The MAX1448 +3V, 10-bit analog-to-digital converter
(ADC) features a fully differential input, a pipelined 10stage ADC architecture with wideband track-and-hold
(T/H), and digital error correction incorporating a fully
differential signal path. The ADC is optimized for lowpower, high dynamic performance in imaging and digital communications applications. The converter
operates from a single +2.7V to +3.6V supply, consuming only 120mW while delivering a 59dB (typ) signal-tonoise ratio (SNR) at a 20MHz input frequency. The fully
differential input stage has a -3dB 400MHz bandwidth
and may be operated with single-ended inputs. In addition to low operating power, the MAX1448 features a
5µA power-down mode for idle periods.
An internal +2.048V precision bandgap reference is
used to set the ADC full-scale range. A flexible reference structure allows the user to supply a buffered,
direct, or externally derived reference for applications
requiring increased accuracy or a different input voltage range.
Lower speed, pin-compatible versions of the MAX1448
are also available. Please refer to the MAX1444 data
sheet for a 40Msps version and to the MAX1446 data
sheet for a 60Msps version.
The MAX1448 has parallel, offset binary, CMOS-compatible three-state outputs that can be operated from
+1.7V to +3.6V to allow flexible interfacing. The device
is available in a 5mm x 5mm 32-pin TQFP package and
is specified over the extended industrial (-40°C to
+85°C) temperature range.
(VDD= +3.0V, OVDD= +2.0V; 0.1µF and 1.0µF capacitors from REFP, REFN, and COM to GND; V
REFIN
= +2.048V, REFOUT
connected to REFIN through a 10kΩ resistor, V
IN
= 2Vp-p (differential with respect to COM), CL≈ 15pF at digital outputs (Note 5),
f
CLK
= 83.3MHz (50% duty cycle), TA= T
MIN
to T
MAX
, unless otherwise noted. Typical values are at T
A
=
+25°C.)
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
VDD, OVDDto GND ...............................................-0.3V to +3.6V
OGND to GND.......................................................-0.3V to +0.3V
IN+, IN- to GND........................................................-0.3V to V
DD
REFIN, REFOUT, REFP,
REFN, and COM to GND..........................-0.3V to (V
DD
+ 0.3V)
OE, PD, CLK to GND..................................-0.3V to (V
DD
+ 0.3V)
D9–D0 to GND.........................................-0.3V to (OV
Note 1: SNR, SINAD, THD, SFDR and HD3 are based on an analog input voltage of -0.5dB FS referenced to a +1.024V full-scale
input voltage range.
Note 2: Intermodulation distortion is the total power of the intermodulation products relative to the individual carrier. This number is
6dB better if referenced to the two-tone envelope.
Note 3: Digital outputs settle to V
IH,VIL
.
Note 4: With REFIN driven externally, REFP, COM, and REFN are left floating while powered down.
Note 5: Equivalent dynamic performance is obtainable over full OV
DD
range with reduced CL.
MAX1448
10-Bit, 80Msps, Single +3.0V, Low-Power
ADC with Internal Reference
The MAX1448 uses a 10-stage, fully differential,
pipelined architecture (Figure 1) that allows for highspeed conversion while minimizing power consumption. Each sample moves through a pipeline stage
every half clock-cycle. Counting the delay through the
output latch, the clock-cycle latency is 5.5.
A 1.5-bit (2-comparator) flash ADC converts the held
input voltage into a digital code. The following digitalto-analog converter (DAC) converts the digitized result
back into an analog voltage, which is then subtracted
from the original held input signal. The resulting error
signal is then multiplied by two, and the product is
passed along to the next pipeline stage where the
process is repeated. Each stage provides a 1-bit resolution. Digital error correction compensates for ADC
comparator offsets in each pipeline stage and ensures
no missing codes.
