Rainbow Electronics MAX152 User Manual

19-0119; Rev. 1; 12/93
Evaluation Kit Manual
Follows Data Sheet
+3V, 8-Bit ADC with 1µA Power-Down
_______________General Description
The MAX152 high-speed, microprocessor (µP)-com­patible, 8-bit analog-to-digital converter (ADC) uses a half-flash technique to achieve a 1.8µs conversion time, and digitizes at a rate of 400k samples per sec­ond (ksps). It operates with single +3V or dual ±3V supplies and accepts either unipolar or bipolar inputs. A–P—O—W—E—R—D—O—W—N–pin reduces current consumption to a typical value of 1µA. The part returns from power­down and acquires an input signal in less than 900ns, providing large reductions in supply current in applica­tions with burst-mode input signals.
The MAX152 is DC and dynamically tested. Its µP inter­face appears as a memory location or input/output port that requires no external interface logic. The data outputs use latched, three-state buffered circuitry for direct connection to a µP data bus or system input port. The ADC's input/ref­erence arrangement enables ratiometric operation. A fully-
___________________________Features
Single +3.0V to +3.6V Supply1.8µs Conversion TimePower-Up in 900nsInternal Track/Hold400ksps ThroughputLow Power: 1.5mA (Operating Mode)
1µA (Power-Down Mode)
300kHz Full-Power Bandwidth20-Pin DIP, SO and SSOP PackagesNo External Clock RequiredUnipolar/Bipolar InputsRatiometric Reference Inputs2.7V Version Available – Contact Factory
assembled evaluation kit provides a proven PC board lay­out to speed prototyping and design.
_______________________Applications
Cellular Telephones Portable Radios Battery-Powered Systems Burst-Mode Data Acquisition Digital Signal Processing Telecommunications High-Speed Servo Loops
________________Functional Diagram
V
DD
20
THREE-
STATE
DRIVERS
MAX152
19
V
SS
18
PWRDN
D0-D7 DATA OUT PINS 2-5, 14-17
VREF+ VREF-
V
12 11
1
IN
GND
4-BIT
FLASH
ADC
4-BIT
DAC
VREF+
4-BIT
16
FLASH
ADC
(4LSB)
TIMING AND CONTROL CIRCUITRY
6
7
10
MODE
WR
/RDY
13
CS
89
RD INT
________________________________________________________________
______________Ordering Information
PART TEMP. RANGE
MAX152CPP 0°C to +70°C MAX152CWP 0°C to +70°C MAX152CAP 0°C to +70°C MAX152C/D 0°C to +70°C MAX152EPP -40°C to +85°C MAX152EWP -40°C to +85°C MAX152EAP -40°C to +85°C MAX152MJP -55°C to +125°C
* Contact factory for dice specifications. ** Contact factory for availability and processing to MIL-STD-883.
__________________Pin Configuration
TOP VIEW
D0 (LSB)
WR
/RDY
MODE
GND
V
D1 D2
D3
RD
INT
IN
10
1 2 3 4 5
MAX152
6 7 8 9
DIP/SO/SSOP
Call toll free 1-800-998-8800 for free samples or literature.
