Rainbow Electronics АDC0805 User Manual

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805 8-Bit mP Compatible A/D Converters
December 1994
ADC0801/ADC0802/ADC0803/ADC0804/ADC0805
8-Bit mP Compatible A/D Converters
General Description
The ADC0801, ADC0802, ADC0803, ADC0804 and ADC0805 are CMOS 8-bit successive approximation A/D converters that use a differential potentiometric ladderÐ similar to the 256R products. These converters are de­signed to allow operation with the NSC800 and INS8080A derivative control bus with TRI-STATE
output latches di-
É
rectly driving the data bus. These A/Ds appear like memory locations or I/O ports to the microprocessor and no inter­facing logic is needed.
Differential analog voltage inputs allow increasing the com­mon-mode rejection and offsetting the analog zero input voltage value. In addition, the voltage reference input can be adjusted to allow encoding any smaller analog voltage span to the full 8 bits of resolution.
Features
Y
Compatible with 8080 mP derivativesÐno interfacing logic needed - access time - 135 ns
Y
Easy interface to all microprocessors, or operates ‘‘stand alone’’
Typical Applications
Y
Differential analog voltage inputs
Y
Logic inputs and outputs meet both MOS and TTL volt­age level specifications
Y
Works with 2.5V (LM336) voltage reference
Y
On-chip clock generator
Y
0V to 5V analog input voltage range with single 5V supply
Y
No zero adjust required
Y
0.3×standard width 20-pin DIP package
Y
20-pin molded chip carrier or small outline package
Y
Operates ratiometrically or with 5 VDC, 2.5 VDC, or ana­log span adjusted voltage reference
Key Specifications
Y
Resolution 8 bits
Y
Total error
Y
Conversion time 100 ms
g
(/4 LSB,g(/2 LSB andg1 LSB
TL/H/5671– 1
8080 Interface
Error Specification (Includes Full-Scale,
Zero Error, and Non-Linearity)
Part
Number
Full-
Scale
Adjusted
V
/2e2.500 VDCV
REF
(No Adjustments) (No Adjustments)
/2eNo Connection
REF
ADC0801g(/4 LSB
ADC0802
g
(/2 LSB
ADC0803g(/2 LSB
ADC0804
TL/H/5671– 31
TRI-STATEÉis a registered trademark of National Semiconductor Corp. Z-80
is a registered trademark of Zilog Corp.
É
C
1995 National Semiconductor Corporation RRD-B30M115/Printed in U. S. A.
TL/H/5671
ADC0805
g
1 LSB
g
1 LSB
Absolute Maximum Ratings (Notes1&2)
If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications.
Supply Voltage (V Voltage
Logic Control Inputs At Other Input and Outputs
Lead Temp. (Soldering, 10 seconds)
) (Note 3) 6.5V
CC
b
0.3V toa18V
b
0.3V to (V
CC
a
0.3V)
Dual-In-Line Package (plastic) 260 Dual-In-Line Package (ceramic) 300
Surface Mount Package
Vapor Phase (60 seconds) 215 Infrared (15 seconds) 220
Storage Temperature Range
Package Dissipation at T
e
25§C 875 mW
A
ESD Susceptibility (Note 10) 800V
Operating Ratings (Notes1&2)
Temperature Range T
ADC0801/02LJ, ADC0802LJ/883b55§CsT
C
§
C
§
C
§
C
§
ADC0801/02/03/04LCJ ADC0801/02/03/05LCN ADC0804LCN 0 ADC0802/03/04LCV 0 ADC0802/03/04LCWM 0
Range of V
CC
b
65§Ctoa150§C
s
T
MIN
s
A
b
40§CsT
b
A
40§CsT
A
CsT
§
A
CsT
§
A
CsT
§
A
4.5 VDCto 6.3 V
A
s s s s s
s
a
a a a a a
T
MAX
125§C
85§C 85§C 70§C 70§C 70§C
DC
Electrical Characteristics
s
The following specifications apply for V
CC
e
5VDC,T
MIN
s
T
T
A
MAX
and f
e
640 kHz unless otherwise specified.
CLK
Parameter Conditions Min Typ Max Units
ADC0801: Total Adjusted Error (Note 8) With Full-Scale Adj.
