• High measurement speed
<0.5 ms/point (ZVM)
<0.7 ms/point (ZVK)
• Fast data transfer via IEC/IEEE bus
Transfer time <15 ms (200 points)
• Accurate calibration in test fixtures
and on wafers
Modern calibration techniques
TOM, TRM, TRL, TNA, TOM-X
• Swept frequency-conversion and
multitone measurements on amplifiers and mixers
– Arbitrary configuration of genera-
tor and receiver
– Selective receiver with fundamen-
tal mixing
• Easy integration into PC environ-
ment and networks
Internal PC with WindowsNT
• Embedding of virtual matching
networks
Import of virtual networks using
CAE-compatible file formats (
.S2P, *.S4P, *.flp)
*
.S1P,
*
Overview
Vector network analyzers of ZV family
The vector network analyzer family from
Rohde&Schwarz comprises the units
ZVRL, ZVRE, ZVCE, ZVR, ZVC, ZVM and
ZVK. All units are equipped with generator, test set, reference and receiver channels. The analyzers differ in frequency
range, unidirectional or bidirectional
measurement capabilities, active or passive test set, number of reference channels and thus availability of calibration
techniques.
For the units up to 4 GHz (ZVRL, ZVRE,
ZVR) and 8 GHz (ZVCE, ZVC), a separate
data sheet (PD757.1802) is available. In
addition, a free-of-charge CD-ROM (Order
No. 1007.9074.14-03) contains extensive
information on the network analyzers –
including manuals, application notes and
startup information.
Additional information can also be found
on the Rohde& Schwarz web site
(www.rohde-schwarz.com).
10 MHz .............................. 20 GHz
300 kHz ....... 4 GHz
9 kHz ..................... 4 GHz
10 Hz .......................... 4 GHz
20 kHz ........................ 8 GHz
300 kHz ................ 8 GHz
ZVR, ZVRE
(active bridges)
ZVR, ZVRE, ZVRL
(passive bridges)
ZVR, ZVRE, ZVRL
(with Ext. Measurements option)
ZVC, ZVCE
(active couplers,
passive bridges)
ZVC, ZVCE
(active bridges)
Network Analyzers ZVM and ZVK ...
Versatile test set for universal use
ZVM and ZVK are compact instruments
with integrated generator, two reference
and two receiver channels and a bidirectional test set. This can be extended by
attenuators with integrated switches in
the generator and receiver paths. With
this configuration, ZVM and ZVK offer
direct access to all reference and receiver
channels. This concept makes ZVM and
ZVK well equipped for complex test setups, for example for bidirectional measurements on power amplifiers.
Fundamental mixing concept
ZVM and ZVK have two independent synthesizers for the generator and the
receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic
range and outstanding selectivity,
enabling straightforward measurements
on frequency-converting DUTs or DUTs
with extremely high selectivity.
Embedding and de-embedding
of virtual networks, CAE software
The Virtual Embedding Networks option
enables virtual embedding of arbitrary
linear two-port networks into the test
setup. The required data (
.S4P, *.flp) are obtained from a measure-
*
ment of the existing network or generated by CAE tools from the theoretical
model.
In tests of components that have to be
matched to a given impedance, the
matching network can thus be taken into
account through mathematical algorithms of ZVM and ZVK instead of using
the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any
loss of speed – great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be
analyzed, compensating for the effects of
its housing and bonding leads through
de-embedding.
.S1P, *.S2P,
*
Powerful and highly precise
Special calibration techniques
ZVM and ZVK feature modern calibration
techniques patented by Rohde&Schwarz
that allow full two-port calibration using
fewer or only partially known standards.
This simplifies the design of calibration
standards used for example in test
fixtures or on wafers. Thus calibration in
non-coaxial systems can be performed
with a minimum of effort at maximum
accuracy and dynamic range.
Time-domain measurements
By transforming measurement data from
the frequency to the time domain, discontinuities or impedances along the DUT
can be displayed as a function of DUT
length. With a maximum number of 2001
points, ZVM and ZVK can measure even
very long DUTs with high resolution. Five
filters allow the location of a discontinuity
and the sidelobe suppression to be determined with optimum resolution.The
S-parameters of a given discontinuity can
be displayed in the time domain by setting a window (gating). An additional
processor module included in the corresponding option accelerates data
... designed for the most stringent demands
processing and the display of results to
provide even realtime display – a valuable
aid, for example in the tuning of bandpass filters with time domain transformation.
printer, or the use of software tools on
ZVM or ZVK for result processing or control of the network analyzers via the IEC/
IEEE bus or an internal RSIB*) data bus.
ZVM and ZVK can thus act as controllers
of their own or for a complete test or pro-
Internal PC and Ethernet
ZVM and ZVK are based on Windows NT.
The user has complete access to the hard
duction system. Moreover, the internal
PC enables control and data exchange
via Ethernet.
disk, the floppy disk drive and all interfaces of the internal PC. This allows, for
example, the connection of an external
monitor, the installation of any type of
Decoupled 4-channel display
In the decoupled mode, the frequency
grid, measurement bandwidth, calibra-
ZVM and ZVK extend the frequency range of the Rohde&Schwarz network analyzers to 20 GHz and 40 GHz. Their outstanding performance in terms of speed,
dynamic range and accuracy shows already in standard applications such as
S-parameter or group delay measurements. This is enhanced by a wealth of measurement, display and logging functions. In addition, ZVM and ZVK can be used
for complex measurement tasks, for example measurements on frequency-converting DUTs (conversion loss, intermodulation, spurious) and nonlinear measurements (intercept point and compression point).
