RAMTRON FM18L08-70-S, FM18L08-70-P Datasheet

Preliminary
FM18L08
256Kb 2.7-3.6V Bytewide FRAM Memory
Features
256K bit Ferroelectric Nonvolatile RAM
10 year data retention at 85° C
Unlimited read/write cycles
NoDelay™ write
Advanced high-reliability ferroelectric process
Superior to Battery -backed SRAM
No battery concerns
Monolithic reliability
True surface mount solution, no rework steps
Superior for moisture, shock, and vibration
Resistant to negative voltage undershoots
Description
The FM18L08 is a 256-kilobit nonvolatile memory employing an advanced ferroelectric process. A ferroelectric random access memory or FRAM is nonvolatile but operates in other respects as a RAM. It provides data retention for 10 years while eliminating the reliability concerns, functional disadvantages and system design complexities of battery -backed SRAM. Fast-write time and practically unlimited read/write endurance make it superior to other types of nonvolatile memory and a good substitute for ordinary SRAM.
In-system operation of the FM18L08 is very similar to other RAM based devices. Memory read- and write­cycles require equal times. The FRAM memory, however, is nonvolatile due to its unique ferroelectric memory process. Unlike BBSRAM, the FM18L08 is a truly monolithic nonvolatile memory. It provides the same functional benefits of a fast write without the serious disadvantages associated with modules and batteries or hybrid memory solutions.
These capabilities make the FM18L08 ideal for nonvolatile memory applications requiring frequent or rapid writes in a bytewide environment. The availability of a true surface-mount package improves the manufacturability of new designs, while the DIP package facilitates simple design retrofits. The FM18L08 offers guaranteed operation over an industrial temperature range of -40°C to +85°C.
SRAM & EEPROM Compatible
JEDEC 32Kx8 SRAM & EEPROM pinout
70 ns access time
130 ns cycle time
Equal access & cycle time for reads and writes
Low Power Operation
2.7V to 3.6V operation
15 mA active current
15 µA standby current
Industry Standard Configuration
Industrial temperature -40° C to +85° C
28-pin SOP or DIP
Pin Configuration
A14 A12
A7 A6 A5 A4 A3 A2 A1
A0 DQ0 DQ1 DQ2
VSS DQ3
Ordering Information
FM18L08-70-S 70 ns access, 28-pin SOP FM18L08-70-P 70 ns access, 28-pin DIP
VDD WE A13 A8 A9 A11 OE A10 CE DQ7 DQ6 DQ5 DQ4
This data sheet contains specifications for a product under development. Ramtron International Corporation Characterization is not complete; specifications may change without notice. 1850 Ramtron Drive, Colorado Springs, CO 80921 (800) 545-FRAM, (719) 481-7000, Fax (719) 481-7058
www.ramtron.com
23 March 2001 1/11
Ramtron FM18L08
Figure 1. Block Diagram
CE
WE
OE
A0-A14
Address
Latch
Control
Logic
A10-A14
A0-A7
A8-A9
Row
Decoder
Block Decoder
32,768 x 8 FRAM Array
Column Decoder
I/O Latch
Bus Driver
DQ0-7
Pin Description
Pin Name Pin Number I/O Pin Description
A0-A14 1-10, 21, 23-26 I Address. The 15 address lines select one of 32,768 bytes in the FRAM
array. The address value will be latched on the falling edge of /CE. DQ0-7 11-13, 15-19 I/O Data. 8-bit bi -directional data bus for accessing the FRAM array. /CE 20 I Chip Enable. /CE selects the device when low. The falling edge of /CE
causes the address to be latched internally. Address changes that
occur after /CE goes low will be ignored until the next falling edge
occurs. /OE 22 I Output Enable. When /OE is low the FM18L08 drives the data bus
when valid data is available. Taking /OE high causes the DQ pins to be
tri-stated. /WE 27 I Write Enable. Taking /WE low causes the FM18L08 to write the
contents of the data bus to the address location latched by the falling
edge of /CE. VDD 28 I Supply Voltage. VSS 14 I Ground.
Functional Truth Table
/CE /WE /OE Function
H X X Standby/Precharge æ
X X Latch Address L H L Read L L X Write
23 March 2001 2/11
Ramtron FM18L08
Overview
The FM18L08 is a bytewide FRAM logically organized as 32,768 x 8. It is accessed using an industry standard parallel interface. The FM18L08 is inherently nonvolatile via its unique ferroelectric process. All data written to the part is immediately nonvolatile with no delay. Functional operation of the FRAM memory is similar to SRAM type devices. The major operating difference between the FM18L08 and an SRAM (besides nonvolatile storage) is that the FM18L08 latches the address on the falling edge of /CE.
Memory Operation
Users access 32,768 memory locations each with 8 data bits through a parallel interface. The access and cycle time are the same for read and write memory operations. Writes occur immediately at the end of the access with no delay. Unlike an EEPROM, it is not necessary to poll the device for a ready condition since writes occur at bus speed. A pre-charge operation, where /CE goes inactive, is a part of every memory cycle. Thus unlike SRAM, the access and cycle times are not equal.
Note that the FM18L08 contains a limited low voltage write protection circuit. This will prevent access when VDD is much lower than the specified operating range. It is still the user’s responsibility to ensure that VDD is within data sheet tolerances to prevent incorrect operation.
The FM18L08 is designed to operate in a manner very similar to other bytewide memory products. For users familiar with SRAM, the performance is comparable but the bytewide interface operates in a slightly different manner as described below. For users familiar with EEPROM, the obvious differences result from the higher write performance of FRAM technology including NoDelay writes and from unlimited write endurance.
