Notice: This is not a final specification.
Some parametric limits are subject to change.
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
DESCRIPTION
The M5M29KE131BVP is a Stacked micro Multi Chip
Package that contents 2 Dies of 64M-bit Flash memory in a
48-pin TSOP(I) for lead free use.
128M-bit Flash memory is a 16,777,216 bytes / 8,388,608
words, single power supply and high performance nonvolatile memory fabricated by CMOS technology for the
peripheral circuit and DINOR IV (Divided bit-line NOR IV)
architecture for the memory cell. All memory blocks are
locked and can not be programmed or erased, when WP# is
Low. Using Software Lock Release function, program or
erase operation can be executed.
Renesas LSIs
M5M29KE131BVP
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
The M5M29KE131BVP is suitable for a high performance cellular
phone and a mobile PC that are required to be small mounting
area, weight and small power dissipation.
FEATURES
Access timeRandom70ns (Max.)
Page25ns(Max.)
Supply voltageVCC= 3.0 ~ 3.6V
Ambient temperatureTa=-40 ~ 85 °C
Package48pin TSOP(Type-I), Lead pitch 0.5mm
Outer-lead finishing : Sn-Cu
APPLICATION
Digital Cellar Phone, Telecommunication,
PDA, Car Navigation System, Video Game Machine
WE#: Write enable
WP#: Write protect
RP#: Reset power down
BYTE#: Byte enable
Rev.0.2_48a_bezz
Preliminary
Input
A22-A0, OE#, WE#, CE#, WP#,
Output
Notice: This is not a final specification.
Some parametric limits are subject to change.
MCP Block Diagram
A0 to A22
CE#
WP#
RP#
WE#
OE#
BYTE#
Renesas LSIs
M5M29KE131BVP
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
VccGND
64Mbit DINOR IV
Flash Memory
DQ0 to DQ15
64Mbit DINOR IV
Flash Memory
Capacitance
SymbolConditions
CIN
COUT
capacitance
Capacitance
RP#,BYTE#
Parameter
Ta=25°C, f=1MHz,
DQ15-DQ024pF
Vin=Vout=0V
Limits
Min.Typ.Max.
24pF
Unit
2
Rev.0.2_48a_bezz
Preliminary
Notice: This is not a final specification.
Some parametric limits are subject to change.
Flash Memory Part
Renesas LSIs
M5M29KE131BVP
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
Description
The 128M-bit DINOR IV(Divided bit line NOR IV) Flash
Memory is 3.3V-only high speed 134,217,728-bit CMOS
boot block Flash Memory. Alternating BGO(Back Ground
Operation) feature of the device allows Program or Erase
operations to be performed in one bank while the device
simultaneously allows Read operations to be performed
on the other bank in each 64M-bit area which is selected
by A22=L or H. This BGO feature is suitable for
communication products and cellular phone.The Flash
Memory is fabricated by CMOS technology for the
peripheral circuits and DINOR IV architecture for the
memory cells.
Features
- Organization8,388,608-word x 16-bit
16,777,216-word x 8-bit
- Supply VoltageVCC = 3.0 ~ 3.6V
- Access time
Random Access70ns(Max.)
Random Page Read25ns(Max.)
- Read108mW (Max. at 5MHz)
- Page Read36mW (Max.)
(After Automatic Power Down)0.66µW(typ.)
- Program/Erase126mW(Max.)
Standby0.66µW(typ.)
Deep Power Down mode0.66µW(typ.)
- Auto Program for Bank(I) – Bank(IV)
Program Time
Word Program30µs/1word(typ.)
Byte Program30µs/1byte(typ.)
Page Program4ms(typ.)
Program Unit
Word Program1 word
Byte Program1 byte
Page Program128 words/256 bytes
- Auto Erase
Erase time150ms(typ.)
Erase unit
Bank(I) ,Bank(VIII)
Boot Block4K-word /8K-byte x 2
Parameter Block 4K-word /8K-byte x 6
Main Block32K-word /64K-byte x 7
Bank(II) ,Bank(VII)
Main Block32K-word /64K-byte 8
Bank(III) ,Bank(VI)
Main Block32K-word /64K-byte x 56
Bank(IV) ,Bank(V)
Main Block32K-word /64K-byte x 56
- Program/Erase cycles100Kcycles
- Dual Boot Block Architecture
There are Bottom and Top boot blocks in both sides.
Bottom Boot (A22=VIL )
Top Boot(A22=VIH)
- The Other Functions
Software Command Control
Quick Data Reclaim
Software Lock Release(while WP# is low)
Erase Suspend/Resume
Program Suspend/Resume
Status Register Read
Alternating Back Ground Program/Erase Operation
Among Bank (I)-Bank(IV)
in Bottom 64Mbit area (A22=VIL),
Among Bank (V)-Bank(VIII)
in Top 64Mbit area (A22=VIH)
Random Page Read
3
Rev.0.2_48a_bezz
Preliminary
Boot Block T134 4Kword
.
Boot Block T133 4Kword
.
Parameter Block T132 4Kword
.
Bank(VIII)
..15blocks
Parameter Block T127 4Kword
.
Main Block T126 32Kword
...
Main Block T120 32Kword
.
Main Block T119 32Kword
.
Bank(VII)
..8blocks
..Main Block T112 32Kword
.
Main Block T111 32Kword
.
Bank(VI)
..56blocks
..Main Block T56 32Kword
.
Main Block T55 32Kword
.
Bank(V)
..56blocks
.
Main Block T0 32Kword
Main Block B134 32Kword
.
Bank(IV)
..56blocks
..Main Block B79 32Kword
.
Main Block B78 32Kword
.
Bank(III)
..56blocks
..Main Block B23 32Kword
.
Main Block B22 32Kword
.
Bank(II)
..8blocks
..Main Block B15 32Kword
.
Main Block B14 32Kword
...
Main Block B8 32Kword
.
Bank(I)
Parameter Block B7 4Kword
.
15blocks
..Parameter Block B2 4Kword
.
Boot Block B1 4Kword
Boot Block B0 4Kword
.....
128word Page Buffer
……………………
Notice: This is not a final specification.
Some parametric limits are subject to change.
Block Diagram
(128Mbit Flash Memory)
A22
Renesas LSIs
M5M29KE131BVP
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
Address
Input
A21
A20
A19
A18
A17
A16
A15
A14
A13
A12
A11
A10
A9
A8
A7
A6
A5
VCC
GND
A22="H"A22="L"
X-Decoder
Chip
Enable
Output Enable
Write Enable
Write
Protect
Reset
/PowerDown
BYTE
Enable
A4
A3
A2
A1
A0
F-CE#
OE#
WE#
F-WP#
F-RP#
BYTE#
Y-Decoder
Status / ID Register
Command
User
Interface
Write
State
Machine
DQ15
/A-1
Y-Gate / Sense Amp.
………………………………….
Multiplexer
………………………………….
I/O Buffer
……………………
Data I/O
DQ14
DQ0DQ1
4
Rev.0.2_48a_bezz
Preliminary
Notice: This is not a final specification.
