The MAX1421 is a +3.3V, 12-bit analog-to-digital converter (ADC), featuring a fully-differential input,
pipelined, 12-stage ADC architecture with wideband
track-and-hold (T/H) and digital error correction incorporating a fully-differential signal path. The MAX1421 is
optimized for low-power, high-dynamic performance
applications in imaging and digital communications.
The converter operates from a single +3.3V supply,
consuming only 188mW while delivering a typical signal-to-noise ratio (SNR) of 66dB at an input frequency
of 15MHz and a sampling frequency of 40Msps. The
fully-differential input stage has a small signal -3dB
bandwidth of 400MHz and may be operated with single-ended inputs.
An internal +2.048V precision bandgap reference sets
the full-scale range of the ADC. A flexible reference
structure accommodates an internal or externally
applied buffered or unbuffered reference for applications requiring increased accuracy or a different input
voltage range.
In addition to low operating power, the MAX1421 features two power-down modes, a reference power-down
and a shutdown mode. In reference power-down, the
internal bandgap reference is deactivated, resulting in
a typical 2mA supply current reduction. For idle periods, a full shutdown mode is available to maximize
power savings.
The MAX1421 provides parallel, offset binary, CMOScompatible three-state outputs.
The MAX1421 is available in a 7mm x 7mm, 48-pin
TQFP package, and is specified over the commercial
(0°C to +70°C) and the extended industrial (-40°C to
+85°C) temperature ranges.
Pin-compatible higher- and lower-speed versions of the
MAX1421 are also available. Please refer to the
MAX1420 data sheet for a frequency of 60Msps and
the MAX1422 data sheet for a frequency of 20Msps.
= +3.3V, AGND = DGND = 0, VIN= ±1.024V, differential input voltage at -0.5dB FS, internal reference,
f
CLK
= 40MHz (50% duty cycle), digital output load CL≈ 10pF, TA= T
MIN
to T
MAX
, unless otherwise noted. Typical values are at
T
A
= +25°C.)
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
AVDD, DVDDto AGND..............................................-0.3V to +4V
DV
DD
, AVDDto DGND..............................................-0.3V to +4V
DGND to AGND.....................................................-0.3V to +0.3V
INP, INN, REFP, REFN, REFIN,
CML, CLK, CLK,....................(AGND - 0.3V) to (AV
DD
+ 0.3V)
D0–D11, OE, PD .......................(DGND - 0.3V) to (DV
Note 1: Internal reference, REFIN bypassed to AGND with a combination of 0.22µF in parallel with 1nF capacitor.
Note 2: External +2.048V reference applied to REFIN.
Note 3: Internal reference disabled. V
REFIN
= 0, V
REFP
= +2.162V, V
CML
= +1.65V, and V
REFN
= +1.138V.
Note 4: IMD is measured with respect to either of the fundamental tones.
Note 5: Specifies the common-mode range of the differential input signal supplied to the MAX1421.
Note 6: V
DIFF
= V
REFP
- V
REFN
Note 7: Input bandwidth is measured at a 3dB level.
Note 8: V
REFIN
is internally biased to +2.048V through a 10kΩ resistor.
Note 9: Measured as the ratio of the change in mid-scale offset voltage for a ± 5% change in V
AVDD
using the internal reference.
ELECTRICAL CHARACTERISTICS (continued)
(V
AVDD
= V
DVDD
= +3.3V, AGND = DGND = 0, VIN= ±1.024V, differential input voltage at -0.5dB FS, internal reference,
f
CLK
= 40MHz (50% duty cycle), digital output load CL≈ 10pF, TA= T
AGNDAnalog Ground. Connect all return paths for analog signals to AGND.
Analog Supply Voltage. For optimum performance bypass to the closest AGND with a parallel
AV
DD
combination of a 0.1µF and a 1nF capacitor. Connect a single 10µF and 1µF capacitor combination
between AV
and AGND.