Input Track-and-Hold Circuit
Figure 2 displays a simplified functional diagram of the
input track-and-hold (T/H) circuit in both track and hold
mode. In track mode, switches S1, S2a, S2b, S4a, S4b,
S5a, and S5b are closed. The fully differential circuit
samples the input signal onto the two capacitors (C2a
and C2b) through S4a and S4b. S2a and S2b set the
common mode for the amplifier input and open simulta-
neously with S1, sampling the input waveform. S4a and
S4b are then opened before S3a and S3b connect
capacitors C1a and C1b to the amplifier output, and
S4c is closed. The resulting differential voltage is held
on C2a and C2b. The amplifier is used to charge C1a
and C1b to the same values originally held on C2a and
C2b. This value is then presented to the first-stage
quantizer and isolates the pipeline from the fast-changing input. The wide-input-bandwidth T/H amplifier
allows the MAX1448 to track and sample/hold analog
inputs of high frequencies beyond Nyquist. Analog
inputs (IN+ and IN-) can be driven either differentially
or single-ended. It is recommended to match the
impedance of IN+ and IN- and set the common-mode
voltage to midsupply (V
DD
/2) for optimum performance.
Analog Input and Reference Configuration
The MAX1448 full-scale range is determined by the
internally generated voltage difference between REFP
(VDD/2 + V
REFIN
/4) and REFN (VDD/2 - V
REFIN
/4). The
ADC’s full-scale range is user-adjustable through the
REFIN pin, which provides a high input impedance for
this purpose. REFOUT, REFP, COM (VDD/2), and REFN
are internally buffered, low-impedance outputs.
The MAX1448 provides three modes of reference operation:
•Internal reference mode
•Buffered external reference mode
•Unbuffered external reference mode
In internal reference mode, the internal reference output (REFOUT) can be tied to the REFIN pin through a
resistor (e.g., 10kΩ) or resistor-divider if an application
requires a reduced full-scale range. For stability purposes, it is recommended to bypass REFIN with a
>10nF capacitor to GND.
In buffered external reference mode, the reference voltage levels can be adjusted externally by applying a
stable and accurate voltage at REFIN. In this mode,
REFOUT may be left open or connected to REFIN
through a >10kΩ resistor.
In unbuffered external reference mode, REFIN is connected to GND, thereby deactivating the on-chip
buffers of REFP, COM, and REFN. With their buffers
shut down, these pins become high impedance and
can be driven by external reference sources.
Clock Input (CLK)
The MAX1448 CLK input accepts CMOS-compatible
clock signals. Since the interstage conversion of the
device depends on the repeatability of the rising and
falling edges of the external clock, use a clock with low
jitter and fast rise and fall times (<2ns). In particular,
sampling occurs on the falling edge of the clock signal,
mandating this edge to provide lowest possible jitter.
Any significant aperture jitter would limit the SNR performance of the ADC as follows:
SNR = 20log (1 / 2πfINtAJ)
where fINrepresents the analog input frequency, and
tAJis the time of the aperture jitter.
Clock jitter is especially critical for undersampling
applications. The clock input should always be consid-
ered as an analog input and routed away from any analog input or other digital signal lines.
The MAX1448 clock input operates with a voltage
threshold set to VDD/2. Clock inputs with a duty cycle
other than 50% must meet the specifications for high
and low periods as stated in the Electrical Character-istics. See Figures 3a, 3b, 4a, and 4b for the relationship between spurious-free dynamic range (SFDR),
signal-to-noise ratio (SNR), total harmonic distortion
(THD), or signal-to-noise plus distortion (SINAD) versus
duty cycle.
Output Enable (OE), Power Down (PD),
and Output Data (D0–D9)
All data outputs, D0 (LSB) through D9 (MSB), are
TTL/CMOS-logic compatible. There is a 5.5 clock-cycle
latency between any particular sample and its valid
output data. The output coding is straight offset binary
(Table 1). With OE and PD high, the digital outputs
enter a high-impedance state. If OE is held low with PD
high, the outputs are latched at the last value prior to
the power down.
The capacitive load on the digital outputs D0–D9
should be kept as low as possible (<15pF) to avoid
large digital currents that could feed back into the analog portion of the MAX1448, degrading its dynamic performance. Using buffers on the ADC’s digital outputs
can further isolate the digital outputs from heavy
capacitive loads. To further improve the MAX1448’s
dynamic performance, small series resistors (e.g.,
100Ω) may be added to the digital output paths, close
to the ADC.
Figure 5 displays the timing relationship between output enable and data output valid as well as powerdown/wake-up and data output valid.