Some parametric limits are subject to change.
Renesas LSIs
M5M29KE131BVP
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
Function of Flash Memory
The 128M-bit DINOR IV Flash Memory includes on-chip
program/erase control circuitry. The Write State Machine
(WSM) controls block erase and word/page program
operations. Operational modes are selected by the
commands written to the Command User Interface (CUI).
The Status Register indicates the status of the WSM and
when the WSM successfully completes the desired
program or block erase operation.
A Deep Power Down mode is enabled when the RP# pin
is at GND, minimizing power consumption.
Read
The 128M-bit DINOR IV Flash Memory has four read
modes, which accesses to the memory array ,the Page read,
the Device Identifier and the Status Register. The
appropriate read commands are required to be written to the
CUI. Upon initial device power up or after exit from deep
power down, the 128M-bit DINOR IV Flash Memory
automatically resets to read array mode. In the read array
mode and in the conditions are low level input to OE#, high
level input to WE# and RP#, low level input to CE# and
address signals to the address inputs (A22 - A0:Word Mode,
A22-A-1:Byte Mode) the data of the addressed location to
the data input/output (DQ15-DQ0:Word Mode, DQ7DQ0:Byte Mode) is output.
Output Disable
When OE# is at VIH, output from the devices is disabled.
Data input/output are in a high-impedance (High-Z) state.
Standby
When CE# is at VIH, the device is in the standby mode
and its power consumption is reduced. Data input/output
are in a high-impedance (High-Z) state. If the memory is
deselected during block erase or program, the internal
control circuits remain active and the device consumes
normal active power until the operation completes.
Deep Power Down
When RP# is at VIL, the device is in the deep power down
mode and its power consumption is substantially low.
During read modes, the memory is deselected and the data
input/output are in a high-impedance (High-Z) state. After
return from power down, the CUI is reset to Read Array,
and the Status Register is cleared to value 80H.
During block erase or program modes, RP# low will abort
either operation. Memory array data of the block being
altered become invalid.
Automatic Power Down (Auto-PD)
Write
Writes to the CUI enables reading of memory array data,
device identifiers and reading and clearing of the Status
Register. They also enable block erase and program. The
CUI is written by bringing WE# to low level and OE# is at
high level, while CE# is at low level. Address and data are
latched on the earlier rising edge of WE# and CE#.
Standard micro processor write timings are used.
Alternating Background Operation (BGO)
The 128M-bit DINOR IV Flash Memory allows to read array
from one bank while the other bank operates in software
command write cycling or the erasing / programming
operation in the background. Array Read operation with the
other bank in BGO is performed by changing the bank
address without any additional command. When the bank
address points the bank in software command write cycling
or the erasing / programming operation, the data is read out
from the status register. The access time with BGO is the
same as the normal read operation.
The Automatic Power Down minimizes the power
consumption during read mode. The device automatically
turns to this mode when any addresses or CE# isn't
changed more than 200ns after the last alternation. The
power consumption becomes the same as the stand-by
mode. During this mode, the output data is latched and can
be read out. New data is read out correctly when
addresses are changed.
BBR(Back Bank array Read)
In the 128M-bit DINOR IV Flash Memory , when one
memory address is read according to a Read Mode in the
case of the same as an access when a Read Mode
command is input, an another Bank memory data can be
read out (Read Array or Page Read) by changing an
another Bank address.
5
Rev.0.2_48a_bezz
Preliminary
Notice: This is not a final specification.
Some parametric limits are subject to change.
Renesas LSIs
M5M29KE131BVP
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
Software Command Definitions
The device operations are selected by writing specific
software command into the Command User Interface.
Clear Status Register Command (50H)
The Erase Status, Program Status and Block Status bits
are set to "1"s by the Write State Machine and can only
be reset by the Clear Status Register command of 50H.
These bits indicate various failure conditions.
Read Array Command (FFH)
The device is in Read Array mode on initial device power
up and after exit from deep power down, or by writing FFH
to the Command User Interface. After starting the internal
operation the device is set to the read status register mode
automatically.Automated block erase is initiated by writing the Block
Read Device Identifier Command (90H)
We can normally read device identifier codes when Read
Device Identifier Code Command (90H) is written to the
command latch. Following the command write, the
manufacturer code and the device code can be read from
A0 address 0H and 1H in a bank address, respectively.
Read Status Register Command (70H)
The Status Register is read after writing the Read Status
Register command of 70H to the Command User Interface.
Also, after starting the internal operation the device is set to
the Read Status Register mode automatically.
The contents of Status Register are latched on the later
falling edge of OE# must be toggled every status read.
Block Erase / Confirm Command (20H/D0H)
Erase command of 20H followed by the Confirm
command of D0H. An address within the block to be
erased is required. The WSM executes iterative erase
pulse application and erase verify operation.
Program Commands
A) Word / Byte Program (40H)
Word/Byte program is executed by a two-command
sequence. The Word/Byte program Setup command of
40H is written to the Command Interface, followed by a
second write specifying the address and data to be written.
The WSM controls the program pulse application and
verify operation.
Page Read Command (F3H)
The Page Read command (F3H) timing can be used by
writing the first command to CUI and F-CE# falls VIL or
changing the address(A22-A2) is necessary to start
activating page read mode. This command is fast random
4 words read. During the read it is necessary to fix F-CE#
low and change addresses that are defined by A0 and
A1(0h - 3h) at random continuously. The mode is kept until
F-RP# is set to L or this chip is powered down.
The first read of Page Read timing is the same as normal
read (ta(CE)). F-CE# should be fallen “L”. The read timing
after the first is the same as ta(PAD).
In the page read mode the upper address(A22-A2) or FCE# are supposed not to be clocked during read operation.
Otherwise the access time is as same as normal read.
B) Page Program for Data Blocks (41H)
Page Program allows fast programming of 128words
/256bytes of data. Writing of 41H initiates the page
program operation for the Data area. From 2nd cycle to
129th cycle :Word Mode, 257th cycle :Byte Mode, write
data must be serially inputted. Address A6-A0:Word
Mode, A6-A-1:Byte Mode have to be incremented from
00H to 7FH. After completion of data loading, the WSM
controls the program pulse application and verify
operation.
C) Single Data Load to Page Buffer (74H)
/ Page Buffer to Flash (0EH/D0H)
Single data load to the page buffer is performed by
writing 74H followed by a second write specifying the
column address(A6-A0:Word Mode, A6-A-1:Byte Mode)
and data. Distinct data up to 128word/256bytes can be
loaded to the page buffer by this two-command sequence.
On the other hand, all of the loaded data to the page buffer
is programmed simultaneously by writing Page Buffer to
Flash command of 0EH followed by the confirm command
of D0H. After completion of programming the data on the
page buffer is cleared automatically.
6
Rev.0.2_48a_bezz
Preliminary
Notice: This is not a final specification.
Some parametric limits are subject to change.
