This Transient Analysis User Manual provides all the information specific to the appli-cation. All general software functions and settings common to all applications and
operating modes are described in the R&S VSE Base Software User Manual.
The main focus in this manual is on the measurement results and the tasks required to
obtain them. The following topics are included:
●
Welcome to the Transient Analysis Application
Introduction to and getting familiar with the application
●
Measurements and Result Displays
Details on supported measurements and their result types
●
Measurement Basics
Background information on basic terms and principles in the context of the measurement
●
Configuration + Analysis
A concise description of all functions and settings available to configure measurements and analyze results with their corresponding remote control command
●
How to Perform Measurements in the Transient Analysis Application
The basic procedure to perform each measurement and step-by-step instructions
for more complex tasks or alternative methods
●
Measurement Examples
Detailed measurement examples to guide you through typical measurement scenarios and allow you to try out the application immediately
●
Optimizing and Troubleshooting the Measurement
Hints and tips on how to handle errors and optimize the test setup
●
Remote Commands for Transient Analysis
Remote commands required to configure and perform Transient Analysis in a
remote environment, sorted by tasks
(Commands required to set up the environment or to perform common tasks in the
software are provided in the R&S VSE Base Software User Manual)
Programming examples demonstrate the use of many commands and can usually
be executed directly for test purposes
●
Reference
File format description
●
List of remote commands
Alphabetical list of all remote commands described in the manual
●
Index
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1.2Typographical conventions
Preface
Typographical conventions
The following text markers are used throughout this documentation:
ConventionDescription
"Graphical user interface elements"
[Keys]Key and knob names are enclosed by square brackets.
Filenames, commands,
program code
InputInput to be entered by the user is displayed in italics.
LinksLinks that you can click are displayed in blue font.
"References"References to other parts of the documentation are enclosed by quota-
All names of graphical user interface elements on the screen, such as
dialog boxes, menus, options, buttons, and softkeys are enclosed by
quotation marks.
Filenames, commands, coding samples and screen output are distinguished by their font.
tion marks.
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2Welcome to the transient analysis applica-
Welcome to the transient analysis application
Starting the transient analysis application
tion
The R&S VSE-K60 is a firmware application that adds functionality to detect transient
signal effects to the R&S VSE.
The R&S VSE Transient Analysis application features:
●
Analysis of transient effects
●
Quick analysis even before measurement end due to online transfer of captured
and measured I/Q data
●
Easy analysis of user-defined regions within the captured data
●
Analysis of frequency hopping or chirped FM signals (with additional Transient
Analysis options)
This user manual contains a description of the functionality that the application provides, including remote control operation.
Functions that are not discussed in this manual are the same as in the I/Q Analyzer
application and are described in the R&S VSE User Manual. The latest version is available for download at the product homepage (http://www.rohde-schwarz.com/product/
VSE.html).
An application note discussing RF signal analysis and interference tests using the R&S
VSE Transient Analysis application is available from the Rohde & Schwarz website:
1MA267: Automotive Radar Sensors - RF Signal Analysis and Inference Tests
2.1Starting the transient analysis application
Transient Analysis requires a separate application on the R&S VSE. It is activated by
creating a new measurement channel in Transient Analysis mode.
To activate the Transient Analysis application
1.
Select the "Add Channel" function in the Sequence tool window.
A dialog box opens that contains all operating modes and applications currently
available in your R&S VSE.
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Welcome to the transient analysis application
Understanding the display information
2. Select the "Transient Analysis" item.
The R&S VSE opens a new measurement channel for the R&S VSE Transient
Analysis application.
2.2Understanding the display information
The following figure shows a measurement diagram during analyzer operation. All different information areas are labeled. They are explained in more detail in the following
sections.
