Raytheon RMTR13390 Datasheet

Raytheon RF Components
362 Lowell Street
Andover, MA 01810
Revised April 6, 2001
Page 1
www.raytheon.com/micro
Characteristic performance data and specifications are subject to change without notice.
ADVANCED INFORMATION
Description
2 mil substrateConversion Loss 5 dBm (typ.)Wide operating bandwidthChip size 3.224 mm x 1.134 mm
Features
Electrical
Characteristics
(At 25°C), 50 system,
Vd = +5 V, Quiescent
current (Idq)= 100 mA,
Pin=+17 dBm
Note: 1. Typical range of the negative gate voltage is -0.5 to 0.0V to set typical Idq of 100 mA.
Absolute
Maximum
Ratings
Parameter Symbol Value Unit
Positive DC Voltage (+5 V Typical) Vd + 6 Volts Negative DC Voltage Vg - 2 Volts Simultaneous (Vd - Vg) Vdg + 8 Volts Positive DC Current Id 187 mA RF Input Power (from 50 Ω source) P
IN
+22 dBm
Operating Baseplate Temperature T
C
-30 to +85 °C
Storage Temperature Range T
stg
-55 to +125 °C
Thermal Resistance R
j
117 °C/W
(Channel to Backside)
Parameter Min Typ Max Unit
Input Frequency Range 12 13.5 GHz Output Frequency Range 36 40.5 GHz Gate Supply Voltage (Vg)
1
- 0.2 V Input Drive Power @ Fo +15 +17 dBm Output Power @ 3Fo +12 dBm
Parameter Min Typ Max Unit
Conversion Loss 5 dBm Fundamental Rejection -15 dBc 2nd Harmonic Rejection -25 dBc 4th Harmonic Rejection -25 dBc Input Return Loss 8 dB Output Return Loss 7 dB
RMTR13390
13-39 GHz Tripler MMIC
Raytheon RF Components
362 Lowell Street
Andover, MA 01810
Revised April 6, 2001
Page 2
www.raytheon.com/micro
Characteristic performance data and specifications are subject to change without notice.
ADVANCED INFORMATION
CAUTION: THIS IS AN ESD SENSITIVE DEVICE.
Chip carrier material should be selected to have GaAs compatible thermal coefficient of expansion and high thermal conductivity such as copper molybdenum or copper tungsten. The chip carrier should be machined, finished flat, plated with gold over nickel and should be capable of withstanding 325°C for 15 minutes.
Die attachment should utilize Gold/Tin (80/20) eutectic alloy solder and should avoid hydrogen environment for PHEMT devices. Note that the backside of the chip is gold plated and is used as RF ground.
These GaAs devices should be handled with care and stored in dry nitrogen environment to prevent contamination of bonding surfaces. These are ESD sensitive devices and should be handled with appropriate precaution including the use of wrist grounding straps. All die attach and wire/ribbon bond equipment must be well grounded to prevent static discharges through the device.
Recommended wire bonding uses 3 mils wide and 0.5 mil thick gold ribbon with lengths as short as practical allowing for appropriate stress relief. The RF input and output bonds should be typically 0.012” long corresponding to a typically 2 mil between the chip and the substrate material.
Figure 1
Functional Block
Diagram
Application
Information
MMIC Chip
RF OUT
3Fo
RF IN
Fo
Ground
(Back of Chip)
Gate Supply
(Vg1, Vg2 & Vg3)
Drain Supply
(Vd2)
Drain Supply
(Vd3)
Drain Supply
(Vd1)
X3
0.0
0.974 1.8830.182 2.369
1.019
2.5292.0251.723
0.113
1.007
0.127
3.042
3.111
1.134
0.777
0.577
0.377
0.115
3.224
Figure 2
Chip Layout and Bond
Pad Locations
Chip Size is 3.224 mm x
1.134 mm. Back of chip
is RF ground.
Dimensions in mm
RMTR13390
13-39 GHz Tripler MMIC
Raytheon RF Components
362 Lowell Street
Andover, MA 01810
Revised April 6, 2001
Page 3
www.raytheon.com/micro
Characteristic performance data and specifications are subject to change without notice.
ADVANCED INFORMATION
RF OUT
3Fo
RF IN
Fo
Ground (Back of Chip)
Gate Supply (Vg)
Drain Supply (Vd = +5 V)
100 pF
10,000 pF
100 pF
10,000 pF
100 pF100 pF
L= Bond Wire Inductance
LL
LLL
L
L
L
L
Figure 3
Recommended
Application Schematic
Circuit Diagram
RMTR13390
13-39 GHz Tripler MMIC
X3
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