The MAX152 high-speed, microprocessor (µP)-compatible, 8-bit analog-to-digital converter (ADC) uses a
half-flash technique to achieve a 1.8µs conversion
time, and digitizes at a rate of 400k samples per second (ksps). It operates with single +3V or dual ±3V
supplies and accepts either unipolar or bipolar inputs.
A–P—O—W—E—R—D—O—W—N–pin reduces current consumption to
a typical value of 1µA. The part returns from powerdown and acquires an input signal in less than 900ns,
providing large reductions in supply current in applications with burst-mode input signals.
The MAX152 is DC and dynamically tested. Its µP interface appears as a memory location or input/output port that
requires no external interface logic. The data outputs use
latched, three-state buffered circuitry for direct connection
to a µP data bus or system input port. The ADC's input/reference arrangement enables ratiometric operation. A fully-
___________________________Features
♦ Single +3.0V to +3.6V Supply
♦ 1.8µs Conversion Time
♦ Power-Up in 900ns
♦ Internal Track/Hold
♦ 400ksps Throughput
♦ Low Power: 1.5mA (Operating Mode)
1µA(Power-Down Mode)
♦ 300kHz Full-Power Bandwidth
♦ 20-Pin DIP, SO and SSOP Packages
♦ No External Clock Required
♦ Unipolar/Bipolar Inputs
♦ Ratiometric Reference Inputs
♦ 2.7V Version Available – Contact Factory
assembled evaluation kit provides a proven PC board layout to speed prototyping and design.
_______________________Applications
Cellular Telephones
Portable Radios
Battery-Powered Systems
Burst-Mode Data Acquisition
Digital Signal Processing
Telecommunications
High-Speed Servo Loops
MAX152CPP0°C to +70°C
MAX152CWP0°C to +70°C
MAX152CAP0°C to +70°C
MAX152C/D0°C to +70°C
MAX152EPP-40°C to +85°C
MAX152EWP-40°C to +85°C
MAX152EAP-40°C to +85°C
MAX152MJP-55°C to +125°C
* Contact factory for dice specifications.
** Contact factory for availability and processing to MIL-STD-883.
__________________Pin Configuration
TOP VIEW
D0 (LSB)
WR
/RDY
MODE
GND
V
D1
D2
D3
RD
INT
IN
10
1
2
3
4
5
MAX152
6
7
8
9
DIP/SO/SSOP
Call toll free 1-800-998-8800 for free samples or literature.
PIN-PACKAGE
20 Plastic DIP
20 Wide SO
20 SSOP
Dice*
20 Plastic DIP
20 Wide SO
20 SSOP
20 CERDIP**
V
20
DD
V
19
SS
PWRDN
18
17
D7 (MSB)
16
D6
15
D5
14
D4
13
CS
VREF+
12
VREF-
11
Maxim Integrated Products
MAX152
1
+3V, 8-Bit ADC with 1µA Power-Down
ABSOLUTE MAXIMUM RATINGS
VDDto GND.............................................................-0.3V to +7V
VSSto GND..............................................................+0.3V to -7V
Digital Input Voltage to GND........................-0.3V, (VDD+ 0.3V)
Digital Output Voltage to GND .....................-0.3V, (VDD+ 0.3V)
VREF+ to GND................................(VSS- 0.3V) to (VDD+ 0.3V)
VREF- to GND.................................(VSS- 0.3V) to (VDD+ 0.3V)
VINto GND.....................................(VSS- 0.3V) to (VDD+ 0.3V)
MAX152
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
ELECTRICAL CHARACTERISTICS
(Unipolar input range, VDD= 3.0V to 3.6V, GND = 0V, VSS= GND, VREF+ = 3.0V, VREF- = GND, specifications are given for RD
mode (pin 7 = GND), T
PARAMETERSYMBOLCONDITIONSUNITS
ACCURACY (Note 1)
ResolutionNBits
Total Unadjusted ErrorTUEUnipolar rangeLSB
Differential NonlinearityDNLNo-missing-codes guaranteedLSB
Zero-Code Error (Note 2)Unipolar and bipolar modesLSB
Full-Scale Error (Note 2)Unipolar and bipolar modesLSB
DYNAMIC PERFORMANCE (Note 3)
Signal-to-Noise Plus
Distortion Ratio
Total Harmonic Distortion
Spurious-Free Dynamic RangedB
Input Full-Power BandwidthVIN= 3.0V
Maximum Input Slew Rate, TrackingV/µs
ANALOG INPUT
Input Voltage RangeV
Input Leakage CurrentI
Input CapacitanceC
REFERENCE INPUT
Reference ResistanceRREFkΩ
VREF+ Input Voltage RangeV
VREF- Input Voltage RangeV
