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R&S®IC-Check
Generic Test Software Library
User Manual
(?>ÁAZ)
1514511742
User Manual
Version 03
Page 2
This Software Description is valid for the R&S GTSL-Software version 2.90 (and higher versions).
© 2018 Rohde & Schwarz GmbH & Co. KG
Mühldorfstr. 15, 81671 München, Germany
Phone: +49 89 41 29 - 0
Fax: +49 89 41 29 12 164
Email: info@rohde-schwarz.com
Internet: www.rohde-schwarz.com
Subject to change – Data without tolerance limits is not binding.
R&S® is a registered trademark of Rohde & Schwarz GmbH & Co. KG.
Trade names are trademarks of the owners.
1514.5117.42 | Version 03 | R&S®IC-Check
The following abbreviations are used throughout this manual: R&S®IC-Check is abbreviated as R&S IC-Check.
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R&S®IC-Check
1 General....................................................................................................5
1.1 Reference Documents.................................................................................................. 5
1.2 Explanation of Symbols............................................................................................... 5
2 Software Installation..............................................................................6
3 Functional Description.......................................................................... 7
3.1 General...........................................................................................................................7
3.2 R&S IC-Check Test Library...........................................................................................8
3.2.1 General........................................................................................................................... 8
3.2.2 Entries in PHYSICAL.INI.................................................................................................9
3.2.3 Entries in APPLICATION.INI........................................................................................... 9
Contents
Contents
3.2.4 Functions.......................................................................................................................10
3.3 R&S IC-Check Loader................................................................................................. 11
3.4 R&S IC-Check User Interface..................................................................................... 11
3.5 Hardware for IC-Check Tests..................................................................................... 12
4 R&S IC-Check User Interface..............................................................13
4.1 General.........................................................................................................................13
4.2 Main Screen................................................................................................................. 13
4.3 Menu Structure............................................................................................................14
4.4 Menu Bar Functions....................................................................................................14
4.4.1 Main Menu <File>......................................................................................................... 14
4.4.1.1 Menu <Save Program>................................................................................................. 14
4.4.1.2 Menu <Save Program As...>.........................................................................................14
4.4.1.3 Menu <Write Report...>.................................................................................................15
4.4.1.4 Menu <Close>...............................................................................................................16
4.4.2 Main Menu <Configure>................................................................................................16
4.4.2.1 Menu <Enable Debug Display>.................................................................................... 16
4.4.3 Main Menu <Help>........................................................................................................17
4.4.3.1 Menu <About...>............................................................................................................17
4.5 Control Elements........................................................................................................ 17
4.5.1 IC Selection...................................................................................................................17
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R&S®IC-Check
4.5.2 PIN Selection................................................................................................................ 18
4.5.3 REF List........................................................................................................................ 18
4.5.4 PIN Measured Value Display.........................................................................................18
4.5.5 IC Measurement Result Overview Display....................................................................19
4.5.6 Pin Settings................................................................................................................... 19
4.5.7 Learning Mode.............................................................................................................. 20
4.5.8 Run IC Test................................................................................................................... 20
5 License Management...........................................................................22
6 Test Methods........................................................................................ 23
6.1 Test Setup.................................................................................................................... 23
6.2 Discharging the Reference Pins and Test Pins........................................................ 23
6.3 Checking Test Pins..................................................................................................... 24
Contents
7 Running R&S IC-Check....................................................................... 27
7.1 Calling R&S IC-Check Test Library Functions..........................................................27
7.1.1 Description.................................................................................................................... 27
7.1.2 Example........................................................................................................................ 27
7.2 Starting the R&S IC-Check Loader............................................................................ 30
7.2.1 Description.................................................................................................................... 30
7.2.2 R&S IC-Check Loader, starting.....................................................................................30
8 R&S IC-Check Test Programs............................................................. 34
8.1 Structure of an IC-Check Test File.............................................................................34
8.2 Keywords..................................................................................................................... 35
8.3 Required Entries......................................................................................................... 36
8.4 Configuration via the R&S IC-Check User Interface................................................ 37
8.4.1 Example: Determining the Optimum Settings............................................................... 38
8.4.2 Example: Determining the Limit Values via the Learning Mode.................................... 41
9 Report Format...................................................................................... 45
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R&S®IC-Check
1 General
1.1 Reference Documents
General
Explanation of Symbols
The Generic Test Software Library R&S IC-Check is part of the Generic Test Software
Library R&S GTSL. For this reason, the following documentation is to be noted in addition to this software description:
●
Software Description Generic Test Software Library R&S GTSL
The related test hardware is required for performing IC-Check tests. The test hardware
is described in the following documentation:
●
User Manual Test System Versatile Platform R&S CompactTSVP TS-PCA3
●
User Manual Test System Versatile Platform R&S PowerTSVP TS-PWA3
●
User Manual Analog Source and Measurement Module R&S TS-PSAM
●
User Manual Matrix Module B R&S TS-PMB
1.2 Explanation of Symbols
Certain text passages in this software description are specially highlighted. The passages marked in this way have the following significance:
Highlights important details to which special attention must be paid and that make your
work easier.
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R&S®IC-Check
2 Software Installation
Software Installation
Generic Test Software Library R&S IC-Check is installed using the installation routine
for the Generic Test Software Library R&S GTSL.
For a detailed description of the installation procedure for the Generic Test Software
Library R&S GTSL please refer to chapter “Software Installation” of the document:
●
Software Description Generic Test Software Library R&S GTSL
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R&S®IC-Check
3 Functional Description
3.1 General
Functional Description
General
Figure 3-1: R&S IC-Check Layer Model
Using Generic Test Software Library R&S IC-Check it is possible to prepare and perform tests on pins of ICs or other mounted electronic circuit devices. The individual
R&S IC-Check software components are arranged in layers exactly like R&S GTSL.
