Rainbow Electronics MAX1182 User Manual

General Description
The MAX1182 is a +3V, dual 10-bit analog-to-digital converter (ADC) featuring fully-differential wideband track-and-hold (T/H) inputs, driving two pipelined, 9­stage ADCs. The MAX1182 is optimized for low-power, high-dynamic performance applications in imaging, instrumentation and digital communication applications. This ADC operates from a single +2.7V to +3.6V sup­ply, consuming only 195mW while delivering a typical signal-to-noise ratio (SNR) of 59dB at an input frequen­cy of 20MHz and a sampling rate of 65Msps. The T/H driven input stages incorporate 400MHz (-3dB) input amplifiers. The converters may also be operated with single-ended inputs. In addition to low operating power, the MAX1182 features a 2.8mA sleep mode as well as a 1µA power-down mode to conserve power during idle periods.
An internal +2.048V precision bandgap reference sets the full-scale range of the ADC. A flexible reference structure allows the use of the internal or an externally derived reference, if desired for applications requiring increased accuracy or a different input voltage range.
The MAX1182 features parallel, CMOS-compatible three-state outputs. The digital output format is set to two’s complement or straight offset binary through a single control pin. The device provides for a separate output power supply of +1.7V to +3.6V for flexible inter­facing. The MAX1182 is available in a 7mm x 7mm, 48­pin TQFP package, and is specified for the extended industrial (-40°C to +85°C) temperature range.
Pin-compatible higher and lower speed versions of the MAX1182 are also available. Please refer to the MAX1180 datasheet for 105Msps, the MAX1181 datasheet for 80Msps, the MAX1183 datasheet for 40Msps, and the MAX1184 datasheet for 20Msps. In addition to these speed grades, this family includes a 20Msps multiplexed output version (MAX1185), for which digital data is presented time-interleaved on a single, parallel 10-bit output port.
Applications
High Resolution Imaging
I/Q Channel Digitization
Multchannel IF Undersampling
Instrumentation
Video Application
Features
Single +3V OperationExcellent Dynamic Performance:
59dB SNR at f
IN
= 20MHz
77dB SFDR at f
IN
= 20MHz
Low Power:
65mA (Normal Operation)
2.8mA (Sleep Mode) 1µA (Shutdown Mode)
0.02dB Gain and 0.25° Phase Matching (typ)Wide ±1V
P-P
Differential Analog Input Voltage
Range
400MHz -3dB Input BandwidthOn-Chip +2.048V Precision Bandgap ReferenceUser-Selectable Output Format—Two’s
Complement or Offset Binary
48-Pin TQFP Package with Exposed Pad for
Improved Thermal Dissipation
Evaluation Kit Available
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with
Internal Reference and Parallel Outputs
________________________________________________________________ Maxim Integrated Products 1
Pin Configuration
19-2094; Rev 0; 7/01
Ordering Information
For pricing, delivery, and ordering information, please contact Maxim/Dallas Direct! at 1-888-629-4642, or visit Maxim’s website at www.maxim-ic.com.
PART TEMP. RANGE PIN-PACKAGE
MAX1182ECM -40°C to +85°C 48 TQFP-EP
REFN
REFP
REFIN
REFOUT
D9A
D8A
D7A
D6A
D5A
D4A
D3A
D2A
COM
V GND INA+ INA-
V GND INB­INB+ GND
V
CLK
4847464544434241403938
1
2
DD
3
4
5
6
DD
7
8
9
10
11
DD
12
1314151617181920212223
DD
V
GND
MAX1182
DD
T/B
V
GND
48 TQFP-EP
SLEEP
OE
PD
D9B
D8B
D7B
37
24
D6B
36
D1A D0A
35
OGND
34
OV
33
DD
OV
32
DD
OGND
31
D0B
30
D1B
29
D2B
28
D3B
27
D4B
26
D5B
25
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with Internal Reference and Parallel Outputs
2 _______________________________________________________________________________________
ABSOLUTE MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
(VDD= +3V, OVDD= +2.5V; 0.1µF and 1.0µF capacitors from REFP, REFN, and COM to GND; REFOUT connected to REFIN through a 10kresistor, V
IN
= 2Vp-p (differential w.r.t. COM), CL= 10pF at digital outputs (Note 5), f
CLK
= 65MHz (50% duty cycle),
T
A
= T
MIN
to T
MAX
, unless otherwise noted. Typical values are at TA= +25°C.)