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
Flash to Page Buffer Command (F1H/D0H)Power Supply Voltage
M5M29KE131BVP
Stacked-uMCP (micro Multi Chip Package)
Renesas LSIs
CMOS FLASH MEMORY
Array data load to the page buffer is performed by
writing the Flash to Page Buffer command of F1H
followed by the Confirm command of D0H. An address
within the page to be loaded is required. Then the array
data can be copied into the other pages within the same
bank by using the Page Buffer to Flash command.
Clear Page Buffer Command (55H/D0H)
Loaded data to the page buffer is cleared by writing the
Clear Page Buffer command of 55H followed by the
Confirm command of D0H. This command is valid for
clearing data loaded by Single Data Load to Page Buffer
command.
Data Protection
The 128M-bit DINOR IV Flash Memory has a master
Write Protect pin (WP#). When WP# is at VIH, all blocks
can be programmed or erased. When WP# is low, all
blocks are in locked mode which prevents any
modifications to memory blocks. Software Lock Release
function is only command which allows to program or erase.
When the power supply voltage is less than VLKO, Low
VCC Lock-Out voltage, the device is set to the Read-only
mode.
A delay time of 60µs is required before any device
operation is initiated. The delay time is measured from the
time Flash VCC reaches Flash VCCmin (3.0V).
During power up, RP# = GND is recommended. Falling in
Busy status is not recommended for possibility of
damaging the device.
Memory Organization
The 128M-bit DINOR IV Flash Memory is constructed by
2 boot blocks of 4K words, 6 parameter blocks of 4K words
and 7 main blocks of 32K words in Bank(I) and Bank(VIII),
by 8 main blocks of 32K words in Bank(II) and Bank(VII),
and by 56 main blocks of 32K words in Bank(III),
BANK(IV) , BANK(V) and Bank(VI).
A block is erased independently of other blocks in the
array.
Suspend/Resume Command (B0H/D0H)
Writing the Suspend command of B0H during block erase
operation interrupts the block erase operation and allows
read out from another block of memory. Writing the
Suspend command of B0H during program operation
interrupts the program operation and allows read out from
another block of memory. The Bank address is required
when writing the Suspend/Resume Command. The device
continues to output Status Register data when read, after
the Suspend command is written to it. Polling the WSM
Status and Suspend Status bits will determine when the
erase operation or program operation has been suspended.
At this point, writing of the Read Array command to the CUI
enables reading data from blocks other than that which is
suspended. When the Resume command of D0H is written
to the CUI, the WSM will continue with the erase or
program processes.
Erase All Unlocked Blocks Command (A7H/D0H)
The command sequence enable us to erase all blocks.
The command can be used by writing Setup command
A7H(1stcycle) and confirm command D0H(2ndcycle). The
sequence is not valid in case of WP#=VIL.
7
Rev.0.2_48a_bezz
Preliminary
Notice: This is not a final specification.
Some parametric limits are subject to change.
Renesas LSIs
M5M29KE131BVP
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
5) SA=A21-A2:1stPage Address, A1,A0:voluntary address / RD0=1stPage read data
6) SA+i: Page address(is equal to 1stPage Address of A21-A2), A1,A0: voluntary address / RDi: 2ndPage read data
7) In case of Bottom 64M-bit area, A22 must be set to VIL.
In case of Top 64M-bit area, A22 must be set to VIH.
8) X can be VIH or VIL.
2nd Bus Cycle
Address
A22-A18 A0
SA
2)
Bank
Bank
M5M29KE131BVP
Stacked-uMCP (micro Multi Chip Package)
1)
Data
(DQ0-15)(DQ0-7)(DQ0-15)(DQ0-7)
3)
ID
4)
Renesas LSIs
CMOS FLASH MEMORY
3rd-5th Bus Cycle
Mode
Address
6)
Data
RDi
1)
Command List (WP# =VIH)
1st Bus Cycle
Command
Mode
Address
Word ProgramWriteBank
Page ProgramWriteBank
Page Buffer to FlashWriteBank
Block Erase/ConfirmWriteBank
Erase All Unlocked BlocksWriteA22
A0-A21=X
Clear Page BufferWriteA22
A0-A21=X
Single Data Load to Page BufferWriteA22
A0-A21=X
Flash to Page BufferWriteBank
1)
Data
(DQ0-15)(DQ0-7)(DQ0-15)(DQ0-7)(DQ0-15)(DQ0-7)
7)
7)
7)
7)
8)
9)
8)
9)
8)
9)
7)
40HWriteWA
41HWriteWA0
0EHWriteWA
20HWriteBA
A7HWriteA22
55HWriteA22
74HWriteWA
F1HWriteRA
ModeAddress
2nd Bus Cycle
2)
3)
4)
5)
8)
A0-A21=X
A0-A21=X
9)
8)
9)
2)
6)
Data
WD
WD0
D0H
D0H
D0H
D0H
WD
D0H
1)
2)
3)
1)
1)
1)
1)
2)
1)
1) In the case of Word mode(BYTE#=VIH), upper byte data (DQ15-DQ8) is ignored.
2) WA=Write Address, WD=Write Data
3) WA0, WAn=Write Address, WD0, WDn=Write Data.
Word mode (BYTE#=VIH) : Write address and write data must be provided sequentially from 00H to 7FH for A6-A0. Page size is 128
words (128-word x 16-bit), and also A22-A7 (block address, page address) must be valid.
Byte mode (BYTE#=VIL) : Write address and write data must be provided sequentially from 00H to FFH for A6-A-1. Page size is 256
Bytes (256-byte x 8-bit), and also A22-A7 (block address, page address) must be valid.
4) WA=Write Address: A22-A7 (block address, page address) must be valid.
6) RA=Read Address: A22-A7 (block address, page address) must be valid.
7) Bank=Bank address (Bank(I)-Bank(VIII): A22-18)
8) In case of Bottom 64M-bit area, A22 must be set to VIL.In case of Top 64M-bit area, A22 must be set to VIH.
9) X can be VIH or VIL.
3rd-129th Bus Cycles
3rd-257th Bus Cycles(Byte mode)
Address
Mode
WriteWAn
1)
Data
3)
WDn
3)
11
Rev.0.2_48a_bezz
Preliminary
4th Bus Cycle
5th Bus Cycle
Renesas LSIs
Notice: This is not a final specification.
Some parametric limits are subject to change.
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
Software Command Definition
Command List (WP# =VIL)
Software lock release operation needs following consecutive 7bus cycles.Moreover, additional 127(255) bus cycles are needed for page
program operation.
Setup Command for
Software Lock Release
Mode
Word ProgramWriteBank
Page ProgramWriteBank
Page Buffer to FlashWriteBank
Block Erase/ConfirmWriteBank
Clear Page BufferWriteBank
Write Bank
Write Bank
Write Bank
Write Bank
Write Bank
Write Bank
Write Bank
8)
8)
8)
8)
8)
8)
8)
Data
ACH
ACH
ACH
ACH
ACH
ACH
ACH
1)
Setup Command for
Software Lock Release
Mode
Word ProgramWriteBank
Page ProgramWriteBank
Page Buffer to FlashWriteBank
Block Erase/ConfirmWriteBank
Clear Page BufferWriteBank
Single Data Load to Page Buffer
WriteBank
Flash to Page BufferWriteBank
Setup Command for
Program or Erase Operations
Mode
Word ProgramWriteBank
Page ProgramWriteBank
Page Buffer to FlashWriteBank
Block Erase/ConfirmWriteBank
Clear Page BufferWriteA22
Single Data Load to Page Buffer
WriteA22
Flash to Page BufferWriteBank
1) In the case of word mode(BYTE#=VIH) upper byte data (DQ15-DQ8) is ignored.