The bottom layer (device driver layer) of the R&S IC-Check contains the device drivers
necessary for the test hardware used. The test hardware is accessed using these
device drivers.
The middle layer (library layer) of the R&S IC-Check contains the R&S GTSL IC-Check
library. The R&S IC-Check library provides the functions necessary for performing the
IC-Check tests. In this layer further information is passed to the resource manager
library via the two files PHYSICAL.INI and APPLICATION.INI. The various device
drivers from the lowest level are called from this layer.
The top layer (execution layer) contains the test sequences for performing the ICCheck tests. The test sequences call functions from the R&S IC-Check test library in
the middle layer. The function calls include, e.g.
●
loading ICC programs,
●
running ICC programs,
●
debugging ICC programs and
●
the generation of reports.
The calls for the individual functions from the R&S IC-Check test library can be made
using a sequence editor (e.g. TestStand) or a dedicated C program.
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R&S®IC-Check
3.2 R&S IC-Check Test Library
Functional Description
R&S IC-Check Test Library
The top layer (execution layer) also contains the R&S IC-Check Loader and the R&S
IC-Check User Interface which is opened using a function call from the R&S IC-Check
test library.
For further information on R&S GTSL see "Software Description Generic Test Software
Library R&S GTSL"
R&S IC-Check includes the following parts and programs:
●
R&S IC-Check test library
●
R&S IC-Check Loader
●
R&S IC-Check User interface
The following section provides a short overview of the test functions available in the
R&S IC-Check test library.
The individual test functions and their parameters are described in the online help for
the R&S IC-Check test library. The help files (.HLP) are in the folder ...\GTSL\BIN.
Starting with GTSL 3.30, no GTSL license is required.
3.2.1 General
Name of the dynamic link library (.DLL):
Name of the help file (.HLP):
License required R&S TS-LBAS and
Supported devices: R&S TS-PMB Matrix Module
The R&S IC-Check test library offers functions for the IC-Check test using the R&S ICCheck software and the R&S TS-PSAM and R&S TS-PMB modules.
The functions allow to
ICCHECK.DLL
ICCHECK.HLP
R&S TS-LICC
R&S TS-PSAM Source and Measurement Module
●
load, run and debug ICC programs
●
generate a report
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R&S®IC-Check
3.2.2 Entries in PHYSICAL.INI
Functional Description
R&S IC-Check Test Library
Section [device->...]
Keyword Value Description
Type String Mandatory entry
pmb = R&S TS-PMB Matrix Module
psam = R&S TS-PSAM Source and Measurement Module
ResourceDesc String Mandatory entry
VISA resource descriptor in the form
PXI[segment number]::[device number]::
[function]::INSTR
CAN[board]::[controller]::[frame]::[slot]
DriverPrefix String Mandatory entry
Prefix for the IVI driver functions, without
underscore:
R&S TS-PMB : rspmb
R&S TS-PSAM : rspsam
DriverDLL String Mandatory entry
DriverOption String Mandatory entry
3.2.3 Entries in APPLICATION.INI
Section [bench->...]
Keyword Value Description
ICCDevice String Mandatory entry
SwitchDevice<i> String Mandatory entry
File name of the driver DLL
R&S TS-PMB : rspmb.dll
R&S TS-PSAM : rspsam.dll
Option string being passed to the device
driver during the Driver_Init function. See
the online help file for the appropriate device
driver.
Refers to the device section of the
R&S TS-PSAM
Refers to a section with switch
devices in PHYSICAL.INI.
<i> stands for a number from
1,2,3,...,n. The numbers must be
assigned in ascending order without gaps.
<i> may be omitted in the case it
is 1.
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R&S®IC-Check
Functional Description
R&S IC-Check Test Library
Keyword Value Description
AppChannelTable String Mandatory entry
Refers to a section with defined
channel names in
APPLICATION.INI.
Simulation 0 / 1 Optional entry
Blocks the simulation of the
entered devices (value = 0).
Enables simulation of the entered
devices (value = 1).
Default = 0
Trace 0 / 1 Optional entry
Blocks the tracing function of the
library (value = 0).
Enables the tracing function of the
library (value = 1).
Default = 0
ChannelTableCase
Sensitive
Section [io_channel->...]
Contains a list of user-specific channel names which are assigned to the physical
device names and to the physical device channel names. The defined names apply
only to the relevant application. For details about channel name syntax, refer to the
manual "Software Description GTSL", chapter 8.3.4.
Keyword Value Description
<user-defined name> String Physical channel description in
3.2.4 Functions
Setup ICCHECK_Setup
Cleanup ICCHECK_Cleanup
Library Version ICCHECK_Lib_Version
Program Control
Load Program ICCHECK_Load_Program
Run Program ICCHECK_Run_Program
Debug Program ICCHECK_Debug_Program
Report Generation
Write Report to File ICCHECK_Write_Report
Load Detailed Report ICCHECK_Load_Detailed_Report
0 / 1 Optional entry
The channel names in the channel table are treated case-sensitive (value = 1) or case-insensitive
(value = 0).
the combination
<device name>!<device channel
name>
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R&S®IC-Check
3.3 R&S IC-Check Loader
Functional Description
R&S IC-Check User Interface
Get Detailed Report Entry ICCHECK_Get_Detailed_Report_Entry
Attribute Information
Get Attribute Int ICCHECK_Get_Attribute_Int
Get Attribute Real ICCHECK_Get_Attribute_Real
Get Attribute String ICCHECK_Get_Attribute_String
Using the R&S IC-Check Loader the R&S IC-Check User Interface can be opened
directly.