ADC0802: Total Unadjusted Error (Note 8) V
ADC0803: Total Adjusted Error (Note 8) With Full-Scale Adj.
ADC0804: Total Unadjusted Error (Note 8) V
ADC0805: Total Unadjusted Error (Note 8) V
V
/2 Input Resistance (Pin 9) ADC0801/02/03/05 2.5 8.0 kX
REF
(See Section 2.5.2)
/2e2.500 V
REF
DC
(See Section 2.5.2)
/2e2.500 V
REF
/2-No Connection
REF
DC
ADC0804 (Note 9) 0.75 1.1 kX
Analog Input Voltage Range (Note 4) V(a)orV(b) Gnd–0.05 V
DC Common-Mode Error Over Analog Input Voltage
Power Supply Sensitivity V
Range
e
g
5V
DC
10% Over
CC
Allowed VIN(a) and VIN(b) Voltage Range (Note 4)
g
(/16
g
(/16
g
(/4 LSB
g
(/2 LSB
g
(/2 LSB
g
1 LSB
g
1 LSB
a
0.05 V
CC
g
(/8 LSB
g
(/8 LSB
DC
AC Electrical Characteristics
The following specifications apply for V
e
5VDCand T
CC
Symbol Parameter Conditions Min Typ Max Units
T
C
T
C
f
CLK
CR Conversion Rate in Free-Running INTR tied to WR with 8770 9708 conv/s
t
W(WR)L
t
ACC
t1H,t
tWI,t
C
IN
C
OUT
Conversion Time f
Conversion Time (Note 5, 6) 66 73 1/f
Clock Frequency V Clock Duty Cycle (Note 5) 40 60 %
Mode CS
Width of WR Input (Start Pulse Width) CSe0VDC(Note 7) 100 ns
Access Time (Delay from Falling C Edge of RD
TRI-STATE Control (Delay C
0H
from Rising Edge of RD Hi-Z State) Circuits)
Delay from Falling Edge 300 450 ns
RI
of WR or RD to Reset of INTR
Input Capacitance of Logic 5 7.5 pF Control Inputs
TRI-STATE Output 5 7.5 pF Capacitance (Data Buffers)
to Output Data Valid)
to (See TRI-STATE Test
CONTROL INPUTS[Note: CLK IN (Pin 4) is the input of a Schmitt trigger circuit and is therefore specified separately
VIN(1) Logical ‘‘1’’ Input Voltage V
(Except Pin 4 CLK IN)
e
25§C unless otherwise specified.
A
e
640 kHz (Note 6) 103 114 ms
CLK
e
5V, (Note 5) 100 640 1460 kHz
CC
e
0VDC,f
e
100 pF 135 200 ns
L
e
10 pF, R
L
e
5.25 V
CC
e
640 kHz
CLK
e
10k 125 200 ns
L
DC
2.0 15 V
CLK
]
DC
2
AC Electrical Characteristics (Continued)
s
5V
DC
DC
DC
DC
DC
s
T
T
A
, unless otherwise specified.
MAX
0.005 1 mA
b
e
4.75 V
CC
CC
CC
CC
e
e
e
4.75 V
4.75 V
4.75 V
DC
DC
2.4 V
DC
4.5 V
DC
b
e
25§C 4.5 6 mA
A
e
25§C 9.0 16 mA
A
e
25§C
A
supply. Be careful, during testing at low VCClevels (4.5V),
CC
does not exceed the supply voltage by more than 50 mV, the output
IN
pulse (see timing diagrams).
b
1
0.005 mA
3 mA
]
0.8 V
0.4 V
0.4 V
3 mA
Figure 5
.