2) WA=Write Address, WD=Write Data
3) WA0, WAn=Write Address, WD0, WDn=Write Data. Write address and write data must be provided sequentially
from 00H to 7FH for A6-A0(word mode) and from 00H to FFH for A6-A-1(byte mode), respectively.
Page size is 128 words (128-word x 16-bit/ word mode) or Page size is 256 bytes (256-word x 8-bit/ byte mode),
and also A22-A7 (block address, page address) must be valid.
4) WA=Write Address: A22-A7 (block address, page address) must be valid.
The output of upper byte data (DQ15-DQ8) is “0H ”. A22 must be set “VIL”.
Absolute Maximum Ratings
SymbolParameterConditionsMin.Max.Units
VCCVCC Voltage-0.24.6V
VI1All Input or Output Voltage
TaAmbient Temperature-4085 °C
TbsTemperature under Bias-5095 °C
TstgStorage Temperature-65125 °C
IoutOutput Short Circuit Current100mA
1)Minimum DC voltage is –0.6V on input / output pins. During transitions, the level may undershoot to –2.0V for periods
<20ns. Maximum DC voltage on input / output pins is VCC+0.5V which, during transitions, may overshoot to VCC+1.5V
for periods <20ns.
With Respect to GND
1)
-0.64.6V
M5M29KE131BVP
Stacked-uMCP (micro Multi Chip Package)
Renesas LSIs
CMOS FLASH MEMORY
DC electrical characteristics
SymbolParameterTest Conditions
ILIInput Leakage Current-22
ILOOutput Leakage Current-2020
ISB31050
VCC Deep Power Down Current
ISB4
ICC1 VCC Read Current for Word
ICC1P VCC Page Read Current for Word
ICC2 VCC Write Current for Word
ICC3 VCC Program Current
ICC4 VCC Erase Current
VILInput Low Voltage-0.50.4
VIHInput High Voltage2.4VCC+0.5
VOLOutput Low Voltage0.45
VOH10.85xVCC
Output High Voltage
VOH2VCC-0.4
VLKO Low VCC Lock Out Voltage
2)
(Ta= -40 ~85 °C and Flash VCC=3.0V~3.6V, unless otherwise noted)
2) To protect against initiation of write cycle during Flash VCC power up / down, a write cycle is locked out for Flash VCC less than VLKO.
If Flash VCC is less than VLKO, Write State Machine is reset to read mode. When the Write State Machine is in Busy state, if Flash
VCC is less than VLKO, the alteration of memory contents may occur.
14
Rev.0.2_48a_bezz
Preliminary
Limits
Notice: This is not a final specification.
Some parametric limits are subject to change.
Renesas LSIs
M5M29KE131BVP
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
AC electrical characteristics
(Ta=-40 ~85 °C and Flash VCC=3.0V~3.6V, unless otherwise noted)
Read Only Mode
SymbolParameter
tRCtAVAVRead Cycle Time70ns
ta(AD)tAVQVAddress Access Time70ns
ta(CE)tELQVChip Enable Access Time70ns
ta(OE)tGLQVOutput Enable Access Time30ns
ta(PAD)tPAVQVPage Read Access Time25ns
tCEPHCE# "H"Pulse width30ns
tCLZtELQXChip Enable to Output in Low-Z0ns
tDF(CE)tEHQZChip Enable High to Output in High-Z25ns
tOLZtGLQXOutput Enable to Output in Low-Z0ns
tDF(OE)tGHQZOutput Enable to High to Output in High-Z25ns
tPHZtPLQZRP# Low to Output High-Z150ns
ta(BYTE)tFL/HQVBYTE# access time70ns
tBHZtFLQZBYTE# low to output high-Z25ns
tOHtOHOutput Hold from CE#, OE# and Addresses0ns
tBCDtELFL/HCE# low to BYTE# high or low5ns
tBADtAVFL/HAddress to BYTE# high or low5ns
tOEHtWHGLOE# Hold from WE# High10ns
tPStPHELRP# Recovery to CE# Low150ns
Flash VCC=3.0-3.6V
Min.Typ.Max.
Units
-Timing measurements are made under AC waveforms for read operations.
15
Rev.0.2_48a_bezz
Preliminary
Limits
Limits
Notice: This is not a final specification.
Some parametric limits are subject to change.
Renesas LSIs
M5M29KE131BVP
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
AC electrical characteristics
(Ta=-40 ~85 °C and Flash VCC=3.0V~3.6V, unless otherwise noted)
Read / Write Mode (WE# control)
SymbolParameter
tWCtAVAVWrite Cycle Time70ns
tAStAVWHAddress Setup Time35ns
tAHtWHAXAddress Hold Time0ns
tDStDVWHData Setup Time35ns
tDHtWHDXData Hold Time0ns
tOEHtWHGLOE# Hold from WE# High10ns
tCStELWLChip Enable Setup Time0ns
tCHtWHEHChip Enable Hold Time0ns
tWPtWLWHWrite Pulse Width35ns
tWPHtWHWLWrite Pulse Width High30ns
tBStFL/HWHByte enable high or low set-up time35ns
tBHtWHFL/HByte enable high or low hold time70ns
tGHWLtGHWLOE# Hold to WE# Low0ns
tBLStPHHWHBlock Lock Setup to Write Enable High70ns
tBLHtQVPHBlock Lock Hold from Valid SRD0ns
tDAPtWHRH1Duration of Auto Program Operation(Word Mode)30300µs
tDAPtWHRH1Duration of Auto Program Operation(Byte Mode)30300µs
tDAPtWHRH1Duration of Auto Program Operation(Page Mode)480ms
tDAEtWHRH2Duration of Auto Block Erase Operation150600ms
tWHRLtWHRLDelay Time During Internal Operation70ns
tPStPHWLRP# Recovery to CE# Low150ns
-Read timing parameters during command write operations mode are the same as during read only operation mode.
-Typical values at Flash VCC=3.3V and Ta=25 °C.
Flash VCC=3.0-3.6V
Min.Typ.Max.