tion technique and measurement mode
can be configured independently for each
of the four display channels. In amplifier
measurements, this allows the simultaneous measurement and display of
important parameters in quasi-realtime,
such as gain, compression point (power
Highlights in brief
ZVMZVK
Frequency range10 MHz to 20 GHz10 MHz to 40 GHz
Frequency resolution100 µHz
Impedance50 Ω
Te st p o rt sPC 3.5 male2.92 mm male
Measurement time
(normalized)
Output power+5 dBm/+2 dBm to −85 dBm 0 dBm/−5 dBm to −85 dBm
Power uncertainty<1 dB to 2 dB
Dynamic range
(IF bandwidth 10 Hz)
Measurement bandwidths1 Hz to 10 kHz (in 9 steps) and 26 kHz
Calibration techniques
2 Vector Network Analyzers ZVM, ZVK
<0.5 ms/point<0.7 ms/point
>85 dB (<0.5 GHz)
>115 dB (0.5 GHz to 8 GHz)
>110 dB (8 GHz to 16 GHz)
>100 dB (16 GHz to 20 GHz)
TOM, TRM, TNA, TOM-X, AutoKal (all Rohde& Schwarz patents),
TRL, TOSM, normalization techniques
>80 dB (<0.5 GHz)
>110 dB (0.5 GHz to 8 GHz)
>105 dB (8 GHz to 16 GHz)
>90 dB (16 GHz to 20 GHz)
>90 dB (20 GHz to 28 GHz)
>80 dB (28 GHz to 40 GHz)
sweep) and harmonics versus power or
frequency, or compression point versus
frequency (see screen display below).
Time-optimized calibration, measurement and control
The Rohde&Schwarz two-port calibration
techniques reduce the number of required
calibration standards to a minimum of 2.
This significantly cuts the time required for
manual calibration. The short measurement time of
<
500 µs or <700 µs per
point guarantees minimum sweep times
through to realtime display. The output of
a marker value via the IEC/IEEE bus takes
less than 5 ms, the transfer of a complete
trace (200 points) less than 15 ms. These
featur es are the b asis for the exce llent pe rformance of ZVM and ZVK both in manual
operation and in automated test systems.
*) Remote control via an internal software interface
using the same SCPI command syntax as for normal
Vector Network Analyzers ZVM, ZVK3
Convincing concepts – features in detail
1
Patented calibration techniques
Besides various normalization techniques, ZVM and ZVK offer the classic
12-term TOSM technique (Through,
Open, Short, Match). In addition, the
analyzers feature as standard other calibration techniques mostly patented by
Rohde&Schwarz: TOM, TRM, TRL,TNA, TOM-X (Fig. 4).
The standards are defined as follows *):
THROUGH
Through-connection of known length
OPEN
Open circuit of known length and phase
response
Extremely short measurement
times
A powerful microprocessor system combined with ultra-fast synthesizers makes
for extremely short measurement times
even with a large number of test points
and small measurement bandwidths
(Fig. 3). This in conjunction with short
IEC/IEEE-bus access and transfer times
considerably speeds up automated test
and production sequences.
Ultra-wide dynamic range
The extremely low-noise front end, using
fundamental mixing, yields a dynamic
range that, with appropriate configuration, by far exceeds the specified values
of 115 dB (Fig. 2) and 110 dB. This exceptionally wide range makes it possible to
measure RF components with high stopband attenuation and achieve high accuracy also at low power levels.
The Rohd e&Schwarz calibration techniques offer maximum
convenience and accuracy also for on-wafer measurements
SHORT
Short circuit of known length
MATC H
Matched termination
Bandpass filter measurement with ZVM: the extremely
low-noise front end based on fundamental mixing yields a
dynamic range of up to >140 dB (not guaranteed)
2
4 Vector Network Analyzers ZVM, ZVK
*) For detailed description see specifications.
LINE
Ideal matched line of known length
accurate, full two-port calibration in test
fixtures or on wafers (Fig. 1).
Measurements on amplifiers and
frequency-converting DUTs
REFLECT
Reflecting one-port standard,
identical for PORT 1 and PORT 2
ATTENUATOR
Matched attenuator with unknown
attenuation
The advantage of the 7-term calibration
techniques (TRL, TNA, TRM, TOM) is the
reduced number of calibration standards
required and their simplified description.
In particular, the use of REFLECT or
NETWORK avoids the use of OPEN and
thus the complex determination of the
fringing capacitance. This allows the
design and production of calibration
st an dard s a t rea so nabl e c ost a nd enab le s
TRL is recommended where high directivity is necessary.
TNA is recommended for applications
with symmetrical test ports and where a
well-matched two-port or double match
(ATTENUATOR) can be provided in sufficient quality. If the calibration step is carried out with NETWORK, the test fixture
can simply be left open. Thus a full twoport calibration can be performed with
only two standards and the same accuracy as TOSM.
TOM offers the advantage of implicit verification: errors resulting from faulty calibration standards or operator errors are
automatically detected with high probability and thus avoided already during calibration.
The system concept of ZVM and ZVK with
two independent synthesizers for the
generator and receiver sections enables
versatile measurements with excellent
accuracy, wide dynamic range and high
measurement speed on frequency-converting and nonlinear DUTs such as
amplifiers and mixers. Three generators
(one internal, two external) can be configured and controlled independently of
each other. The fundamental mixing concept of ZVM and ZVK and the resulting
high selectivity make additional external
filters superfluous. The receiver will even
detect weak signals such as intermodulation products and spurious, since the full
sensitivity and dynamic range of ZVM and
ZVK are available also for selective, frequency-converting DUTs.
3
Measurement times
Frequency sweeps with 401 test points
IF bandwidth 10 kHz
ZVMZVK
Frequency range
10 MHz to 20 GHz or 10 MHz to 40 GHz
Frequency-converting and nonlinear
DUTs of any type (e.g. front ends, see
Fig. 5) can thus be measured with little
effort. The decoupled measurement and
display mode permits the simultaneous
display of different parameters on ZVM or
ZVK (Figs 6 and 7).
The user-friendly MIXER MODE menu
makes it very easy to configure mixer
measurements with constant or swept
RF, IF or LO. For more complex measurement tasks, the ARBITRARY mode offers
almost unlimited configurations of the
internal and the external generators and
the receiver of ZVM and ZVK.
