The BD80C0AFPS, BD90C0AFPS is low-saturation regulator. This IC has a built-in over-current protection circuit that
prevents the destruction of the IC due to output short circuits and a thermal shutdown circuit that protects the IC from thermal
damage due to overloading.
●Features
1) Output Current: 1A
2) Output Voltage: 8.0V / 9.0V
3) High Output Voltage Precision: ±1%
4) Low saturation with PDMOS output
5) Built-in over-current protection circuit that prevents the destruction of the IC due to output short circuits
6) Built-in thermal shutdown circuit for protecting the IC from thermal damage due to overloading
7) Low ESR Capacitor
8) TO252S-3 packaging
●Applications
Audiovisual equipments, FPDs, televisions, personal computers or any other consumer device
●Absolute maximum ratings (Ta=25℃)
Parameter Symbol Ratings Unit
Supply Voltage
Power Dissipation
Operating Temperature Range Topr -40 ~ +105 ℃
Storage Temperature Range Tstg -55 ~ +150 ℃
Maximum Junction Temperature Tjmax +150 ℃
*1 Not to exceed Pd.
*2 TO252S-3:Reduced by 9.6mW / °C over Ta = 25°C, when mounted on glass epoxy board: 70mm×70mm×1.6mm.
NOTE: This product is not designed for protection against radioactive rays.
Mounted on a Rohm standard board
Board size : 70mm
Copper foil area :7mm
TO252-3
×70 mm×1.6 mm
θja=104.2(℃/W)
×7mm
5
4.80
③
4
3.50
②
3
1.85
①
2
Power Di ssipati on: Pd (W )
1
Mounted on a Rohm standard board
Board size : 70mm
Copper foil area :7mm
①2-layer board
(back surface copper foil area :15mm×15mm) ②2-layer board
(back surface copper foil area :70mm×70mm) ③4-layer board
(back surface copper foil area :70mm×70mm))
①:θja=67.6℃/W
②:θja=35.7℃/W
③:θja=26.0℃/W
×70 mm×1.6 mm
×7mm
0
0255075100125150
Ambient T emperat ure: Ta
(℃)
Fig.20 Fig.21(reference data)
0
0255075100125150
Ambient T emperat ure: Ta
(℃)
When using at temperatures over Ta=25℃, please refer to the heat reducing characteristics shown in Fig.20 and Fig.21.
The IC characteristics are closely related to the temperature at which the IC is used, so it is necessary to operate the IC at
temperatures less than the maximum junction temperature Tjmax.
Fig.20 and Fig.21 shows the acceptable loss and heat reducing characteristics of the TO252S-3 package. Even when the
ambient temperature Ta is a normal temperature (25℃), the chip (junction) temperature Tj may be quite high so please
operate the IC at temperatures less than the acceptable loss Pd.
The calculation method for power consumption Pc(W) is as follows :(Fig.21③)
Pc=(Vcc-Vo)×Io+Vcc×Ib
Acceptable loss Pd≧Pc
Solving this for load current Io in order to operate within the acceptable loss,
Io≦
Pd-Vcc×Ib
Vcc-Vo
Vcc:
Vo:
Io:
Ib:
Ishort:
Input voltage
Output voltage
Load current
Circuit current
Short current
(Please refer to Fig.8,Fig.17 for Ib.)
It is then possible to find the maximum load current Io
Max with respect to the applied voltage Vcc at the time of thermal
Please refer to the above information and keep thermal designs within the scope of acceptable loss for all operating
temperature ranges. The power consumption Pc of the IC when there is a short circuit (short between Vo and GND) is :
Pc=Vcc×(Ib + Ishort) (Please refer to Fig.4,Fig.13 for Ishort.)
1. Absolute maximum ratings
Use of the IC in excess of absolute maximum ratings (such as the input voltage or operating temperature range) may
result in damage to the IC. Assumptions should not be made regarding the state of the IC (e.g., short mode or open mode)
when such damage is suffered. If operational values are expected to exceed the maximum ratings for the device, consider
adding protective circuitry (such as fuses) to eliminate the risk of damaging the IC.
2. Electrical characteristics described in these specifications may vary, depending on temperature, supply voltage external
circuits and other conditions. Therefore, be sure to check all relevant factors, including transient characteristics.
3. GND potential
The potential of the GND pin must be the minimum potential in the system in all operating conditions. Ensure that no pins
are at a voltage below the GND at any time, regardless of transient characteristics.
4. Ground wiring pattern
When using both small-signal and large-current GND traces, the two ground traces should be routed separately but
connected to a single ground potential within the application in order to avoid variations in the small-signal ground caused
by large currents. Also ensure that the GND traces of external components do not cause variations on GND voltage. The
power supply and ground lines must be as short and thick as possible to reduce line impedance.
5. Inter-pin shorts and mounting errors
Use caution when orienting and positioning the IC for mounting on printed circuit boards. Improper mounting may result in
damage to the IC. Shorts between output pins or between output pins and the power supply or GND pins (caused by poor
soldering or foreign objects) may result in damage to the IC.
6. Operation in strong electromagnetic fields
Using this product in strong electromagnetic fields may cause IC malfunction. Caution should be exercised in applications
where strong electromagnetic fields may be present.