MAX152C__ ........................................................0°C to +70°C
MAX152E__ .....................................................-40°C to +85°C
MAX152MJP ..................................................-55°C to +125°C
Storage Temperature Range.............................-65°C to +150°C
Lead Temperature (soldering, 10sec).............................+300°C
MINTYPMAX
8
±1
±1
±1
±1
=
SAMPLE
= 30.273kHz
IN
SAMPLE
SAMPLE
= 30.273kHz
IN
SAMPLE
SAMPLE
= 30.273kHz
IN
SAMPLE
p-p
= 340kHz,
=
= 340kHz,
=
= 340kHz,
45
45
-50
-50
50
50
0.3
0.280.5
VREF-VREF+
DD
±3
22
12 4
VREF- V
V
SS
DD
VREF+
dB
MHz
V
µA
pF
+3V, 8-Bit ADC with 1µA Power-Down
ELECTRICAL CHARACTERISTICS (continued)
(Unipolar input range, VDD= 3.0V to 3.6V, GND = 0V, VSS= GND, VREF+ = 3.0V, VREF- = GND, specifications are given for RD
mode (pin 7 = GND), T
PARAMETERCONDITIONSUNITS
LOGIC INPUTS
Input High Voltage
Input Low Voltage
Input High Current
Input Low Current
Input Capacitance (Note 4)
LOGIC OUTPUTS
Output Low Voltage
Output High Voltage
Floating-State Current
Floating Capacitance (Note 4)
POWER REQUIREMENTS
Positive Supply Voltage
Negative Supply Voltage
Positive Supply Current
Power-Down VDDCurrent
(Note 5)
Negative Supply Current
Power-Down VSSCurrent
Power-Supply RejectionPSR
Note 1: Accuracy measurements performed at VDD= 3.0V, unipolar mode. Operation over supply range is guaranteed by power-
supply rejection test.
Note 2: Bipolar tests are performed with VREF+ = +1.5V, VREF- = -1.5V, VSS= -3.0V.
Note 3: Unipolar input range, VIN= 3.0V
Note 4: Guaranteed by design.
Note 5: Power-down current increases if control inputs are not driven to ground or VDD.
Note 6: Input control signals are specified with tr= tf= 5ns, 10% to 90% of +3.0V, and timed from a voltage level of 1.3V. Timing
delays get shorter at higher supply voltages. See the Converson Time vs. Supply Voltage graph in the
Characteristics
to extrapolate timing delays at other power-supply voltages.
Note 7: See Figure 1 for load circuit. Parameter defined as the time required for the output to cross 0.66V or 2.0V.
Note 8: See Figure 2 for load circuit. Parameter defined as the time required for the data lines to change 0.5V.
Mode Selection Input is internally
pulled low with a 15µA current source.
MODE = 0 activates read mode
MODE = 1 activates write-read mode*
Read Input must be low to access
data.*
Interrupt Output goes low to indicate
end of conversion.*
Lower limit of reference span. Sets the
zero-code voltage. Range is
V
≤ VREF- < VREF+.
SS
Upper limit to reference span. Sets the
full-scale input voltage. Range is
VREF- < VREF+ ≤ V
Chip-Select Input must be low for the
device recognize WR or RD inputs.
Powerdown Input reduces supply
current when low.
Negative Supply. Unipolar: VSS= 0V,
Bipolar: V
Positive Supply, +3V.
Section.
≤ VREF+.
IN
= -3V.
SS
B. HIGH-Z TO V
.
DD
A. V
OL
TO HIGH-Z B. V
OH
OL
TO HIGH-Z
Figure 2. Load Circuits for Data-Hold TIme Test
Converter Operation
The MAX152 uses a half-flash conversion technique
(see
Functional Diagram
) in which two 4-bit flash ADC
sections achieve an 8-bit result. Using 15 comparators, the flash ADC compares the unknown input voltage to the reference ladder and provides the upper 4
data bits.
An internal digital-to-analog converter (DAC) uses the
4 most significant bits (MSBs) to generate the analog
result from the first flash conversion and a residue voltage that is the difference between the unknown input
and the DAC voltage. The residue is then compared
again with the flash comparators to obtain the lower 4
data bits (LSBs).
The MAX152 is characterized for operation between
+3.0V and +3.6V. Conversion times decrease as the
supply voltage increases. The supply current decreases rapidly with decreasing supply voltage. (See
Typical Operating Characteristics
.)