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
VDD, OVDD to GND...............................................-0.3V to +3.6V
OGND to GND.......................................................-0.3V to +0.3V
INA+, INA-, INB+, INB- to GND ...............................-0.3V to V
DD
REFIN, REFOUT, REFP, REFN, CLK,
COM to GND ..........................................-0.3V to (V
DD
+ 0.3V)
OE, PD, SLEEP, T/B, D9A–D0A,
D9B–D0B to OGND .............................-0.3V to (OV
DD
+ 0.3V)
Continuous Power Dissipation (T
A
= +70°C)
48-Pin TQFP (derate 12.5mW/°C above +70°C).......1000mW
Operating Temperature Range ...........................-40°C to +85°C
Junction Temperature......................................................+150°C
Storage Temperature Range .............................-60°C to +150°C
Lead temperature (soldering, 10s) ..................................+300°C
DC ACCURACY
Resolution 10 Bits
Integral Nonlinearity INL fIN = 7.47MHz ±0.6 ±1.9 LSB
Differential Nonlinearity DNL fIN = 7.47MHz, no missing codes guaranteed ±0.4 ±1.0 LSB Offset Error < ±1 ±1.7 % FS Gain Error 0 ±2 % FS
ANALOG INPUT
Differential Input Voltage Range
Common-Mode Input Voltage Range
Input Resistance R
Input Capacitance C
CONVERSION RATE
Maximum Clock Frequency f
Data Latency 5
DYNAMIC CHARACTERISTICS (f
Signal-to-Noise Ratio SNR
Signal-to-Noise and Distortion (up to 5th harmonic)
Spurious-Free Dynamic Range SFDR
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
V
DIFF
V
CLK
= 65MHz, 4096-point FFT)
CLK
SINAD
Differential or single-ended inputs ±1.0 V
CM
Switched capacitor load 33 k
IN
IN
f
= 7.47MHz, TA = +25°C 56.8 59.5
INA or B
f
= 20MHz, TA = +25°C 56.5 59
INA or B
= 39.9MHz (Note 1) 59
f
INA or B
f
= 7.47MHz, TA = +25°C 56.5 59
INA or B
f
= 20MHz, TA = +25°C 56 58.5
INA or B
= 39.9MHz (Note 1) 58.5
f
INA or B
f
= 7.47MHz, TA = +25°C6576
INA or B
f
= 20MHz, TA = +25°C6577
INA or B
= 39.9MHz, (Note 1) 75
f
INA or B
VDD/2
± 0.5
5pF
65 MHz
V
Clock
Cycles
dB
dB
dBc
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with
Internal Reference and Parallel Outputs
_______________________________________________________________________________________ 3
ELECTRICAL CHARACTERISTICS (continued)
(VDD= +3V, OVDD= +2.5V; 0.1µF and 1.0µF capacitors from REFP, REFN, and COM to GND; REFOUT connected to REFIN through a 10kresistor, V
IN
= 2Vp-p (differential w.r.t. COM), CL= 10pF at digital outputs (Note 5), f
CLK
= 65MHz (50% duty cycle),
T
A
= T
MIN
to T
MAX
, unless otherwise noted. Typical values are at TA= +25°C.)
Intermodulation Distortion (first 5 odd-order IMDs)
Total Harmonic Distortion (first 5 harmonics)
Small-Signal Bandwidth Input at -20dB FS, differential inputs 500 MHz
Full-Power Bandwidth FPBW Input at -0.5dB FS, differential inputs 400 MHz
Aperture Delay t
Aperture Jitter t
Overdrive Recovery Time For 1.5 x full-scale input 2 ns Differential Gain ±1% Differential Phase ±0.25 d egr ees
Output Noise INA+ = INA- = INB+ = INB- = COM 0.2 LSB
INTERNAL REFERENCE
Reference Output Voltage REFOUT
Reference Temperature Coefficient
Load Regulation 1.25 mV/mA
BUFFERED EXTERNAL REFERENCE (V
REFIN Input Voltage V
Positive Reference Output Voltage
Negative Reference Output Voltage
Differential Reference Output Voltage Range
REFIN Resistance R
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
f
= 7.47MHz -83
INA or B
f
= 20MHz -82Third-Harmonic Distortion HD3
INA or B
= 39.9MHz (Note 1) -77
f
INA or B
f
= 19.13042MHz at -6.5dB FS
REF
REFIN
REF
INA or B
f
= 21.2886M H z at - 6.5d B FS ( N ote 2)
I N A o r B
f
= 7.47MHz, TA = +25°C -75.5 -64
INA or B
f
= 20MHz, TA = +25°C -76 -63
INA or B
= 39.9MHz, (Note 1) -74
f
INA or B
= +2.048V)
V
REF
= V
REFP
- V
REFN
IMD
THD
TC
REFIN
V
REFP
V
REFN
V
REFIN
AD
AJ
dBc
-75 dBc
dBc
1ns
2ps
2.048
±3%
60 ppm/°C
2.048 V
2.012 V
0.988 V
0.98 1.024 1.07 V
>50 M
RMS
RMS
V
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with Internal Reference and Parallel Outputs
4 _______________________________________________________________________________________
ELECTRICAL CHARACTERISTICS (continued)
(VDD= +3V, OVDD= +2.5V; 0.1µF and 1.0µF capacitors from REFP, REFN, and COM to GND; REFOUT connected to REFIN through a 10kresistor, V
IN
= 2Vp-p (differential w.r.t. COM), CL= 10pF at digital outputs (Note 5), f
CLK
= 65MHz (50% duty cycle),
T
A
= T
MIN
to T
MAX
, unless otherwise noted. Typical values are at TA= +25°C.)