7. Testing on application boards
When testing the IC on an application board, connecting a capacitor directly to a low-impedance pin may subject the IC to
stress. Always discharge capacitors completely after each process or step. The IC’s power supply should always be
turned off completely before connecting or removing it from a jig or fixture during the evaluation process. To prevent
damage from static discharge, ground the IC during assembly and use similar precautions during transport and storage.
8. Thermal consideration
Use a thermal design that allows for a sufficient margin in light of the Pd in actual operating conditions.
Consider Pc that does not exceed Pd in actual operating conditions. (Pd≧Pc)
Tjmax: Maximum junction temperature=150℃, Ta: Peripheral temperature[℃] , θja: Thermal resistance of package-ambience[℃/W], Pd: Package Power dissipation [W]
Pc: Power dissipation [W], Vcc: Input Voltage, Vo: Output Voltage, Io: Load, Ib: Bias Current
9. Vcc pin
Insert a capacitor(capacitor≧1µF ~ ) between the Vcc and GND pins. The appropriate capacitance value varies by
application. Be sure to allow a sufficient margin for input voltage levels.
10. Output pins
It is necessary to place capacitors between each output pin and GND to prevent oscillation on the output.
Usable capacitance values range from 1µF to 1000µF. Ceramic capacitors can be used as long as their ESR value is low
enough to prevent oscillation (0.001Ω to 20Ω). Abrupt fluctuations in input voltage and load conditions may affect the
output voltage. Output capacitance values should be determined only through sufficient testing of the actual application.
Vcc=9V~25V(BD80C0AFPS)
~25V(BD90C0AFPS)
Vcc=10V
℃~+105℃
Ta= - 40
~100µF Cout=1µF~100µF
Cin=1µF
Cout_ESR(Ω)
100
10
1
0.1
0.01
0.001
Unstable operating region
Stable operating region
02004006008001000
Io(mA)
Cout_ESR vs Io(reference data)
~25V(BD80C0AFPS)
Vcc=9V
~25V(BD90C0AFPS)
Vcc=10V
℃~+105℃
Ta= - 40
~100µF Cout=1µF~100µF
Cin=1µF
~1A
Io=0A
100
10
Cin(μF)
1
1
Stable operating region
10
Cout(μF)
100
Cin vs Cout(reference data)
Vcc
Cin
(1µF~ )
Vcc
Vo
GND
Cout(1µF~ )
ESR
(0.001Ω~ )
Io(ROUT)
※Operation Notes10 Measurement circuit
11. For a steep change of the Vcc voltage
Because MOS for output Transistor is used when an input voltage change is very steep, it may evoke large current.
When selecting the value of external circuit constants, please make sure that the operation on the actual application takes
these conditions into account.
12. For an infinitesimal fluctuations of output voltage.
At the use of the application that infinitesimal fluctuations of output voltage caused by some factors (e.g. disturbance noise,
input voltage fluctuations, load fluctuations, etc.), please take enough measures to avoid some influence (e.g. insert the
filter, etc.).
13. Over current protection circuit (OCP)
The IC incorporates an integrated over-current protection circuit that operates in accordance with the rated output capacity.
This circuit serves to protect the IC from damage when the load becomes shorted. It is also designed to limit output current
(without latching) in the event of a large and instantaneous current flow from a large capacitor or other component. These
protection circuits are effective in preventing damage due to sudden and unexpected accidents. However, the IC should
not be used in applications characterized by the continuous or transitive operation of the protection circuits.
14. Thermal shutdown circuit (TSD)
The IC incorporates a built-in thermal shutdown circuit, which is designed to turn the IC off completely in the event of
thermal overload. It is not designed to protect the IC from damage or guarantee its operation. ICs should not be used after
this function has activated, or in applications where the operation of this circuit is assumed.
15. Applications or inspection processes where the potential of the Vcc pin or other pins may be reversed from their normal
state may cause damage to the IC's internal circuitry or elements. Use an output pin capacitance of 1000µF or lower in
case Vcc is shorted with the GND pin while the external capacitor is charged. Insert a diode in series with Vcc to prevent
reverse current flow, or insert bypass diodes between Vcc and each pin.
16. Positive voltage surges on V
A power zener diode should be inserted between V
pin.
the V
CC
CC
pin
and GND for protection against voltage surges of more than 35V on
CC
Vcc
GND
17. Negative voltage surges on V
A schottky barrier diode should be inserted between V
pin.
V
CC
CC
pin
and GND for protection against voltages lower than GND on the
CC
Vcc
GND
18. Output protection diode
Loads with large inductance components may cause reverse current flow during startup or shutdown. In such cases, a
protection diode should be inserted on the output to protect the IC.
19. Regarding input pins of the IC
This monolithic IC contains P+ isolation and P substrate layers between adjacent elements in order to keep them isolated.
PN junctions are formed at the intersection of these P layers with the N layers of other elements, creating parasitic diodes
and/or transistors. For example (refer to the figure below):
○When GND > Pin A and GND > Pin B, the PN junction operates as a parasitic diode
○When GND > Pin B, the PN junction operates as a parasitic transistor
Parasitic diodes occur inevitably in the structure of the IC, and the operation of these parasitic diodes can result in mutual
interference among circuits, operational faults, or physical damage. Accordingly, conditions that cause these diodes to
operate, such as applying a voltage lower than the GND voltage to an input pin (and thus to the P substrate) should be
avoided.
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