Units
Read / Write Mode (CE# control)
SymbolParameter
tWCtAVAVWrite Cycle Time70ns
tAStAVEHAddress Setup Time35ns
tAHtEHAXAddress Hold Time0ns
tDStDVEHData Setup Time35ns
tDHtEHDXData Hold Time0ns
tOEHtEHGLOE# Hold from CE# High10ns
tWStWLELWrite Enable Setup Time0ns
tWHtEHWHWrite Enable Hold Time0ns
tCEPtELEHCE# Pulse Width35ns
tCEPHtEHELCE#"H" Pulse Width30ns
tBStFL/HEHByte enable high or low set-up time35ns
tBHtEHFL/HByte enable high or low hold time70ns
tGHELtGHELOE# Hold to CE# Low0ns
tBLStPHHEHBlock Lock Setup to Write Enable High70ns
tBLHtQVPHBlock Lock Hold from Valid SRD0ns
tDAPtEHRH1Duration of Auto Program Operation(Word Mode)30300µs
tDAPtEHRH1Duration of Auto Program Operation(Byte Mode)30300µs
tDAPtEHRH1Duration of Auto Program Operation(Page Mode)480ms
tDAEtEHRH2Duration of Auto Block Erase Operation150600ms
tEHRLtEHRLDelay Time During Internal Operation70ns
tPStPHELRP# Recovery to CE# Low150ns
-Timing measurements are made under AC waveforms for read operations.
-Typical values at Flash VCC=3.3V and Ta=25 °C.
Flash VCC=3.0-3.6V
Min.Typ.Max.
Units
16
Rev.0.2_48a_bezz
Preliminary
F-RP#=VIH Setup Time from Flash VCC min.
Notice: This is not a final specification.
Some parametric limits are subject to change.
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
Main Block Write Time (Byte Mode)28sec
Main Block Write Time (Word Mode)14sec
Page Write Time 480ms
Flash to Page Buffer Time100150µs
Program Suspend / Erase Suspend Time
ParameterMin. Typ.Max.Unit
Program Susupend Time15µs
Erase Susupend Time15µs
Flash VCC Power Up / Down Timing
Renesas LSIs
M5M29KE131BVP
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
symbolParameterMin. Typ.Max.Unit
tVCS
tVHELF-CE#=VIL Setup Time from Flash VCC min.60µs
During power up / down, by the noise pulses on control pins, the device has possibility of accidental erase of programming.
The device must be protected against initiation of write cycle for memory contents during power up / down. The delay time
of min. 60 µsec is always required before read operation or write operation is initiated from the time Flash VCC reaches
Flash VCC min. during power up /down. By holding F-RP#=VIL, the contents of memory is protected during Flash VCC
power up / down. During power up, F-RP# must be held VIL for min. 2µs from the time Flash VCC reaches Flash VCC min..
During power down, F-RP# must be held VIL until Flash VCC reaches GND. F-RP# doesn’t have latch mode, therefore FRP# must be held VIH during read operation or erase / program operation.
2µs
17
Rev.0.2_48a_bezz
Preliminary
IH
IL
IH
IL
IHVIL
IHVIL
OHVOVIHVIL
Read /Write Inhibit
Read /Write Inhibit
Read /Write Inhibit
Notice: This is not a final specification.
Some parametric limits are subject to change.
Flash VCC Power up / down Timing
Renesas LSIs
M5M29KE131BVP
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
3.0V
V
CC
RP#
CE#
WE#
GND
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
t
VHEL
t
VCS
t
PS
t
PS
AC Waveforms for Read Operation and Test Conditions
t
RC
(WORD)
V
V
V
Address Valid
t
a(AD)
V
t
V
CEPH
t
OEH
t
a(CE)
V
t
a(OE)
t
CLZ
OLZ
Output Valid
V
High-Z
FFH
t
PS
t
A22-A
0
A22 -A-1 (BYTE)
F-CE#
OE#
WE#
DATA
F-RP#
t
DF(CE)
t
DF(OE)
t
OH
t
PHZ
High-Z
Test Conditions for
AC Characteristics
Input Voltage : VIL=0V, VIH=Flash Vcc
Input Rise and Fall Times : <5ns
Reference Voltage
at timing measurement : (Flash Vcc)/2
Output Load : 1 TTL gate +
CL(30pF)
or
1.3V
1N914
3.3kohm
DUT
CL=30pF
18
- After inputting Read Array Command FFH, it is necessary to make F-CE# “H” pulse more than 30ns (tCEPH).
And after inputting Read Array Command FFH, it is also necessary to keep 30ns to recover before starting read
after WE# rises “H” in case of changing a part or all of addresses( A22~A0/A22~A-1) and F-CE#= “L”.
Rev.0.2_48a_bezz
Preliminary
D7-D0
IHVIL
IHVILVIHVIL
IHVIL
OHVOL
D14-D8
OHVOL
IHVIL
Notice: This is not a final specification.
Some parametric limits are subject to change.
Byte AC Waveforms for Read Operation
Renesas LSIs
M5M29KE131BVP
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
ADDRESS
A22-A0
F-CE#
OE#
BYTE#
DATA
DATA
D15/A-1
V
Address Valid
t
t
BCD
t
BAD
t
CLZ
a(AD)
t
a(BYTE)
t
a(CE)
t
a(OE)
t
OLZ
t
BAD
Output Valid
V
V
V
High-Z
V
High-Z
V
Address Valid
When BYTE# = VIH, F-CE# = OE# = VIL, D15/A-1 is output status. At this time, input signal must not be applied.
Address Valid
t
a(BYTE)
t
BHZ
ValidValid
Valid
t
a(AD)
D15A-1
t
DF(CE)
t
DF(OE)
t
OH
19
Rev.0.2_48a_bezz
Preliminary
Notice: This is not a final specification.
Some parametric limits are subject to change.
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
AC Waveforms for Word / Byte Program Operation (WE# Control)
V
(Word)
(Byte)
IH
Bank Address
High-Z
t
BLS
Valid
t
t
t
BS
WC
PS
t
WP
V
IL
V
IH
V
IL
t
CS
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
40H
t
WPH
Address Valid
t
AS
t
CH
t
DS
DIN
t
OEH
Bank Address Valid
t
AH
t
WHRL
SRD
DH
Busy
t
BH
t
Program
t
DAP
ADDRESS
A22-A
0
A22-A
-1
F-CE#
OE#
WE#
DATA
F-RP#
F-WP#
BYTE#
Renesas LSIs
M5M29KE131BVP
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
Bank Address Valid
Read Status Register
t
a(CE)
t
a(OE)
SRD
Ready
t
BLH
FFH
Write Read Array Command
AC Waveforms for Word / Byte Program Operation (F-CE# Control)
V
(Word)
(Byte)
IH
Bank Address
t
WS
High-Z
t
BLS
t
Valid
t
WC
t
PS
BS
t
CEP
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
40H
Address Valid
t
AS
t
WH
t
DS
DIN
Bank Address Valid
t
t
OEH
t
EHRL
t
DH
AH
Program
SRD
Busy
t
BH
t
DAP
ADDRESS
A22-A
0
A22-A
-1
F-CE#
OE#
WE#
DATA
F-RP#
F-WP#
BYTE#
Bank Address Valid
Read Status Register
t
a(CE)
t
a(OE)
SRD
Ready
Write Read Array Command
t
BLH
FFH
20
Rev.0.2_48a_bezz
Preliminary
\
Notice: This is not a final specification.
Some parametric limits are subject to change.