Power-Down Mode
In burst-mode or low sample-rate applications, the
MAX152 can be shut down between conversions,
reducing supply current to microamp levels (see
Typical Operating Characteristics
PWRDN pin shuts the device down, reducing supply
current to typically 1µA when powered from a single 3V
supply. A logic high on PWRDN wakes up the
MAX152. A new conversion can be started within
900ns of the PWRDN pin being driven high (this
includes both the power-up delay and the track/hold
acquisition time). If power-down mode is not required,
connect PWRDN to V
Once the MAX152 is in power-down mode, lowest supply current is drawn with MODE low (RD mode) due to
an internal pull-down resistor at this pin. In addition, for
minimum current consumption, other digital inputs
should remain high in power-down. Refer to the
Reference
section for information on reducing refer-
ence current during power-down.
___________________Digital Interface
The MAX152 has two basic interface modes set by the
status of the MODE input pin. When MODE is low, the
converter is in the RD mode; when MODE is high, the
converter is set up for the WR-RD mode.
Read Mode (MODE = 0)
In RD mode, conversion control and data access are
controlled by the RD input (Figure 3). The comparator
inputs track the analog input voltage for the duration of
tP. A conversion is initiated by driving RD low. With µPs
that can be forced into a wait state, hold RD low until
output data appears. The µP starts the conversion,
waits, and then reads data with a single read instruction.
WR/RDY is configured as a status output (RDY) in RD
mode, where it can drive the ready or wait input of a
µP. RDY is an open-collector output (with no internal
pull-up) that goes low after the falling edge of CS and
goes high at the end of the conversion. If not used, the
WR/RDY pin can be left unconnected. The INT output
goes low at the end of the conversion and returns high
on the rising edge of CS or RD.
Write-Read Mode (MODE = 1)
Figures 4 and 5 show the operating sequence for the
write-read (WR-RD) mode. The comparator inputs
track the analog input voltage for the duration of tP.
The conversion is initiated by a falling edge of WR.
When WR returns high, the 4 MSBs' flash result is
latched into the output buffers and the 4 LSBs' conversion begins. INT goes low, indicating conversion end,
and the lower 4 data bits are latched into the output
buffers. The data is then accessible after RD goes low
(see
A minimum acquisition time (tP) is required from INT
going low to the start of another conversion (WR going
low).
Options for reading data from the converter include the
following:
Using Internal Delay
The µP waits for the INT output to go low before reading the data (Figure 4). INT goes low after the rising
edge of WR, indicating that the conversion is complete
and the result is available in the output latch. With CS
low, data outputs D0-D7 can be accessed by pulling
RD low. INT is then reset by the rising edge of CS or
RD.
Fastest Conversion: Reading Before Delay
An external method of controlling the conversion time is
shown in Figure 5. The internally generated delay
t
varies slightly with temperature and supply volt-
INTL
age, and can be overridden with RD to achieve the
fastest conversion time. RD is brought low after the rising edge of WR, but before INT goes low. This completes the conversion and enables the output buffers
(D0-D7) that contain the conversion result. INT also
goes low after the falling edge of RD and is reset on the
rising edge of RD or CS. The total conversion time is
therefore: t
= tWR(600ns) + tRD(800ns) + t
CWR
ACC1
(400ns) = 1800ns.
Stand-Alone Operation
Besides the two standard WR-RD mode options, standalone operation can be achieved by connecting CS
and RD low (Figure 6). A conversion is initiated by
pulling WR low. Output data can be read by either
edge of the next WR pulse.
Figure 7a. Power Supply as Reference
VIN+
+3V
VIN-
20
V
34.8k
3.01k
DD
12
VREF+
0.1
µF
VREF-
11
4.7
0.1
7
6
µF
µF
8
1
LM10
3
4
+2.5V
2
10
GND
MAX152
1
V
IN
Figure 7b. External Reference, +2.5V Full Scale
1
V
IN
10
GND
20
MAX152
V
DD
12
VREF+
11
VREF-
0.1µF
+3V
0.1µF
4.7µF
*CURRENT PATH MUST STILL
EXIST FROM VIN- TO GND.
VIN+
1.2V
V
IN-
0.1µF
Figure 7c. Input Not Referenced to GND
+3V
MAX872
PWRDN
MTD3055EL
C1
2.2µF
+
N
V
DD
MAX152
VREF+
VREF-
PWRDN
Figure 7d. An N-channel MOSFET switches off the reference
load during power-down.
Figures 7a-7c show some reference connections.