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
Maximum REFP, COM Source Current
Maximum REFP, COM Sink Current
Maximum REFN Source Current I
Maximum REFN Sink Current I
UNBUFFERED EXTERNAL REFERENCE
REFP, REFN Input Resistance
Differential Reference Input Voltage
COM Input Voltage V
REFP Input Voltage V
REFN Input Voltage V
DIGITAL INPUTS (CLK, PD, OE, SLEEP, T/B)
Input High Threshold V
Input Low Threshold V
Input Hysteresis V
Input Leakage
Input Capacitance C
DIGITAL OUTPUTS (D9A–D0A, D9B–D0B)
Output Voltage Low V
Output Voltage High V
Three-State Leakage Current I
Three-State Output Capacitance C
I
SOURCE
I
SINK
SOURCE
SINK
= AGND, reference voltage applied to REFP, REFN, and COM)
REFIN
Measured between REFP and COM, and REFN and COM
V
REF
= V
REFP
– V
REFN
CL K 0.8 x V PD, OE, SLEEP, T/B 0.8 x OV
CL K 0.2 x V PD, OE, SLEEP, T/B 0.2 x OV
VIH = OV
DD
or V
(CLK) ±5
DD
VIL = 0 ±5
I
= 200µA 0.2 V
SINK
I
OE = OV OE = OV
= 200µA OVDD - 0.2 V
SOURCE
DD
DD
R R
V
LEAK
REFP
REFN
REF
COM
REFP
REFN
IH
IL
HYST
I
IH
I
IL
IN
OL
OH
OUT
(V
,
>5 mA
250 µA
250 µA
>5 mA
4k
1.024 ±10%
VDD/2 ± 10%
V
+
COM
/2
V
REF
V
-
COM
V
/2
REF
DD
DD
DD
DD
0.1 V
5pF
±10 µA
5pF
V
V
V
V
V
V
µA
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with
Internal Reference and Parallel Outputs
_______________________________________________________________________________________ 5
ELECTRICAL CHARACTERISTICS (continued)
(VDD= +3V, OVDD= +2.5V; 0.1µF and 1.0µF capacitors from REFP, REFN, and COM to GND; REFOUT connected to REFIN through a 10kresistor, V
IN
= 2Vp-p (differential w.r.t. COM), CL= 10pF at digital outputs (Note 5), f
CLK
= 65MHz (50% duty cycle),
T
A
= T
MIN
to T
MAX
, unless otherwise noted. Typical values are at TA= +25°C.)
Note 1: SNR, SINAD, THD, SFDR, and HD3 are based on an analog input voltage of -0.5dB FS referenced to a +1.024V full-scale
input voltage range.
Note 2: Intermodulation distortion is the total power of the intermodulation products relative to the individual carrier. This number is
6dB or better, if referenced to the two-tone envelope.
Note 3: Digital outputs settle to V
IH
, VIL. Parameter guaranteed by design.
Note 4: With REFIN driven externally, REFP, COM, and REFN are left floating while powered down. Note 5: Equivalent dynamic performance is obtainable over full OV
DD
range with reduced CL.
POWER REQUIREMENTS
Analog Supply Voltage Range V
Output Supply Voltage Range OV
Analog Supply Current I
Output Supply Current I
Power Dissipation PDISS
Power-Supply Rejection Ratio PSRR
TIMING CHARACTERISTICS
CLK Rise to Output Data Valid t
Output Enable Time t
Output Disable Time t
CLK Pulse Width High t
CLK Pulse Width Low t
Wake-Up Time t
CHANNEL-TO-CHANNEL MATCHING
Crosstalk f
Gain Matching f
Phase Matching f
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
DD
DD
VDD
OVDD
DO
ENABLE
DISABLE
CH
CL
WAKE
Operating, f
Sleep mode 2.8 Shutdown, clock idle, PD = OE = OV
Operating, CL = 15pF, f
-0.5dB FS
Sleep mode 100 Shutdown, clock idle, PD = OE = OV
Operating, f
Sleep mode 8.4 Shutdown, clock idle, PD = OE = OV Offset ±0.2 mV/V Gain ±0.1 %/V
Figure 3 (Note 3) 5 8 ns
Figure 4 10 ns
Figure 4 1.5 ns
Figure 3, clock period: 15.4ns
Figure 3, clock period: 15.4ns
Wakeup from Sleep mode (Note 4) 0.42
Wakeup from Shutdown (Note 4) 1.5
= 20MHz at -0.5dB FS -70 dB
INA or B
= 20MHz at -0.5dB FS 0.02 ±0.2 dB
INA or B
= 20MHz at -0.5dB FS 0.25 d eg r ees
INA or B
= 20MHz at -0.5dB FS 65 80
INA or B
= 20MHz at
INA or B
= 20MHz at -0.5dB FS 195 240
INA or B
DD
DD
DD
2.7 3.0 3.6 V
1.7 2.5 3.6 V
mA
11A
11 mA
210
mW
34W
7.7 ± 1.5
7.7 ± 1.5
µA
ns
ns
µs
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with Internal Reference and Parallel Outputs
6 _______________________________________________________________________________________
Typical Operating Characteristics
(VDD= +3V, OVDD= +2.5V, internal reference, differential input at -0.5dB FS, f
CLK
= 65MHz, CL≈ 10pF, TA= +25°C, unless otherwise
noted.)