System Timing Requirements
Figure 6 shows the relationship between the clock
input, analog input, and data output. The MAX1448
samples at the falling edge of the input clock. Output
Table 1. MAX1448 Output Code for Differential Inputs
data is valid on the rising edge of the input clock. The
output data has an internal latency of 5.5 clock cycles.
Figure 6 also shows the relationship between the input
clock parameters and the valid output data.
Applications Information
Figure 7 shows a typical application circuit containing a
single-ended to differential converter. The internal reference provides a V
DD
/2 output voltage for level shifting
purposes. The input is buffered and then split to a volt-
age follower and inverter. A lowpass filter follows the op
amps to suppress some of the wideband noise associated with high-speed op amps. The user may select the
R
ISO
and CINvalues to optimize the filter performance
to suit a particular application. For the application in
Figure 7, an RISO of 50Ω is placed before the capacitive load to prevent ringing and oscillation. The 22pF
CINcapacitor acts as a small bypassing capacitor.
Figure 3a. Spurious Free Dynamic Range vs. Clock Duty
Cycle (Differential Input)
Figure 3b. Signal-to-Noise Ratio vs. Clock Duty Cycle
(Differential Input)
Figure 4a. Total Harmonic Distortion vs. Clock Duty Cycle
(Differential Input)
Figure 4b. Signal-to-Noise Plus Distortion vs. Clock Duty Cycle
(Differential Input)
100
fIN = 25.12MHz AT -0.5dB FS
90
80
SFDR (dBc)
70
60
50
204030506070
CLOCK DUTY CYCLE (%)
64
fIN = 25.12MHz AT -0.5dB FS
62
60
58
SNR (dB)
56
-50
fIN = 25.12MHz AT -0.5dB FS
-55
-60
-65
-70
THD (dBc)
-75
-80
-85
204030506070
CLOCK DUTY CYCLE (%)
64
fIN = 25.12MHz AT -0.5dB FS
62
60
58
SINAD (dB)
56
54
52
204030506070
CLOCK DUTY CYCLE (%)
54
52
204030506070
CLOCK DUTY CYCLE (%)
MAX1448
10-Bit, 80Msps, Single +3.0V, Low-Power
ADC with Internal Reference
Using Transformer Coupling
An RF transformer (Figure 8) provides an excellent
solution for converting a single-ended source signal to
a fully differential signal, required by the MAX1448 for
optimum performance. Connecting the transformer’s
center tap to COM provides a VDD/2 DC level shift to
the input. Although a 1:1 transformer is shown, a stepup transformer may be selected to reduce the drive
requirements. A reduced signal swing from the input
driver, such as an op amp, may also improve the overall distortion.
In general, the MAX1448 provides better SFDR and
THD with fully differential input signals than singleended drive, especially for very high input frequencies.
In differential input mode, even-order harmonics are
lower since both inputs (IN+, IN-) are balanced, and
each of the inputs only requires half the signal swing
compared to single-ended mode.
Single-Ended AC-Coupled Input Signal
Figure 9 shows an AC-coupled, single-ended application. The MAX4108 op amp provides high speed, high
bandwidth, low noise, and low distortion to maintain the
integrity of the input signal.
Grounding, Bypassing,
and Board Layout
The MAX1448 requires high-speed board layout design
techniques. Locate all bypass capacitors as close to
the device as possible, preferably on the same side as
the ADC, using surface-mount devices for minimum
inductance. Bypass VDD, REFP, REFN, and COM with
two parallel 0.1µF ceramic capacitors and a 2.2µF
bipolar capacitor to GND. Follow the same rules to
bypass the digital supply (OV
D
D
) to OGND. Multilayer
boards with separated ground and power planes produce the highest level of signal integrity. Consider
using a split ground plane arranged to match the physical location of the analog ground (GND) and the digital
output driver ground (OGND) on the ADC's package.
The two ground planes should be joined at a single
point so that the noisy digital ground currents do not
interfere with the analog ground plane. The ideal location of this connection can be determined experimentally at a point along the gap between the two ground
planes that produces optimum results. Make this connection with a low-value, surface-mount resistor (1Ω to
5Ω), a ferrite bead, or a direct short. Alternatively, all
ground pins could share the same ground plane if the
ground plane is sufficiently isolated from any noisy, digital systems ground plane (e.g., downstream output
buffer or DSP ground plane). Route high-speed digital
signal traces away from sensitive analog traces. Keep
all signal lines short and free of 90° turns.