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Welcome to the transient analysis application
Understanding the display information
1
2
3
4
5
1 = Channel bar for firmware and measurement settings
2 = Color coding for windows of same channel
3 = Window title bar with diagram-specific (trace) information
4 = Diagram area
5 = Diagram footer with diagram-specific information
Channel bar information
In the R&S VSE Transient Analysis application, the R&S VSE shows the following settings:
Table 2-1: Information displayed in the channel bar in the Transient Analysis application
Ref LevelReference level
AttRF attenuation
FreqCenter frequency for the RF signal
Meas BWMeasurement bandwidth
Meas TimeMeasurement time (data acquisition time)
Sample RateSample rate
ModelSignal model (hop, chirp or none)
In addition, the channel bar also displays information on instrument settings that affect
the measurement results even though this is not immediately apparent from the display
of the measured values (e.g. transducer or trigger settings). This information is displayed only when applicable for the current measurement. For details see the
R&S VSE Base Software User Manual.
Window title bar information
For each diagram, the header provides the following information:
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Welcome to the transient analysis application
Understanding the display information
0
1256 7
Figure 2-1: Window title bar information in the R&S VSE Transient Analysis application
0 = Color coding for windows of same channel
1 = Window number
2 = Window type
3 = Trace color
4 = Trace number
5 = Detector mode
6 = Trace mode
6 = Dock/undock window function
7 = Close window function
34
Diagram footer information
The diagram footer (beneath the diagram) contains the following information, depending on the evaluation:
Time domain:
●
Start and stop time of data acquisition
●
Number of data points
●
Time displayed per division
Frequency domain:
●
Center frequency
●
Number of data points
●
Bandwidth displayed per division
●
Measurement bandwidth
Spectrogram:
●
Center frequency
●
Number of data points
●
Measurement bandwidth
●
Selected frame number
Status bar information
The software status, errors and warnings and any irregularities in the software are indicated in the status bar at the bottom of the R&S VSE window.
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3About transient analysis
About transient analysis
Transient analysis refers to signal effects which may appear briefly or change rapidly in
time or frequency. Typical examples are spurious emissions or modulated signals
using frequency-hopping techniques. Such signals often require analysis of a large
bandwidth, if possible without gaps.
Ideally, such signals are analyzed in real-time mode, which employs special hardware
in order to capture and process data simultaneously, and seamlessly. However, if a
real-time analyzer is not available, the Transient Analysis application is a good choice.
Similarly to real-time mode, but without the special hardware, this application captures
data and asynchronously - before data acquisition is completed - starts analyzing the
available input and displays first results. Especially for large bandwidths or long measurement times, analysis becomes much more efficient and the complete measurement task can be sped up significantly. Although gaps may occur between successive
measurements with large bandwidths, the results from each individual measurement
are complete without gaps.
Thus, the Transient Analysis application supports you in analyzing time- and frequency-variant signals with large bandwidths.
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4Measurement basics
4.1Data acquisition
Measurement basics
Signal processing
Some background knowledge on basic terms and principles used in analysis of transient signals is provided here for a better understanding of the required configuration
settings.
●Working with spectrograms.....................................................................................35
The R&S VSE Transient Analysis application measures the power of the signal input
over time. How much data is captured depends on the measurement bandwidth and
the measurement time. These two values are interdependant and allow you to define
the data to be measured using different methods:
●
By defining a bandwidth around the specified center frequency to be measured at a
specified sample rate
●
By defining a time length during which a specified number of samples are measured at the specified center frequency
4.2Signal processing
The R&S VSE Transient Analysis application measures the power of the signal input
over time. In order to convert the time domain signal to a frequency spectrum, an FFT
(Fast Fourier Transformation) is performed which converts a vector of input values into
a discrete spectrum of frequencies.
The application calculates multiple FFTs per capture, by dividing one capture into several overlapping FFT frames. This is especially useful in conjunction with window functions since it enables a gap-free frequency analysis of the signal.
Using overlapping FFT frames leads to more individual results and improves detection
of transient signal effects. However, it also extends the duration of the calculation. The
size of the FFT frame depends on the number of input signal values (record length),
the overlap factor, and the time resolution (time span used for each FFT calculation).
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Measurement basics
Signal processing
FFT window functions
Each FFT frame is multiplied with a specific window function after sampling in the time
domain. Windowing helps minimize the discontinuities at the end of the measured signal interval and thus reduces the effect of spectral leakage, increasing the frequency
resolution.
Additional filters can be applied after demodulation to filter out unwanted signals, or
correct pre-emphasized input signals.