• intermodulation products of amplifiers and mixers (e.g. IP3, IP5, IP7...)
•spurious
Front-end measurement: simultaneous display of both sidebands, LO crosstalk and RF input
matching
Amplifier measurement:
simultaneous display of gain,
compression and harmonics
versus power, and display of
compression point versus frequency
• mixture products of DUTs with multiple frequency conversion, multipliers,
dividers and combinations of such
components
In am plif ier m ea sure ment s, ZVM a nd ZV K
can display even nonlinear parameters
versus frequency, e.g.:
• n dB compression point
• second-order intercept point (SOI)
• third-order intercept point (TOI)
7
The Rohde&Schwarz network analyzers
offer system error and power correction,
yielding high accuracy in the measurement of S-parameters and absolute
power.
Two DC inputs at the rear enable the
display of DC voltages versus frequency,
and in amplifier measurements the power
added efficiency (PAE) can be displayed.
6 Vector Network Analyzers ZVM, ZVK
Test set and system configuration
ZVM and ZVK are four-channel instruments with two measurement and two
reference channels. The test sets are of
fully symmetrical design in the forward
and the reverse direction (Fig. 8).
During a bidirectional sweep, the electronic RF switch applies the signal to the
DUT at every frequency point in the forward and the reverse direction: ZVM and
ZVK thus indicate the fully corrected
measured values during the sweep − a
valuable aid in alignments at small measurement bandwidths.
Optional step attenuators (ZVM-B21 to
-B24, ZVK-B21 to -B24) with attenuation
from 0 dB to 70 dB in steps of 10 dB can
be inserted into the generator and
receiver paths (Fig. 8).
The attenuators extend the output power
range down to –90 dBm and the maximum input power at PORT 1/2 to
+27 dBm.
If ZVM or ZVK are fitted with an attenuator in a receiver path, an additional test
por t – IN PUT b 1 o r I NP UT b2 – i s a vail ab le
on the front panel. An internal switch in
the attenuator enables direct access to
the respective receiver channel, bypassing the coupler. Sensitivity and dynamic
range are thus increased by typically
10 dB. The two reference channels can be
accessed directly too, since the associated paths are routed via the front panel
as standard (R1 CHANNEL IN/OUT,
R2 CHANNEL IN/OUT, Fig. 8). In the case
of ZVM, the PORT 1, PORT 2, INPUT b1
and INPUT b2 test ports are PC3.5 male
connectors, the inputs and outputs of the
reference channels are SMA female connectors. In the case of ZVK, all ports are
2.92 mm male connectors, the inputs and
outputs of the reference channels are
2.92 mm female connectors.
A network analyzer equipped with
receiver step attenuators not only offers
sensitivity and dynamic range increased
by 10 dB, but also the functionality of an
instrument without a test set ("Delete
Testset"), i.e. direct access to the reference and measurement channels.
Active DUTs can be powered and driven
via the inner conductors of PORT 1 and
PORT 2 with DC voltage of up to 30 V or
200 mA. The required DC power is applied
via rear-panel BNC connectors.
The flexible concept of the network analyzers allows the configuration of complex
external test sets for special measurement tasks such as:
• group delay of mixers with the aid of a
reference mixer
• high-power measurements on power
amplifiers using a test set with
preamplifiers (Fig. 9)
•S
measurement on power amplifier
22
during operation
Test set of ZVM and ZVKProposal of external test set for measurements on power amplifiers (DUTs)
8
Vector Network Analyzers ZVM, ZVK7
9
Specifications
Unless otherwise stated, specifications apply to test ports PORT 1 and
PORT 2, a nominal output power of –10 dBm at the source port and an
IF bandwidth ≤10 kHz.
Especially important data are framed in blue
Measurement range
Characteristic impedance50 Ω
Port connectors
ZVM3.5 mm (male)
ZVK2.92 mm (male)
Frequency
Range ZVM10 MHz to 20 GHz
Range ZVK10 MHz to 40 GHz
Uncertainty4 x 10
Resolution100 µHz
Number of test points (selectable)1 to 2001
Measurement time per point
with min. 400 pointsZVMZVK
and IF bandwidth of10 Hz10 kHz10 kHz
with system error correction<200 ms<0.9 ms<1.1 ms
normalized<100 ms<0.5 ms<0.7 ms
Dynamic range (without system error correction,
without optional attenuator)ZVMZVMZVKZVK
at IF bandwidth of10 Hz10 kHz10 Hz10 kHz
up to 500 MHz>75 dB >45 dB >70 dB >40 dB
500 MHz to 8 GHz>115 dB >85 dB >110 dB >80 dB
8 GHz to 16 GHz>110 dB >80 dB>105 dB >75 dB
16 GHz to 20 GHz>100 dB >70 dB >90 dB >60 dB
20 GHz to 28 GHz>90 dB >60 dB
28 GHz to 40 GHz>80 dB >50 dB
(The dynamic range is defined as the difference between the maximum nominal
source power and the peak value displayed after smoothing the measured trace
for the transmission magnitude with an aperture of 1%, the trace being caused
by inherent noise and crosstalk, with test ports short-circuited.)
Measurement bandwidths
(IF bandwidths) 1 Hz to 10 kHz (half-decade steps) and
−6
+ 1 x 10−6 x operating time in
years
26 kHz (full)
Measurement accuracy
The following data are valid between 20°C and 26°C, provided the instrument
has reached thermal equilibrium (about 1 h after switch-on) and the temperature
has not varied by more than 1 K after calibration. Validity of the data is conditional
on the use of a suitable calibration kit by which the effective system data specified below are achieved.
ZVM uncertainty of transmission measurements
after system error correction
Specifications are based on a matched DUT, an IF bandwidth of 10 Hz, and a nominal output power of –10 dBm at the source port.