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
AC Waveforms for Page Program Operation (WE# Control)
V
IH
A22-A
7
(Word)
0
-1
(Byte)
V
V
A6-A
A6-A
V
V
F-CE#
V
V
OE#
V
V
WE#
V
V
DATA41HDIN
V
V
F-RP#
V
V
F-WP#
V
V
BYTE#
V
IL
IH
IL
IH
IL
t
IH
IL
IH
IL
IH
IL
IH
IL
IH
IL
IH
IL
Bank Address
CS
High-Z
t
BLS
t
BS
Valid
t
WC
t
WPtWPH
t
PS
Address Valid
00H01H-7EH7FH
00H01H-FEHFFH
t
AS
t
CH
AC Waveforms for Page Program Operation (F-CE# Control)
The Other Bank
Address Valid
Valid
Valid
t
AH
t
OEH
t
DH
t
DS
t
a(CE)
t
a(OE)
DOUT
Address Valid
t
GHWL
DINDIN
Renesas LSIs
M5M29KE131BVP
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
Bank Address Valid
t
OEH
t
WHRL
SRD
t
BH
Bank Address Valid
Read Status Register
Busy
t
a(CE)
t
a(OE)
SRD
Ready
Write Read Array Command
t
DAP
t
BLH
FFH
V
IH
A22 - A
7
(Word)
(Byte)
-1
V
V
V
A6-A
A6-A
0
V
F-CE#
V
V
OE#
V
V
WE#
V
V
DATA41HDIN
V
V
F-RP#
V
V
F-WP#
V
V
BYTE#
V
IL
IH
IL
IH
IL
IH
IL
IH
IL
IH
IL
IH
IL
IH
IL
IH
IL
t
WS
High-Z
Bank Address
Valid
t
WC
t
CEP
t
PS
t
BLS
t
BS
Address Valid
00H01H-7EH7FH
00H01H-FEHFFH
t
AS
t
WH
t
CEPH
The Other Bank
Address Valid
Valid
Valid
t
AH
t
OEH
t
DH
t
DS
t
a(CE)
t
a(OE)
DOUT
Address Valid
t
GHEL
DINDIN
Bank Address Valid
t
OEH
t
EHRL
SRD
Busy
t
BH
Bank Address Valid
Read Status Register
SRD
Ready
t
DAP
t
BLH
t
a(CE)
t
a(OE)
FFH
Write Read Array Command
21
Rev.0.2_48a_bezz
Preliminary
Notice: This is not a final specification.
Some parametric limits are subject to change.
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
AC Waveforms for Erase Operation (WE# Control)
V
(Word)
(Byte)
IH
Bank Address
High-Z
t
BLS
t
Valid
t
WC
t
PS
BS
t
WP
V
IL
V
IH
V
IL
t
CS
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
Address Valid
t
AS
t
CH
t
WPH
t
DS
D0H
Bank Address Valid
t
AH
t
OEH
t
WHRL
t
DH
t
ADDRESS
A22-A
0
A22-A
-1
F-CE#
OE#
WE#
DATA20H
F-RP#
F-WP#
BYTE#
BH
SRD
Busy
Erase
t
DAE
Renesas LSIs
M5M29KE131BVP
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
Bank Address Valid
Read Status Register
t
a(CE)
t
a(OE)
SRD
Ready
t
BLH
FFH
Write Read Array Command
AC Waveforms for Erase Operation (F-CE# Control)
V
(Word)
(Byte)
IH
Bank Address
t
WS
High-Z
t
BLS
t
Valid
t
WC
t
t
PS
BS
CEP
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
20H
Address Valid
t
AS
t
WH
t
DS
D0H
Bank Address Valid
t
AH
t
OEH
t
EHRL
SRD
t
DH
t
BH
Erase
Busy
ADDRESS
A22-A
0
A22-A
-1
F-CE#
OE#
WE#
DATA
F-RP#
F-WP#
BYTE#
t
DAE
Bank Address Valid
Read Status Register
t
a(CE)
t
a(OE)
SRD
Ready
Write Read Array Command
t
BLH
FFH
22
Rev.0.2_48a_bezz
Preliminary
Notice: This is not a final specification.
Some parametric limits are subject to change.
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
AC Waveforms for Word / Byte Program Operation with BGO (WE# Control)
M5M29KE131BVP
Stacked-uMCP (micro Multi Chip Package)
Renesas LSIs
CMOS FLASH MEMORY
Change Bank Address
Address
Valid
Address
Valid
t
a(CE)
t
a(OE)
DOUTDOUT
WP
Program in one bank
Address Valid
t
AS
t
CH
t
WPH
t
DS
V
(Byte)
IH
Bank Address
High-Z
Valid
t
WC
t
V
7
IL
V
IH
V
IL
V
IH
V
IL
t
CS
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
ADDRESS
A22 - A
A6-A
(Word)
0
A6-A
-1
F-CE#
OE#
WE#
DATA40HDIN
Read Status RegisterRead Array in another bank
Address Valid
t
AH
t
OEH
t
WHRL
SRD
t
DH
Program
Busy
AC Waveforms for Word / Byte Program Operation with BGO (F-CE# Control)
Address
Valid
Address
Valid
CEP
Program in one bank
Address Valid
t
AS
t
WH
t
DS
V
(Byte)
IH
Bank Address
t
WS
High-Z
Valid
t
WC
t
V
IL
7
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
ADDRESS
A22 - A
A6-A
(Word)
0
A6-A
-1
F-CE#
OE#
WE#
DATA40HDIN
Read Status RegisterRead Array in another bank
Address Valid
t
AH
t
OEH
t
EHRL
SRD
t
DH
Program
Busy
Change Bank Address
Address
Valid
Address
Valid
Address
Valid
Address
Valid
t
a(CE)
t
a(OE)
DOUTDOUT
23
Rev.0.2_48a_bezz
Preliminary
\
Change Bank Address
Notice: This is not a final specification.
Some parametric limits are subject to change.
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
AC Waveforms for Page Program Operation with BGO (WE# Control)
M5M29KE131BVP
Stacked-uMCP (micro Multi Chip Package)
Renesas LSIs
CMOS FLASH MEMORY
V
IH
A22-A
7
V
A6-A
(Word)
0
V
A6-A
(Byte)
-1
V
V
F-CE#
V
V
OE#
V
V
WE#
V
V
DATA41HDIN
V
IL
IH
IL
IH
IL
t
IH
IL
IH
IL
IH
IL
Bank Address
CS
High-Z
Valid
t
WC
t
WPtWPH
00H01H-7EH7FH
00H01H-FEHFFH
t
AS
t
CH
Program in one bank
Address Valid
t
AH
t
DH
t
DS
DINDIN
t
OEH
t
WHRL
SRD
Busy
AC Waveforms for Page Program Operation with BGO (F-CE# Control)
t
OEH
t
EHRL
Change Bank Address
SRD
Busy
7
(Word)
(Byte)
-1
V
IH
Bank Address
V
IL
V
IH
V
IL
V
IH
V
IL
t
WS
V
IH
V
IL
V
IH
V
IL
V
IH
High-Z
V
IL
Valid
t
WC
t
CEPtCEPH
00H01H-7EH7FH
00H01H-FEHFFH
t
AS
t
WH
ADDRESS
A22 - A
A6-A
0
A6-A
F-CE#
OE#
WE#
DATA41HDIN
Program in one bank
Address Valid
t
AH
t
DH
t
DS
DINDIN
Read Array in another bank
Address
Valid
Address
Valid
DOUTDOUT
Read Array in another bank
Address
Valid
DOUTDOUT
t
DAP
t
a(CE)
t
a(OE)
t
t
Address
Valid
Address
Valid
Address
Valid
a(CE)
a(OE)
24
Rev.0.2_48a_bezz
Preliminary
Notice: This is not a final specification.