Asynchronous data processing
During a measurement in the R&S VSE Transient Analysis application, the data is captured and stored in the capture buffer until the defined measurement time has expired.
As soon as a minimum amount of data is available, the first FFT calculation is performed. As soon as the required number of (overlapping) FFT results is available, the
detector function is applied to the data and the first frame is displayed in the Spectrogram (and any other active result displays).
Figure 4-1: Signal processing: calculating one spectrogram frame
Shortly after the measurement time is over, the final results are displayed and the measurement is complete. Due to this asynchronous processing, initial analysis results are
available very quickly. At the same time, the data is captured over the full bandwidth
entirely without gaps. The following figure illustrates how the capture and result display
processes are performed asynchronously.
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Measurement basics
Signal processing
Figure 4-2: Asynchronous data processing
Multiple spectrograms
However, after each data acquisition, a short delay occurs before the next acquisition
can be carried out. Thus, for measurements for which several spectrograms are
required and the capturing process is repeated several times (defined by the "frame
count"), a short gap in the results between spectrograms can be detected.
Figure 4-3: Signal processing: calculating several spectrograms
Resolution bandwidth
The resolution bandwidth (RBW) has an effect on how the spectrum is measured and
displayed. It determines the frequency resolution of the measured spectrum and is
directly coupled to the selected analysis bandwidth (ABW). The ABW can be the full
measurement bandwidth, the bandwidth of the analysis region, or the length of the
result range, depending on the evaluation basis of the result display (see Chapter 4.4,
"Basis of evaluation", on page 24). If the ABW is changed, the resolution bandwidth is
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Measurement basics
Signal models
automatically adjusted. Which coupling ratios are available depends on the selected
FFT Window.
A small resolution bandwidth has several advantages. The smaller the resolution bandwidth, the better you can observe signals whose frequencies are close together and
the less noise is displayed. However, a small resolution bandwidth also increases the
required measurement time.
The resolution bandwidth parameters can be defined in the bandwidth configuration,
see Chapter 6.6, "Bandwidth settings", on page 104.
Time resolution
The time resolution determines the size of the bins used for each FFT calculation. The
shorter the time span used for each FFT, the shorter the resulting span, and thus the
higher the resolution in the spectrum becomes. The time resolution to be used for
R&S VSE can be defined manually or automatically according to the data acquisition
settings.
4.3Signal models
If the additional firmware options R&S VSE-K60H or -K60C are installed, the R&S VSE
Transient Analysis application supports different signal models for which similar parameters are characteristic.
●Automatic vs. manual hop/chirp state detection......................................................24
4.3.1Frequency hopping
Some digital data transmission standards employ a frequency-hopping technique, in
which a carrier signal is rapidly switched among many frequency channels. Discrete
frequencies and continuous modulation are characteristic of this signal model.
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Measurement basics
Signal models
Figure 4-4: Typical spectrogram of a frequency-hopping signal
Analyzing such signals includes the following challenges:
●
Detecting the currently used carrier frequency and a possible offset
●
Determining the duration the signal stays at one frequency and the time it takes to
switch to another
●
Measuring the average power level
●
Demodulating the signal correctly
The R&S VSE Transient Analysis application (with the additional R&S VSE-K60H
option installed) can automatically detect frequency hops in a measured signal and
determine characteristic hop parameters. Both pulsed and continuous wave hopping
signals can be analyzed.
Assuming a frequency-hopping signal model, the frequency bands in which the carrier
can be expected are usually known in advance. Therefore, you can configure conditions that must apply to the measured signal in order to detect a frequency hop and
distinguish it from random spurs or frequency distortions. Such conditions can be a frequency tolerance around a defined nominal value, for instance, or a minimum or maximum dwell time in which the frequency remains steady.
Figure 4-5: Parameters required to detect hops
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Measurement basics
Signal models
Nominal Frequency Values (Hop States)
The (nominal) frequency values the carrier is expected to "hop" to are defined in
advance. Each such level is considered to be a hop state. The hop states are defined
as frequency offsets from the center frequency. A tolerance span can be defined to
compensate for settling effects. As long as the deviation remains within the tolerance
above or below the nominal frequency, the hop state is detected.