10 MHz to 500 MHz
for +15 dB to −25 dB0.2 dB or 2°
for −25 dB to −35 dB1 dB or 6°
500 MHz to 8 GHz
for +15 dB to +5 dB0.2 dB or 2°
for +5 dB to −50 dB0.1 dB or 1°
for −50 dB to −65 dB0.2 dB or 2°
for −65 dB to −80 dB1 dB or 6°
8GHz to 16GHz
for +15 dB to −55 dB0.2 dB or 2°
for −55 dB to −70 dB1 dB or 6°
16 GHz to 20 GHz
for +12 dB to +5 dB0.3 dB or 3°
for +5 dB to −30 dB0.2 dB or 2°
for −30 dB to −45 dB0.3 dB or 3°
for −45 dB to −60 dB1 dB or 6°
ZVM uncertainty of reflection measurements
after system error correction
Specifications are based on an isolating DUT, an IF bandwidth of 10 Hz, and a
nominal output power of –10 dBm at the source port.
10 MHz to 20 GHz
for +10 dB to +3 dB0.6 dB or 4°
for +3 dB to −15 dB0.4 dB or 3°
for −15 dB to −25 dB1 dB or 6°
for −25 dB to −35 dB3 dB or 20°
Variation of data trace at 0 dB
per Kelvin of temperature variation<0.2 dB or <2°
ZVK uncertainty of transmission measurements
after system error correction
Sp eci fic atio ns a re b ase d on a mat che d DU T, an I F ba ndw idt h of 10 H z, a nd a nom inal output power of –10 dBm at the source port.
10MHz to 500MHz
for +10 dB to −15 dB0.2 dB or 2°
for −15 dB to −30 dB1 dB or 6°
500 MHz to 8 GHz
for +10 dB to +5 dB0.2 dB or 2°
for +5 dB to −45 dB0.1 dB or 1°
for −45 dB to −60 dB0.2 dB or 2°
for −60 dB to −75 dB1 dB or 6°
8GHz to 16GHz
for +10 dB to −50 dB0.2 dB or 2°
for −50 dB to −65 dB1 dB or 6°
16 GHz to 28 GHz
for +5 dB to −20 dB0.2 dB or 2°
for −20 dB to −35 dB0.3 dB or 3°
for −35 dB to −50 dB1 dB or 6°
28 GHz to 40 GHz
for +5 dB to −10 dB0.2 dB or 2°
for −10 dB to −25 dB0.3 dB or 3°
for −25 dB to −40 dB1 dB or 6°
ZVK uncertainty of reflection measurements
after system error correction
Specifications are based on an isolating DUT, an IF bandwidth of 10 Hz, and a
nominal output power of –10 dBm at the source port.
10 MHz to 20 GHz
for +5 dB to −15 dB1 dB or 6°
for −15 dB to −30 dB3 dB or 20°
20 GHz to 40 GHz
for +5 dB to 0 dB2 dB or 15°
for 0 dB to −10 dB1 dB or 6°
for −10 dB to −25 dB3 dB or 20°
Variation of data trace at 0 dB
per Kelvin of temperature variation<0.2 dB or <2°
8 Vector Network Analyzers ZVM, ZVK
Effective system data
Input level
The following data are valid between 20°C and 26°C, provided the instrument
has reached thermal equilibrium (about 1 h after switch-on) and the temperature
has not varied by more than 1 K after calibration. The data are based on an IF
bandwidth of 10 Hz and system error calibration by means of a suitable calibration kit.
Frequency range50 MHz to 20 GHzabove 20 GHz
ZVMZVKZVK
Directivity>46 dB>42 dB>38 dB
Source match>36 dB>36 dB>33 dB
Reflection tracking<0.1 dB<0.1 dB<0.1 dB
Load match>46 dB>42 dB>38 dB
Transmission tracking<0.1 dB<0.1 dB<0.2 dB
Output power
Range without optional generator step attenuator
ZVMZVK
up to 16 GHz−20 dBm to +5 dBm −20 dBm to 0 dBm
above 16 GHz−20 dBm to +2 dBm −20 dBm to −5 dBm
Uncertainty at −10 dBm
without optional power calibration2 dB2 dB
150 MHz to 16 GHz in
temperature range 20°C to 26 °C 1 dB1 dB
Linearity (referred to −10 dBm)<1 dB<1 dB
above 150 MHz in
temperature range 20°C to 26 °C <0.4 dB<0.4 dB
Resolution0.1 dB0.1 dB
Spectral purity
Harmonics
at maximum nominal source powerZVMZVK
up to 10 GHz<−23 dBc<−20 dBc
10 GHz to 20 GHz<−17 dBc<−15 dBc
above 20 GHz<−25 dBc
at −10 dBm source power
up to 10 GHz<−30 dBc<−30 dBc
above 10 GHz<−25 dBc<−25 dBc
Spurious<−35 dBc<−35 dBc
Maximum nominal input level
without optional receiver step attenuator+5 dBm
with receiver step attenuator set to 0 dB+5 dBm
with receiver step attenuator set to ≥30 dB+27 dBm
Level measurement uncertainty (without optional power calibration)
in temperature range 20 °C to 26 °C
up to 500 MHzfor +5 dBm to –45 dBm2 dB
500 MHz to 16 GHz for +5 dBm to –70 dBm2 dB
16 GHz to 20 GHz for +5 dBm to –50 dBm2 dB
20 GHz to 28 GHz for +5 dBm to –50 dBm (ZVK)3 dB
above 28 GHzfor +5 dBm to –30 dBm (ZVK)4 dB
Damage level
without optional receiver step attenuator+27 dBm
with receiver step attenuator set to 0 dB+27 dBm
with receiver step attenuator set to ≥30 dB+30 dBm
Damage DC current/voltage0.5 A or 30 V
RMS noise level at IF bandwidth 10 Hz
up to 500 MHz<−80 dBm
500 MHz to 8 GHz<−110 dBm
8 GHz to 16 GHz<−105 dBm
16 GHz to 20 GHz<−95 dBm
20 GHz to 28 GHz (ZVK)<−95 dBm
above 28 GHz (ZVK)<−85 dBm
Match (without system error correction)
up to 50 MHz>10 dB
50 MHz to 8 GHz>12 dB
8 GHz to 20 GHz>10 dB
above 20 GHz (ZVK)>8 dB
Reference channel inputs
R CHANNEL IN
ZVMZVK
ConnectorsSMA (female)2.92 mm (female)
Match>12 dB>8 dB
Maximum nominal input level+5 dBm+5 dBm
Damage level+20 dBm+20 dBm
SSB phase noise
