W982516CH is a high-speed synchronous dynamic random access memory (SDRAM), organized as
4M words × 4 banks × 16 bits. Using pipelined architecture and 0.13 µm process technology,
W982516CH delivers a data bandwidth of up to 166M words per second (-6). To fully comply with the
personal computer industrial standard, W982516CH is sorted into two speed grades: -6, -7 and -75.
The -6 is compliant to the 166 MHz/CL3 specification, the -7 is compliant to the 143 MHz/CL3 or
PC133/CL2 specification, the -75 is compliant to the PC133/CL3 specification, for handheld device
application, we also provide a low power option, the 75L grade, with Self Refresh Current under 1mA.,
and an industrial temperature option, the grade of 75I, which is guranteed to support -40° C – 85°C.
Accesses to the SDRAM are burst oriented. Consecutive memory location in one page can be
accessed at a burst length of 1, 2, 4, 8 or full page when a bank and row is selected by an ACTIVE
command. Column addresses are automatically generated by the SDRAM internal counter in burst
operation. Random column read is also possible by providing its address at each clock cycle. The
multiple bank nature enables interleaving among internal banks to hide the precharging time.
By having a programmable Mode Register, the system can change burst length, latency cycle,
interleave or sequential burst to maximize its performance. W982516CH is ideal for main memory in
high performance applications.
FEATURES
• 3.3V ± 0.3V Power Supply
• Up to 166 MHz Clock Frequency
• 4,194,304 Words × 4 Banks × 16 Bits Organization
• Self Refresh Mode: Standard and Low Power
• CAS Latency: 2 and 3
• Burst Length: 1, 2, 4, 8, and Full Page
• Burst Read, Single Writes Mode
• Byte Data Controlled by LDQM, UDQM
• Power-down Mode
• Auto-precharge and Controlled Precharge
• 8K Refresh Cycles/64 mS
• Interface: LVTTL
• Packaged in TSOP II 54 -pin, 400 mil - 0.80
AVAILABLE PART NUMBER
Part Number Speed Grade Self Refresh Current (Max) Operating Temperature
Note: These parameters are periodically sampled and not 100% tested.
Publication Release Date: Mar 2003
- 5 - Revision A1
CI- 3.8 pf
W982516CH
AC CHARACTERISTICS A ND OPERATING CONDITION
(Vcc = 3.3V ± 0.3V, Ta = 0 to 70°C for –6/-7/-75/75L, Ta=-40 to 85°C for 75I ; Notes: 5, 6, 7, 8)
PARAMETER SYM.
MIN. MAX. MIN. MAX.
Ref/Active to Ref/Active Command Period
Active to precharge Command Period
Active to Read/Write Command Delay Time
Read/Write(a) to Read/Write(b) Command
Period
Precharge to Active Command Period
Active(a) to Active(b) Command Period
Write Recovery Time CL* = 2
CL* = 3
CLK Cycle Time CL* = 2
CL* = 3 7 1000 7.5 1000 nS
CLK High Level Width
CLK Low Level Width
Access Time from CLK CL* = 2
Output Data Hold Time
Output Data High Impedance Time
Output Data Low Impedance Time
Power Down Mode Entry Time
Transition Time of CLK
(Rise and Fall)
Data-in Set-up Time
Data-in Hold Time
Address Set-up Time
Address Hold Time
CKE Set -up Time
CKE Hold Time
Command Set -up Time
Command Hold Time
Refresh Time
Mode register Set Cycle Time
*CL = CAS Latency
CL* = 3 5.4 5.4 nS
tRC
t
RAS
t
RCD
t
CCD
tRP
t
RRD
tWR
tCK
tCH 2.5 2.5
tCL 2.5 2.5
tAC
tOH
tHZ
tLZ
tSB
tT
tDS
tDH
tAS
tAH
t
CKS
t
CKH
t
CMS
t
CMS
t
REF
t
RSC
-7
(PC133, CL2)
56 65 nS
40 100000
15 20 nS
1 1 tCK
15 20 nS
15 15 nS
2 2 tCK
2 2 tCK
7.5 1000 10 1000 nS
5.4 6 nS
3 3 nS
3 7 3 7.5 nS
0 0 nS
0 7 0 7.5 nS
0.5 10 0.5 10 nS
1.5 1.5 nS
0.8 0.8 nS
1.5 1.5 nS
0.8 0.8 nS
1.5 1.5 nS
0.8 0.8 nS
1.5 1.5 nS
0.8 0.8 nS
64 64 mS
14 15 nS
-75/75L/75I
(PC133, CL3)
45 100000
UNIT
nS
nS
nS
- 6 -
PARAMETER SYM. -6
MIN. MAX.