-100
-70
-80
-90
-50
-60
-10
-20
-30
-40
0
0 5 10 15 20 25 30 35
FFT PLOT CHA (8192-POINT RECORD,
DIFFERENTIAL INPUT)
MAX1182 toc01
ANALOG INPUT FREQUENCY (MHz)
AMPLITUDE (dB)
CHA
f
INA
= 6.0065MHz
f
INB
= 7.51410MHz
f
CLK
= 65.00057MHz
AINA = -0.55dB FS
-100
-70
-80
-90
-50
-60
-10
-20
-30
-40
0
0 5 10 15 20 25 30 35
FFT PLOT CHB (8192-POINT RECORD,
DIFFERENTIAL INPUT)
MAX1182 toc02
ANALOG INPUT FREQUENCY (MHz)
AMPLITUDE (dB)
CHB
f
INA
= 6.0065MHz
f
INB
= 7.51410MHz
f
CLK
= 65.00057MHz
AINB = -0.56dB FS
-100
-70
-80
-90
-50
-60
-10
-20
-30
-40
0
0 5 10 15 20 25 30 35
FFT PLOT CHA (8192-POINT RECORD,
DIFFERENTIAL INPUT)
MAX1182 toc03
ANALOG INPUT FREQUENCY (MHz)
AMPLITUDE (dB)
CHA
f
INA
= 20.08257MHz
f
INB
= 25.09727MHz
f
CLK
= 65.00057MHz
AINB = -0.52dB FS
-100
-70
-80
-90
-50
-60
-10
-20
-30
-40
0
0 5 10 15 20 25 30 35
FFT PLOT CHB (8192-POINT RECORD,
DIFFERENTIAL INPUT)
MAX1182 toc04
ANALOG INPUT FREQUENCY (MHz)
AMPLITUDE (dB)
CHB
f
INA
= 20.08257MHz
f
INB
= 25.09727MHz
f
CLK
= 65.00057MHz
AINB = -0.52dB FS
-100
-70
-80
-90
-50
-60
-10
-20
-30
-40
0
0 5 10 15 20 25 30 35
FFT PLOT CHA (8192-POINT RECORD,
DIFFERENTIAL INPUT)
MAX1182 toc05
ANALOG INPUT FREQUENCY (MHz)
AMPLITUDE (dB)
CHA
f
INA
= 37.31661MHz
f
INB
= 46.99687MHz
f
CLK
= 65.00057MHz
AINB = -0.52dB FS
-100
-70
-80
-90
-50
-60
-10
-20
-30
-40
0
0 5 10 15 20 25 30 35
FFT PLOT CHB (8192-POINT RECORD,
DIFFERENTIAL INPUT)
MAX1182 toc06
ANALOG INPUT FREQUENCY (MHz)
AMPLITUDE (dB)
CHB
f
INA
= 37.31661MHz
f
INB
= 46.99687MHz
f
CLK
= 65.00057MHz
AINB = -0.49dB FS
-100
-70
-80
-90
-50
-60
-10
-20
-30
-40
0
0 5 10 15 20 25 30 35
TWO-TONE IMD PLOT (8192-POINT RECORD,
DIFFERENTIAL INPUT)
MAX1182 toc07
ANALOG INPUT FREQUENCY (MHz)
AMPLITUDE (dB)
f
IN1
f
IN1
= 19.13042MHz
f
IN2
= 21.28864MHz
f
CLK
= 65.00057MHz AIN = -6.5dB FS TWO-TONE ENVELOPE = -0.47dB FS
f
IN2
2nd ORDER IMD
3rd ORDER IMD
SIGNAL-TO-NOISE RATIO
vs. ANALOG INPUT FREQUENCY
MAX1182 toc08
ANALOG INPUT FREQUENCY (MHz)
SNR (dB)
61
55
56
57
58
59
60
110100
CHA
CHB
DIFFERENTIAL INPUT CONFIGURATION
62
54
56
58
60
SIGNAL-TO-NOISE + DISTORTION
vs. ANALOG INPUT FREQUENCY
MAX1182 toc09
ANALOG INPUT FREQUENCY (MHz)
SINAD (dB)
110100
CHA
CHB
DIFFERENTIAL INPUT CONFIGURATION
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with
Internal Reference and Parallel Outputs
_______________________________________________________________________________________ 7
Typical Operating Characteristics (continued)
(VDD= +3V, OVDD= +2.5V, internal reference, differential input at -0.5dB FS, f
CLK
= 65MHz, CL≈ 10pF, TA= +25°C, unless otherwise
noted.)
THD (dB)
GAIN (dB)
TOTAL HARMONIC DISTORTION
vs. ANALOG INPUT FREQUENCY
-65 DIFFERENTIAL INPUT
CONFIGURATION
-68
-71
-74
-77
-80
110100
CHA
ANALOG INPUT FREQUENCY (MHz)
CHB
MAX1182 toc10
SFDR (dB)
SMALL-SIGNAL INPUT BANDWIDTH
vs. ANALOG INPUT FREQUENCY, SINGLE-ENDED
6
AIN = 100mV
4
2
0
-2
-4
-6
P-P
MAX1182 toc13
SPURIOUS-FREE DYNAMIC RANGE
vs. ANALOG INPUT FREQUENCY
87
DIFFERENTIAL INPUT CONFIGURATION
83
79
75
71
67
63
110100
ANALOG INPUT FREQUENCY (MHz)
SIGNAL-TO-NOISE RATIO
vs. INPUT POWER (f
65
60
55
50
SNR (dB)
45
40
= 20.085279MHz)
IN
FULL-POWER INPUT BANDWIDTH
vs. ANALOG INPUT FREQUENCY, SINGLE-ENDED
6
CHA
CHB
MAX1182 toc11
GAIN (dB)
4
2
0
-2
-4
-6
-8 1 100 100010
ANALOG INPUT FREQUENCY (MHz)
SIGNAL-TO-NOISE + DISTORTION
= 20.085279MHz)
IN
MAX1182 toc14
SINAD (dB)
vs. INPUT POWER (f
65
60
55
50
45
40
MAX1182 toc12
MAX1182 toc15
-8 1 100 100010
ANALOG INPUT FREQUENCY (MHz)
TOTAL HARMONIC DISTORTION
vs. INPUT POWER (f
-55
-60
-65
THD (dB)
-70
-75
-80
-20 -12-16 -8 -4 0 INPUT POWER (dB FS)
= 20.085279MHz)
IN
MAX1182 toc16
35
-20 -12-16 -8 -4 0 INPUT POWER (dB FS)
SPURIOUS-FREE DYNAMIC RANGE
vs. INPUT POWER (f
80
76
72
SFDR (dB)
68
64
60
-20 -12-16 -8 -4 0 INPUT POWER (dB FS)
= 20.085279MHz)
IN
MAX1182 toc17
35
-20 -12-16 -8 -4 0 INPUT POWER (dB FS)
INTEGRAL NONLINEARITY
1.0
0.5
0
INL (LSB)
-0.5
-1.0
(BEST-ENDPOINT FIT)
0 256 384128 512 640 768 896 1024
DIGITAL OUTPUT CODE
MAX1182 toc18
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with Internal Reference and Parallel Outputs
8 _______________________________________________________________________________________
Typical Operating Characteristics (continued)
(VDD= +3V, OVDD= +2.5V, internal reference, differential input at -0.5dB FS, f
CLK
= 65MHz, CL≈ 10pF, TA= +25°C, unless otherwise
noted.)