The nominal frequency levels are numbered consecutively in the "Hop States" table
(see Chapter 6.2.2, "Signal states", on page 79), starting at 0. The state index of the
corresponding nominal frequency level is assigned to each detected hop in the measured signal results.
Dwell Time Conditions
The dwell time is the time the signal remains in the tolerance area of a nominal hop
frequency, or in other words: the duration of a hop from beginning to end. In a default
measurement, useful dwell times for the current measurement are determined automatically. However, you can define minimum or maximum dwell times, or both, manually, in order to detect only specific hops, for example.
4.3.2Frequency chirping
Frequency chirping is similar to hopping, however, instead of switching to discrete frequencies, the frequency varies with time at a particular chirp rate. Transient analysis
with the R&S VSE application (and the additional R&S VSE-K60C option) is restricted
to the commonly used linear FM chirp signals. In this case, the nominal chirp switches
to discrete values, referred to as the chirp states.
Figure 4-6: Typical spectrogram of a chirped signal
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Measurement basics
Basis of evaluation
The R&S VSE Transient Analysis application can automatically detect chirps in a measured signal and determine characteristic chirp parameters. Both pulsed and continuous wave chirp signals can be analyzed.
Obviously, if you consider the chirps rather than the individual frequencies, the measured data from chirped signals is very similar to hopped signals, and thus the analysis
tasks and the characteristic parameters are very similar, as well.
Figure 4-7: Parameters required to detect chirps
In the R&S VSE Transient Analysis application, for a chirp signal, the derivation of the
captured signal data is calculated before further analysis. From there, processing is
identical for both signal models.
4.3.3Automatic vs. manual hop/chirp state detection
By default, the R&S VSE Transient Analysis application automatically detects the existing hop/chirp states in a pre-measurement. For an initial overview of the signal at hand
this detection is usually sufficient. For more accurate results, particularly if the input
signal is known in advance, the nominal frequency or chirp values can be defined manually.
4.4Basis of evaluation
Depending on the measurement task, not all of the measured data in the capture buffer
may be of interest. In some cases it may be useful to restrict analysis to a specific
user-definable region, or to a selected individual chirp or hop. This makes analysis
more efficient and the display clearer.
Automatic detection of hops or chirps, for example, is always based on a restricted
analysis region. Numeric results for characteristic parameters, as well as statistical
results, are also calculated on this restricted basis.
For graphical displays, selecting an individual hop or chirp allows you to analyze or
compare characteristic values in detail.
Which evaluation basis is available for which result display is indicated in Table 5-1.
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Measurement basics
Analysis region
Detected hops/chirps are indicated by green bars along the x-axis in graphical result
displays. The selected hop/chirp (see "Select Hop / Select Chirp"on page 121) is indicated by a blue bar. The hop/chirp index as displayed in the result tables is indicated at
the bottom of each bar.
Figure 4-8: Example of detected hops with hop index in graphical result display and result table
4.5Analysis region
The analysis region determines which of the captured data is analyzed and displayed
on the screen. By default, the entire capture buffer data is defined as the analysis
region. However, you can select a specific frequency and time region which is of interest for analysis. The results can then be restricted to this region (see Chapter 7.2,
"Evaluation basis", on page 121).
Note, however, that only one analysis region can be defined. All result displays that are
restricted to the analysis region thus have the same data basis.
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Measurement basics
Analysis region
Numeric results (displayed in the result or statistics tables) are always calculated
based on the analysis region.
For graphical result displays based on the analysis region, the x-axis range corresponds to the analysis region length (see "Time Gate Length"on page 103).
The analysis region is indicated by a colored frame in the Full Spectrogram display,
and by vertical blue lines in result displays based on the full capture buffer.
The colors used to indicate the analysis range in spectrograms are configurable, see
"Modifying Analysis Region and Sweep Separator Colors"on page 128.
Defining the analysis region
There are different methods of defining the analysis region:
●
absolute definition: by defining an absolute frequency span and an absolute time
gate
The frequency span is defined by an offset from the center frequency and an analysis bandwidth.
The time gate is defined by a starting point after measurement begin and the gate
length.