Ref/Active to Ref/Active Command Period
Active to precharge Command Period
Active to Read/Write Command Delay Time
Read/Write(a) to Read/Write(b) Command
Period
Precharge to Active Command Period
Active(a) to Active(b) Command Period
Write Recovery Time CL* = 2
CL* = 3
CLK Cycle Time CL* = 2
CL* = 3 6 1000 nS
CLK High Level Width
CLK Low Level Width t
Access Time from CLK CL* = 2
Output Data Hold Time
Output Data High Impedance Time
Output Data Low Impedance Time
Power Down Mode Entry Time
Transition Time of CLK
(Rise and Fall)
Data-in Set-up Time
Data-in Hold Time
Address Set-up Time
Address Hold Time
CKE Set -up Time
CKE Hold Time
Command Set -up Time
Command Hold Time
Refresh Time
Mode register Set Cycle Time
CL* = 3 5.4 nS
tRC
t
RAS
t
RCD
t
CCD
tRP
t
RRD
tWR
tCK
tCH 2.5
2.5 nS
CL
tAC
tOH
tHZ
tLZ
tSB
tT
tDS
tDH
tAS
tAH
t
CKS
t
CKH
t
CMS
t
CMS
t
REF
t
RSC
60 nS
42 100000
18 nS
1 tCK
18 nS
12 nS
2 tCK
2 tCK
7.5 1000 nS
5.4 nS
3 nS
3 7 nS
0 nS
0 7 nS
0.5 10 nS
1.5 nS
0.8 nS
1.5 nS
0.8 nS
1.5 nS
0.8 nS
1.5 nS
0.8 nS
64 mS
12 nS
W982516CH
UNIT
nS
nS
Publication Release Date: Mar 2003
- 7 - Revision A1
DC CHARACTERISTICS
(VCC = 3.3V ± 0.3V, Ta = 0 to 70°C for –6/-7/-75/75L, Ta=-40 to 85°C for 75I)
PARAMETER SYM.
Operating Current
t
= min., tRC = min.
CK
Active precharge command
cycling without burst
operation
Standby Current
t
= min, CS = VIH
CK
VIH/L = VIH (min.)/VIL (max.)
Bank: Inactive state
Standby Current
CLK = VIL, CS= VIH
VIH/L = VIH (min.)/VIL (max.)
BANK: Inactive state
No Operating Current
t
= min., CS = VIH (min.)
CK
BANK: Active state
(4 banks)
Burst Operating Current
t
= min.
CK
Read/ Write command cycling
Auto Refresh Current
t
= min.
CK
Auto refresh command cycling
Self Refresh Current
Self Refresh Mode
CKE = 0.2V
1 Bank Operation ICC1 90 80 75 3
CKE = VIHICC2 50 40 35 3
CKE = VIL(Power
down mode)
CKE = VIHICC2S 10 10 10
CKE = VIL(Power
down mode)
CKE = VIHICC3 70 60 55
CKE = VIL(Power
down mode)
Standard(-6/-7/-75) 3 3 3
Low Power(75L/75I)
ICC2P 2 2 2 3
ICC2PS2 2 2 mA
ICC3P 10 10 10
ICC4 110 100 95 3, 4
ICC5 180 170 160 3
ICC6L
-6
MAX. MAX.
- 1
-7
W982516CH
-75/75L/75I
UNIT
NOTES
PARAMETER SYMBOL
Input Leakage Current
(0V ≤ VIN≤ VCC, all other pins not under test = 0V)
Output Leakage Current
(Output disable, 0V ≤ VOUT≤ VCCQ)
LVTTL Output ″H″ Level Voltage
(IOUT = -2 mA )
LVTTL Output ″L″ Level Voltage
(IOUT = 2 mA )
II(L) -5 5
IO(L) -5 5
VOH 2.4 - V
VOL - 0.4 V
MIN. MAX. UNIT NOTES
µ A
µ A
- 8 -
W982516CH
Notes:
1. Operation exceeds "ABSOLUTE MAXIMUM RATING" may cause permanent damage to the
devices.