PIN-PACKAGE
20 Plastic DIP 20 Wide SO 20 SSOP Dice* 20 Plastic DIP 20 Wide SO 20 SSOP 20 CERDIP**
V
20
DD
V
19
SS
PWRDN
18 17
D7 (MSB)
16
D6
15
D5
14
D4
13
CS
VREF+
12
VREF-
11
Maxim Integrated Products
MAX152
1
+3V, 8-Bit ADC with 1µA Power-Down
ABSOLUTE MAXIMUM RATINGS
VDDto GND.............................................................-0.3V to +7V
VSSto GND..............................................................+0.3V to -7V
Digital Input Voltage to GND........................-0.3V, (VDD+ 0.3V)
Digital Output Voltage to GND .....................-0.3V, (VDD+ 0.3V)
VREF+ to GND................................(VSS- 0.3V) to (VDD+ 0.3V)
VREF- to GND.................................(VSS- 0.3V) to (VDD+ 0.3V)
VINto GND.....................................(VSS- 0.3V) to (VDD+ 0.3V)
MAX152
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
ELECTRICAL CHARACTERISTICS
(Unipolar input range, VDD= 3.0V to 3.6V, GND = 0V, VSS= GND, VREF+ = 3.0V, VREF- = GND, specifications are given for RD mode (pin 7 = GND), T
PARAMETER SYMBOL CONDITIONS UNITS
ACCURACY (Note 1)
Resolution N Bits Total Unadjusted Error TUE Unipolar range LSB Differential Nonlinearity DNL No-missing-codes guaranteed LSB Zero-Code Error (Note 2) Unipolar and bipolar modes LSB Full-Scale Error (Note 2) Unipolar and bipolar modes LSB DYNAMIC PERFORMANCE (Note 3)
Signal-to-Noise Plus Distortion Ratio
Total Harmonic Distortion
Spurious-Free Dynamic Range dB
Input Full-Power Bandwidth VIN= 3.0V Maximum Input Slew Rate, Tracking V/µs
ANALOG INPUT
Input Voltage Range V Input Leakage Current I Input Capacitance C
REFERENCE INPUT
Reference Resistance RREF k VREF+ Input Voltage Range V VREF- Input Voltage Range V
2 _______________________________________________________________________________________
= T
to T
A
MIN
, unless otherwise noted.)
MAX
MAX152C/E, f
IN
IN
400kHz, f MAX152M, f
f
= 30.725kHz
IN
MAX152C/E, f 400kHz, f
MAX152M, f f
= 30.725kHz
IN
MAX152C/E, f 400kHz, f
MAX152M, f f
= 30.725kHz
IN
VSS< VIN< V
S/(N+D)
THD dB
IN
Continuous Power Dissipation (TA= +70°C)
Plastic DIP (derate 11.11mW/°C above +70°C) ..........889mW
Wide SO (derate 10.00mW/°C above +70°C)..............800mW
SSOP (derate 8.00mW/°C above +70°C) ....................640mW
CERDIP (derate 11.11mW/°C above +70°C)...............889mW
Operating Temperature Ranges:
MAX152C__ ........................................................0°C to +70°C
MAX152E__ .....................................................-40°C to +85°C
MAX152MJP ..................................................-55°C to +125°C
Storage Temperature Range.............................-65°C to +150°C
Lead Temperature (soldering, 10sec).............................+300°C
MIN TYP MAX
8
±1 ±1 ±1 ±1
=
SAMPLE
= 30.273kHz
IN
SAMPLE
SAMPLE
= 30.273kHz
IN
SAMPLE
SAMPLE
= 30.273kHz
IN
SAMPLE
p-p
= 340kHz,
=
= 340kHz,
=
= 340kHz,
45
45
-50
-50
50
50
0.3
0.28 0.5
VREF- VREF+
DD
±3
22
12 4
VREF- V
V
SS
DD
VREF+
dB
MHz
V µA pF
+3V, 8-Bit ADC with 1µA Power-Down
ELECTRICAL CHARACTERISTICS (continued)
(Unipolar input range, VDD= 3.0V to 3.6V, GND = 0V, VSS= GND, VREF+ = 3.0V, VREF- = GND, specifications are given for RD mode (pin 7 = GND), T
PARAMETER CONDITIONS UNITS
LOGIC INPUTS
Input High Voltage
Input Low Voltage
Input High Current
Input Low Current Input Capacitance (Note 4)
LOGIC OUTPUTS
Output Low Voltage
Output High Voltage Floating-State Current
Floating Capacitance (Note 4)
POWER REQUIREMENTS
Positive Supply Voltage Negative Supply Voltage
Positive Supply Current
Power-Down VDDCurrent (Note 5)
Negative Supply Current Power-Down VSSCurrent
Power-Supply Rejection PSR
Note 1: Accuracy measurements performed at VDD= 3.0V, unipolar mode. Operation over supply range is guaranteed by power-
supply rejection test.