Read Operatio n
A read operation begins on the falling edge of /CE. At this time, the address bits are latched and a memory cycle is initiated. Once started, a full memory cycle must be completed internally regardless of the state of /CE. Data becomes available on the bus after the access time has been satisfied.
After the address has been latched, the address value may be changed upon satisfying the hold time parameter. Unlike an SRAM, changing address values
23 March 2001 3/11
will have no effect on the memory operation after the address is latched.
The FM18L08 will drive the data bus when /OE is asserted to a low state. If /OE is asserted after the memory access time has been satisfied, the data bus will be driven with valid data. If /OE is asserted prior to completion of the memory access, the data bus will be driven when valid data is available. This feature minimizes supply current in the system by eliminating transients due to invalid data. When /OE is inactive the data bus will remain tri-stated.
Write Operation
Writes operations require the same time as reads. The FM18L08 supports both /CE- and /WE-controlled write cycles. In all cases, the address is latched on the falling edge of /CE.
In a /CE-controlled write, the /WE signal is asserted prior to beginning the memory cycle. That is, /WE is low when /CE falls. In this case, the device begins the memory cycle as a write. The FM18L08 will not drive the data bus regardless of the state of /OE.
In a /WE-controlled write, the memory cycle begins on the falling edge of /CE. The /WE signal falls after the falling edge of /CE. Therefore, the memory cycle begins as a read. The data bus will be driven according to the state of /OE until /WE falls. The timing of both /CE- and /WE-controlled write cycles is shown in the electrical specifications.
Write access to the array begins asynchronously after the memory cycle is initiated. The write access terminates on the rising edge of /WE or /CE, whichever is first. Data set-up time, as shown in the electrical specifications, indicates the in terval during which data cannot change prior to the end of the write access.
Unlike other truly nonvolatile memory technologies, there is no write delay with FRAM. Since the read and write access times of the underlying memory are the same, the user experiences no delay through the bus. The entire memory operation occurs in a single bus cycle. Therefore, any operation including read or write can occur immediately following a write. Data polling, a technique used with EEPROMs to determine if a write is complete, is unnecessary.
Pre-charge Operation
The pre-charge operation is an internal condition where the state of the memory is prepared for a new
Ramtron FM18L08
access. All memory cycles consist of a memory access and a pre-charge. The pre-charge is user initiated by taking the /CE signal high or inactive. It must remain high for at least the minimum pre -charge timing specification.
The user dictates the beginning of this operation since a pre-charge will not begin until /CE rises. However, the device has a maximum /CE low time specification that must be satisfied.
Applications
As a true nonvolatile RAM, the FM18L08 fits into many diverse applications. Clearly, its monolithic nature and high performance make it superior to battery -backed SRAM in most every application. Unlimited endurance allows the FM18L08 to be used in applications that could not take advantage of the previous generation of RAM products. This applications guide is intended to facilitate the transition from BBSRAM to FRAM. It is divided into two parts. First is a treatment of the advantages of FRAM memory compared with battery-backed SRAM. Second is a design guide, which highlights the simple design considerations that should be reviewed in both retrofit and new design situations.
FRAM Advantages
Although battery-backed SRAM is a mature and established solution, it has numerous weaknesses. These stem directly or indirectly from the presence of the battery. FRAM uses an inherently nonvolatile storage mechanism that requires no battery. It therefore eliminates these weaknesses. The major considerations in upgrading to FRAM are as follows.
Construction Issues
1. Cost The cost of both the component and the manufacturing overhead of battery -backed SRAM is high. FRAM with its monolithic construction is inherently a lower cost solution. In addition, there is no ‘built-in’ rework step required for battery attachment when using surface mount parts. Therefore assembly is streamlined and more cost effective. In the case of DIP battery -backed modules, the user is constrained to through-hole assembly techniques and a board wash using no water.
2. Humidity A typical battery-backed SRAM module is qualified at 60º C, 90% Rh, no bias, and no pressure. This is because the multi-component assemblies are vulnerable to moisture, not to mention dirt. FRAM is
qualified using HAST – highly accelerated stress test. This requires 120º C at 85% Rh, 24.4 psia at VDD.
3. System reliability Data integrity must be in question when using a battery -backed SRAM. They are inherently vulnerable to shock and vibration. If the battery contact comes loose, data will be lost. In addition a negative voltage, even a momentary undershoot, on any pin of a battery-backed SRAM can cause data loss. The negative voltage causes current to be drawn directly from the battery. These momentary short circuits can greatly weaken a battery and reduce its capacity over time. In general, there is no way to monitor the lost battery capacity. Should an undershoot occur in a battery backed system during a power down, data can be lost immediately.
4. Space Certain disadvantages of battery-backed SRAM, such as susceptibility to shock, can be reduced by using the old fashioned DIP module. However, this alternative takes up board space, height, and dictates through-hole assembly. FRAM offers a true surface­mount solution that uses 25% of the board space.
No multi-piece assemblies, no connectors, and no modules. A real nonvolatile RAM is finally available!
Direct Battery Issues
5. Field maintenance Batteries, no matter how mature, are a built-in maintenance problem. They eventually must be replaced. Despite long life projections, it is impossible to know if any individual battery will last considering all of the factors that can degrade them.
6. Environmental Lithium batteries are widely regarded as an environmental problem. They are a potential fire hazard and proper disposal can be a burden. In addition, shipping of lithium batteries may be restricted.
7. Style! Backing up an SRAM with a battery is an old­fashioned approach. In many cases, such modules are the only through-hole component in sight. FRAM is the latest memory technology and it is changing the way systems are designed.
23 March 2001 4/11
Loading...
+ 7 hidden pages