2. All voltages are referenced to VSS
3. These parameters depend on the cycle rate and listed values are measured at a cycle rate with the
minimum values of tCK and tRC.
4. These parameters depend on the output loading conditions. Specified values are obtained with
output open.
5. Power up sequence is further described in the "Functional Description" section.
6. AC Testing Conditions
Output Reference Level 1.4V/1.4V
Output Load See diagram below
Input Signal Levels 2.4V/0.4V
Transition Time (Rise and Fall) of Input Signal 2 nS
Input Reference Level 1.4V
1.4 V
50 ohms
Z = 50 ohmsoutput
AC TEST LOAD
7. Transition times are measured between VIH and V IL.
8. tHZ defines the time at which the outputs achieve the open circuit condition and is not referenced to
output level.
50pF
Publication Release Date: Mar 2003
- 9 - Revision A1
W982516CH
CS
WE
OPERATION MODE
Fully synchronous operations are performed to latch the commands at the positive edges of CLK.
Table 1 shows the truth table for the operation commands.
Table 1 Truth Table (Note (1) , (2))
COMMAND DEVICE
Bank Active Idle H x x v v v L L H H
Bank Precharge Any H x x v L x L L H L
Precharge All Any H x x x H x L L H L
Write Active (3) H x x v L v L H L L
Write with Autoprecharge Active (3) H x x v H v L H L L
Read Active (3) H x x v L v L H L H
Read with Autoprecharge Active (3) H x x v H v L H L H
Mode Register Set Idle H x x v v v L L L L
No- operation Any H x x x x x L H H H
Burst Stop Active (4) H x x x x x L H H L
Device Deselect Any H x x x x x H x x x
Auto-refresh Idle H H x x x x L L L H
Self-refresh Entry Idle H L x x x x L L L H
Self-refresh Exit Idle
Clock Suspend Mode
Entry
Power Down Mode Entry Idle
Clock Suspend Mode Exit Active L H x x x x x x x x
Power Down Mode Exit
Data Write/Output Enable Active H x L x x x x x x x
Data Write/Output Disable
STATE
(S.R.)
Active H L x x x x x x x x
Active (5)
Any
(Power
down)
Active H x H x x x x x x x
CKEN-1 CKEN DQM BS0, 1 A10
L
L
H
H
L
L
H
H
L
L
H
H
x
x
x
x
x
x
A0−A9
A11, A12
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
H
L
H
L
H
L
RAS CAS
x
H
x
H
x
H
x
H
x
H
x
H
x
x
x
x
x
x
Notes:
(1) v = valid x = Don't care L = Low Level H = High Level
(2) CKEn signal is input level when commands are provided.
CKEn -1 signal is the input level one clock cycle before the command is issued.
(3) These are state of bank designated by BS0, BS1 signals.
(4) Device state is full page burst operation.
(5) Power Down Mode can not be entered in the burst cycle.
When this command asserts in the burst cycle, device state is clock suspend mode.
- 10 -
W982516CH
FUNCTIONAL DESCRIPTION
Power Up and Initialization
The default power up state of the mode register is unspecified. The following power up and
initialization sequence need to be followed to guarantee the device being preconditioned to each user
specific needs.
During power up, all Vcc and VccQ pins must be ramp up simultaneously to the specified voltage
when the input signals are held in the "NOP" state. The power up voltage must not exceed Vcc +0.3V
on any of the input pins or Vcc supplies. After power up, an initial pause of 200 µS is required followed
by a precharge of all banks using the precharge command. To prevent data contention on the DQ bus
during power up, it is required that the DQM and CKE pins be held high during the initial pause period.
Once all banks have been precharged, the Mode Register Set Command must be issued to initialize
the Mode Register. An additional eight Auto Refresh cycles (CBR) are also required before or after
programming the Mode Register to ensure proper subsequent operation.
Programming Mode Register
After initial power up, the Mode Register Set Command must be issued for proper device operation.