Some parametric limits are subject to change.
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
AC Waveforms for Erase Operation with BGO (WE# Control)
Renesas LSIs
M5M29KE131BVP
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
Change Bank Address
ADDRESS
A22-A
(Word)
0
A22-A
(Byte)
-1
F-CE#
OE#
WE#
DATA
V
IH
Bank Address
V
IL
V
IH
V
IL
t
CS
V
IH
V
IL
V
IH
V
IL
V
IH
High-Z
V
IL
Valid
t
WC
t
WP
20H
t
WPH
t
AS
t
CH
t
DS
D0H
Read Status RegisterRead Array in another bankProgram in one bank
Address Valid
t
OEH
t
WHRL
t
DH
SRD
Busy
AC Waveforms for Erase Operation with BGO (F-CE# Control)
Address
Valid
t
AH
t
a(CE)
t
a(OE)
DOUTDOUT
Address
Valid
ADDRESS
A22-A
(Word)
0
A22-A
(Byte)
-1
F-CE#
OE#
WE#
DATA
Change Bank Address
V
IH
Bank Address
WS
Valid
t
WC
t
CEP
20H
t
t
WH
DS
t
AS
V
IL
V
IH
V
IL
V
IH
V
IL
t
V
IH
V
IL
V
IH
High-Z
V
IL
Address Valid
t
OEH
D0H
t
EHRL
SRD
t
DH
Busy
Read Array in another bankRead Status RegisterProgram in one bank
Address
Valid
t
AH
t
a(CE)
t
a(OE)
Address
Valid
DOUTDOUT
25
Rev.0.2_48a_bezz
Preliminary
IHVIL
IH
IL
IHVIL
IHVIL
IH
IL
IHVIL
IHVIL
CStCHtWP
AHtAS
OEH
BLHta(OE)ta(CE)
ADDRESS
Notice: This is not a final specification.
Some parametric limits are subject to change.
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
AC Waveforms for Suspend Operation (WE# Control)
Renesas LSIs
M5M29KE131BVP
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
(Word)
0
-1
(Byte)
V
Bank Address Valid
V
V
t
ADDRESS
A22-A
A22-A
F-CE#
V
OE#
V
WE#
V
DATAB0H
High-Z
V
V
F-RP#
V
F-WP#
t
t
Suspend Time
Bank Address Valid
Read Status Register
S.R.6,7=1
SRD
Valid
t
AC Waveforms for Suspend Operation (F-CE# Control)
V
(Word)
(Byte)
-1
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
High-Z
V
IL
V
IH
V
IL
V
IH
V
IL
A22-A
0
A22-A
F-CE#
OE#
WE#
DATAB0H
F-RP#
F-WP#
Bank Address Valid
t
AS
t
t
WS
CEP
t
WH
t
AH
t
OEH
Suspend Time
Bank Address Valid
Read Status Register
t
a(CE)
t
a(OE)
S.R.6,7=1
SRD
Valid
t
BLH
26
Rev.0.2_48a_bezz
Preliminary
IH
IL
IH
IL
IH
IL
IH
IL
IH
IL
CStWPtWCta(OE)
a(CE)
CHta(AD)ta(OE)
a(AD)ta(OE)
a(AD)
a(CE)ta(CE)
IHVIL
IHVIL
IH
IL
IHVIL
IH
IL
CStWP
Bank Address Valid
Address Valid
CH
a(AD)
a(AD)
Notice: This is not a final specification.
Some parametric limits are subject to change.
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
AC Waveforms for Device ID Read Operation with BBR(Back Bank Read)
M5M29KE131BVP
Stacked-uMCP (micro Multi Chip Package)
Renesas LSIs
CMOS FLASH MEMORY
ADDRESS
A22 - A
V
V
0
Bank Address ValidAddress ValidAddress ValidBank Address Valid
V
F-CE#
V
t
V
OE#
V
V
WE#
DATA90H
V
V
High-Z
V
Change Bank Address
t
Return Bank Address
t
t
t
ID
ID
t
Dout
AC Waveforms for Status Register Read Operation with BBR(Back Bank Read)
ADDRESS
A22 - A
V
0
V
F-CE#
t
V
OE#
V
V
WE#
V
DATA70H
High-Z
V
Change Bank Address
t
a(CE)
t
t
EHRL
t
a(OE)
t
a(OE)
t
SRD
Return Bank Address
t
a(CE)
Bank Address Valid
t
Dout
t
a(CE)
t
SRD
a(OE)
27
Rev.0.2_48a_bezz
Preliminary
Notice: This is not a final specification.
Some parametric limits are subject to change.
Renesas LSIs
M5M29KE131BVP
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
Word / Byte Program Flow Chart
Start
Write 40H
Write Address,
Data
Status Register
Read
SR.7 = 1?
YES
Full Status Check
If Desired
Word / Byte Program
Completed
NO
Write
B0H?
YES
Suspend Loop
Write D0H
NO
YES
Block Erase Flow Chart
Start
Page Program Flow Chart
Start
Write 41H
n = 0
Write Address n,
DATA n
n = 7FH?
n = FFH?
YES
Status Register
Read
SR.7 = 1?
YES
Full Status Check
If Desired
Page Program
Completed
NO
NO
Suspend Loop
n = n + 1
Write
B0H?
YES
Write D0H
YES
NO
Write 20H
Write D0H
Block Address
Status Register
Read
SR.7 = 1?
YES
Full Status Check
If Desired
Erase
Completed
28
NO
Write
B0H?
YES
Suspend Loop
Write D0H
YES
NO
Status Register Check Flow Chart
Start
SR.4,5 = 1?
NO
SR.5 = 0?
YES
SR.4 = 0?
YES
SR.3 = 0?
YES
Pass
(Block Erase, Program)
YES
NO
NO
NO
Command
Sequence Error
Block Erase
Error
Program Error
(Page Program)
Block Erase Error
(Block Fail)
Rev.0.2_48a_bezz
Preliminary
Notice: This is not a final specification.
Some parametric limits are subject to change.
Renesas LSIs
M5M29KE131BVP
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
Single Data Load to Page Buffer
Flow Chart
Start
Write 74H
Write Address,
Data
Load
Finished?
Single Data Load
To Page Buffer
Completed
NO
YES
Page Buffer to Flash Flow Chart
Start
Suspend / Resume Flow Chart
Start
NO
NO
Suspend
Erase/ Program
Finished
Write B0H
Status Register
Read
S.R. 7=1?