Note 2: Bipolar tests are performed with VREF+ = +1.5V, VREF- = -1.5V, VSS= -3.0V. Note 3: Unipolar input range, VIN= 3.0V Note 4: Guaranteed by design. Note 5: Power-down current increases if control inputs are not driven to ground or VDD.
= T
to T
A
MIN
, unless otherwise noted.)
MAX
SYMBOL MIN TYP MAX
V
V
CS, WR, RD, PWRDN
INH
MODE 2.4 CS, WR, RD, PWRDN
INL
MODE 0.8 CS, RD, PWRDN
I
INH
WR
2.0
0.66
±1 ±3
µA
MODE 15 100
I
INL
C
CS, WR, RD, PWRDN, MODE CS, WR, RD, PWRDN, MODE
IN
INT, D0-D7, I
V
V I
LKG
C
OUT
V
V
INT, D0-D7, I
OL
RDY, I
SINK
INT, D0-D7, I
OH
INT, D0-D7, I D0-D7, RDY ±3 µA D0-D7, RDY 58pF
DD
Unipolar operation GND
SS
Bipolar operation (Note 2) -3.6 -3.0
VDD= 3.6V
I
DD
VDD= 3.0V
CS = RD = VDD,
PWRDN = 0
I
CS = RD = 0, PWRDN = V
SS
CS = RD = VDD, PWRDN = 0 VDD= 3.3V ±10%
, WR-RD mode, VDD= 3.0V
P-P
= 20µA
SINK
= 400µA
SINK
= 1mA
= 20µA
SOURCE
= 400µA
SOURCE
MAX152C, CS = RD = 0, PWRDN = V
MAX152E/M, CS = RD = 0, PWRDN = V
MAX152C, CS = RD = 0, PWRDN = V
MAX152E/M, CS = RD = 0, PWRDN = V
MAX152C/E/M
VDD-0.1 VDD-0.4
3.0 3.6 V
DD
DD
DD
DD
DD
±1/16 ±1/4 LSB
±1 µA
58pF
0.1
0.4
0.4
2.5 5
2.5 6
1.5 3
1.5 3.5
150
150µA 125µA
mA
µA
MAX152
V
V
V
V
V
_______________________________________________________________________________________ 3
+3V, 8-Bit ADC with 1µA Power-Down
TIMING CHARACTERISTICS
(Unipolar input range, VDD= 3V, VSS= 0V, TA= +25°C, unless otherwise noted.) (Note 6)
PARAMETER SYMBOL CONDITIONS
Conversion Time (WR-RD Mode)
MAX152
Conversion Time (RD Mode)
Power-Up Time CS to RD,WR
Setup Time CS to RD,WR
Hold Time CS to RDY
Delay Data Access Time
(RD Mode) (Note 7) RD to INT Delay
(RD Mode) Data Hold Time
(Note 8) Delay Time Between
Conversions WR Pulse Width
Delay Time Between
WR and RD Pulses
RD Pulse Width
Data Access Time (Note 7)
RD to INT Delay WR to INT Delay
RD Pulse Width
Data Access Time (Note 7)
WR to INT Delay Data Access Time
After INT (Note 7)
t
CWR
t
CRD
t
UP
t
CSS
t
CSH
t
RDY
t
ACC0CL
t
INTH
t
DH
t
P
t
WR
t
RD
t
READ1
t
ACC1
t
RI
t
INTL
t
READ2
t
ACC2
t
IHWR
t
ID
tRD< t C
CL= 50pF, R
INTL
= 100pF
L
= 5.1kto V
L
,
DD
= 100pF
CL= 50pF
WR-RD mode, determined by t (Figure 6)
WR-RD mode, t
< t
RD
INTL
(Figure 6)
ACC1
, CL= 100pF
CL= 50pF WR-RD mode,
t
> t
,
RD
INTL
determined by t (Figure 5)
WR-RD mode, t
< t
RD
INTL
(Figure 5) Stand-alone mode,
C
= 50pF
L
Stand-alone mode, C
= 100pF
L
ACC2
, CL= 100pF
ALL GRADES
= +25°C
T
A
MIN TYP MAX
1.8 2.06 2.4 µs
2.0 2.3 2.6 µs
0.9 1.2 1.4 µs
0 0 0 ns
0 0 0 ns
100 120 140 ns
t
CRD
+100
100 160 170 180 ns
100 130 150 ns
450 600 700 ns
0.6 10 0.66 10 0.8 10 µs
0.8 0.9 1.0 µs
400 500 600 ns
400 500 600 ns
300 340 400 ns
0.7 1.45 1.6 1.8
180 220 250 ns
180 220 250 ns
180 200 240 ns
100 130 150 ns
MAX152C/E
= T
T
A
MIN
MIN MAX
to T
t
CRD
+130
MAX
Note 6: Input control signals are specified with tr= tf= 5ns, 10% to 90% of +3.0V, and timed from a voltage level of 1.3V. Timing
delays get shorter at higher supply voltages. See the Converson Time vs. Supply Voltage graph in the
Characteristics
to extrapolate timing delays at other power-supply voltages.