All banks must be in a precharged state and CKE must be high at least one cycle before the Mode
Register Set Command can be issued. The Mode Register Set Command is activated by the low
signals of RAS, CAS, CS and WE at the positive edge of the clock. The address input data during this
cycle defines the parameters to be set as shown in the Mode Register Operation table. A new
command may be issued following the mode register set command once a delay equal to t
elapsed. Please refer to the next page for Mode Register Set Cycle and Operation Table.
RSC
has
Bank Activate Command
The Bank Activate command must be applied before any Read or Write operation can be executed.
The operation is similar to RAS activate in EDO DRAM. The delay from when the Bank Activate
command is applied to when the first read or write operation can begin must not be less than the RAS
to CAS delay time (t
Activate command can be issued to the same bank. The minimum time interval between successive
Bank Activate commands to the same bank is determined by the RAS cycle time of the device (tRC).
The minimum time interval between interleaved Bank Activate commands (Bank A to Bank B and vice
versa) is the Bank to Bank delay time (t
specified as t
RAS
(max).
). Once a bank has been activated it must be precharged before another Bank
RCD
). The maximum time that each bank can be held active is
RRD
Read and Write Access Modes
After a bank has been activated , a read or write cycle can be followed. This is accomplished by
setting RAS high and CAS low at the clock rising edge after minimum of t
level defines whether the access cycle is a read operation (WE high), or a write operation (WE low).
The address inputs determine the starting column address.
Reading or writing to a different row within an activated bank requires the bank be precharged and a
new Bank Activate command be issued. When more than one bank is activated, interleaved bank
Read or Write operations are possible. By using the programmed burst length and alternating the
access and precharge operations between multiple banks, seamless data access operation among
many different pages can be realized. Read or Write Commands can also be issued to the same bank
or between active banks on every clock cycle.
Publication Release Date: Mar 2003
- 11 - Revision A1
delay. WE pin voltage
RCD
W982516CH
Burst Read Command
The Burst Read command is initiated by applying logic low level to CS and CAS while holding RAS
and WE high at the rising edge of the clock. The address inputs determine the starting column
address for the burst. The Mode Register sets type of burst (sequential or interleave) and the burst
length (1, 2, 4, 8, full page) during the Mode Register Set Up cycle. Table 2 and 3 in the next page
explain the address sequence of interleave mode and sequential mode.
Burst Write Command
The Burst Write command is initiated by applying logic low level to CS, CAS and WE while holding
RAS high at the rising edge of the clock. The address inputs determine the starting column address.
Data for the first burst write cycle must be applied on the DQ pins on the same clock cycle that the
Write Command is issued. The remaining data inputs must be supplied on each subsequent rising
clock edge until the burst length is completed. Data supplied to the DQ pins after burst finishes will be
ignored.
Read Interrupted by a Read
A Burst Read may be interrupted by another Read Command. When the previous burst is interrupted,
the remaining addresses are overridden by the new read address with the full burst length. The data
from the first Read Command continues to appear on the outputs until the CAS latency from the
interrupting Read Command the is satisfied.
Read Interrupted by a Write
To interrupt a burst read with a Write Command, DQM may be needed to place the DQs (output
drivers) in a high impedance state to avoid data contention on the DQ bus. If a Read Command will
issue data on the first and second clocks cycles of the write operation, DQM is needed to insure the
DQs are tri-stated. After that point the Write Command will have control of the DQ bus and DQM
masking is no longer needed.
Write Interrupted by a Write
A burst write may be interrupted before completion of the burst by another Write Command. When the
previous burst is interrupted, the remaining addresses are overridden by the new address and data
will be written into the device until the programmed burst length is satisfied.
Write Interrupted by a Read
A Read Command will interrupt a burst write operation on the same clock cycle that the Read
Command is activated. The DQs must be in the high impedance state at least one cycle before the
new read data appears on the outputs to avoid data contention. When the Read Command is
activated, any residual data from the burst write cycle will be ignored.
Burst Stop Command
A Burst Stop Command may be used to terminate the existing burst operation but leave the bank open
for future Read or Write Commands to the same page of the active bank, if the burst length is full page.