The operation of the R&S IC-Check Loader is described in Chapter 7.2, "Starting the
R&S IC-Check Loader", on page 30.
3.4 R&S IC-Check User Interface
The R&S IC-Check User Interface for configuring and running an ICC program is started either using a function from the R&S IC-Check test library or using the R&S ICCheck Loader.
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R&S®IC-Check
Functional Description
Hardware for IC-Check Tests
Figure 3-2: R&S IC-Check User Interface
R&S IC-Check User Interface provides functions for configuring test parameters,
adjusting limit values (using the Learning Mode) and running an ICC program.
The individual functions of the R&S IC-Check User Interface are described in Chap-
ter 4, "R&S IC-Check User Interface", on page 13.
3.5 Hardware for IC-Check Tests
To be able to perform an IC-Check test using R&S IC-Check the following test hardware must be available:
●
Test System Versatile Platform R&S CompactTSVP TS-PCA3
●
Test System Versatile Platform R&S PowerTSVP TS-PWA3 (alternative expansion)
●
R&S TS-PSAM Source and Measurement Module
●
R&S TS-PMB Matrix Module B
The individual components of test hardware are described in the related user manuals.
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R&S®IC-Check
4 R&S IC-Check User Interface
4.1 General
4.2 Main Screen
R&S IC-Check User Interface
Main Screen
The Generic Test Software Library R&S IC-Check runs under the Microsoft Windows
operating systems.
To operate the Generic Test Software Library R&S IC-Check basic skills in the usage of
the Microsoft Windows operating systems are required.
Figure 4-1: Main Screen
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R&S®IC-Check
4.3 Menu Structure
R&S IC-Check User Interface
Menu Bar Functions
1 Menu bar see section 4.3 and 4.4
2 IC Selection see section 4.5.1
3 PIN Selection see section 4.5.2
4 REF List see section 4.5.3
5 PIN measurement results see section 4.5.4
6 Run IC Test see section 4.5.8
7 Learning Mode see section 4.5.7
8 IC measurement result overview see section 4.5.5
9 PIN settings see section 4.5.6
Figure 4-2: Menu structure
4.4 Menu Bar Functions
4.4.1 Main Menu <File>
4.4.1.1 Menu <Save Program>
All the changes made to the IC-Check program file currently loaded are saved.
4.4.1.2 Menu <Save Program As...>
Here, the IC-Check program file currently loaded can be saved with a different name.
All the changes made to the IC-Check program file currently loaded will also be saved.
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R&S®IC-Check
R&S IC-Check User Interface
Menu Bar Functions
4.4.1.3 Menu <Write Report...>
The topical measured values of the IC-Check program file currently loaded are written
into a report file. The name of the report file can be selected via the Windows standard
dialogue.
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R&S®IC-Check
R&S IC-Check User Interface
Menu Bar Functions
For a sample report file, please refer to chapter 9: Report Format.
4.4.1.4 Menu <Close>
The IC-Check user interface is closed.
4.4.2 Main Menu <Configure>
4.4.2.1 Menu <Enable Debug Display>
In this menu item, a marker can be set and removed again. When the marking has
been set, the recorded measured values of the selected pin will be displayed in the
form of a graphics after a measurement cycle.
For an example, please refer to Chapter 6, "Test Methods", on page 23.
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R&S®IC-Check
4.4.3 Main Menu <Help>
4.4.3.1 Menu <About...>
R&S IC-Check User Interface
Control Elements
The version number of the R&S IC-Check library is displayed.
4.5 Control Elements
4.5.1 IC Selection
Selection of the IC to be tested. All the ICs defined in the IC-Check program file (.icc
extension) currently loaded are listed.
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4.5.2 PIN Selection
R&S IC-Check User Interface
Control Elements
Selection of the pin, the configuration parameters and measured values of which are to
be displayed on the user interface. The selected pin will also be selected in the graphical display of all the pins of the selected IC.
4.5.3 REF List
Display of all the reference pins defined for the selected IC. This list is intended as a
display element only, it does not offer any options for selecting a reference pin. During
a measurement sequence, all the reference pins are connected with each other.
4.5.4 PIN Measured Value Display
These display fields display the CR measurement result and the configured limit values
-LIM and +LIM of the currently selected pin. If several consecutive measurements are
performed for one pin in learning mode, the lowest and highest value of the series of
measurement will be displayed in the MIN and MAX fields. For more information on the
learning mode, please refer to Chapter 8, "R&S IC-Check Test Programs",
on page 34.
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R&S®IC-Check
4.5.5 IC Measurement Result Overview Display
R&S IC-Check User Interface
Control Elements
This graphics in the center of the user interface shows all the pins of the IC currently
selected. The topical measured value and the configured limit values are displayed for
each pin. In test mode, the indicator bar representing the topical measured value will
be displayed in green as long as the measured value is within the permissible limits.
Otherwise the indicator bar will be red.
In the learning mode, in which multiple measurements are performed for each pin, the
entire range of the individual measured values will be displayed in orange. For more
information on the learning mode, please refer to Chapter 8.4.2, "Example: Determin-
ing the Limit Values via the Learning Mode", on page 41.
4.5.6 Pin Settings
Display of the measurement configuration of the currently selected pin. The individual
fields show the conditions on which the tests are performed for a pin. Changes in these
fields will become effective after either the Apply button, the Test button or the Learn
button has been clicked. It is possible to choose whether the current settings of all the
fields are to be applied to the pin currently selected or to all the pins of the IC currently
selected.