YES
S.R. 6=1?
YES
Write FFH
Read Array
Data
Write 0EH
Write D0H
Page Address
Status Register
Read
SR.7 = 1?
YES
Full Status Check
If Desired
Page Buffer
To Flash
Completed
NO
Write
BOH?
YES
Suspend Loop
Write D0H
YES
NO
Read
Finished?
Write D0H
Operation
Restart
NO
YES
Clear Page Buffer Flow Chart
Start
Write 55H
Write D0H
Clear Page Buffer
Completed
Resume
29
Rev.0.2_48a_bezz
Preliminary
Bank Address
Bank Address
(Random Read)
(Random Read)
Notice: This is not a final specification.
Some parametric limits are subject to change.
Operation Status (F-WP#=VIH)
Renesas LSIs
M5M29KE131BVP
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
Back Bank Read State
Read Array
(Random Read)
Setup State
Clear Page Buffer
Setup
55H
Ready
Clear
Status Register
Single Data Load
to Page Buffer
Setup
Change Bank
Address
Others
74H
Page Buffer
50H
3)
D0H
Flash to
Setup
Read/Standby State
(Random Read Mode)
WD
D0H
F1H
0EH
Page Buffer to
Flash
Setup
Other
D0H
Status Register
Device Identifier
41H40H
Page Program
Setup
Wdi
I=0-127
Program &
Verify
Read
Read
Status Register
70H
90H
Read
90H
WD
70H
FFH
Read Array
(Random Read)
FFH
Word Program
Setup
Internal State
B0HB0H
D0HD0H
Block Erase
Setup
D0H
Erase &
Verify
Read
Status Register
20H
D0H
A7H
Erase All Unlocked
Blocks Setup
Others
Change
Read State with BGO
Read Array
Suspend
Read
Status Register
70H
State
Read State with BGO
Read Array
Change
FFH
Read Array
(Random Read)
1) After setting up Clear Page Buffer, D0H enables to clear Page Buffer.
2) To access any bank during Erase All Unlocked Block results Status Register Read.
Although Read Status Register Command and Read Array Command can be issued under Suspend State,
output data make no sense.
30
Rev.0.2_48a_bezz
Preliminary
Release Setup
Release Setup
Release Setup
Release Setup
Release Setup
Others
3)
7BH
Others
Others
Others
Notice: This is not a final specification.
Some parametric limits are subject to change.
Operation Status (F-WP#=VIL)
Renesas LSIs
M5M29KE131BVP
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
Back Bank Read State
Read Array
(Random Read)
Read Array
(Random Read)
Setup State
Clear Page Buffer
Setup
Clear
Status Register
Change Bank
Address
55H
Single Data Load
to Page Buffer
Setup
Change Bank
Address
D0H
4)
Others
WD
74H
Page Buffer
50H
Flash to
Setup
Read/Standby State
(Random Read Mode)
D0H
Software Lock
F1H
Page Buffer to
0EH
Flash
Setup
Device Identifier
BA#
Software Lock
Software Lock
Page Program
Setup
70H
90H
Read
90H
FFH
41H40H
Word Program
Setup
Read
Status Register
70H
FFH
Read Array
(Random Read)
ACH
Software Lock
BA
20H
3)
Block Erase
Software Lock
Setup
60H
Wdi
Ready
Change Bank
Address
Read State with BGO
Other
Read Array
(Random Read)
D0H
I=0-127
Program &
Verify
Read
Status Register
WD
B0HB0H
D0HD0H
Status Register
Suspend
Internal State
Read
70H
State
Read State with BGO
Read Array
(Random Read)
Change Bank
AddressRead Array
FFH
(Random Read)
1) BA, BA#: Block Address, Block Address# (Shown in Command List(F-WP#=VIL) in detail).
2) After setting up Clear Page Buffer, D0H enables to clear Page Buffer.
D0H
Erase &
Verify
Read
Status Register
Other
31
Rev.0.2_48a_bezz
Preliminary
Notice: This is not a final specification.
Some parametric limits are subject to change.
Renesas LSIs
M5M29KE131BVP
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
Package Dimension
48P3R-C
32
Rev.0.2_48a_bezz
Preliminary
Notice: This is not a final specification.
Some parametric limits are subject to change.
Renesas LSIs
M5M29KE131BVP
134,217,728-BIT (16,777,216-WORD BY 8-BIT / 8,388,608-WORD BY 16-BIT)
CMOS FLASH MEMORY
Stacked-uMCP (micro Multi Chip Package)
Nippon Bldg.,6-2,Otemachi 2-chome,Chiyoda-ku,Tokyo,100-0004 Japan
Keep safety first in your circuit designs!
• RenesasTechnology Corporation puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to
personal injury, fire or property damage.Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of nonflammable
material or (iii) prevention against any malfunction or mishap.
Notes regarding these materials
• These materials are intended as a reference to assist our custom ers in the selection of theRenesas Technology Corporation product best suited to the customer's application; they do not convey any license under any intellectual
property rights, or any other rights, belonging to Renesas Technology Corporation or a third party.
• RenesasTechnology Corporation assumes no responsibility for any damage, or infringement of any third-party's rights, originating in the use of any product data, diagrams, charts, programs, algorithms, or circuit application
examples contained in these materials.
• All information contained in these materials, including product data, diagrams, charts, programs and algorithms represents information on products at the time of publication of these materials, and are subject to change by
Renesas Technology Corporation without notice due to product improvements or other reasons. It is therefore recommended that customers contact Renesas Technology Corporation or an authorized Renesas Technology
Corporation product distributor for the latest product information before purchasing a product listed herein.
The information described here may contain technical inaccuracies or typographical errors.
Renesas Technology Corporation assumes no responsibility for any damage, liability, or other loss rising from these inaccuracies or errors.
Please also pay attention to information published by Renesas Technology Corporation by various means, including the Renesas Technology Corporation Semiconductor home page (http://www.renesas.com).
• When using any or all of the information contained in these materials, including product data, diagrams, charts, programs, and algorithms, please be sure to evaluate all information as a total system before making a final decision
on the applicability of the information and products. Renesas Technology Corporation assumes no responsibility for any damage, liability or other loss resulting from the information contained herein.
• RenesasTechnology Corporation semiconductors are not designed or manufactured for use in a device or system that is used under circumstances in which human life is potentially at stake. Please contactRenesas Technology
Corporation or an authorized Renesas Technology Corporation product distributor when considering the use of a product contained herein for any specific purposes, such as apparatus or systems for transportation, vehicular,
medical, aerospace, nuclear, or undersea repeater use.
• The prior written approval ofRenesas Technology Corporation is necessary to reprint or reproduce in whole or in part these materials.
• If these products or technologies are subject to the Japanese export control restrictions, they must be exported under a license from the Japanese government and cannot be imported into a country other than the approved
destination.
• Any diversion or reexport contrary to the export control laws and regulations of Japan and/or the country of destination is prohibited.
• Please contactRenesas Technology Corporation for further details on these materials or the products contained therein.