Use of the Burst Stop Command during other burst length operations is illegal. The Burst Stop
Command is defined by having RAS and CAS high with CS and WE low at the rising edge of the clock.
The data DQs go to a high impedance state after a delay which is equal to the CAS Latency in a burst
read cycle interrupted by Burst Stop. If a Burst Stop Command is issued during a full page burst write
operation, then any residual data from the burst write cycle will be ignored.
- 12 -
W982516CH
Addressing Sequence of Sequential Mode
A column access is performed by increasing the address from the column address which is input to
the device. The disturb address is varied by the Burst Length as shown in Table 2.
Table 2 Address Sequence of Sequential Mode
DATA ACCESS ADDRESS
Data 0 n BL = 2 (disturb address is A0)
Data 1 n + 1 No address carry from A0 to A1
Data 2 n + 2 BL = 4 (disturb addresses are A0 and A1)
Data 3 n + 3 No address carry from A1 to A2
Data 4 n + 4
Data 5 n + 5 BL = 8 (disturb addresses are A0, A1 and A2)
Data 6 n + 6 No address carry from A2 to A3
Data 7 n + 7
BURST LENGTH
Addressing Sequence of Interleave Mode
A column access is started in the input column address and is performed by inverting the address bit
in the sequence shown in Table 3.
If A10 is set to high when the Read or Write Command is issued, then the auto-precharge function is
entered. During auto-precharge, a Read Command will execut e as normal with the exception that the
active bank will begin to precharge automatically before all burst read cycles have been completed.
Regardless of burst length, it will begin a certain number of clocks prior to the end of the scheduled
burst cycle. The number of clocks is determined by CAS latency.
A Read or Write Command with auto-precharge can not be interrupted before the entire burst
operation is completed. Therefore, use of a Read, Write, or Precharge Command is prohibited during
a read or write cycle with auto-precharge. Once the precharge operation has started, the bank cannot
be reactivated until the Precharge time (tRP) has been satisfied. Issue of Auto-pecharge command is
illegal if the burst is set to full page length. If A10 is high when a Write Command is issued, the Write
with Auto-pecharge function is initiated. The SDRAM automatically enters the precharge operation two
clock delay from the last burst write cycle. This delay is referred to as Write tWR. The bank undergoing
auto-precharge can not be reactivated until tWR and tRP are satisfied. This is referred to as t
to Active delay (t
Bank Activate Command and the beginning of the internal precharge operation must satisfy t
= tWR + tRP). When using the Auto-precharge Command, the interval between the
DAL
Precharge Command
The Precharge Command is used to precharge or close a bank that has been activated. The
Precharge Command is entered when CS, RAS and WE are low and CAS is high at the rising edge of
the clock. The Precharge Command can be used to precharge each bank separately or all banks
simultaneously. Three address bits, A10, BS0, and BS1, are used to define which bank(s) is to be
precharged when the command is issued. After the Precharge Command is issued, the precharged
bank must be reactivated before a new read or write access can be executed. The delay between the
Precharge Command and the Activate Command must be greater than or equal to the Precharge time
(tRP).
, Data-in
DAL
RAS
(min).
Self Refresh Command
The Self Refresh Command is defined by having CS, RAS, CAS and CKE held low with WE high at
the rising edge of the clock. All banks must be idle prior to issuing the Self Refresh Command. Once
the command is registered, CKE must be held low to keep the device in Self Refresh mode. When the
SDRAM has entered Self Refresh mode all of the external control signals, except CKE, are disabled.
The clock is internally disabled during Self Refresh Operation to save power. The device will exit Self
Refresh operation after CKE is returned high. A minimum delay time is required when the device exits
Self Refresh Operation and before the next command can be issued. This delay is equal to the tAC
cycle time plus the Self Refresh exit time.
If, during normal operation, AUTO REFRESH cycles are issued in bursts (as opposed to being evenly
distributed), a burst of 8,192 AUTO REFRESH cycles should be completed just prior to entering and
just after exiting the self refresh mode.
Power Down Mode
The Power Down mode is initiated by holding CKE low. All of the receiver circuits except CKE are
gated off to reduce the power. The Power Down mode does not perform any refresh operations,
therefore the device can not remain in Power Down mode longer than the Refresh period (t
device.