1 Hz bandwidth,10 kHz from carrier
up to 150 MHz<−100 dBc
150 MHz to 1 GHz<−90 dBc
above 1 GHz<−90 dBc + 20 x log (f/GHz)
<−78 dBc at 4 GHz
<−72 dBc at 8 GHz
<−64 dBc at 20 GHz
<−58 dBc at 40 GHz (ZVK)
Residual FM
RMS weighting from 10 Hz to 3 kHz
up to 150 MHz<2 Hz
150 MHz to 1 GHz<5 Hz
1 GHz to 2 GHz<10 Hz
2 GHz to 4 GHz<20 Hz
4 GHz to 8 GHz<40 Hz
8 GHz to 20 GHz<80 Hz
20 GHz to 40 GHz (ZVK)<160 Hz
System error correction techniques
ZVM and ZVK offer normalizations for reflection and transmission measurements,
full one-port calibration (3-term, OSM), one-path two-port calibration, and the
classic 12-term two-port calibration (TOSM). In addition, the following full twoport calibration methods are available: TOM, TRM, TRL, TNA and TOM-X (15term). TOM, TRM, TNA and TOM-X are calibration methods patented by
Rohde& Schwarz.
The names of the methods indicate the standards used for calibration:
T = Through
The T standard is a two-port standard which establishes a direct low-loss connection between the two test ports. A frequency-dependent attenuation can be taken into account by the analyzer. The standard has to be well-matched and may
have any electrical length, which has to be exactly known (compare L standard).
O = Open
Th e O s ta nda rd is a on e-p ort st and ar d. I t re al ize s t ota l re fl ect io n wi th a ma gn itu de
of 1 in the ideal case and a phase of approx. 0°. The phase response versus frequency must be accurately known to the analyzer (coefficients C
dependent increase of the return loss can be taken into account by the analyzer.
The electrical length of the O standard may differ from zero and must be exactly
known.
Vector Network Analyzers ZVM, ZVK9
). A frequency-
i
S = Short
Th e S s tan dar d is a on e-p ort sta nda rd. It real ize s to ta l re fle cti on w ith a ma gni tud e
of 1 in the ideal case and a phase of approx. 180° at short-circuit plane (coeffi-
). A frequency-dependent increase of the return loss can be taken into ac-
cients L
i
cou nt by t he analyzer. The e lectr ical len gth of the S standa rd may dif fer fr om zero
an d m us t be kn own . I t c aus es a l eng th -p rop or tio na l f req ue nc y de pe nd enc e o f t he
phase.
M = Match
The M standard is a one-port standard which in the ideal case realizes a zero-reflection termination for the reference impedance (mostly 50 Ω). A sliding match
is often used at high frequencies because it yields higher effective directivities
than fixed loads.
R = Reflect
The R standard is a one-port standard. In contrast to the M standard it features
high reflection which may assume any unknown value. It must be known however wh eth er the ref le ct a pp roa ch es a n op en or a sh ort ci rcu it . If li ne t ran sf orm at ion
is to be expected from open to short because of the electrical length of the
R standard, the electrical length has to be approximately known.
L = Line
The L standard is a two-port standard. It establishes an almost perfectly matched
connection between the two test ports and defines the reference impedance. A
frequency-dependent attenuation caused by the L standard can be taken into account by the analyzer. The L standard has to have an electrical length different
from that of the T standard, but the difference should not amount to an integer
multiple of half the wavelength (singularity).
The N standard is a two-port standard featuring symmetrical reflection which
may as sum e any valu e other tha n zer o but has to b e id enti cal at b oth port s. Sa me
as with the R standard it must be known whether the reflection approaches an
open or a short circuit. Transmission of the N standard is arbitrary, need not be
known and may vary arbitrarily versus frequency. In the extreme case it may even
be 1 or zero.
A = Attenuator
The A standard is a two-port standard. It has to be well-matched and may feature
any unknown attenuation different from that of the T standard.
TO M-X ( X = c ros sta lk) is a n ex ten sio n of the TOM m eth od. It c ons ide rs a ll p oss ibl e
crosstalk between the four receiver channels (full model). Since this technique
does not use approximations, it is particularly effective in the elimination of crosstalk and thus in increasing the effective dynamic range of the system. This method however needs a higher effort.
Display
Screen26 cm colour LCD
Resolution640 x 480 x 256
Sweep modesfrequency, power, and time
Parameter formats (examples)S parameters and derived quantities like
SWR, impedance, admittance, group
delay, etc, as well as nonlinear parameters (optional) like n dB compression
point, SOI and TOI.