Note 7: See Figure 1 for load circuit. Parameter defined as the time required for the output to cross 0.66V or 2.0V. Note 8: See Figure 2 for load circuit. Parameter defined as the time required for the data lines to change 0.5V.
MAX152M
= T
T
A
MIN
MIN MAX
Typical Operating
to T
t
CRD
+150
MAX
UNITS
ns
µs
_________________________________________________________________________________________
4 _______________________________________________________________________________________
+3V, 8-Bit ADC with 1µA Power-Down
0
MAX186
5
__________________________________________Typical Operating Characteristics
(TA=+25°C, unless otherwise noted).
CONVERSION TIME
vs. AMBIENT TEMPERATURE
1.6
1.4
1.2 VDD = 3.6V
1.0
0.8
(NORMALIZED TO VALUE AT +25°C)
0.6
CRD
t
0.4
1400
1300
1200
(ns)
1100
CRD
t
1000
900
800
2.8 4.0
VDD = 3.0V
-60 140
-20 20 100 TEMPERATURE (°C)
CONVERSION TIME
vs. SUPPLY VOLTAGE
3.0 3.4 3.8 SUPPLY VOLTAGE (V)
60
3.2
6
5
4
3.6
VDD = 3.3V
SUPPLY CURRENT
vs. SUPPLY VOLTAGE
CS
= RD = 0V
MILITARY
SIGNAL-TO-NOISE RATIO
0
-20
-40
-60
RATIO (dB)
-80
-100
-120 0 200
40 80 160
vs. SUPPLY VOLTAGE
1.1
= 3.0V)
DD
1.0
0.9
0.8
TIMING (NORMALIZED TO V
0.7
2.8 3.8
3.0 3.2 3.6 4.0
EXTENDED
fIN = 30.27 kHz
= 400ksps
f
SAMPLE
SNR = 48.2dB
120
FREQUENCY (kHz)
NORMALIZED TIMING
3.4
SUPPLY VOLTAGE (V)
5
4
3
8.0
7.5
7.0
6.5
6.0
5.5
EFFECTIVE BITS
5.0
4.5
4.0
10,000
1000
100
SUPPLY CURRENT (µA)
10
1
ERROR
vs. POWER-UP TIME
VDD = 3.0V
EFFECTIVE BITS vs. 