GAIN ERROR vs. TEMPERATURE,
DIFFERENTIAL NONLINEARITY
0.5
0.4
0.3
0.2
0.1
0
DNL (LSB)
-0.1
-0.2
-0.3
-0.4
-0.5 0 256 384128 512 640 768 896 1024
DIGITAL OUTPUT CODE
MAX1182 toc19
EXTERNAL REFERENCE (V
1.0
0.5
0
-0.5
-1.0
-1.5
GAIN ERROR (% FS)
-2.0
-2.5
-3.0
-40 -15 10 35 60 85 TEMPERATURE (°C)
CHA
OFFSET ERROR vs. TEMPERATURE,
REFIN
CHB
= +2.048V)
0.15
0.10
MAX1182 toc20
0.05
-0.05
OFFSET ERROR (% FS)
-0.10
-0.15
0
EXTERNAL REFERENCE
(V
REFIN
CHA
-40 10-15 35 60 85 TEMPERATURE (°C)
= +2.048V)
CHB
MAX1182 toc21
ANALOG SUPPLY CURRENT
vs. ANALOG SUPPLY VOLTAGE
80
70
(mA)
60
VDD
I
50
40
2.70 3.152.85 3.00 3.30 3.45 3.60 VDD (V)
SFDR, SNR, THD, SINAD
vs. CLOCK DUTY CYCLE
90
fIN = 25.097265MHz
SFDR
80
70
SNR
60
SFDR, SNR, THD, SINAD (dB)
50
SINAD
THD
MAX1182 toc22
ANALOG SUPPLY CURRENT
vs. TEMPERATURE
85
75
(mA)
65
VDD
I
55
45
-40 10-15 356085 TEMPERATURE (°C)
MAX1182 toc25
(V)
REFOUT
V
2.045
2.040
2.035
2.030
2.025
ANALOG POWER-DOWN CURRENT
vs. ANALOG POWER SUPPLY
0.30 OE = PD = OV
MAX1182 toc23
0.24
0.18
(µA)
VDD
I
0.12
0.06
0
2.70 3.002.85 3.15 3.30 3.45 3.60
INTERNAL REFERENCE VOLTAGE
vs. ANALOG POWER VOLTAGE
DD
MAX1182 toc24
VDD (V)
MAX1182 toc26
40
30 40 4535 50 55 60 65 70
CLOCK DUTY CYCLE (%)
2.020
2.70 3.002.85 3.15 3.30 3.45 3.60 VDD (V)
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with
Internal Reference and Parallel Outputs
_______________________________________________________________________________________ 9
Typical Operating Characteristics (continued)
(VDD= +3V, OVDD= +2.5V, internal reference, differential input at -0.5dB FS, f
CLK
= 65MHz, CL≈ 10pF, TA= +25°C, unless otherwise
noted.)
Pin Description
(V)
REFOUT
V
PIN NAME FUNCTION
1 COM Common-Mode Voltage Input/Output. Bypass to GND with a 0.1µF capacitor.
2, 6, 11, 14, 15 V
3, 7, 10, 13, 16 GND Analog Ground
4 INA+ Channel A Positive Analog Input. For single-ended operation, connect signal source to INA+.
5 INA- Channel A Negative Analog Input. For single-ended operation, connect INA- to COM.
8 INB- Channel B Negative Analog Input. For single-ended operation, connect INB- to COM.
9 INB+ Channel B Positive Analog Input. For single-ended operation, connect signal source to INB+.
12 CLK Converter Clock Input
17 T/B
INTERNAL REFERENCE VOLTAGE
vs. TEMPERATURE
2.06
2.05
2.04
2.03
2.02
2.01
2.00
-40 10-15 35 60 85 TEMPERATURE (°C)
DD
Analog Supply Voltage. Bypass to GND with a capacitor combination of 2.2µF in parallel with
0.1µF.
T/B selects the ADC digital output format. High: Twos complement. Low: Straight offset binary.
MAX1182 toc27
OUTPUT NOISE HISTOGRAM (DC INPUT)
160000
140000
120000
100000
80000
COUNTS
60000
40000
20000
0
0
N-2 N-1 N N+1 N+2
129421
926
DIGITAL OUTPUT CODE
725
MAX1182 toc28
0
18 SLEEP
19 PD
20 OE
Sleep Mode Input. High: Deactivates the two ADCs, but leaves the reference bias circuit active. Low: Normal operation.