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R&S®IC-Check
4.5.7 Learning Mode
R&S IC-Check User Interface
Control Elements
In the learning mode, the configured measurements can be repeated automatically up
to 100 times. For each pin, the range between the lowest and the highest of the determined measured values will be displayed in orange as the measurement result. The
limit values to be set for each pin can then be adapted to this scatter range of the measurement values. There are two methods of doing so:
●
Limits are set ("Set Limits" button)
The limits are set around the scatter range. The distance of the limits to the scatter
range is defined for each pin in the ”Limit“ field of the ”Pin Settings“ area.
●
Existing limits are extended ("Extend Limits" button)
Existing limits will be changed such that their distance to the scatter area is at least
the value defined in the ”Limit“ field of the ”Pin Settings“ area. If the lower or upper
limit defined up to that point is further away from the scatter area than this value,
this limit value will not be changed.
The learning process can be performed for the IC currently selected or for all the ICs of
the currently loaded IC-Check program file.
The learning mode procedure is described in detail in Chapter 8.4.2, "Example: Deter-
mining the Limit Values via the Learning Mode", on page 41.
4.5.8 Run IC Test
The test can be performed for the IC currently selected or for all the ICs of the currently
loaded IC-Check program file. The required test time and the number of faults that
occurred will be displayed.
Faults that occurred can be accessed via the arrow keys that will then be displayed.
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R&S®IC-Check
R&S IC-Check User Interface
Control Elements
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R&S®IC-Check
5 License Management
License Management
The Generic Test Software Library R&S IC-Check is part of the Generic Test Software
Library R&S GTSL.
Starting with GTSL 3.30, no GTSL license is required.
During the installation of the Generic Test Software Library R&S GTSL, all available
test libraries and R&S IC-Check are copied to the system. You need the License Key
File named TS-LICC.lic in order to access the functions from the R&S IC-Check
test library. Refer to chapter “R&S GTSL license management” of the document “GTSL
Software Description” for a detailed description of the R&S GTSL license management.
Figure 5-1: License checking
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R&S®IC-Check
6 Test Methods
6.1 Test Setup
6.2 Discharging the Reference Pins and Test Pins
Test Methods
Discharging the Reference Pins and Test Pins
The following test equipment is used to perform the test:
●
Bipolar DC source (square wave generator) with programmable analogue voltage,
current limiting and switching frequency (R&S TS-PSAM).
●
Fast ammeter with equidistant data recording (R&S TS-PSAM).
●
Discharge circuit ( R&S TS-PSAM ).
●
Flexible wiring matrix for test points and measuring systems (R&S TS-PMB).
Figure 6-1: Discharging the reference pins and test pins
First, all the pins of the unit of a DUT (device under test) to be tested must be discharged so that faulty measurements due to charge reversal effects are prevented in
the test later on (typically due to integrated or parasitic capacitors).
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R&S®IC-Check
6.3 Checking Test Pins
Test Methods
Checking Test Pins
For this purpose, all the reference pins and test pins are discharged in a controlled via
the ammeter and the discharge circuit (with current limiting) to the GND potential and
connected to a common measuring line “Reference Pins” or “Inactive Test Pins”.
Figure 6-2: Checking test pins
In the second phase, every single test pin is disconnected from the common measuring line “Inactive Test Pins” and connected to the measuring line “Active Test Pin”. Via
the DC source connected in series with the ammeter, a DC voltage or a suitable
square wave signal is connected to the test pin. The output voltage, current limiting
and pulse frequency can be set individually for each test point. Isochronously with the
activation of the DC source, the current flow with be recorded equidistantly with a sampling frequency of 200 kHz. 256 values will be recorded. Subsequently, the test pin is
reconnected to the measuring line “Inactive Test Pins”.
Due to the bipolar characteristic of the DC source, multiple current paths can be measured in one measurement (refer to the example “red” and “green”).
What is generally referred to as the “Coupling Ratio” is determined as the measurement result. It indicates the ratio of the current flow through a pin to the set current limiting of the stimulus source. If a DC voltage is used as the stimulus on the pin, the current flow through the pin is calculated as the average value of all the recorded measured values. If, however, a pulsed voltage (square wave voltage) is used as the stimulus following a Fast Fourier Transformation (FFT) of the recorded data, the amplitude
of the basic oscillation is used as the dimension for the current flow through the pin.
From the theory of the FFT a spectral resolution of sampling frequency divided by the
number of recorded measured values, i.e. 200 kHz / 256 = 781.25 Hz. When testing a
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R&S®IC-Check
Test Methods
Checking Test Pins
pin, the frequency of the applied stimulus voltage is always set to a multiple of this
value (refer to the DCF setting parameters in Chapter 8.2, "Keywords", on page 35).
Example of current flow measured on a pin stimulated with a square wave voltage:
The recorded current profile is subjected to an FFT.
You obtain a typical “digital fingerprint” of a test bin based on the basic frequency (refer
to f[10] kHz in the diagram) and of its multiple of the generated DC stimulus source
square wave signal. Typically, the level of the basic frequency is the highest level. Due
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Test Methods
Checking Test Pins
to the bipolar characteristic of the DC source, the offset (f[0] in the diagram) is also
very concise and clearly different depending on the type of test pin or network (Input,
Output, Diode, R, C,…). The amplitude values are converted to a fictitious coupling
rate (CR= percentage of the set current limiting).