INPUT FREQUENCY, WR-RD MODE
VDD = 3.0V f
= 400kHz
SAMPLE VIN = 2.98Vp-p TA = T
to T
MIN
MAX
1k 10k 100k
INPUT FREQUENCY (Hz)
AVERAGE POWER CONSUMPTION
vs. CONVERSION RATE USING PWRDN
VDD = 3.0V
1 100k
10 100 10k 1M
1k
CONVERSIONS/SEC
-
1M
MAX152
3
SUPPLY CURRENT (mA)
2
1
2.8 3.0 3.4 3.8
_________________________________________________________________________________________________
COMMERCIAL
+25°C
3.2 3.6
SUPPLY VOLTAGE (V)
2
ERROR (LSBs)
1
VDD = 3.6V
0
120 160 240 32
200 280
tUP (ns)
5
+3V, 8-Bit ADC with 1µA Power-Down
DATA
OUTPUTS
3k
V
DD
DATA
OUTPUTS
C
L
3k
C
L
DATA
OUTPUTS
3k
10pF
DATA
OUTPUTS
V
DD
3k
10pF
MAX152
A. HIGH-Z TO V
OH
Figure 1. Load Circuits for Data-Access Time Test
____________________Pin Description _______________Detailed Description
PIN NAME FUNCTION
Analog Input. Range is
1 2 D0 Three-State Data Output (LSB)
3-5 D1-D3 Three-State Data Outputs
6
7 MODE
8
9
10 GND Ground
11 VREF-
12 VREF+
13
14-16 D4-D6 Three-State Data Outputs
17 D7 Three-State Data Output (MSB) 18
19 20
*See
V
IN
WR/RDY
RD
INT
CS
PWRDN
V
SS
V
DD
Digital Inferface
VREF- V
Write Control Input/Ready Status Output*
Mode Selection Input is internally pulled low with a 15µA current source. MODE = 0 activates read mode MODE = 1 activates write-read mode*
Read Input must be low to access data.*
Interrupt Output goes low to indicate end of conversion.*
Lower limit of reference span. Sets the zero-code voltage. Range is V
VREF- < VREF+.
SS
Upper limit to reference span. Sets the full-scale input voltage. Range is VREF- < VREF+ V
Chip-Select Input must be low for the device recognize WR or RD inputs.
Powerdown Input reduces supply current when low.
Negative Supply. Unipolar: VSS= 0V, Bipolar: V
Positive Supply, +3V.
Section.
VREF+.
IN
= -3V.
SS
B. HIGH-Z TO V
.
DD
A. V
OL
TO HIGH-Z B. V
OH
OL
TO HIGH-Z
Figure 2. Load Circuits for Data-Hold TIme Test
Converter Operation
The MAX152 uses a half-flash conversion technique (see
Functional Diagram
) in which two 4-bit flash ADC sections achieve an 8-bit result. Using 15 compara­tors, the flash ADC compares the unknown input volt­age to the reference ladder and provides the upper 4 data bits.
An internal digital-to-analog converter (DAC) uses the 4 most significant bits (MSBs) to generate the analog result from the first flash conversion and a residue volt­age that is the difference between the unknown input and the DAC voltage. The residue is then compared again with the flash comparators to obtain the lower 4 data bits (LSBs).
The MAX152 is characterized for operation between +3.0V and +3.6V. Conversion times decrease as the supply voltage increases. The supply current decreas­es rapidly with decreasing supply voltage. (See
Typical Operating Characteristics
.)
Power-Down Mode
In burst-mode or low sample-rate applications, the MAX152 can be shut down between conversions, reducing supply current to microamp levels (see
Typical Operating Characteristics
PWRDN pin shuts the device down, reducing supply current to typically 1µA when powered from a single 3V supply. A logic high on PWRDN wakes up the MAX152. A new conversion can be started within 900ns of the PWRDN pin being driven high (this includes both the power-up delay and the track/hold acquisition time). If power-down mode is not required, connect PWRDN to V
DD
.
). A logic low on the
6 _______________________________________________________________________________________
+3V, 8-Bit ADC with 1µA Power-Down
Once the MAX152 is in power-down mode, lowest sup­ply current is drawn with MODE low (RD mode) due to an internal pull-down resistor at this pin. In addition, for minimum current consumption, other digital inputs should remain high in power-down. Refer to the
Reference
section for information on reducing refer-
ence current during power-down.
___________________Digital Interface
The MAX152 has two basic interface modes set by the status of the MODE input pin. When MODE is low, the converter is in the RD mode; when MODE is high, the converter is set up for the WR-RD mode.
Read Mode (MODE = 0)
In RD mode, conversion control and data access are controlled by the RD input (Figure 3). The comparator inputs track the analog input voltage for the duration of tP. A conversion is initiated by driving RD low. With µPs that can be forced into a wait state, hold RD low until output data appears. The µP starts the conversion, waits, and then reads data with a single read instruction.