●
Relative definition: by linking the analysis region to the full capture buffer and defining a percentage of the full bandwidth and measurement time
The specified frequency offset or time gate start are also considered for relative
values.
●
Graphically: The analysis region is indicated by a dotted frame in the Spectrogram
display and by vertical lines in the full spectrum display. Its size and position can be
moved by tapping and dragging the frame on the touchscreen.
Furthermore, the data zoom and shift functions allow you to change the size and
position of the analysis region from any graphical result display (see Chapter 4.6,
"Zooming and shifting results", on page 28).
The absolute and relative methods can be combined, for example by defining an absolute frequency span and a relative time gate.
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Measurement basics
Analysis region
Figure 4-9: Visualization of absolute analysis region parameters
Processing data in the analysis region - data zoom
In result displays restricted to the analysis region, only the data measured for the
specified frequency range and within the defined time gate is considered. Furthermore,
the analysis region data is taken only from the latest data acquisition, that is, only data
that is still in the capture buffer is analyzed.
Restricting the results to an analysis region has the same effect as a data zoom: the
results are recalculated for a restricted data base. The data in the capture buffer is filtered by the defined time gate; the measured data within that time span then passes a
bandpass filter, so only the frequency range of interest is analyzed. Depending on the
selected result display, the data is then demodulated, if necessary, and distributed
among the trace points using a detector. The time span displayed per division of the
diagram is much smaller compared to the initial full data analysis. Thus, the results of
the analysis range become more precise.
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Zooming and shifting results
Figure 4-10: Data zoom - full result vs. analysis region result
4.6Zooming and shifting results
As described above (Processing data in the analysis region - data zoom), restricting
the results to an analysis region has the same effect as a data zoom: the results are
recalculated for a restricted data base.
This is exactly what the "Data Zoom" ( ) function in the toolbar does: it changes the
size of the analysis region and re-evaluates the new data base. Thus, if the analysis
region is reduced, less data is displayed in the same area of the screen, thus enlarging
the display of the selected data. If the analysis region is enlarged, more data is displayed.
The "Data Shift" ( ) function, on the other hand, does not change the size of the
analysis region, but the position. Thus you can scroll through the signal and analyze
several hops/chirps after another, for example.
The effects of a data zoom or shift are reflected in the Analysis Region settings of the
"Data Acquisition" dialog box.
Similarly, when the data zoom and shift functions are applied to a hop/chirp-based
result display, the size or position of the result range are changed (see Chapter 7.1.1,
"Result range", on page 112).
This means that ALL result displays based on the analysis region or hop/chirp result
range are re-evaluated after a data zoom or shift function is applied in any window.
This includes result tables, which may take some time to re-calculate. Close the result
tables during a data shift/zoom to improve the screen update speed.
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4.7Measurement range
Measurement basics
Measurement range
Use the data zoom or shift functions in the full spectrum or spectrogram displays and
analyze the data sequentially or hop-by-hop / chirp-by-chirp in the other result displays!
In order to calculate frequency, phase or power results in frequency hopping or chirped
signals more accurately, it may be useful not to take the entire dwell time of the hop (or
length of the chirp) into consideration, but only a certain range within the dwell time/
length. Thus, it is possible to eliminate settling effects, for instance. For other measurements, the settling time may be of particular interest.
For such cases, a measurement range can be defined for frequency, phase and power
results, in relation to specific hop or chirp characteristics.
Figure 4-11: Dwell time parameters for hopped signals
Similarly, for chirped signals, a measurement range can be defined for the corresponding parameters.
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Measurement basics
Measurement range
Figure 4-12: Measurement range parameters for chirped signals
Each range is defined by a reference point, an offset, and the range length. The reference point can be either the center or either edge of the hop/chirp, or a point defined
by an offset to one of these characteristic points. The range is then centered around
this reference point.
Example:
In Figure 4-11, the indicated measurement range could be defined by the following
parameters, for example:
●
"Reference": Hop End
●
"Offset": -x
●
"Alignment": right
●
"Length": L
For frequency/phase deviation and power measurements, the measurement range can
also be aligned to the end of the FM or PM settling time.
30User Manual 1178.3763.02 ─ 07
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