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R&S®IC-Check
7 Running R&S IC-Check
7.1 Calling R&S IC-Check Test Library Functions
7.1.1 Description
Running R&S IC-Check
Calling R&S IC-Check Test Library Functions
The Generic Test Software Library R&S IC-Check can be executed in two ways:
●
By opening a function from the R&S IC-Check test library.
●
Using the R&S IC-Check Loader.
Figure 7-1: Running R&S IC-Check by calling R&S IC-Check library functions
R&S IC-Check test library functions are called from the test sequence (e.g. test
sequence in TestStand or a dedicated C program). The test hardware available is managed using the resource manager with the aid of the configuration files
(PHYSICAL.INI and APPLICATION.INI). The R&S IC-Check library opens theR&S
IC-Check User Interface and the corresponding ICC program. The ICC program
opened can now be configured in the R&S IC-Check User Interface. The ICC program
can be executed on the test hardware directly from the R&S IC-Check User Interface.
An ICC program can also be loaded and executed without opening the R&S IC-Check
User Interface.
7.1.2 Example
In the following example, functions from the R&S IC-Check library are called from a C
program. Among other aspects, the R&S IC-Check User Interface can be opened.
#include <cviauto.h>
#include <ansi_c.h>
#include <userint.h>
#include <cvirte.h>
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R&S®IC-Check
Running R&S IC-Check
Calling R&S IC-Check Test Library Functions
#include "resmgr.h"
#include "iccheck.h"
// defines the drive and path for the example files
#define PATH "C:\\Program Files\\Rohde&Schwarz\\GTSL\\ICCHECK\\example\\"
int main (int argc, char *argv[])
{
short errorOccurred = FALSE;
long errorCode;
char errorMessage[GTSL_ERROR_BUFFER_SIZE] = "";
char userMessage[1024];
long resourceId = -1;
long programId = -1;
long numberOfICs;
long failCount;
int response = 0;
// load the configuration files
if ( ! errorOccurred )
{
RESMGR_Setup (0, PATH "example_physical.ini",
PATH "example1_application.ini",
&errorOccurred, &errorCode, errorMessage);
}
// load the ICCHECK library
if ( ! errorOccurred )
{
ICCHECK_Setup (0, "bench->ICC",
&resourceId,
&errorOccurred, &errorCode, errorMessage);
}
// load the ICC program
if ( ! errorOccurred )
{
ICCHECK_Load_Program (0, resourceId,
PATH "example1.icc",
&numberOfICs,
&errorOccurred, &errorCode, errorMessage);
}
do
{
// start the program
if ( ! errorOccurred )
{
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R&S®IC-Check
Running R&S IC-Check
Calling R&S IC-Check Test Library Functions
if ( 1 == ConfirmPopup ( "ICCHECK", "Start in configuration mode?" ) )
{
// configure the program with IC-Check user interface
ICCHECK_Debug_Program (0, resourceId,
0, // index of IC to test
&failCount,
&errorOccurred, &errorCode, errorMessage);
}
else
{
// run the program without IC-Check user interface
ICCHECK_Run_Program (0, resourceId,
0, // start index of ICs to test
0, // stop index of ICs to test
&failCount,
&errorOccurred, &errorCode, errorMessage);
}
}
// write the report to a text file
if ( ! errorOccurred )
{
ICCHECK_Write_Report (0, resourceId,
"iccreport.txt",
0, // 0 = overwrite, 1 = append
&errorOccurred, &errorCode, errorMessage);
}
// ask the user to run the program again
if ( ! errorOccurred )
{
sprintf ( userMessage, "%d tests failed\n\nTry again?", failCount );
response = ConfirmPopup ("ICCHECK", userMessage );
}
else
{
break;
}
} while (1 == response);
// error handling
if ( errorOccurred )
{
sprintf ( userMessage, "Error Code %d:\n\n%s", errorCode, errorMessage );
MessagePopup ( "ICCHECK", userMessage );
}
// release ICCHECK library
if ( resourceId >= 0 )
{
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R&S®IC-Check
7.2 Starting the R&S IC-Check Loader
7.2.1 Description
Running R&S IC-Check
Starting the R&S IC-Check Loader
ICCHECK_Cleanup (0, resourceId, &errorOccurred, &errorCode, errorMessage);
}
// close resource manager
RESMGR_Cleanup (0, &errorOccurred, &errorCode, errorMessage);
return 0;
}
Figure 7-2: Running R&S IC-Check by starting R&S IC-Check Loader
The R&S IC-Check Loader initiates the function calls to the R&S IC-Check test library.
In the R&S IC-Check Loader the names of the configuration files (PHYSICAL.INI and
APPLICATION.INI) must be entered. Hardware management is performed using the
resource manager. The R&S IC-Check Loader opens the R&S IC-Check User Interface
and the selected ICC program. The ICC program can now be configured in the R&S
IC-Check User Interface. The ICC program can be executed on the test hardware
directly from the R&S IC-Check User Interface.
7.2.2 R&S IC-Check Loader, starting
To open the R&S IC-Check User Interface in the standalone mode, perform the following steps:
The following buttons work identically in all dialogs of the R&S IC-Check Loader:
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R&S®IC-Check
Running R&S IC-Check
Starting the R&S IC-Check Loader
1. Start the R&S IC-Check Loader using Start->Programs->GTSL->IC-Check
Loader.
Opens the standard Windows dialog box for
opening files. Select the appropriate files for the
IC-Check.
The previous dialog of the R&S IC-Check Loader
appears.
The next dialog of the R&S IC-Check Loader
appears.
Quits the R&S IC-Check Loader.
Figure 7-3: R&S IC-Check Loader Select Configuration
Note: If there is no valid license for the test libraries used, the R&S IC-Check User
Interface is opened in the demo mode. The execution of the ICC program opened
is simulated.
