Raytheon RMWL05001 Datasheet

Raytheon RF Components
362 Lowell Street
Andover, MA 01810
Revised March 2, 2001
Page 1
www.raytheon.com/micro
Characteristic performance data and specifications are subject to change without notice.
PRODUCT INFORMATION
Single positive supply operation4 mil substrateNoise figure 1.4 dB (typ.)Small-signal gain 18 dB (typ.)1dB compressed Pout 14 dBm (typ.)Chip size 2.0 mm x 1.15 mm
Features
The RMWL05001 is a 2-stage GaAs MMIC amplifier designed as a 4.7 to 5.2 GHz Low Noise Amplifier for use in point to point radios, point to multi-point communications, LMDS, and other millimeter wave applications. In conjunction with other Raytheon amplifiers, multipliers and mixers it forms part of a complete 38 GHz transmit/receive chipset. The RMWL05001 utilizes Raytheon’s 0.25µm power PHEMT process and is sufficiently versatile to serve in a variety of low noise amplifier applications.
RMWL05001
5 GHz Low Noise Amplifier MMIC
Electrical
Characteristics
(At 25°C),
50
system,
Vd=+4 V
Single Bias Supply
Parameter Min Typ Max Unit
Frequency Range 4.7 5.2 GHz Noise Figure 1.4 2.3 dB Gain Small Signal at Pin=-20 dBm 14 18 20 dB Gain Variation vs. Frequency 1 dB Gain at 1dB Compression 17 dB Power Output at 1dB Compression 14 dBm
Parameter Min Typ Max Unit
Drain Current at Pin=-20 dBm 50 mA Input Return Loss (Pin=-15 dBm) 15 dB Output Return Loss (Pin=-15 dBm) 15 dB
Absolute
Maximum
Ratings
Parameter Symbol Value Units
Positive DC voltage (+4 V Typical) Vd +6 Volts Positive DC current I
D
113 mA
RF Input Power (from 50 source) P
IN
+8 dBm
Operating Baseplate Temperature T
C
-30 to +85 °C
Storage Temperature Range T
stg
-55 to +125 °C
Thermal Resistance R
JC
112 °C /W
(Channel to Backside)
Raytheon RF Components
362 Lowell Street
Andover, MA 01810
Revised March 2, 2001
Page 2
www.raytheon.com/micro
Characteristic performance data and specifications are subject to change without notice.
PRODUCT INFORMATION
CAUTION: THIS IS AN ESD SENSITIVE DEVICE.
Chip carrier material should be selected to have GaAs compatible thermal coefficient of expansion and high thermal conductivity such as copper molybdenum or copper tungsten. The chip carrier should be machined, finished flat, plated with gold over nickel and should be capable of withstanding 325°C for 15 minutes.
Die attachment should utilize Gold/Tin (80/20) eutectic alloy solder and should avoid hydrogen environment for PHEMT devices. Note that the backside of the chip is gold plated and is used as RF and DC ground.
These GaAs devices should be handled with care and stored in dry nitrogen environment to prevent contamination of bonding surfaces. These are ESD sensitive devices and should be handled with appropriate precaution including the use of wrist grounding straps. All die attach and wire/ribbon bond equipment must be well grounded to prevent static discharges through the device.
Recommended wire bonding uses 3 mils wide and 0.5 mil thick gold ribbon with lengths as short as practical allowing for appropriate stress relief. The RF input and output bonds should be typically 0.012” long corresponding to a typically 2 mil between the chip and the substrate material.
Application
Information
RMWL05001
5 GHz Low Noise Amplifier MMIC
Figure 1
Functional Block
Diagram
RF IN RF OUT
Drain Supply
Vd
Ground
(Back of chip)
MMIC Chip
RF IN RF OUT
Ground
(Back of chip)
MMIC Chip
Figure 2
Schematic of
Application Circuit
Amplifier is self-biased.
No gate supply is
required.
Drain Supply
Vd=+4 V
100pF
10,000pF
L
L
L = Bond Wire Inductance
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