- 14 -
REF
) of the
W982516CH
The Power Down mode is exited by bringing CKE high. When CKE goes high, a No Operation
Command is required on the next rising clock edge, depending on tCK. The input buffers need to be
enabled with CKE held high for a period equal to t
No Operation Command
The No Operation Command should be used in cases when the SDRAM is in a idle or a wait state to
prevent the SDRAM from registering any unwanted commands between operations. A No Operation
Command is registered when CS is low with RAS, CAS, and WE held high at the rising edge of the
clock. A No Operation Command will not terminate a previous operation that is still executing, such as
a burst read or write cycle.
Deselect Command
The Deselect Command performs the same function as a No Operation Command. Deselect
Command occurs when CS is brought high, the RAS, CAS, and WE signals become don't cares.
Clock Suspend Mode
During normal access mode, CKE must be held high enabling the clock. When CKE is registered low
while at least one of the banks is ac tive, Clock Suspend Mode is entered. The Clock Suspend mode
deactivates the internal clock and suspends any clocked operation that was currently being executed.
There is a one clock delay between the registration of CKE low and the time at which the SDRAM
operation suspends. While in Clock Suspend mode, the SDRAM ignores any new commands that are
issued. The Clock Suspend mode is exited by bringing CKE high. There is a one clock cycle delay
from when CKE returns high to when Clock Suspend mode is exited.
Note: The PowerDown Mode is entered by asserting CKE "low".
All Input/Output buffers (except CKE buffers) are turned off in the PowerDown mode.
When CKE goes high, command input must be No operation at next CLK rising edge.
Publication Release Date: Mar 2003
- 33 - Revision A1
Operating Timing Example, continued
Autoprecharge Timing (Read Cycle)
W982516CH
(1) CAS
Latency=2
( a ) burst length = 1
Command
( b ) burst length = 2
( d ) burst length = 8
( a ) burst length = 1
( b ) burst length = 2
( c ) burst length = 4
( d ) burst length = 8
DQ
Command
DQ
( c ) burst length = 4
Command
DQ
Command
DQ
(2) CAS
Latency=3
Command
DQ
Command
DQ
Command
DQ
Command
DQ
01110987654321
Read AP
Act
t
RP
Q0
ReadAPAct
ReadAPAct
Q0
Q0
t
RP
Q1
Q1Q2
t
Q3
RP
APActRead
t
RP
Q0Q1Q2Q3Q4Q5Q6Q7
Read APAct
t
RP
Q0
ReadAPAct
ReadAPAct
ReadAPAct
t
RP
Q0
Q1
Q0
Q1Q2Q3
t
RP
t
RP
Q0Q1Q2Q3Q4Q5Q6Q7
Note )
Read
AP
Act
represents the Read with Auto precharge command.
represents the start of internal precharging.
represents the Bank Activate command.
When the Auto precharge command is asserted, the period from Bank Activate command to
the start of internal precgarging must be at least t
RAS
(min).
- 34 -
Operating Timing Example, continued
Autoprecharge Timing (Write Cycle)
W982516CH
(1) CAS Latency = 2
(a) burst length = 1
Command
DQ
(b) burst length = 2
Command
DQ
(c) burst length = 4
Command
DQ
(d) burst length = 8
Command
DQ
(2) CAS Latency = 3
(a) burst length = 1
Command
DQ
(b) burst length = 2
Command
DQ
(c) burst length = 4