Power-Down Input. High: Power-down mode Low: Normal operation
Output Enable Input. High: Digital outputs disabled Low: Digital outputs enabled
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with Internal Reference and Parallel Outputs
10 ______________________________________________________________________________________
Pin Description (continued)
PIN NAME FUNCTION
21 D9B Three-State Digital Output, Bit 9 (MSB), Channel B
22 D8B Three-State Digital Output, Bit 8, Channel B
23 D7B Three-State Digital Output, Bit 7, Channel B
24 D6B Three-State Digital Output, Bit 6, Channel B
25 D5B Three-State Digital Output, Bit 5, Channel B
26 D4B Three-State Digital Output, Bit 4, Channel B
27 D3B Three-State Digital Output, Bit 3, Channel B
28 D2B Three-State Digital Output, Bit 2, Channel B
29 D1B Three-State Digital Output, Bit 1, Channel B
30 D0B Three-State Digital Output, Bit 0 (LSB), Channel B
31, 34 OGND Output Driver Ground
32, 33 OV
35 D0A Three-State Digital Output, Bit 0 (LSB), Channel A
36 D1A Three-State Digital Output, Bit 1, Channel A
37 D2A Three-State Digital Output, Bit 2, Channel A
38 D3A Three-State Digital Output, Bit 3, Channel A
39 D4A Three-State Digital Output, Bit 4, Channel A
40 D5A Three-State Digital Output, Bit 5, Channel A
41 D6A Three-State Digital Output, Bit 6, Channel A
42 D7A Three-State Digital Output, Bit 7, Channel A
43 D8A Three-State Digital Output, Bit 8, Channel A
44 D9A Three-State Digital Output, Bit 9 (MSB), Channel A
45 REFOUT
46 REFIN Reference Input. V
47 REFP
48 REFN Negative Reference Input/Output. Conversion range is ± (V
DD
Output Driver Supply Voltage. Bypass to OGND with a capacitor combination of 2.2µF in parallel with 0.1µF.
Internal Reference Voltage Output. May be connected to REFIN through a resistor or a resistor divider.
= 2 (V
REFIN
Positive Reference Input/Output. Conversion range is ± (V > 0.1µF capacitor.
a > 0.1µF capacitor.
REFP
- V
). Bypass to GND with a >1nF capacitor.
REFN
- V
REFP
REFN
- V
REFP
REFN
). Bypass to GND with a
). Bypass to GND with
Detailed Description
The MAX1182 uses a 9-stage, fully-differential pipelined architecture (Figure 1) that allows for high­speed conversion while minimizing power consump­tion. Samples taken at the inputs move progressively through the pipeline stages every half clock cycle. Counting the delay through the output latch, the clock­cycle latency is five clock cycles.
1.5-bit (2-comparator) flash ADCs convert the held­input voltages into a digital code. The digital-to-analog converters (DACs) convert the digitized results back into analog voltages, which are then subtracted from the original held input signals. The resulting error sig­nals are then multiplied by two and the residues are passed along to the next pipeline stages where the process is repeated until the signals have been processed by all nine stages. Digital error correction compensates for ADC comparator offsets in each of these pipeline stages and ensures no missing codes.
Input Track-and-Hold (T/H) Circuits
Figure 2 displays a simplified functional diagram of the input track-and-hold (T/H) circuits in both track and
hold mode. In track mode, switches S1, S2a, S2b, S4a, S4b, S5a and S5b are closed. The fully-differential cir­cuits sample the input signals onto the two capacitors (C2a and C2b) through switches S4a and S4b. S2a and S2b set the common mode for the amplifier input, and open simultaneously with S1, sampling the input wave­form. Switches S4a and S4b are then opened before switches S3a and S3b, connect capacitors C1a and C1b to the output of the amplifier, and switch S4c is closed. The resulting differential voltages are held on capacitors C2a and C2b. The amplifiers are used to charge capacitors C1a and C1b to the same values originally held on C2a and C2b. These values are then presented to the first-stage quantizers and isolate the pipelines from the fast-changing inputs. The wide input bandwidth T/H amplifiers allow the MAX1182 to track­and-sample/hold analog inputs of high frequencies (> Nyquist). The ADC inputs (INA+, INB+, INA-, and INB-) can be driven either differentially or single-ended. Match the impedance of INA+ and INA- as well as INB+ and INB- and set the common-mode voltage to mid-supply (V
DD
/2) for optimum performance.
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with
Internal Reference and Parallel Outputs
______________________________________________________________________________________ 11
Figure 1. Pipelined Architecture—Stage Blocks
V
IN
T/H
Σ
V
OUT
x2
V
IN
x2
T/H
Σ
V
OUT
FLASH
ADC
T/H
V
INA
DAC
1.5 BITS
STAGE 1 STAGE 2
DIGITAL CORRECTION LOGIC
10
D9A–D0A
V
= INPUT VOLTAGE BETWEEN INA+ AND INA- (DIFFERENTIAL OR SINGLE-ENDED)
INA
= INPUT VOLTAGE BETWEEN INB+ AND INB- (DIFFERENTIAL OR SINGLE-ENDED)
V
INB
2-BIT FLASH
ADC
STAGE 8 STAGE 9
FLASH
ADC
T/H
V
INB
DAC
1.5 BITS
STAGE 1 STAGE 2
DIGITAL CORRECTION LOGIC
D9B–D0B
2-BIT FLASH
ADC
STAGE 8 STAGE 9
10
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with Internal Reference and Parallel Outputs
12 ______________________________________________________________________________________
Figure 2. MAX1182 T/H Amplifiers
INA+
INA-
INB+
S4a
S4b
S4a
S4c
S4c
C2a
C2b
C2a
INTERNAL
BIAS
S2a
S1
INTERNAL
BIAS
INTERNAL
BIAS
S2a
S1
S2b
C1a
C1b
C1a
COM
COM
COM
S5a
S5b
S5a
S3a
S3b
S3a
OUT
OUT
OUT
HOLD
TRACK
HOLD
TRACK
CLK
INTERNAL NONOVERLAPPING CLOCK SIGNALS
INB-
S4b
C2b
INTERNAL
BIAS
S2b
C1b
S5b
COM
OUT
MAX1182
S3b
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with
Internal Reference and Parallel Outputs
______________________________________________________________________________________ 13
Analog Inputs and Reference
Configurations
The full-scale range of the MAX1182 is determined by the internally generated voltage difference between REFP (VDD/2 + V
REFIN
/4) and REFN (VDD/2 - V
REFIN
/4). The full-scale range for both on-chip ADCs is adjustable through the REFIN pin, which is provided for this purpose.