Starting with GTSL 3.30, no GTSL license is required.
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R&S®IC-Check
Running R&S IC-Check
Starting the R&S IC-Check Loader
2. Use the dialog box "Browse..." button to select the appropriate Application Layer
Configuration File for the IC-Check. The path and file name for the selected Application Layer Configuration File is displayed.
3. Use the dialog box "Browse..." button to select the appropriate Physical Layer
Configuration File for the IC-Check. The path and file name for the Physical Layer
Configuration File selected is displayed.
4. Using the "Next" button, the selected configuration files are loaded and the dialog
for selecting a Bench and an ICC program appears.
Figure 7-4: R&S IC-Check Bench and Program Configuration
5. Select the appropriate Application Layer Bench.
All benches in the Application Layer Configuration File are displayed in the list box.
6. Use the dialog box "Browse..." button to select the ICC program file to be loaded.
7. Use the "Next" button to load the selected bench and ICC program file.
8. Depending on the information read from the selected bench the following two
options exist:
a) TheR&S IC-Check User Interface is opened.
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R&S®IC-Check
Running R&S IC-Check
Starting the R&S IC-Check Loader
b) The dialog box for the vacuum control is opened. If there is an entry for the
vacuum library in the Application bench, the dialog box for the vacuum control
is opened.
Example:
[bench->icc]
ICCDevice = device->psam
VacuumControl1 = device->psys1
VacuumControl2 = device->psys2
SwitchDevice1 = device->pmb1
... etc.
Figure 7-5: R&S IC-Check Loader Vacuum Control
9. Activate vacuum valves.
The vacuum control entries in the selected bench are represented by switch controls. A maximum of two entries can be supported. By selecting a switch control the
corresponding vacuum valve can be activated.
10. Use the "Next" button to open the R&S IC-Check User Interface.
Once the R&S IC-Check User Interface has been quit, the opening dialog box (R&S
IC-Check Loader Select bench and program File or RR&S IC-Check Loader Vacuum
Control ) is displayed again. Use the "Quit" button to exit the R&S IC-Check Loader.
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R&S®IC-Check
8 R&S IC-Check Test Programs
8.1 Structure of an IC-Check Test File
R&S IC-Check Test Programs
Structure of an IC-Check Test File
An IC-Check program file is a test file with the extension .icc. It can be created or
edited using any text editor. The logical structure of the ICC program file is made up of
information blocks on ICs to be tested. Each information block begins with the name of
the block in square brackets. All the subsequent lines begin with a keyword and either
describe the measurement configuration to be applied to test the individual pins of the
IC or the names of the pins and reference pins to be tested.
Example:
;
;
IC-Check Program File created on Fri May 08 13:13:36 2009
;
[IC1]
MSG = 'EPM7032'
DCV = 0.750
DCM = 1
DCC = 3
DCF = 0
DLY = 0
LIM = 3
REF = GND,
REF = VCC,
REF = 3.3V,
PIN = CTRQ0, MSG='D1.P34', LL=17.44, UL=23.47
PIN = CTRTC, MSG='D1.P35', LL=51.95, UL=58.29
PIN = CTRQ1, MSG='D1.P33', LL=51.74, UL=57.86
PIN = CTRQ2, MSG='D1.P31', LL=52.48, UL=58.57
[IC2]
MSG = 'V5 Cluster'
DCV = 2.000
DCM = 0
DCC = 2
DCF = 5
DLY = 0
LIM = 5
REF = GND,
REF = VCC,
PIN = INPUT, MSG='C17', DCV=0.100, DCM=1, DCF=30, DLY=1, LL=25.26, UL=51.46, LIM=13
PIN = TR1.B, MSG='BASISV5', DCV=0.900, DCF=0, LL=94.97, UL=104.99
PIN = TR1.C, MSG='COLLECTORV5', DCV=0.300, DCF=25, LL=78.37, UL=89.77
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R&S®IC-Check
8.2 Keywords
R&S IC-Check Test Programs
Keywords
PIN = TR1.E, MSG='EMITTERV5', DCV=0.040, DCF=11, DLY=1, LL=17.37, UL=28.15
PIN = OUTPUT, MSG='C31', DCV=0.200, DCF=20, LL=76.64, UL=90.08
The following keywords may be included in an ICC program file:
MSG The name of the IC to be tested. The name entered
here is also displayed on the user interface of the
IC-Check as the name of the IC. If the optional keyword MSG is missing, the name of the information
block will be used as the name for the IC (e.g. ‚[IC1]'
in the above example).
DCV Stimulus voltage for testing the pins of the IC in volt.
Value range: 0.0 V bis 5.0 V. No specification results
in a stimulus voltage of 1 V.
DCM Operating mode of the R&S TS-PSAM DC voltage
source DCS for generating the stimulus voltage.
Value range:
1: DCS operates in the bipolar mode (possible as of
R&S TS-PSAM modification index 3.0)
0: DCS operates in the unipolar mode. No specification results in the unipolar DCS mode.
On one pin tested with a DC voltage, two measurements with different stimulus voltages are performed
in the bipolar mode. First, the voltage +DCV is
applied and then the voltage -DCV; in each case,
the current is measured on the pin. If the DCS is
operated in the unipolar mode, only one current
measurement on the pin is performed with the stimulus voltage +DCV applied.
DCC Selects the current limiting to be set on the R&S TS-
PSAM DCS.
Value range:
0: 10 µA
1: 100 µA
2: 1 mA
3: 10 mA.
No specification results in a current limiting of 1 mA.