DD
6INPPositive Analog Signal Input
7INNNegative Analog Signal Input
17CLKClock Frequency Input. Clock frequency input ranges from 100kHz to 40MHz.
18CLK
Complementary Clock Frequency Input. This input is used for differential clock inputs. If the ADC is
driven with a single-ended clock, bypass CLK with a 0.1µF capacitor to AGND.
Digital Supply Voltage. For optimum performance bypass, to the closest DGND with a parallel
21, 31, 32,DV
DD
combination of a 0.1µF and a 1nF capacitor. Connect a single 10µF and 1µF capacitor combination
between DV
and DGND.
DD
22, 29, 30DGNDDigital Ground
23–28D0–D5Digital Data Outputs. Data bits D0 through D5, where D0 represents the LSB.
33–38D6–D11Digital Data Outputs. D6 through D11, where D11 represents the MSB.
39OE
Output Enable Input. A logic “1” on OE places the outputs D0–D11 into a high-impedance state. A
logic “0” allows for the data bits to be read from the outputs.
40PDShutdown Input. A logic “1” on PD places the ADC into shutdown mode.
External Reference Input. Bypass to AGND with a capacitor combination of 0.22µF in parallel with
43REFIN
1nF. REFIN can be biased externally to adjust reference levels and calibrate full-scale errors. To
disable the internal reference, connect REFIN to AGND.
44REFP
45REFN
46CML
P osi ti ve Refer ence I/O . Byp ass to AG N D w i th a cap aci tor com b i nati on of 0.22µF i n p ar al l el w i th 1nF.
W i th the i nter nal r efer ence d i sab l ed ( RE FIN = AG N D ) , RE FP shoul d b e b i ased to V
C M L
+ V
D IF F
/ 2.
N eg ati ve Refer ence I/O . Byp ass to AG N D w i th a cap aci tor com b i nati on of 0.22µF i n p ar al l el w i th 1nF.
W i th the i nter nal r efer ence d i sab l ed ( RE FIN = AG N D ) , RE FN shoul d b e b i ased to V
C M L
- V
D IF F
/ 2.
Common-Mode Level Input. Bypass to AGND with a capacitor combination of 0.22µF in parallel
with 1nF. With the internal reference disabled (REFIN = AGND).
Page 10
MAX1421
12-Bit, 40Msps, +3.3V, Low-Power ADC
with Internal Reference
The MAX1421 uses a 12-stage, fully-differential, pipelined architecture (Figure 1) that allows for high-speed
conversion while minimizing power consumption. Each
sample moves through a pipeline stage every halfclock-cycle. Including the delay through the output latch,
the latency is seven clock cycles.
A 2-bit (2-comparator) flash ADC converts the heldinput voltage into a digital code. The following digital-toanalog converter (DAC) converts the digitized result
back into an analog voltage, which is then subtracted
from the original held-input signal. The resulting error
signal is then multiplied by two, and the product is
passed along to the next pipeline stage. This process is
repeated until the signal has been processed by all 12
stages. Each stage provides a 1-bit resolution. Digital
error correction compensates for ADC comparator offsets in each pipeline stage and ensures no missing
codes.
Input Track-and-Hold Circuit
Figure 2 displays a simplified functional diagram of the
input T/H circuit in both track-and-hold modes. In track
mode, switches S1, S2a, S2b, S4a, S4b, S5a, and S5b
are closed. The fully differential circuit passes the input
signal to the two capacitors (C2a and C2b) throughswitches (S4a and S4b). Switches S2a and S2b set the
common mode for the transconductance amplifier
(OTA) input, and open simultaneously with S1, sampling the input waveform. The resulting differential voltage is held on capacitors C2a and C2b. Switches S4a
and S4b are then opened before switches S3a and S3b,
connecting capacitors C1a and C1b to the output of the
amplifier, and switch S4c is closed. The OTA is used to
charge capacitors C1a and C1b to the same values
originally held on C2a and C2b. This value is then presented to the first-stage quantizer and isolates the
pipeline from the fast-changing input. The wide-input
bandwidth, T/H amplifier allows the MAX1421 to track
and sample/hold analog inputs of high frequencies
beyond Nyquist. The analog inputs INP and INN can be
driven either differentially or single-ended. Match the
impedance of INP and INN and set the common-mode
voltage to midsupply (AV
DD
/ 2) for optimum perfor-
mance.
