The MAX1198 is a 3.3V, dual, 8-bit analog-to-digital converter (ADC) featuring fully differential wideband trackand-hold (T/H) inputs, driving two ADCs. The MAX1198
is optimized for low power, small size, and high-dynamic
performance for applications in imaging, instrumentation, and digital communications. This ADC operates
from a single 2.7V to 3.6V supply, consuming only
264mW, while delivering a typical signal-to-noise and
distortion (SINAD) of 48.1dB at an input frequency of
50MHz and a sampling rate of 100Msps. The T/H-driven
input stages incorporate 400MHz (-3dB) input amplifiers. The converters may also be operated with singleended inputs. In addition to low operating power, the
MAX1198 features a 3.2mA sleep mode, as well as a
0.15µA power-down mode to conserve power during
idle periods.
An internal 2.048V precision bandgap reference sets
the full-scale range of the ADC. A flexible reference
structure allows the use of this internal or an externally
applied reference, if desired, for applications requiring
increased accuracy or a different input voltage range.
The MAX1198 features parallel, CMOS-compatible threestate outputs. The digital output format can be set to two’s
complement or straight offset binary through a single control pin. The device provides for a separate output power
supply of 1.7V to 3.6V for flexible interfacing with various
logic families. The MAX1198 is available in a 7mm x 7mm,
48-pin TQFP package, and is specified for the extended
industrial (-40°C to +85°C) temperature range.
Pin-compatible lower speed versions of the MAX1198
are also available. Refer to the MAX1195 data sheet for
40Msps and the MAX1197 data sheet for 60Msps. In
addition to these speed grades, this family includes a
multiplexed output version (MAX1196, 40Msps), for
which digital data is presented time interleaved and on
a single, parallel 8-bit output port.
For a 10-bit, pin-compatible upgrade, refer to the
MAX1180 data sheet. With the N.C. pins of the
MAX1198 internally pulled down to ground, this ADC
becomes a drop-in replacement for the MAX1180.
(VDD= 3.3V, OVDD= 2.5V, 0.1µF and 2.2µF capacitors from REFP, REFN, and COM to GND; REFOUT connected to REFIN through a
10kΩ resistor, V
IN
= 2V
P-P
(differential with respect to COM), CL= 10pF at digital outputs, f
CLK
= 100MHz, TA= T
MIN
to T
MAX
, unless
otherwise noted. ≥+25°C guaranteed by production test, <+25°C guaranteed by design and characterization. Typical values are at
T
A
= +25°C.)
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
VDD, OVDDto GND ...............................................-0.3V to +3.6V
OGND to GND.......................................................-0.3V to +0.3V
INA+, INA-, INB+, INB- to GND ...............................-0.3V to V
DD
REFIN, REFOUT, REFP, REFN,
COM, CLK to GND .................................-0.3V to (V
DD
+ 0.3V)
OE, PD, SLEEP, T/B, D7A–D0A,
D7B–D0B to OGND .............................-0.3V to (OV
(VDD= 3.3V, OVDD= 2.5V, 0.1µF and 2.2µF capacitors from REFP, REFN, and COM to GND; REFOUT connected to REFIN through a
10kΩ resistor, V
IN
= 2V
P-P
(differential with respect to COM), CL= 10pF at digital outputs, f
CLK
= 100MHz, TA= T
MIN
to T
MAX
, unless
otherwise noted. ≥+25°C guaranteed by production test, <+25°C guaranteed by design and characterization. Typical values are at
T
A
= +25°C.)
