
DoC Report
2006137
04/27/07
Suite 1400
Herndon, VA 20170
http://www.rheintech.com
360 Herndon Parkway
2 TEST DETAILS
2.1 PRODUCT DESCRIPTION
SanDisk SATA 5000 2.5” SSD is a drop-in replacement for the hard disk drive. It has no moving/ mechanical
parts.
Features
o 2.5" small form factor supporting unformatted capacity of 32GB
o 9.5mm case height
o SATA 7+15 pins combo connector
Interface to host
o Standards: SATA 1.0a 1.5Gb/s
High performance
o Host transfer rate: 150MB/s
o Internal transfer read rate: 67MB/s
o Internal transfer write rate: 47MB/s
o Random Read (4KB): 5350 IOPS
o Average access time: 0.11msec
Low power consumption
o Supply voltage: 5Vdc
o Typical read/write: 190mA
o Typical idle: 125mA
o Typical standby: 70mA
o Typical sleep: 60mA
Reliability
o Mean time between failure (MTBF): 2,000,000 hours, based on Part Stress Analysis
o Operating shock: 1,500G, 0.5msec half sine
o Operating vibration: 2.17G, 7-500 Hz
o Operating temperature: 0˚C to 70˚C
o Non operating temperature and storage: -55˚C to 95˚C
o Operating temperature: 0˚C to 70˚C
2.2 MODIFICATIONS
None
2.3 EUT EXERCISE DESCRIPTION
The SanDisk SSD SATA 5000 2.5” was installed in a Class B laptop personal computer which was running
Windows XP. The computer was programmed to transfer files continuously, to and from the device under test
using a software application provided by Dell. The SanDisk SSD SATA 5000 2.5” was tested as a
representative of the full line of available capacities. The only difference among the different sizes is the onboard flash memory. Otherwise, there are no physical, clock, or electronic changes. Determination of the 2.5
as the “worst case” test sample was determined by SanDisk based on preliminary scanning of the devices under
test and engineering judgement that: because of the small changes between the various capacities, any
changes in emission amplitudes or EMC susceptibility would be inconsequential.
SanDisk Corporation Page 5 of 17
DoC Report
2006137
04/27/07
Suite 1400
Herndon, VA 20170
http://www.rheintech.com
360 Herndon Parkway
2.4 EQUIPMENT UNDER TEST
Listed below are the identifiers and descriptions of all equipment, cables, and internal devices used with the EUT for this test.
Equipment Under Test
Part Manufacturer Model Serial
SATA Storage
Device
SanDisk
Corporation
SanDisk SSD
SATA 5000 2.5”
Number
713050010 DoC Internal N/A 4/10/2007
Auxiliary Equipment
Part Manufacturer Model Serial
Laptop PC Dell
Laptop AC Adapter Dell LA65NS0-00
Monitor Mag Innovision LT716s 700P
Speaker Boston Acoustics BA265 7002305 N/A Unshielded 011966 09/22/1999
USB Termination Gateway, Inc. USB PCB Rev 1.0 N/A Shielded 008645 04/07/1997
USB Termination Gateway, Inc. USB PCB Rev 1.0 N/A Shielded 011726 05/09/1996
Microphone Gateway, Inc. Telex 700358 N/A Unshielded 016989 01/24/2006
Ethernet hub Flowpoint 134 F258219
Modem US Robotics
Latitude D620
PP18L
Sportster Model
0413
Number
N/A DoC
CN-0DF263-
716156822ED4
F6EQ581028
18U
8390364644
992
FCC
ID
FCC
ID
N/A Unshielded 017737 4/10/2007
DoC
Class
A
Device
DoC
Cable
Description
Cable
Description
Unshielded
Power
Unshielded
Power
Shielded I/O
Unshielded
Power
Unshielded
Power
Shielded I/O
RTL
Bar
Code
RTL
Bar
Code
N/A 4/10/2007
901427 12/15/2005
901278 10/04/2002
900427 11/13/1996
Equipment
Arrival
Date
Equipment
Arrival
Date
SanDisk Corporation Page 6 of 17
DoC Report
2006137
04/27/07
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