Analog Input and Reference Configuration
The full-scale range of the MAX1421 is determined by
the internally generated voltage difference between
REFP (AVDD/ 2 + V
REFIN
/ 4) and REFN (AVDD/ 2 -
V
REFIN
/ 4). The MAX1421’s full-scale range is
adjustable through REFIN, which provides a high input
impedance for this purpose. REFP, CML (AVDD/ 2), and
REFN are internally buffered low impedance outputs.
The MAX1421 provides three modes of reference operation:
•Internal reference mode
•Buffered external reference mode
•Unbuffered external reference mode
In internal reference mode, the on-chip +2.048V
bandgap reference is active and REFIN, REFP, CML,
and REFN are left floating. For stability purposes,
bypass REFIN, REFP, REFN, and CML with a capacitor
network of 0.22µF, in parallel with a 1nF capacitor to
AGND.
In buffered external reference mode, the reference voltage levels can be adjusted externally by applying a
stable and accurate voltage at REFIN.
In unbuffered external reference mode, REFIN is connected to AGND, which deactivates the on-chip buffers
of REFP, CML, and REFN. With their buffers shut down,
these nodes become high impedance and can be driven by external reference sources, as shown in Figure 3.
Clock Inputs (CLK,
CCLLKK
)
The MAX1421’s CLK and CLK inputs accept both single-ended and differential input operation, and accept
CMOS-compatible clock signals. If CLK is driven with a
single-ended clock signal, bypass CLK with a 0.1µF
capacitor to AGND. Since the interstage conversion of
the device depends on the repeatability of the rising
and falling edges of the external clock, use a clock with
low jitter and fast rise and fall times (<2ns). In particular, sampling occurs on the rising edge of the clock signal, requiring this edge to have the lowest possible
jitter. Any significant aperture jitter limits the SNR performance of the ADC according to the following relationship:
where f
IN
represents the analog input frequency and
tAJis the aperture jitter.
Clock jitter is especially critical for high input frequency
applications. The clock input should always be considered as an analog input and routed away from any analog or digital signal lines.
The MAX1421 clock input operates with a voltage
threshold set to AVDD/ 2. Clock inputs must meet the
specifications for high and low periods, as stated in the
Figure 4 shows a simplified model of the clock input circuit. This circuit consists of two 10kΩ resistors to bias
the common-mode level of each input. This circuit may
be used to AC-couple the system clock signal to the
MAX1421 clock input.
Output Enable (
OOEE
), Power-Down (PD), and
Output Data (D0–D11)
With OE high, the digital outputs enter a high-impedance state. If OE is held low with PD high, the outputs
are latched at the last value prior to the power-down. All
data outputs, D0 (LSB) through D11 (MSB), are
TTL/CMOS-logic compatible. There is a seven clock-
cycle latency between any particular sample and its
valid output data. The output coding is in offset binary
format (Table 1).
The capacitive load on the digital outputs D0 through
D11 should be kept as low as possible (≤10pF), to
avoid large digital currents that could feed back into
the analog portion of the MAX1421, thereby degrading
its dynamic performance. The use of digital buffers
(e.g., 74LVCH16244) on the digital outputs of the ADC
can further isolate the digital outputs from heavy capacitive loads. To further improve the dynamic performance of the MAX1421, add small-series resistors of
100Ω to the digital output paths, close to the ADC.
Figure 5 displays the timing relationship between output enable and data output.