REFOUT, REFP, COM (VDD/2), and REFN are internally buffered low-impedance outputs.
The MAX1182 provides three modes of reference oper­ation:
Internal reference mode
Buffered external reference mode
Unbuffered external reference mode
In internal reference mode, connect the internal refer­ence output REFOUT to REFIN through a resistor (e.g., 10k) or resistor divider, if an application requires a reduced full-scale range. For stability and noise filtering purposes bypass REFIN with a >10nF capacitor to GND. In internal reference mode, REFOUT, COM, REFP, and REFN become low-impedance outputs.
In buffered external reference mode, adjust the refer­ence voltage levels externally by applying a stable and accurate voltage at REFIN. In this mode, COM, REFP, and REFN become outputs. REFOUT may be left open or connected to REFIN through a >10kresistor.
In unbuffered external reference mode, connect REFIN to GND. This deactivates the on-chip reference buffers for REFP, COM, and REFN. With their buffers shut down, these nodes become high impedance and may be driven through separate external reference sources.
Clock Input (CLK)
The MAX1182s CLK input accepts CMOS-compatible clock signals. Since the interstage conversion of the device depends on the repeatability of the rising and falling edges of the external clock, use a clock with low jitter and fast rise and fall times (< 2ns). In particular, sampling occurs on the rising edge of the clock signal, requiring this edge to provide lowest possible jitter. Any significant aperture jitter would limit the SNR perfor­mance of the on-chip ADCs as follows:
SNR
dB
= 20 ✕log10(1 / [2π x fINx tAJ]),
where f
IN
represents the analog input frequency and t
AJ
is the time of the aperture jitter.
Clock jitter is especially critical for undersampling applications. The clock input should always be consid-
ered as an analog input and routed away from any ana­log input or other digital signal lines.
The MAX1182 clock input operates with a voltage thresh­old set to V
DD
/2. Clock inputs with a duty cycle other than 50%, must meet the specifications for high and low peri­ods as stated in the Electrical Characteristics.
System Timing Requirements
Figure 3 depicts the relationship between the clock input, analog input, and data output. The MAX1182 samples at the rising edge of the input clock. Output data for channels A and B is valid on the next rising edge of the input clock. The output data has an internal latency of five clock cycles. Figure 4 also determines the relationship between the input clock parameters and the valid output data on channels A and B.
Digital Output Data, Output Data Format
Selection (T/B), Output Enable (/OE)
All digital outputs, D0A–D9A (Channel A) and D0B–D9B (Channel B), are TTL/CMOS logic-compatible. There is a 5-clock-cycle latency between any particular sample and its corresponding output data. The output coding can be chosen to be either straight offset binary or two’s complement (Table 1) controlled by a single pin (T/B). Pull T/B low to select offset binary and high to activate two’s complement output coding. The capaci­tive load on the digital outputs D0A–D9A and D0B–D9B should be kept as low as possible (<15pF), to avoid large digital currents that could feed back into the ana­log portion of the MAX1182, thereby degrading its dynamic performance. Using buffers on the digital out­puts of the ADCs can further isolate the digital outputs from heavy capacitive loads. To further improve the dynamic performance of the MAX1182 small-series resistors (e.g., 100) maybe added to the digital output paths, close to the MAX1182.
Figure 4 displays the timing relationship between out­put enable and data output valid as well as power down/wake-up and data output valid.
Power-Down (PD) and
Sleep (SLEEP) Modes
The MAX1182 offers two power-save modessleep and full power-down mode. In sleep mode (SLEEP = 1), only the reference bias circuit is active (both ADCs are dis­abled), and current consumption is reduced to 2.8mA.
To enter full power-down mode, pull PD high. With OE simultaneously low, all outputs are latched at the last value prior to the power down. Pulling OE high forces the digital outputs into a high impedance state.
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with Internal Reference and Parallel Outputs
14 ______________________________________________________________________________________
Applications Information
Figure 5 depicts a typical application circuit containing two single-ended to differential converters. The internal reference provides a VDD/2 output voltage for level shifting purposes. The input is buffered and then split to a voltage follower and inverter. One lowpass filter per ADC suppresses some of the wideband noise associat­ed with high-speed operational amplifiers, follows the
amplifiers. The user may select the R
ISO
and CINval­ues to optimize the filter performance, to suit a particu­lar application. For the application in Figure 5, a R
ISO
of
50is placed before the capacitive load to prevent ringing and oscillation. The 22pF CINcapacitor acts as a small bypassing capacitor.