DCF Selects the pulse frequency of the R&S TS-PSAM
DCS stimulus voltage to be set.
Value range:
0: the pin is tested with a DC stimulus voltage.
1 to 50: A pulsed stimulus voltage with a frequency
of 200 kHz/256 * DCF is applied to the pin to be tested.
No specification results in a DC stimulus voltage.
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R&S®IC-Check
R&S IC-Check Test Programs
Required Entries
DLY Delay time in milliseconds between the application
of a test voltage on a pin and the measurement of
the current flow through the measuring unit MU of
the R&S TS-PSAM.
Value range:
0 ms to 100 ms.
No specification results in a delay time of 0 seconds.
Annotation:
Even a DLY value of 0 ensures that all the relays
involved in the measurement have switched reliably.
LIM The value used in the learning mode of the IC-
Check for the distance to be set between the most
unfavourable of all the measured results recorded in
the learning mode for one pin and the future limit
value.
Value range:
1 % to 25 %.
No specification results in a default value of 10 %.
REF Logical pin name defined in the "AppChannelTable"
section of the Application.ini file. This pin is
defined as the reference pin for all the measurements on other pins to be tested. 'The stimulus voltage is applied between this reference pin and the
pin to be tested. Multiple reference pins per IC can
be defined. During a measurement, all the reference
pins are connected with each other.
PIN Logical pin name defined in the "AppChannelTable"
8.3 Required Entries
Each information block of an IC-Check program file must include at least one entry of a
reference pin and one entry of a pin to be tested.
Example of minimum configuration
;
; IC-Check Program File
;
section of the Application.ini file. Here, the
previously specified configuration codes can optionally be entered again separated by commas. These
will then have a higher priority for this pin than the
configuration settings specified for the entire IC. If a
learning procedure was performed for an IC via the
IC-Check user interface, i.e. if the limit values of the
individual pins were automatically adapted to the
measured values determined for the pins, the limit
values for each pin will also be written when writing
the ICC program file. The lower limit value is specified via the LL keyword, the upper limit value via the
UL keyword.
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R&S®IC-Check
R&S IC-Check Test Programs
Configuration via the R&S IC-Check User Interface
[IC1]
REF = GND,
PIN = CTRQ0
If this program file is loaded and saved again directly afterwards via the user interface
of the IC-Check application, all the default configuration values will also be saved.
;
; IC-Check Program File created on Tue May 19 13:07:46 2009
;
[IC1]
MSG = ''
DCV = 1.000
DCM = 0
DCC = 2
DCF = 0
DLY = 0
LIM = 10
REF = GND, MSG=''
PIN = CTRQ0, MSG='', LL=40.00, UL=60.00
8.4 Configuration via the R&S IC-Check User Interface
To achieve optimum measurement results, each measurement on a pin of a component or an IC of the circuit to be tested must be configured via the setting parameters.
What is generally referred to as the "coupling ratio" is determined as the measurement
result. It indicates the ratio of the current flow through a pin to the set current limiting of
the stimulus source (also refer to Chapter 6, "Test Methods", on page 23). Ideally, this
"coupling ratio" is close to 50 %. A value close to 0 % points to a missing contact of the
pin to its environment (faulty soldering), a value close to 100 % points to a short-circuit
at this pin. With measurement results as close to 50 % as possible, you can achieve
the largest sensitivity of discrimination for measurements performed one after the other
on different test objects.
To achieve a measured value in the desired dimension, several settings can be
changed on the R&S IC-Check user interface. The effect of the individual changes to
setting parameters can be checked immediately through check measurements.
Notes on the setting parameters:
●
DCF:
If measurements are to be performed on capacitance or inductance values, the
stimulus source DCS of the R&S TS-PSAM is operated in pulsed mode. The pulse
frequency that can be set via the DCF parameter depends on the size of the
capacitance or inductance. The larger the value, the smaller the stimulus frequency
must be chosen. If, however, the ohmic characteristics of the test pin is in the focus
of interest, the effects caused by the reactance can be masked through a DC stimulus voltage. In this case, the DCF parameter will be assigned the value 0.
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R&S®IC-Check
R&S IC-Check Test Programs
Configuration via the R&S IC-Check User Interface
●
DCM:
If the pin to be tested features free-wheeling diodes or diodes for reverse voltage
protection that are not to be tested, the unipolar mode of the R&S TS-PSAM DCS
stimulus source is most appropriate. If, however, the bipolar mode is used, the
clamping effect of these diodes will be included in the measurement result so that
the function of the diodes can be tested as well.
●
DCV and DCC:
With the first tests of the measurement configuration on a pin, the stimulus voltage
DCV should be set to a value larger than 0.6 V and the current limiting DCC to the
medium current range, i.e. 1 mA. Subsequently, the two parameters are varied until
an optimum measurement result (coupling ratio) is achieved. If a pin is tested with
a pulsed stimulus source, the DCF parameter must also be varied accordingly.
●
DLY:
If DC measurements for testing the ohmic characteristics are performed on pins
that also feature capacitance or inductance values, a delay in milliseconds can be
defined. This program lets this delay time elapse before performing a measurement to let transient effects on the test pin fade that could render the measurement
instable. To detect any transient effects, the current flow measured on a selected
pin can be represented in the form of a graphics on the IC-Check user interface.
This function can be enabled via the menu item "Configure" > "Enable Debug Display".
8.4.1 Example: Determining the Optimum Settings
The pins of the following circuit are to be tested.