VREF+ and VREF- inputs set the full-scale and zeroinput voltages of the ADC. The voltage at VREFdefines the input that produces an output code of all
zeros, and the voltage at VREF+ defines the input that
produces an output code of all ones.
The internal resistance from VREF+ to VREF- may be as
low as 1kΩ, and current will flow through it even when
the MAX152 is shut down. Figure 7d shows how an Nchannel MOSFET may be connected to VREF- to break
this path during power-down. The FET should have an
on resistance < 2Ω with a 3V gate drive.
Although VREF+ is frequently connected to VDD, this
circuit uses a low current, low-dropout, 2.5V voltage
reference – the MAX872. Since the MAX872 cannot
continuously furnish enough current for the reference
resistance, this circuit is intended for applications where
the MAX152 is normally in standby and is turned on in
order to make measurements at intervals greater than
20µs. The capacitor C1 connected to VREF+ is slowly
charged by the MAX872 during the standby period and
furnishes the reference current during the short measurement period.
The 2.2µF value of C1 is chosen so that its voltage drops
by less than 1/2LSB during the conversion process.
Larger capacitors reduce the error still further. Use
ceramic or tantalum capacitors for C1.
When VREF- is switched, as in Figure 7d, a new conversion can be initiated after waiting a time equal to the
power-up delay (tUP) plus the turn-on time of the N-chan-
nel FET.
Bypassing
A 4.7µF electrolytic in parallel with a 0.1µF ceramic
capacitor should be used to bypass VDDto GND.
These capacitors should have minimal lead length.
The reference inputs should be bypassed with 0.1µF
capacitors, as shown in Figures 7a-7c.
Input Current
Figure 8 shows the equivalent circuit of the converter
input. When the conversion starts and WR is low, V
connected to sixteen 0.6pF capacitors. During this acquisition phase, the input capacitors charge to the input voltage through the resistance of the internal analog switches.
In addition, about 12pF of stray capacitance must be
charged. The input can be modeled as an equivalent RC
network (Figure 9). As source impedance increases, the
capacitors take longer to charge.
The typical 22pF input capacitance allows source resistance as high as 2.2kΩ without setup problems. For larger resistances, the acquisition time (t
The maximum sampling rate (f
achieved in the WR-RD mode (tRD< t
culated as follows:
f
=
max
MAX152
e.g. at T25 C, V3.0V:
where tWrite pulse width
tttt
=+ °=+
ADD
f
=
max
600ns 800ns 300ns 450ns
f465kHz
=
max
=
WR
tDelay between WR and RD pulses
=
RD
t = RD to INT delay
RI
t = Delay time between conversons.
P
1
+++
WRRDRIP
+++
) for the MAX152 is
max
INTL
1
) and is cal-
Signal-to-Noise Ratio and Effective
Number of Bits
Signal-to-noise plus distortion ratio (SINAD) is the ratio
of the fundamental input frequency's RMS amplitude to
the RMS amplitude of all other ADC output signals. The
output band is limited to frequencies above DC and
below one-half the ADC sample rate.
The theoretical minimum A/D noise is caused by quantization error, and results directly from the ADC's resolution: SNR = (6.02N + 1.76)dB, where N is the number
of bits of resolution. Therefore, a perfect 8-bit ADC can
do no better than 50dB.
The FFT plot (
the result of sampling a pure 30.27kHz sinusoid at a
400kHz rate. This FFT plot of the output shows the output level in various spectral bands.
The effective resolution, or "effective number of bits,"
the ADC provides can be measured by transposing the
equation that converts resolution to SNR: N = (SINAD -
1.76)/6.02 (see
Typical Operation Characteristics
Typical Operating Characteristics
) shows
).
Total Harmonic Distortion
Total harmonic distortion (THD) is the ratio of the RMS
sum of all harmonics of the input signal (in the frequency band above DC and below one-half the sample rate)
to the fundamental itself. This is expressed as:
2
2
(V
V
++++
THD20 log
=
where V
VNare the amplitudes of the 2nd through Nth harmonics.
is the fundamental RMS amplitude, and V2to
1
2
2
V
3
4
V
1
V
L
2
N
)
Spurious-Free Dynamic Range
Spurious-free dynamic range is the ratio of the fundamental RMS amplitude to the amplitude of the next
largest spectral component (in the frequency band
above DC and below one-half the sample rate).
Usually the next largest spectral component occurs at
some harmonic of the input frequency. However, if the
ADC is exceptionally linear, it may occur only at a random peak in the ADC's noise floor. See "Signal to Noise
Ratio" plot in