Signal-to-Noise and DistortionSINAD
Spurious-Free Dynamic RangeSFDR
Third-Harmonic DistortionHD3
Intermodulation Distortion
(First Five Odd-Order IMDs)
Third-Order Intermodulation
Distortion
Total Harmonic Distortion
(First Four Harmonics)
Small-Signal BandwidthInput at -20dB FS, differential inputs500MHz
Full-Power BandwidthFPBWInput at -1dB FS, differential inputs400MHz
Gain Flatness
(12MHz Spacing)
Aperture Delayt
Aperture Jittert
Overdrive Recovery TimeFor 1.5 × full-scale input2ns
IN T ER N A L REF ER EN C E ( RE FIN = RE FOU T thr oug h 10kΩ r esi stor ; RE FP , RE FN , and C OM l evel s ar e g ener ated i nter nal l y. )
Reference Output VoltageV
Positive Reference Output
Voltage
Negative Reference Output
Voltage
Common-Mode LevelV
PARAMETERSYMBOLCONDITIONSMINT YPMAXUNITS
f
= 7.5MHz at -1dB FS48.3
INA or B
f
= 20MHz at -1dB FS46.548.2
IMD
INA or B
f
= 50MHz at -1dB FS48.1
INA or B
f
= 115.1MHz at -1dB FS48
INA or B
f
= 7.5MHz at -1dB FS67
INA or B
f
= 20MHz at -1dB FS6067
INA or B
f
= 50MHz at -1dB FS66
INA or B
f
= 115.1MHz at -1dB FS65
INA or B
f
= 7.5MHz at -1dB FS- 67
INA or B
f
= 20MHz at -1dB FS- 67
INA or B
f
= 50MHz at -1dB FS- 67
INA or B
f
= 115.1MHz at -1dB FS- 66
INA or B
f
IN1(A or B)
f
IN2(A or B)
= 1.989MHz at -7dB FS
= 2.038MHz at -7dB FS
- 69.5dBc
dB
dBc
dBc
(Note 2)
IM3
f
IN1(A or B)
f
IN2(A or B)
= 1.989MHz at -7dB FS
= 2.038MHz at -7dB FS
- 80dBc
(Note 2)
f
= 7.5MHz at -1dB FS- 66
INA or B
f
= 20MHz at -1dB FS- 67- 57
THD
INA or B
f
= 50MHz at -1dB FS- 64
INA or B
f
= 115.1MHz at -1dB FS- 58
INA or B
f
IN1(A or B)
f
IN2(A or B)
= 106MHz at -1dB FS
= 118MHz at -1dB FS
dBc
0.05dB
(Note 3)
AD
AJ
REFOUT
V
REFP
V
REFN
COM
1dB SNR degradation at Nyquist2ps
(Note 4)
(Note 5)2.162V
(Note 5)1.138V
(Note 5)
1ns
RMS
2.048
± 3%
V
D D
±0.1
/ 2
V
V
MAX1198
Dual, 8-Bit, 100Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
Note 1: Guaranteed by design. Not subject to production testing.
Note 2: Intermodulation distortion is the total power of the intermodulation products relative to the total input power.
Note 3: Analog attenuation is defined as the amount of attenuation of the fundamental bin from a converted FFT between two
applied input signals with the same magnitude (peak-to-peak) at f
IN1
and f
IN2
.
Note 4: REFIN and REFOUT should be bypassed to GND with a 0.1µF (min) and 2.2µF (typ) capacitor.
Note 5: REFP, REFN, and COM should be bypassed to GND with a 0.1µF (min) and 2.2µF (typ) capacitor.
Note 6: Typical analog output current at f
INA & B
= 20MHz. For digital output currents vs. analog input frequency,
see Typical Operating Characteristics.
Note 7: See Figure 3 for detailed system timing diagrams. Clock to data valid timing is measured from 50% of the clock
level to 50% of the data output level.
Note 8: Crosstalk rejection is tested by applying a test tone to one channel and holding the other channel at DC level.
Crosstalk is measured by calculating the power ratio of the fundamental of each channel’s FFT.
Note 9: Amplitude matching is measured by applying the same signal to each channel and comparing the magnitude of the funda-
mental of the calculated FFT.
Note 10: Phase matching is measured by applying the same signal to each channel and comparing the phase of the fundamental
of the calculated FFT. The data from both ADC channels must be captured simultaneously during this test.
Note 11: SINAD settles to within 0.5dB of its typical value in unbuffered external reference mode.
ELECTRICAL CHARACTERISTICS (continued)
(VDD= 3.3V, OVDD= 2.5V, 0.1µF and 2.2µF capacitors from REFP, REFN, and COM to GND; REFOUT connected to REFIN through a
10kΩ resistor, V
IN
= 2V
P-P
(differential with respect to COM), CL= 10pF at digital outputs, f
CLK
= 100MHz, TA= T
MIN
to T
MAX
, unless
otherwise noted. ≥+25°C guaranteed by production test, <+25°C guaranteed by design and characterization. Typical values are at
T