WR/RDY is configured as a status output (RDY) in RD mode, where it can drive the ready or wait input of a µP. RDY is an open-collector output (with no internal pull-up) that goes low after the falling edge of CS and goes high at the end of the conversion. If not used, the WR/RDY pin can be left unconnected. The INT output goes low at the end of the conversion and returns high on the rising edge of CS or RD.
Write-Read Mode (MODE = 1)
Figures 4 and 5 show the operating sequence for the write-read (WR-RD) mode. The comparator inputs track the analog input voltage for the duration of tP. The conversion is initiated by a falling edge of WR. When WR returns high, the 4 MSBs' flash result is latched into the output buffers and the 4 LSBs' conver­sion begins. INT goes low, indicating conversion end, and the lower 4 data bits are latched into the output buffers. The data is then accessible after RD goes low (see
Timing Characteristics
PWRDN
WR
RD
INT
D0-D7
Figure 4. WR-RD Mode Timing (tRD> t
CS
t
CSS
t
UP
t
WR
).
t
t
ACC2
) (MODE= 1)
P t
READ2
VALID DATA
t
DH
t
INTL
t
CSH
t
RD
INTL
MAX152
PWRDN
CS
RD
RDY
INT
D0-D7
t
RDY
t
UP
t
t
CSS
CSH
WITH EXTERNAL
PULL-UP
t
CRD
t
ACCO
Figure 3. RD Mode Timing (MODE= 0)
_______________________________________________________________________________________ 7
VALID DATA
t
DH
PWRDN
t
P
t
INTH
Figure 5. WR-RD Mode Timing (tRD< t
CS
WR
RD
INT
t
CSS
t
UP
t
WR
t
CWR
t
ACC1
t
CSH
t
t
RD
P
t
READ1
t
RI
VALID DATA
t
DH
),
Fastest Operating
INTL
t
INTH
Mode (MODE = 1)
+3V, 8-Bit ADC with 1µA Power-Down
t
WR
INT
MAX152
D0-D7
WR
OLD DATA
t
IHWR
t
INTL
t
P
t
ID
NEW DATA
+3V
0.1µF
4.7µF
VIN+ VIN-
1
V
IN
10
GND
MAX152
20
V
DD
12
VREF+
11
VREF-
Figure 6. Stand-Alone Mode Timing (CS= RD= 0) (MODE = 1)
A minimum acquisition time (tP) is required from INT going low to the start of another conversion (WR going low).
Options for reading data from the converter include the following:
Using Internal Delay
The µP waits for the INT output to go low before read­ing the data (Figure 4). INT goes low after the rising edge of WR, indicating that the conversion is complete and the result is available in the output latch. With CS low, data outputs D0-D7 can be accessed by pulling
RD low. INT is then reset by the rising edge of CS or RD.
Fastest Conversion: Reading Before Delay
An external method of controlling the conversion time is shown in Figure 5. The internally generated delay t
varies slightly with temperature and supply volt-
INTL
age, and can be overridden with RD to achieve the fastest conversion time. RD is brought low after the ris­ing edge of WR, but before INT goes low. This com­pletes the conversion and enables the output buffers (D0-D7) that contain the conversion result. INT also goes low after the falling edge of RD and is reset on the rising edge of RD or CS. The total conversion time is therefore: t
= tWR(600ns) + tRD(800ns) + t
CWR
ACC1
(400ns) = 1800ns.
Stand-Alone Operation
Besides the two standard WR-RD mode options, stand­alone operation can be achieved by connecting CS and RD low (Figure 6). A conversion is initiated by pulling WR low. Output data can be read by either edge of the next WR pulse.
Figure 7a. Power Supply as Reference
VIN+
+3V
VIN-
20
V
34.8k
3.01k
DD
12
VREF+
0.1 µF
VREF-
11
4.7
0.1
7
6
µF
µF
8 1
LM10
3
4
+2.5V
2
10
GND
MAX152
1
V
IN
Figure 7b. External Reference, +2.5V Full Scale
1
V
IN
10
GND
20
MAX152
V
DD
12
VREF+
11
VREF-
0.1µF
+3V
0.1µF
4.7µF
*CURRENT PATH MUST STILL  EXIST FROM VIN- TO GND.
