16Mx64 SDRAM DIMM based on 16Mx8, 4Banks, 4K Refresh, 3.3V Synchronous DRAMs with SPD
FEATUREGENERAL DESCRIPTION
The Samsung M366S1723DTS is a 16M bit x 64 Synchronous
Dynamic RAM high density memory module. The Samsung
M366S1723DTS consists of eight CMOS 16M x 8 bit with
4banks Synchronous DRAMs in TSOP-II 400mil package and a
2K EEPROM in 8-pin TSSOP package on a 168-pin glass-epoxy
substrate. One 0.1uF and one 0.22 uF decoupling capacitors
are mounted on the printed circuit board in parallel for each
SDRAM.
The M366S1723DTS is a Dual In-line Memory Module and is
intended for mounting into 168-pin edge connector sockets.
Synchronous design allows precise cycle control with the use of
system clock. I/O transactions are possible on every clock cycle.
Range of operating frequencies, programmable latencies allows
the same device to be useful for a variety of high bandwidth,
high performance memory system applications.
* These pins are not used in this module.
** These pins should be NC in the system
which does not support SPD.
SAMSUNG ELECTRONICS CO., Ltd. reserves the right to change products and specifications without notice.
Rev. 0.1 Sept. 2001
M366S1723DTS
PC133/PC100 Unbuffered DIMM
PIN CONFIGURATION DESCRIPTION
PinNameInput Function
CLKSystem clockActive on the positive going edge to sample all inputs.
CSChip select
CKEClock enable
Disables or enables device operation by masking or enabling all inputs except
CLK, CKE and DQM
Masks system clock to freeze operation from the next clock cycle.
CKE should be enabled at least one cycle prior to new command.
Disable input buffers for power down in standby.
CKE should be enabled 1CLK+tSS prior to valid command.
A0 ~ A11Address
BA0 ~ BA1Bank select address
RASRow address strobe
CASColumn address strobe
WEWrite enable
DQM0 ~ 7Data input/output mask
DQ0 ~ 63Data input/outputData inputs/outputs are multiplexed on the same pins.
VDD/VSSPower supply/groundPower and ground for the input buffers and the core logic.
Row/column addresses are multiplexed on the same pins.
Row address : RA0 ~ RA11, Column address : CA0 ~ CA9
Selects bank to be activated during row address latch time.
Selects bank for read/write during column address latch time.
Latches row addresses on the positive going edge of the CLK with RAS low.
Enables row access & precharge.
Latches column addresses on the positive going edge of the CLK with CAS low.
Enables column access.
Enables write operation and row precharge.
Latches data in starting from CAS, WE active.
Makes data output Hi-Z, tSHZ after the clock and masks the output.
Blocks data input when DQM active. (Byte masking)
Voltage on any pin relative to VssVIN, VOUT-1.0 ~ 4.6V
Voltage on VDD supply relative to VssVDD, VDDQ-1.0 ~ 4.6V
Storage temperatureTSTG-55 ~ +150°C
Power dissipationPD8W
Short circuit currentIOS50mA
Note :
Permanent device damage may occur if "ABSOLUTE MAXIMUM RATINGS" are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
DC OPERATING CONDITIONS AND CHARACTERISTICS
Recommended operating conditions (Voltage referenced to VSS = 0V, TA = 0 to 70°C)