Complex parameters are displayed
either in a complex form or formatted to
magnitude, phase, real or imaginary part
Diagrams (examples)Cartesian: linear, simple or double loga-
rithmic, segmented
polar: linear, logarithmic or segmented,
Smith (any zoom), inverted Smith, Charter
Scaling (examples)0.001 dB/ to 50 dB/
1 m°/ to 200 k°/
1 pU/ to 1 GU/
(automatically variable number of grid
lines through MAX/MIN scaling)
Multichannel displayup to 4 independent display channels
(CH1 to CH4)
LEVEL (input for external level control)
Frequency range0 Hz to 100 kHz
Voltage range0 V to 10 V
Input impedance>10 kΩ
DC MEAS INPUTS DC 1/2 (DC measurement inputs)
Voltag e ra nge−10 V to +10 V
Measurement uncertainty0.1 V
Input impedance>10 kΩ
EXT FREQ REF IN (input for external reference frequency)
Frequency (in 1 MHz steps)1 MHz to 15 MHz
Max. permissible deviation6 x 10
Input level (V
Input impedance1 kΩ
)0.1 V to 3 V
rms
EXT FREQ REF OUT (output of internal reference frequency)
Frequency10 MHz
Frequency uncertainty4 x 10
−6
+ 1 x 10−6 x operating time in years
Level (sine)12 dBm ± 3 dB into 50 Ω
EXTERNAL GENERATOR
Connectors for high-speed control of an external generator from Rohde&Schwarz
families SME, SMP, SMT, etc. The BLANK signal is low at each frequency point of
the sweep and high during the transition from one point to the next. The network
analyzer controls the external generator by means of the TRIGGER signal. To set
the generator to the next frequency point, the TRIGGER signal goes high for a
brief period.
BLANK (input)TTL signal
TR IG GE R (output)TTL signal
ANALYZER MONITORIBM-PC-compatible VGA connector for
analyzer screen
PC MONITORIBM-PC-compatible VGA connector for
PC screen
MOUSEIBM-PC-compatible PS/2 connector
KEYBOARDIBM-PC-compatible 5-contact
DIN connector
USER (input/output)16 bit TTL, user-programmable,
25-contact sub-D
−6
10 Vector Network Analyzers ZVM, ZVK
COM 1/ COM 2IBM-PC-compatible serial interfaces,
RS232, 9-contact sub-D
IEC BUSremote-control interface IEEE488,
IEC625, 24-contact (for general applications)
IEC SYSTEM BUSremote-control interface IEEE488,
IEC625, 24-contact (for control of generators, eg as local oscillators in mixer
measurements)
LPTIBM-PC-compatible printer interface,
Centronics, 25-contact sub-D
MULTIPORTcontrol of optional three-port and four-
port adapters
Optional interfaces (eg LAN Ethernet) are available and specified separately.
Generator Step Attenuator PORT 1/2 options
These options permit the power of the output signal at PORT 1/2 to be attenuated
in 10 dB steps between 0 dB and 70 dB. The use of an attenuator reduces the dyna mic rang e to >10 5 d B bet wee n 12 GH z an d 16 GH z at a n IF ban dwi dth o f 10 Hz .
ZVMZVK
Frequency range10 MHz to 20 GHz10 MHz to 40 GHz
Attenuation0 dB to 70 dB0 dB to 70 dB
Attenuation steps10 dB10 dB
Attenuation uncertainty
up to 30 dB3 dB3 dB
above 40 dB 10 MHz to 20 GHz 3 dB3 dB
Output powerZVMZVK
up to 16 GHz−90 dBm to +2 dBm −90 dBm to −3 dBm
16 GHz to 20 GHz−90 dBm to −2 dBm −90 dBm to −9 dBm
above 20 GHz−90 dBm to −9 dBm
with “Additional Power“ setting with reduced specifications
up to 16 GHz−85 dBm to +5 dBm −85 dBm to 0 dBm
16 GHz to 20 GHz−85 dBm to +2 dBm −85 dBm to −5 dBm
above 20 GHz−85 dBm to −5 dBm
20 GHz to 33 GHz5 dB
Options
Time Domain option
Display and gating of measured values in the time domain and transformation
back to the frequency domain.
Mixer Measurements option
This option allows network analysis for frequency-converting DUTs (single and
multiple conversion) and almost any kind of harmonics and spurious measurements to be performed.
Nonlinear measurements option
For special measurements on nonlinear DUTs, such as the determination of the
n dB compression point versus frequency and the SOI and TOI intermodulation
products.
Power calibration option
Th is o pti on i s n ece ssa ry for pre cis e po wer ca lib rat ion of the net wor k a nal yze r. Th e
source power (additional power meter, e.g. NRVD, NRVS or NRV from Rohde&
Schwarz required) as well as the absolute power measurement of the receiver input signals can be calibrated.
Virtual Embedding Networks option
This option allows measured networks or simulated networks from a CAD program to be taken into account in the measurement results. Mismatched DUTs
such as SAW filters can be matched virtually without any additional hardware being required. Complementary to calibration procedures, the effect of real embedding networks like test fixtures can be eliminated by calculation.
Ethernet option
With this option the analyzer can be networked (LAN).
Receiver Step Attenuator PORT 1/2 options
These options permit the level of the input signal at PORT 1/2 to be attenuated in
10 dB steps between 0 dB and 70 dB. Moreover, with this option fitted, an additional receiver input − INPUT b1/b2 − is available on the front panel. The use of
an attenuator reduces the dynamic range to >105 dB between 12 GHz and
16 GHz at an IF bandwidth of 10 Hz.
ZVMZVK
Frequency range10 MHz to 20 GHz10 MHz to 40 GHz
Attenuation0 dB to 70 dB0 dB to 70 dB
Attenuation steps10 dB10 dB
Attenuation uncertainty
up to 30 dB3 dB3 dB
above 40 dB 10 MHz to 20 GHz 3 dB3 dB
Receiver Inputs INPUT b1/b2
Connectors3.5 mm (male)2.92 mm (male)
Match above 50 MHz>10 dB>8 dB
Maximum nominal input level−5 dBm−5 dBm
Damage level+20dBm+20dBm
20 GHz to 33 GHz5 dB
IEC/IEEE-Bus Interface for Integrated PC option
This option provides a third IEC/IEEE-bus interface to the integrated PC in addition
to the two IEC/IEEE-bus interfaces provided as standard.
Certified Quality System
ISO9001
DQS REG. NO 1954
Vector Network Analyzers ZVM, ZVK11
Options
OptionTypeFeatures and benefits
AutoKalZVR-B1Device for automatic full two-port calibration for connection to PORT 1/2. Frequency range DC to 8 GHz.