VIN+
1.2V
V
IN-
0.1µF
Figure 7c. Input Not Referenced to GND
+3V
MAX872
PWRDN
MTD3055EL
C1
2.2µF
+
N
V
DD
MAX152
VREF+
VREF-
PWRDN
Figure 7d. An N-channel MOSFET switches off the reference load during power-down.
8 _______________________________________________________________________________________
+3V, 8-Bit ADC with 1µA Power-Down
____________Analog Considerations
Reference
Figures 7a-7c show some reference connections. VREF+ and VREF- inputs set the full-scale and zero­input voltages of the ADC. The voltage at VREF­defines the input that produces an output code of all zeros, and the voltage at VREF+ defines the input that produces an output code of all ones.
The internal resistance from VREF+ to VREF- may be as low as 1k, and current will flow through it even when the MAX152 is shut down. Figure 7d shows how an N­channel MOSFET may be connected to VREF- to break this path during power-down. The FET should have an on resistance < 2with a 3V gate drive.
Although VREF+ is frequently connected to VDD, this circuit uses a low current, low-dropout, 2.5V voltage reference – the MAX872. Since the MAX872 cannot continuously furnish enough current for the reference resistance, this circuit is intended for applications where the MAX152 is normally in standby and is turned on in order to make measurements at intervals greater than 20µs. The capacitor C1 connected to VREF+ is slowly charged by the MAX872 during the standby period and furnishes the reference current during the short measure­ment period.
The 2.2µF value of C1 is chosen so that its voltage drops by less than 1/2LSB during the conversion process. Larger capacitors reduce the error still further. Use ceramic or tantalum capacitors for C1.
When VREF- is switched, as in Figure 7d, a new conver­sion can be initiated after waiting a time equal to the power-up delay (tUP) plus the turn-on time of the N-chan-
nel FET.
Bypassing
A 4.7µF electrolytic in parallel with a 0.1µF ceramic capacitor should be used to bypass VDDto GND. These capacitors should have minimal lead length.
The reference inputs should be bypassed with 0.1µF capacitors, as shown in Figures 7a-7c.
Input Current
Figure 8 shows the equivalent circuit of the converter input. When the conversion starts and WR is low, V connected to sixteen 0.6pF capacitors. During this acqui­sition phase, the input capacitors charge to the input volt­age through the resistance of the internal analog switches. In addition, about 12pF of stray capacitance must be charged. The input can be modeled as an equivalent RC network (Figure 9). As source impedance increases, the capacitors take longer to charge.
The typical 22pF input capacitance allows source resis­tance as high as 2.2kwithout setup problems. For larg­er resistances, the acquisition time (t
MAX152
R
IN
V
IN
Figure 8. Equivalent Input Circuit
V
IN
Figure 9. RC Network Equivalent Input Model
R
ON
V
1
IN
C
R
1
4k
V
IN
12pF
) must be increased.
P
10pF
MAX152
IN
MAX152
is
_______________________________________________________________________________________ 9
+3V, 8-Bit ADC with 1µA Power-Down
Conversion Rate
The maximum sampling rate (f achieved in the WR-RD mode (tRD< t culated as follows:
f
=
max
MAX152
e.g. at T 25 C, V 3.0V:
where t Write pulse width
tttt
=+ ° =+
ADD
f
=
max
600ns 800ns 300ns 450ns
f 465kHz
=
max
=
WR
t Delay between WR and RD pulses
=
RD
t = RD to INT delay
RI
t = Delay time between conversons.
P
1
+++
WR RD RI P
+++
) for the MAX152 is
max
INTL
1
) and is cal-
Signal-to-Noise Ratio and Effective
Number of Bits
Signal-to-noise plus distortion ratio (SINAD) is the ratio of the fundamental input frequency's RMS amplitude to the RMS amplitude of all other ADC output signals. The output band is limited to frequencies above DC and below one-half the ADC sample rate.