System Timing Requirements
Figure 6 depicts the relationship between the clock
input, analog input, and data output. The MAX1421
samples at the rising edge of CLK (falling edge of CLK)
and output data is valid seven clock cycles (latency)
later. Figure 6 also displays the relationship between
the input clock parameters and the valid output data.
Applications Information
Figure 7 depicts a typical application circuit containing
a single-ended to differential converter. The internal reference provides an AVDD/ 2 output voltage for levelshifting purposes. The input is buffered and then split to
a voltage follower and inverter. A lowpass filter at the
input suppresses some of the wideband noise associated with high-speed op amps. Select the R
ISO
and C
IN
values to optimize the filter performance and to suit a
particular application. For the application in Figure 7, a
R
ISO
of 50Ω is placed before the capacitive load to pre-
vent ringing and oscillation. The 22pF CINcapacitor
acts as a small bypassing capacitor.
Connecting CINfrom INN to INP may further improve
dynamic performance.
Figure 4. Simplified Clock Input Circuit
Figure 5. Output Enable Timing
Table 1. MAX1421 Output Code for
Differential Inputs
An RF transformer (Figure 8) provides an excellent solution to convert a single-ended signal to a fully differential signal, required by the MAX1421 for optimum
performance. Connecting the center tap of the transformer to CML provides an AVDD/ 2 DC level shift to
the input. Although a 1:1 transformer is shown, a 1:2 or
1:4 step-up transformer may be selected to reduce the
drive requirements.
In general, the MAX1421 provides better SFDR and
THD with fully differential input signals over singleended input signals, especially for very high input frequencies. In differential input mode, even-order
harmonics are suppressed and each of the inputs
requires only half the signal swing compared to singleended mode.
Single-Ended AC-Coupled Input Signal
Figure 9 shows an AC-coupled, single-ended application, using a MAX4108 op amp. This configuration provides high-speed, high-bandwidth, low noise, and low
distortion to maintain the integrity of the input signal.
Grounding, Bypassing, and
Board Layout
The MAX1421 requires high-speed board layout design
techniques. Locate all bypass capacitors as close to
the device as possible, preferably on the same side of
the board as the ADC, using surface-mount devices for
minimum inductance. Bypass REFP, REFN, REFIN, and
CML with a parallel network of 0.22µF capacitors and
1nF to AGND. AVDDshould be bypassed with a similar
network of a 10µF bipolar capacitor in parallel with two
ceramic capacitors of 1nF and 0.1µF. Follow the same
rules to bypass the digital supply DV
DD
to DGND.
Multilayer boards with separate ground and power
planes produce the highest level of signal integrity.
Consider the use of a split ground plane arrangement
to match the physical location of the analog ground
(AGND) and the digital output driver ground (DGND) on
the ADCs package. The two ground planes should be
joined at a single point so that the noisy digital ground
currents do not interfere with the analog ground plane.
Alternatively, all ground pins could share the same
ground plane, if the ground plane is sufficiently isolated
from any noisy, digital systems ground plane (e.g.,
downstream output buffer, DSP ground plane). Route
high-speed digital signal traces away from sensitive
analog traces and remove digital ground and power
planes from underneath digital outputs. Keep all signal
lines short and free of 90 degree turns.
Static Parameter Definitions
Integral Nonlinearity (INL)
Integral nonlinearity is the deviation of the values on an
actual transfer function from a straight line. This straightline can be either a best straight-line fit or a line drawn
between the endpoints of the transfer function, once offset and gain errors have been nullified. The static linearity parameters for the MAX1421 are measured using
the best straight-line fit method.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between an
actual step-width and the ideal value of 1LSB. A DNL
Figure 6. System and Output Timing Diagram
7 CLOCK-CYCLE LATENCY
N
ANALOG INPUT
CLK
CLK
DATA OUTPUT
t
DO
N + 1
N - 7
N - 6
N + 2
N - 5
N + 3
t
CH
N - 4
N + 4
N - 3
N + 5
t
CL
N - 2
N + 6
N - 1N
Page 14
MAX1421
error specification of less than 1LSB guarantees no
missing codes.