Time DomainZVR-B2Measurement of step and impulse response, delay measurements, gating in time and frequency domain
Mixer MeasurementsZVR-B4Independent configuration and control of external generators, internal generator and receiver of ZVM and ZVK
Nonlinear MeasurementsZVR-B5Measurement of n dB compression point and 2nd- or 3rd-order intercept points (SOI/TOI)
Power CalibrationZVR-B7Power calibration to improve absolute amplitude accuracy of generator and receiver
3-Port AdapterZVR-B8External device extending PORT 1 to 2 ports; frequency range 9 kHz to 4 GHz, type N (f) connectors at the DUT side. Con-
Virtual Embedding
Networks
4-Port AdapterZVR-B14 External device extending PORT 1 and PORT 2 to 2 ports each (var. 02), or PORT 1 to 3 ports (var. 03); frequency range 9 kHz
Ethernet Interface for
internal PC
IEC/IEEE-Bus Interface for
internal PC
Generator Step Attenuator
PORT 1
Generator Step Attenuator
PORT 2
Receiver Step Attenuator
PORT 1
Receiver Step Attenuator
PORT 2
ZVR-K9Adding virtual or correcting real existing networks by mathematical algorithms
FSE-B16 Ethernet interface for internal PC
FSE-B17 IEC/IEEE interface for internal PC (in addition to two IEC/IEEE-bus interfaces provided as standard)
ZVM-B21,
ZVK-B21
ZVM-B22,
ZVK-B22
ZVM-B23,
ZVK-B23
ZVM-B24,
ZVK-B24
Type N (f) connectors at the DUT side. Connection to ZVM requires PC3.5 (f) to N (f) adapters, for connection to ZVK,
2.92 mm (f) to N (f) adapters are required
• Full two-port calibration within a few seconds
• Localization of discontinuities, determination of reflection coefficients of discontinuities as a function of length/delay,
supplementary function for calibration, tuning of filters, optimization of connectors, etc
• Easy converter and mixer measurements (conversion gain)
• Convenient measurements of amplifier and mixer products vs. frequency (spurious, harmonics, intermodulation
products, etc)
• Display of compression point and SOI/TOI versus frequency
• High absolute power accuracy of generators (internal and external) and receivers for amplifier and mixer measurements
nection to ZVM requires PC3.5 (f) to N (f) adapters, for connection to ZVK, 2.92 mm (f) to N (f) adapters are required
• Measurements of 3-port devices such as duplex filters
• Replacing various test fixtures with physical matching networks by one single standard fixture and virtual networks
• High accuracy and reproducibility, e.g. in SAW filter measurements
to 4 GHz, type N (f) connectors at the DUT side. Connection to ZVM requires PC3.5 (f) to N (f) adapters, for connection to
ZVK, 2.92 mm (f) to N (f) adapters are required
• Simultaneous measurement of two 2-port devices
• Measurements on diplexers
• Control and data transfer of ZVM or ZVK via Ethernet
• Control of ZVM or ZVK and external test equipment by internal PC
Mechanical attenuator for generator path to PORT 1. Attenuation between 0 dB and 70 dB in 10 dB steps
• Decrease of minimum generator output power down to –90 dBm at PORT 1
Mechanical attenuator for generator path to PORT 2. Attenuation between 0 dB and 70 dB in 10 dB steps
• Decrease of minimum generator output power down to –90 dBm at PORT 2
Mechanical attenuator for receiver path from PORT 1 and Input b1. Attenuation between 0 dB and 70 dB in 10 dB steps.
Includes additional test port Input b1
• Increase of maximum receiver input power at PORT 1 to +27 dBm
• Direct access to measurement channel b1
Mechanical attenuator for receiver path from PORT 2 and Input b2. Attenuation between 0 dB and 70 dB in 10 dB steps.
Includes additional test port Input b2
• Increase of maximum receiver input power at PORT 2 to +27 dBm
• Direct access to measurement channel b22
Vector Network Analyzers ZVM, ZVK12
Ordering information
Order designation
TypeFrequency rangeOrder No.
Analyzers
Vector Network Analyzer
4-channel, 50 Ω,
active test set
ZVM10 MHz to 20 GHz1127.8500.60
Vector Network Analyzer
4-channel, 50 Ω,
active test set
ZVK10 MHz to 40 GHz1127.8651.60
Options
Time DomainZVR-B2–1044.1009.02
Mixer Measurements
Nonlinear MeasurementsZVR-B5–1044.1321.02
Power Calibration
Virtual Embedding
3)
Networks
Ethernet AUI for internal PC FSE-B16–1073.5973.02
Ethernet BNC for internal PC FSE-B16–1073.5973.03
Ethernet RJ45 for internal PC
2.92 mm (for ZVK)ZV-Z340 GHz to 40 GHz1128.3530.02
2.92 mm incl.