The theoretical minimum A/D noise is caused by quan­tization error, and results directly from the ADC's reso­lution: SNR = (6.02N + 1.76)dB, where N is the number of bits of resolution. Therefore, a perfect 8-bit ADC can do no better than 50dB.
The FFT plot ( the result of sampling a pure 30.27kHz sinusoid at a 400kHz rate. This FFT plot of the output shows the out­put level in various spectral bands.
The effective resolution, or "effective number of bits," the ADC provides can be measured by transposing the equation that converts resolution to SNR: N = (SINAD -
1.76)/6.02 (see
Typical Operation Characteristics
Typical Operating Characteristics
) shows
).
Total Harmonic Distortion
Total harmonic distortion (THD) is the ratio of the RMS sum of all harmonics of the input signal (in the frequen­cy band above DC and below one-half the sample rate) to the fundamental itself. This is expressed as:
2
2
(V
V
++++
THD 20 log
=
where V VNare the amplitudes of the 2nd through Nth harmonics.
is the fundamental RMS amplitude, and V2to
1
2
 
2
V
3
4
V
1
V
L
2
N
)
 
Spurious-Free Dynamic Range
Spurious-free dynamic range is the ratio of the funda­mental RMS amplitude to the amplitude of the next largest spectral component (in the frequency band above DC and below one-half the sample rate). Usually the next largest spectral component occurs at some harmonic of the input frequency. However, if the ADC is exceptionally linear, it may occur only at a ran­dom peak in the ADC's noise floor. See "Signal to Noise Ratio" plot in
Typical Operating Characteristics
.
10 ______________________________________________________________________________________
+3V, 8-Bit ADC with 1µA Power-Down
___________________Chip Topography
MAX152
D0
D1
D2
D3
WR/RDY
MODE
RD INT GND VREF- VREF+
TRANSISTOR COUNT: 1856 SUBSTRATE CONNECTED TO V
V
IN
DD
V
0.098"
2.49mm
V
SS
DD
PWRDN
D7 D6
0.104"
2.64mm
D5 D4
CS
________________________________________________________Package Information
INCHES MILLIMETERS
DIM
A
D1
E
E1
A2
A
D
A3
B1
α
e
A
e
B
A1
L
e
B
A1 A2 A3
B
B1
C D
D1
E
E1
e
e
A
e
B
L
α
C
MAX
MIN
–
0.015
0.125
0.055
0.016
0.050
0.008
1.015
0.040
0.300
0.240
0.100 BSC
0.300 BSC
–
0.115
0.200 –
0.150
0.080
0.022
0.065
0.012
1.045
0.070
0.325
0.280
0.400
0.150
15˚
MIN
–
0.38
3.18
1.40
0.41
1.27
0.20
25.78
1.02
7.62
6.10
2.54 BSC
7.62 BSC
–
2.92
20-PIN PLASTIC
DUAL-IN-LINE
PACKAGE
MAX
5.08 –
3.81
2.03
0.56
1.65
0.30
26.54
1.78
8.26
7.11
10.16
3.81
15˚
21-333A
MAX152
______________________________________________________________________________________ 11
+3V, 8-Bit ADC with 1µA Power-Down
__________________________________________Package Information (continued)
INCHES MILLIMETERS
DIM
MAX152
A
A1
B C D
HE
E
e
H
h L
α
MIN
0.093
0.004
0.014
0.009
0.496
0.291
0.394
0.010
0.016 0˚
MAX
MIN
0.104
2.35
0.012
0.10
0.019
0.35
0.013
0.23
0.512
12.60
0.299
7.40
0.419
10.00
0.030
0.25
0.050
0.40
MAX
2.65
0.30
0.49
0.32
13.00
7.60
1.27 BSC0.050 BSC
10.65
0.75
1.27
21-334A
D
h x 45˚
α
A
0.127mm
0.004in.
e
B
A1
C
L
20-PIN PLASTIC
SMALL-OUTLINE
PACKAGE
12 ______________________________________________________________________________________
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