Dynamic Parameter Definitions
Aperture Jitter
Figure 10 depicts the aperture jitter (tAJ), which is the
sample-to-sample variation in the aperture delay.
Aperture Delay
Aperture delay (t
AD
) is the time defined between the
falling edge of the sampling clock and the instant when
an actual sample is taken (Figure 10).
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error). The ideal theoretical
minimum analog-to-digital noise is caused by quantization error only and results directly from the ADCs resolution (N-bits):
SNR
(MAX)
= (6.02 ✕N + 1.76)dB
In reality, there are other noise sources besides quantization noise e.g., thermal noise, reference noise, clock
jitter, etc. SNR is computed by taking the ratio of the
RMS signal to the RMS noise, which includes all spectral components minus the fundamental, the first four
harmonics, and the DC offset.
12-Bit, 40Msps, +3.3V, Low-Power ADC
with Internal Reference
Figure 7. Typical Application Circuit for Single-Ended to Differential Conversion
+5V
+5V
INPUT
MAX4108
-5V
300Ω
300Ω
0.1µF
0.1µF
300Ω
300Ω
300Ω
300Ω
600Ω
600Ω
0.1µF
0.1µF
MAX4108
-5V
+5V
MAX4108
-5V
600Ω
0.1µF
0.1µF
0.1µF
0.1µF
300Ω
LOWPASS FILTER
R
ISO
50Ω
0.1µF
LOWPASS FILTER
R
ISO
50Ω
*TWO C
(22pF) CAPS MAY BE REPLACED BY
IN
ONE 44pF CAP, TO IMPROVE PERFORMANCE.
44pF*
C
IN
22pF
1nF0.22µF
C
IN
22pF
*
*
INP
MAX1421
CML
INN
Page 15
Signal-to-Noise Plus Distortion (SINAD)
SINAD is computed by taking the ratio of the RMS signal to all spectral components minus the fundamental
and the DC offset.
Effective Number of Bits (ENOB)
ENOB specifies the dynamic performance of an ADC at
a specific input frequency and sampling rate. An ideal
ADC’s error consists of quantization noise only. ENOB
is computed from:
*REPLACE BOTH 22pF CAPS WITH 44pF BETWEEN
INP AND INN TO IMPROVE DYNAMIC PERFORMANCE.
0.1µF
25Ω
1kΩ100Ω
0.22µF
R
50Ω
INP
MAX1421
CML
INN
INP
MAX1421
CML
INN
CLK
CLK
ANALOG
INPUT
t
SAMPLED
DATA (T/H)
T/H
AD
TRACKTRACK
t
AJ
HOLD
ENOB
SINADdBdB
=
602..
-
176
dB
Page 16
MAX1421
Total Harmonic Distortion (THD)
THD is typically the ratio of the RMS sum of the first four
harmonics of the input signal to the fundamental itself.
This is expressed as:
where V
1
is the fundamental amplitude, and V2through
V5are the amplitudes of the 2nd- through 5th-order harmonics.
Spurious-Free Dynamic Range (SFDR)
SFDR is the ratio expressed in decibels of the RMS
amplitude of the fundamental (maximum signal component) to the RMS value of the next largest spurious
component, excluding DC offset.
Intermodulation Distortion (IMD)
The two-tone IMD is the ratio expressed in decibels of
either input tone to the worst 3rd-order (or higher) intermodulation products. The individual input tone levels
are at -6.5dB full scale and their envelope is at -0.5dB
full scale.
12-Bit, 40Msps, +3.3V, Low-Power ADC
with Internal Reference
Maxim cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim product. No circuit patent licenses are
implied. Maxim reserves the right to change the circuitry and specifications without notice at any time.
17 ____________________Maxim Integrated Products, 120 San Gabriel Drive, Sunnyvale, CA 94086 408-737-7600