Sliding Matches (for ZVK)
N, 50 ΩZV-Z210 GHz to 18 GHz1085.7099.02
TRL Supplementary Kit,
N, 50 Ω
TRL Supplementary Kit,
PC3.5, 50 Ω
TOM-X Supplementary Kit,
N, 50 Ω
TOM-X Supplementary Kit,
PC3.5, 50 Ω
6)
6)
ZV-Z140 GHz to 26.5 GHz1134.4093.02
ZV-Z150 GHz to 40 GHz1134.4193.02
ZV-Z330 GHz to 26.5 GHz1128.3518.02
ZV-Z350 GHz to 40 GHz1128.3547.02
ZV-Z260.4 GHz to 18 GHz1085.7318.02
ZV-Z270.4 GHz to 26.5 GHz 1085.7401.02
ZV-Z280 GHz to 18 GHz1085.7499.03
ZV-Z294 GHz to 26.5 GHz1085.7647.03
Sliding Matches
N (m), 50 ΩZV-Z411.7 GHz to 18 GHz1085.8095.02
N (f), 50 ΩZV-Z411.7 GHz to 18 GHz1085.8095.03
PC3.5 pair m, f (for ZVM)ZV-Z420 GHz to 26.5 GHz1128.3524.02
2.92 mm pair m, f (for ZVK)ZV-Z440 GHz to 40 GHz1128.3553.02
General accessories
Hardware Options N, 50 Ω
AutoKal7) ZVR-B1 0 GHz to 8 GHz1044.0625.02
3-Port Adapter
4-Port Adapter (2 x SPDT)7)ZVR-B14 0 GHz to 4 GHz1106.7510.02
4-Port Adapter (SP3T)
Test Cables (pairs)
N (m)/N (m), 50 ΩZV-Z110 GHz to 18 GHz1085.6505.03
N (m)/N (m), 75 ΩZV-Z120 GHz to 4 GHz1085.6570.02
N (m)/PC3.5 (m), 50 ΩZV-Z130 GHz to 18 GHz1134.3997.02
Calibration Kits
N, 50 ΩZCAN0 GHz to 3 GHz0800.8515.52
N, 75 ΩZCAN0 GHz to 3 GHz0800.8515.72
Attenuators
1 WDNF0 GHz to 12.4 GHz
50 WRBU 50 0 GHz to 2 GHz
100 WRBU 100 0 GHz to 2 GHz
Matching Pads, N, 50 Ω → N, 75 Ω
Series ResistorRAZ0 GHz to 2.7 GHz0358.5714.02
L SectionRAM0 GHz to 2.7 GHz0358.5414.02
Various Accessories, N, 50 Ω
T CheckZV-Z600 GHz to 4 GHz1108.4990.50
Bias NetworkZV-Z612 MHz to 4 GHz1106.8130.02
DC BlockFSE-Z35 MHz to 7 GHz4010.3895.00
Power Splitter 2 x 50 ΩRVZ0 GHz to 2.7 GHz0800.6612.52
External SWR-Bridges
N (f), 50 Ω ZRA40 kHz to 150 MHz1052.3607.52
N (f), 50 Ω ZRB 25 MHz to 3 GHz0373.9017.52
N (f), 75 ΩZRB 25 MHz to 2 GHz0802.1018.73
N (f), 50 Ω ZRC40 kHz to 4 GHz1039.9492.52
N (f), 75 Ω ZRC40 kHz to 2.5 GHz1039.9492.72
Miscellaneous
Transit Cas eZZK-965–1013.9437.00
19“-Rack Adapter with front
handles
1)
Harmonics and arbitrary frequency conversion measurement included.
2)
Power meter and sensor required.
3)
Only for ZVR, ZVC, ZVM, ZVK.
4)
Com prise s test po rt ’Inp ut b1’, f or bypa ssing c ouple r at PORT 1 .
5)
Com prise s test po rt ’Inp ut b2’, f or bypa ssing c ouple r at PORT 2 .
6)
For ruggedized port.
7)
Two a dapte rs PC 3.5 (f) /N (f) or 2 .92 mm (f )/N (f) req ired.
8)
X = 0: 3 dB, X = 1: 6 dB, X = 2: 10 dB, X = 3: 20 dB, X = 4: 30 dB.
9)
XX = 03: 3 dB, XX = 06: 6 dB, XX = 10: 10 dB, XX = 20: 20 dB, XX = 30: 30 dB.
7)
ZVR-B8 0 GHz to 4 GHz1086.0000.02
7)
ZVR-B14 0 GHz to 4 GHz1106.7510.03
0272.4X10.50
1073.8695.XX
1073.8495.XX
ZZA-96–0396.4928.00
8)
9)
9)
Vector Network Analyzers ZVM, ZVK 13
General data
Temperature loading
Specs complied with5 °C to 40°C
Operational0°C to 50°C
Storage temperature range−40°C to +70 °C
meets IEC68-2-1, IEC 68-2-2
Damp heat40 °C at 95% rel. humidity,
meets IEC68-2-3
Mechanical resistance
Vibration test, sinusoidal10 Hz to 55 Hz, max. 2 g,
55 Hz to 150 Hz, 0.5 g constant,
12 min/axis, meets IEC68-2-6,
IEC1010-1, MIL-T-28800D class 5
Vibration test, random10 Hz to 300 Hz, 1.2 g rms,
5 min/axis, meets IEC68-2-36
Shock test40 g shock spectrum, method 516.3,
meets MIL-STD-810D, MIL-T-28800D
classes 3 and 5
Calibration interval1 year
EMC, emissionfollowing the provisions of Directives
89/336/EEC, revised by
91/263/EEC, 92/31/EEC, 93/68/EEC and
EN50081-1
EMC, immunityfollowing the provisions of Directives
89/336/EEC, revised by 91/263/EWG,
92/31/EEC, 93/68/EEC and EN50082-1
Safetymeets EN 61010-1, UL3111-1,
CSAC22.2 No. 1010-1, IEC 1010-1
Power supply100 V to 120 V (AC) with tolerance
±10%, 6 A, 50 Hz to 400 Hz with tolerance −6 % and +10% or
200 V to 240 V (AC) with tolerance
±10%, 3 A, 50 Hz to 60 Hz with tolerance −6% and +10%
safety class I to VDE411
Power consumption280 W (standby: 10 W)
Test markVDE, GS, CSA, CSA-NRTL/, c∈ mark
Dimensions (W x H x D)435 mm x 281 mm x 584 mm
Weight30 kg
Printed in Germany1100 (U ko)
ROHDE& SCHWARZ GmbH & Co. KG ⋅ Mühldorfstraße 15 ⋅ 81671 München ⋅ Germany ⋅ P.O.B. 8014 69 ⋅ 81614 München ⋅ Germany
PD 757.5543.22 ⋅ Vector Network Analyzers ZVM, ZVK ⋅ Trade names are trademarks of the owners ⋅ Subject to change ⋅ Data without tolerances: typical values
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