DC
DC
DC
DC
DC
DC
DC
DC
DC
DC
DC
DC
DC
DC
DC
DC
e
The following specifications apply for V
CC
5VDCand T
MIN
Symbol Parameter Conditions Min Typ Max Units
CONTROL INPUTS[Note: CLK IN (Pin 4) is the input of a Schmitt trigger circuit and is therefore specified separately
VIN(0) Logical ‘‘0’’ Input Voltage V
(Except Pin 4 CLK IN)
IIN(1) Logical ‘‘1’’ Input Current V
(All Inputs)
IIN(0) Logical ‘‘0’’ Input Current V
(All Inputs)
CC
IN
IN
e
e
e
4.75 V
5V
0V
DC
DC
CLOCK IN AND CLOCK R
a
V
T
b
V
T
V
H
V
OUT
V
OUT
CLK IN (Pin 4) Positive Going 2.7 3.1 3.5 V Threshold Voltage
CLK IN (Pin 4) Negative 1.5 1.8 2.1 V Going Threshold Voltage
CLK IN (Pin 4) Hysteresis 0.6 1.3 2.0 V
a)b
(V
T
(0) Logical ‘‘0’’ CLK R Output I
Voltage V
(1) Logical ‘‘1’’ CLK R Output I
Voltage V
b
(V
)
T
e
360 mA 0.4 V
O
e
4.75 V
CC
eb
360 mA 2.4 V
O
e
4.75 V
CC
DATA OUTPUTS AND INTR
V
(0) Logical ‘‘0’’ Output Voltage
OUT
Data Outputs I INTR Output I
V
(1) Logical ‘‘1’’ Output Voltage I
OUT
V
(1) Logical ‘‘1’’ Output Voltage I
OUT
I
OUT
I
SOURCE
I
SINK
TRI-STATE Disabled Output V Leakage (All Data Buffers) V
e
OUT
e
OUT
eb
360 mA, V
O
eb
O
e
OUT
e
OUT
V
Short to Gnd, T
OUT
V
Short to VCC,T
OUT
1.6 mA, V
1.0 mA, V
10 mA, V
0V 5V
POWER SUPPLY
I
CC
Supply Current (Includes f Ladder Current) V
e
CLK
REF
and CS
640 kHz,
/2eNC, T
e
ADC0801/02/03/04LCJ/05 1.1 1.8 mA ADC0804LCN/LCV/LCWM 1.9 2.5 mA
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating the device beyond its specified operating conditions.
Note 2: All voltages are measured with respect to Gnd, unless otherwise specified. The separate A Gnd point should always be wired to the D Gnd.
Note 3: A zener diode exists, internally, from V
Note 4: For V
conduct for analog input voltages one diode drop below ground or one diode drop greater than the V as high level analog inputs (5V) can cause this input diode to conduct – especially at elevated temperatures, and cause errors for analog inputs near full-scale. The spec allows 50 mV forward bias of either diode. This means that as long as the analog V code will be correct. To achieve an absolute 0 V variations, initial tolerance and loading.
Note 5: Accuracy is guaranteed at f extended so long as the minimum clock high time interval or minimum clock low time interval is no less than 275 ns.
Note 6: With an asynchronous start pulse, up to 8 clock periods may be required before the internal clock phases are proper to start the conversion process. The start request is internally latched, see
Note 7: The CS the converter in a reset mode and the start of conversion is initiated by the low to high transition of the WR
Note 8: None of these A/Ds requires a zero adjust (see section 2.5.1). To obtain zero code at other analog input voltages see section 2.5 and
Note 9: The V
ADC0805, and in the ADC0804LCJ, each resistor is typically 16 kX. In all versions of the ADC0804 except the ADC0804LCJ, each resistor is typically 2.2 kX.
Note 10: Human body model, 100 pF discharged through a 1.5 kX resistor.
(b)tVIN(a) the digital output code will be 0000 0000. Two on-chip diodes are tied to each analog input (see block diagram) which will forward
IN
CLK
input is assumed to bracket the WR strobe input and therefore timing is dependent on the WR pulse width. An arbitrarily wide pulse width will hold
/2 pin is the center point of a two-resistor divider connected from VCCto ground. In all versions of the ADC0801, ADC0802, ADC0803, and
REF
Figure 2
to Gnd and has a typical breakdown voltage of 7 VDC.
CC
to5VDCinput voltage range will therefore require a minimum supply voltage of 4.950 VDCover temperature
DC
e
640 kHz. At higher clock frequencies accuracy can degrade. For lower clock frequencies, the duty cycle limits can be
and section 2.0.