Static Parameter Definitions
Integral Nonlinearity
Integral nonlinearity (INL) is the deviation of the values
on an actual transfer function from a straight line. This
straight line can be either a best straight-line fit or a line
drawn between the endpoints of the transfer function
once offset and gain errors have been nullified. The
MAX1448’s static linearity parameters are measured
using the best straight-line fit method.
Figure 7. Typical Application Circuit Using the Internal Reference
Differential nonlinearity (DNL) is the difference between
an actual step width and the ideal value of 1LSB. A
DNL error specification of less than 1LSB guarantees
no missing codes and a monotonic transfer function.
Dynamic Parameter Definitions
Aperture Jitter
Figure 10 depicts the aperture jitter (tAJ), which is the
sample-to-sample variation in the aperture delay.
Aperture Delay
Aperture delay (tAD) is the time defined between the
falling edge of the sampling clock and the instant when
an actual sample is taken (Figure 10).
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error). The ideal, theoretical
minimum A/D noise is caused by quantization error only
and results directly from the ADC’s resolution (N bits):
SNR
(MAX)
= (6.02 x N + 1.76)dB
In reality, there are other noise sources besides quantization noise: thermal noise, reference noise, clock jitter,
etc. SNR is computed by taking the ratio of the RMS
signal to the RMS noise, which includes all spectral
components minus the fundamental, the first five harmonics, and the DC offset.
Signal-to-Noise Plus Distortion (SINAD)
SINAD is computed by taking the ratio of the RMS signal to all spectral components minus the fundamental
and the DC offset.
Effective Number of Bits (ENOB)
ENOB specifies the dynamic performance of an ADC at
a specific input frequency and sampling rate. An ideal
ADC’s error consists of quantization noise only. ENOB
is computed from:
ENOB = (SINAD - 1.76dB) / 6.02dB
Figure 8. Using a Transformer for AC Coupling
Figure 9. Single-Ended AC-Coupled Input
25Ω
IN+
22pF
0.1µF
V
IN
N.C.
MINICIRCUITS
1
2
T1
TT1–6
6
5
2.2µF
43
0.1µF
25Ω
22pF
MAX1448
COM
IN-
V
IN
MAX4108
R
= 50Ω
ISO
= 22pF
C
IN
100Ω
100Ω
0.1µF
REFP
REFN
1k
R
ISO
C
1k
0.1µF
IN
R
ISO
C
IN
IN+
MAX1448
COM
IN-
MAX1448
10-Bit, 80Msps, Single +3.0V, Low-Power
ADC with Internal Reference
THD is typically the ratio of the RMS sum of the input
signal’s first five harmonics to the fundamental itself.
This is expressed as:
where V1is the fundamental amplitude, and V2through
V5are the amplitudes of the 2nd- through 5th-order
harmonics.
Spurious-Free Dynamic Range (SFDR)
SFDR is the ratio expressed in decibels of the RMS
amplitude of the fundamental (maximum signal component) to the RMS value of the next largest spurious
component, excluding DC offset.
Intermodulation Distortion (IMD)
The two-tone IMD is the ratio expressed in decibels of
either input tone to the worst 3rd-order (or higher) intermodulation products. The individual input tone levels
are at -6.5dB full scale, and their envelope is at -0.5dB
full scale.
10-Bit, 80Msps, Single +3.0V, Low-Power
ADC with Internal Reference
Maxim cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim product. No circuit patent licenses are
implied. Maxim reserves the right to change the circuitry and specifications without notice at any time.
18 ____________________Maxim Integrated Products, 120 San Gabriel Drive, Sunnyvale, CA 94086 408-737-7600
Maxim cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim product. No circuit patent licenses are
implied. Maxim reserves the right to change the circuitry and specifications without notice at any time.
18 ____________________Maxim Integrated Products, 120 San Gabriel Drive, Sunnyvale, CA 94086 408-737-7600