Command
(d) burst length = 8
Command
DQ
DQ
0132
Write
Write
D0
D0
Write
D0
Write
D0
Write
D0
Write
D0
Write
D0
Write
D0
tWR
D1
D1
D1
tWR
D1
D1
D1
4576891110
ActAP
tRP
ActAP
tWR
D2D3
D2D3D4D5D6D7
tWR
D2D3
D2D3D4D5D6D7
tRP
ActAP
tWR
tRP
tRP
tWR
tRP
ActAP
ActAP
tRP
12
ActAP
AP
tRP
Act
tRP
Act
tWR
ActAP
tWR
Publication Release Date: Mar 2003
- 35 - Revision A1
Operating Timing Example, continued
Timing Chart of Read to Write Cycle
In the case of Burst Length = 4
W982516CH
DQM
DQM
DQM
DQM
0
Read Write
DQ
D0D1D2D3
ReadWrite
DQ
Read
Write
DQ
DQ
D0D1D2D3
Read
Note: The Output data must be masked by DQM to avoid I/O conflict
Write
(1) CAS Latency=2
( a ) Command
( b ) Command
(2) CAS Latency=3
( a ) Command
( b ) Command
Timing Chart of Write to Read Cycle
In the case of Burst Length=4
DQM
DQM
DQM
DQM
0
ReadWrite
DQ
D0
ReadWrite
DQ
DQ
DQ
D0D1
Write
Write
D0D1
Read
Read
(1) CAS Latency=2
( a ) Command
( b ) Command
(2) CAS Latency=3
( a ) Command
( b ) Command
D0D1D2D3
D0D1D2D3
Q0Q1Q2Q3
Q0Q1Q2Q3
Q0Q1Q2Q3D0
Q0
Q1
1110987654321
1110987654321
Q2Q3
- 36 -
Timing Chart of Burst Stop Cycle (Burst Stop Command)
W982516CH
(1) Read cycle
( a ) CAS latency =2
( b )CAS latency = 3
(2) Write cycle
01110987654321
ReadBST
Command
DQ
Read
Command
DQ
Command
Write
DQ
Q0Q1Q2Q3Q4
Q0Q1Q2Q3
Q0Q1Q2Q3Q4
Note: represents the Burst stop commandBST
Q4
BST
BST
Timing Chart of Burst Stop Cycle (Precharge Command)
Publication Release Date: Mar 2003
- 37 - Revision A1
(1) Read cycle
W982516CH
01111098765432
(a) CAS latency =2
Command
(b) CAS latency =3
Command
(2) Write cycle
(a) CAS latency =2
Command
(b) CAS latency =3
Command
DQ
DQ
DQM
DQ
DQM
DQ
Q0Q1Q2Q3Q4
Q0Q1Q2Q3Q4
Write
Q0Q1Q2Q3Q4
Write
Q0Q1Q2Q3Q4
PRCGRead
PRCGRead
PRCG
tWR
PRCG
tWR
- 38 -
Operating Timing Example, continued
CKE/DQM Input Timing (Write Cycle)
W982516CH
CLK cycle No.
CLK
CLK cycle No.
CLK
CLK cycle No.
CLK
External
Internal
CKE
DQM
External
Internal
CKE
External
Internal
DQ
DQM
DQ
DQM
1
765432
D1D6D5D3D2
DQM MASK
( 1 )
CKE MASK
7654321
D1D6D5D3D2
DQM MASKCKE MASK
( 2 )
1
CKE
DQ
D1
CKE MASK
( 3 )
5432
D5D4D3D2
76
D6
Publication Release Date: Mar 2003
- 39 - Revision A1
Operating Timing Example, continued
CKE/DQM Input Timing (Read Cycle)
W982516CH
CLK cycle No.
External
CLK
CLK cycle No.
External
CLK
CLK cycle No.
Internal
CKE
DQM
DQ
Internal
CKE
DQM
DQ
1
Q
1
Q
2
Q
3
1
Q
1
Q
2
Q
3
( 1 )
Q
4
( 2 )
OpenOpen
5432
Q
4
6
Open
1
765432
Q
6
7
Q
6
765432
External
CLK
Internal
CKE
DQM
DQ
Q
1
Q
2
Q
3
( 3 )
Q
4
Q
5
Q
6
- 40 -
Operating Timing Example, continued
Self Refresh/Power Down Mode Exit Timing
Asynchronous Control
Input Buffer turn on time ( Power down mode exit time ) is specified by tCKS(min) + tCK(min)
A ) tCK < tCKS(min)+tCK(min)
t
CK
CLK
W982516CH
CKE
Command
B) tCK >= tCKS(min) + tCK (min)
CLK
CKE
Command
Note )
All Input Buffer(Include CLK Buffer) are turned off in the Power Down mode
and Self Refresh mode
NOP
Command
t
CKS
(min)+tCK(min)
CK
t
CKS
(min)+tCK(min)
Command
Input Buffer Enable
Command
Input Buffer Enable
NOP
t
Represents the No-Operation command
Represents one command