3
Typical Performance Characteristics
Delay From Falling Edge of Logic Input Threshold Voltage vs. Supply Voltage
RD
to Output Data Valid
vs. Load Capacitance
CLK IN Schmitt Trip Levels vs. Supply Voltage
f
vs. Clock Capacitor
CLK
Output Current vs Temperature
Full-Scale Error vs
Conversion Time
Power Supply Current
vs Temperature (Note 9)
Effect of Unadjusted Offset Error vs. V
/2 Voltage
REF
Linearity Error at Low
/2 Voltages
V
REF
TL/H/5671– 2
4
TRI-STATE Test Circuits and Waveforms
t
1H
e
t
20 ns
r
t1H,C
e
10 pF
L
t
Timing Diagrams (All timing is measured from the 50% voltage points)
e
t0H,C
0H
e
t
20 ns
r
L
10 pF
TL/H/5671– 3
Output Enable and Reset INTR
Note: Read strobe must occur 8 clock periods (8/f
) after assertion of interrupt to guarantee reset of INTR.
CLK
5
TL/H/5671– 4
Typical Applications (Continued)
6800 Interface Ratiometric with Full-Scale Adjust
Absolute with a 2.500V Reference
*For low power, see also LM385-2.5
Zero-Shift and Span Adjust: 2V
Note: before using caps at VINor V
see section 2.3.2 Input Bypass Capacitors.
Absolute with a 5V Reference
s
s
V
5V Span Adjust: 0VsV
IN
REF
/2,
s
3V
IN
TL/H/5671– 5
6
Typical Applications (Continued)
Directly Converting a Low-Level Signal
1 mV Resolution with mP Controlled Range
V
/2e128 mV
REF
e
1 LSB
1mV
s
s
V
DAC
a
V
(V
DAC
256 mV)
IN
V
REF
/2e256 mV
A mP Interfaced Comparator
For: VIN(a)lVIN(b)
e
Output
FF
Output
HEX
e
00
HEX
For: VIN(a)kVIN(b)
Digitizing a Current Flow
7
TL/H/5671– 6
Typical Applications (Continued)
Self-Clocking Multiple A/Ds
External Clocking
*Use a large R value
to reduce loading at CLK R output.
Self-Clocking in Free-Running Mode
*After power-up, a momentary grounding
input is needed to guarantee operation.
of the WR
Operating with ‘‘Automotive’’ Ratiometric Transducers
CLK
s
1460 kHz
100 kHzsf
mP Interface for Free-Running A/D
Ratiometric with V
/2 Forced
REF
*VIN(b)e0.15 V
15% of V
s
CC
CC
s
V
85% of V
XDR
CC
TL/H/5671– 7
8
Typical Applications (Continued)
mP Compatible Differential-Input Comparator with Pre-Set V
*See
Figure 5
to select R value
e
DB7
‘‘1’’ for VIN(a)lVIN(b)a(V
Omit circuitry within the dotted area if
hysteresis is not needed
Handlingg10V Analog Inputs
/2)
REF
Low-Cost, mP Interfaced, Temperature-to-Digital Converter
(with or without Hysteresis)
OS
*Beckman InstrumentsÝ694-3-R10K resistor array
mP Interfaced Temperature-to-Digital Converter
s
*Circuit values shown are for 0§CsT
**Can calibrate each sensor to allow easy replacement, then
A/D can be calibrated with a pre-set input voltage.
a
128§C
A
TL/H/5671– 8
9
Typical Applications (Continued)
Handling
g
5V Analog Inputs
Read-Only Interface
*Beckman InstrumentsÝ694-3-R10K resistor array
TL/H/5671– 33
mP Interfaced Comparator with Hysteresis
TL/H/5671– 35
Analog Self-Test for a System
TL/H/5671– 34
Protecting the Input
Diodes are 1N914
TL/H/5671– 9
A Low-Cost, 3-Decade Logarithmic Converter
TL/H/5671– 36
*LM389 transistors
e
A, B, C, D
10
TL/H/5671– 37
LM324A quad op amp
Typical Applications (Continued)
3-Decade Logarithmic A/D Converter
Noise Filtering the Analog Input
e
f
20 Hz
C
Uses Chebyshev implementation for steeper roll-off unity-gain, 2nd order, low-pass filter Adding a separate filter for each channel increases system response time if an analog multiplexer is used
Output Buffers with A/D Data Enabled
Multiplexing Differential Inputs
Increasing Bus Drive and/or Reducing Time on Bus
*A/D output data is updated 1 CLK period prior to assertion of INTR
TL/H/5671– 10
*Allows output data to set-up at falling edge of CS
11
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