Figure 8-1: Example circuit
Minimum configuration that must be included in the corresponding information block of
the IC-Check program file:
;
; IC-Check Program File
;
[IC_V5]
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R&S®IC-Check
R&S IC-Check Test Programs
Configuration via the R&S IC-Check User Interface
REF = GND
REF = VCC
PIN = TR1.B
PIN = TR1.C
PIN = TR1.E
PIN = INPUT
PIN = OUTPUT
The channel names on the right-hand side of the assignments have already been
defined in the Application.ini file in advance. They represent specific channels of
the SwitchDevice also specified in the Application.ini file (R&S TS-PMB ).
After the program file has been loaded and the R&S IC-Check user interface has been
called (also refer to Chapter 7, "Running R&S IC-Check", on page 27), the following
screen will be displayed:
The default values set for all five pins to be tested do not yet yield useful results. Now
the measurement parameters must be adapted for each pin such that the measured
coupling ratio is as close to 50 % as possible. For pin 1, the basic pin of the transistor
called TR1.B, the stimulus voltage is reduced to achieve a lower current flow and thus
a lower "coupling ratio".
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R&S®IC-Check
R&S IC-Check Test Programs
Configuration via the R&S IC-Check User Interface
A stimulus voltage of 0.71 on pin 1 results in a current flow of approx. 0.5 mA and thus
to a measured value for the coupling ratio of approx. 50 %.
The measurement parameters for the other pins are now gradually set until all the
measurement results are in the desired range.
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R&S®IC-Check
R&S IC-Check Test Programs
Configuration via the R&S IC-Check User Interface
The next step is to set the limit values for each pin. The learning mode described in
Chapter 8.4.2, "Example: Determining the Limit Values via the Learning Mode",
on page 41 is used for this purpose.
8.4.2 Example: Determining the Limit Values via the Learning Mode
In the learning mode of the R&S IC-Check user interface, measurements can be performed on one IC or on all the ICs in a loop defined in the program file. In this case, all
the measurement results obtained will be evaluated and the variation of the measurement results for each pin will be shown in the form of a graphics. This information
serves for determining the permissible limit values for the "coupling ratio" of each pin.
In the present example, the measurements on the defined IC V5 will be repeated 20
times.
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R&S®IC-Check
R&S IC-Check Test Programs
Configuration via the R&S IC-Check User Interface
The permissible limit values must be adapted to the range of variation of the measurement results for the individual pins. There are two methods of doing so:
●
Setting of the limit values
The limits are set around the spreading range. The distance of the limits to the
spreading range is defined for each pin in the "Limit" field of the "Pin Settings"
parameter area.
●
Expansion of the existing limit values
Existing limits will be changed such that their distance to the spreading range is at
least the value defined in the Limit field of the Pin Settings area. If the lower or
upper limit defined up to that point is further away from the spreading range than
this value, this limit value will not be changed.
The limit values are set in the present example. Now, the following measurements are
all within the defined limits. The characteristics have now been ”learned“ for the tested
circuit. Now it is possible to test other modules in the production and check whether
they are within the limits of the reference module.
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R&S®IC-Check
R&S IC-Check Test Programs
Configuration via the R&S IC-Check User Interface
For pins, the spreading range of which is very small, the limit range can be set to values lower than the ten percent set in the present example.
Via the"File" > "Save Program" or "File" > "Save Program As" menu items the topical settings can be saved in a program file. The corresponding information block in the
program file will then look as follows:
;
; IC-Check Program File created on Tue May 19 17:34:29 2009
;
[IC_V5]
MSG = ''
DCV = 1.000
DCM = 0
DCC = 2
DCF = 0
DLY = 0
LIM = 10
REF = GND, MSG=''
REF = VCC, MSG=''
PIN = TR1.B, MSG='', DCV=0.710, LL=41.99, UL=62.12
PIN = TR1.C, MSG='', DCV=0.300, DCF=30, LL=54.09, UL=74.76
PIN = TR1.E, MSG='', DCV=0.060, DCF=10, DLY=1, LL=28.57, UL=50.04
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R&S®IC-Check
R&S IC-Check Test Programs
Configuration via the R&S IC-Check User Interface
PIN = INPUT, MSG='', DCV=0.100, DCM=1, DCF=30, DLY=1, LL=28.20, UL=48.50
PIN = OUTPUT, MSG='', DCV=0.200, DCF=21, LL=63.51, UL=87.20
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R&S®IC-Check
9 Report Format
Report Format
For each test step, i.e. for each tested pin, a report entry is created. This consists of
the following entries:
1. Header
The following entries are listed in the header:
● IC name and number of IC in order of appearance in the program file ( also
appears in the IC-Check user interface )
● Pin name and number of pin in order of appearance in the program file IC sec-
tion ( also appears in the IC-Check user interface)
● Status of measurement: Passed or Failed
2. Measured result
The measured result consists of the measured value (Coupling Ratio) in percent as
well as the lower and upper limit in square brackets.
Example:
;
; IC-Check Report created on Wed May 20 14:25:25 2009
;
IC [1]: 'IC_V5' Pin [1]: 'TR1.B' Passed
CR = 52.147 % [41.990 ... 62.120]
IC [1]: 'IC_V5' Pin [2]: 'TR1.C' Passed
CR = 64.702 % [54.090 ... 74.760]
IC [1]: 'IC_V5' Pin [3]: 'TR1.E' Passed
CR = 39.619 % [28.570 ... 50.040]
IC [1]: 'IC_V5' Pin [4]: 'INPUT' Passed
CR = 38.371 % [28.200 ... 48.500]
IC [1]: 'IC_V5' Pin [5]: 'OUTPUT' Passed
CR = 75.875 % [63.510 ... 87.200]
45User Manual 1514.5117.42 ─ 03
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