Using Transformer Coupling
A RF transformer (Figure 6) provides an excellent solu­tion to convert a single-ended source signal to a fully differential signal, required by the MAX1182 for opti­mum performance. Connecting the center tap of the transformer to COM provides a VDD/2 DC level shift to the input. Although a 1:1 transformer is shown, a step­up transformer may be selected to reduce the drive requirements. A reduced signal swing from the input driver, such as an op amp, may also improve the over­all distortion.
In general, the MAX1182 provides better SFDR and THD with fully-differential input signals than single­ended drive, especially for very high input frequencies. In differential input mode, even-order harmonics are lower as both inputs (INA+, INA- and/or INB+, INB-) are balanced, and each of the ADC inputs only requires half the signal swing compared to single-ended mode.
Figure 3. System Timing Diagram
Figure 4. Output Timing Diagram
5 CLOCK-CYCLE LATENCY
N
ANALOG INPUT
CLOCK INPUT
t
D0
DATA OUTPUT
D9A–D0A
DATA OUTPUT
D9B–D0B
OE
t
ENABLE
OUTPUT
D9A–D0A
OUTPUT
D9B–D0B
N - 6
N - 6 N - 5 N - 4 N - 3 N - 2 N - 1 N N + 1
VALID DATA
VALID DATA
t
DISABLE
N - 5
N + 1
HIGH-ZHIGH-Z
HIGH-ZHIGH-Z
N - 4
N + 2
t
CH
N - 3
N + 3
N - 2
N + 4
t
CL
N - 1
N + 5
N
N + 6
N + 1
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with
Internal Reference and Parallel Outputs
______________________________________________________________________________________ 15
Table 1. MAX1182 Output Codes For Differential Inputs
*V
REF
= V
REFP
- V
REFN
Single-Ended AC-Coupled Input Signal
Figure 7 shows an AC-coupled, single-ended applica­tion. Amplifiers like the MAX4108 provide high-speed, high-bandwidth, low noise, and low distortion to main­tain the integrity of the input signal.
Typical QAM Demodulation Application
The most frequently used modulation technique for dig­ital communications applications is probably the Quadrature Amplitude Modulation (QAM). Typically found in spread-spectrum based systems, a QAM sig­nal represents a carrier frequency modulated in both amplitude and phase. At the transmitter, modulating the baseband signal with quadrature outputs, a local oscil­lator followed by subsequent up-conversion can gener­ate the QAM signal. The result is an in-phase (I) and a quadrature (Q) carrier component, where the Q compo­nent is 90 degree phase-shifted with respect to the in­phase component. At the receiver, the QAM signal is divided down into its I and Q components, essentially representing the modulation process reversed. Figure 8 displays the demodulation process performed in the analog domain, using the dual matched +3V, 10-bit ADC MAX1182 and the MAX2451 quadrature demodu­lator to recover and digitize the I and Q baseband sig­nals. Before being digitized by the MAX1182, the mixed-down signal components may be filtered by matched analog filters, such as Nyquist or pulse-shap­ing filters which remove any unwanted images from the mixing process, thereby enhancing the overall signal­to-noise (SNR) performance and minimizing inter-sym­bol interference.
Grounding, Bypassing, and
Board Layout
The MAX1182 requires high-speed board layout design techniques. Locate all bypass capacitors as close to the device as possible, preferably on the same side as the ADC, using surface-mount devices for minimum inductance. Bypass VDD, REFP, REFN, and COM with two parallel 0.1µF ceramic capacitors and a 2.2µF bipolar capacitor to GND. Follow the same rules to bypass the digital supply (OVDD) to OGND. Multilayer boards with separated ground and power planes pro­duce the highest level of signal integrity. Consider the use of a split ground plane arranged to match the physical location of the analog ground (GND) and the digital output driver ground (OGND) on the ADCs pack­age. The two ground planes should be joined at a sin­gle point such that the noisy digital ground currents do not interfere with the analog ground plane. The ideal location of this connection can be determined experi­mentally at a point along the gap between the two ground planes, which produces optimum results. Make this connection with a low-value, surface-mount resistor (1to 5), a ferrite bead or a direct short. Alternatively, all ground pins could share the same ground plane, if the ground plane is sufficiently isolated from any noisy, digital systems ground plane (e.g., downstream output buffer or DSP ground plane). Route high-speed digital signal traces away from the sensitive analog traces of either channel. Make sure to isolate the analog input lines to each respective converter to minimize channel­to-channel crosstalk. Keep all signal lines short and free of 90 degree turns.
DIFFERENTIAL INPUT
VOLTAGE*
V
x 511/512 +FULL SCALE - 1LSB 11 1111 1111 01 1111 1111
REF
V
x 1/512 + 1 LSB 10 0000 0001 00 0000 0001
REF
0 Bipolar Zero 10 0000 0000 00 0000 0000
- V
x 1/512 - 1 LSB 01 1111 1111 11 1111 1111
REF
-V
x 511/512 - FULL SCALE + 1 LSB 00 0000 0001 10 0000 0001
REF
-V
x 512/512 - FULL SCALE 00 0000 0000 10 0000 0000
REF
DIFFERENTIAL
INPUT
STRAIGHT OFFSET
BINARY
T/B = 0
TWOS COMPLEMENT
T/B = 1
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with Internal Reference and Parallel Outputs
16 ______________________________________________________________________________________
Figure 5. Typical Application for Single-Ended to Differential Conversion
+5V
INPUT
MAX4108
300
+5V
-5V
300
0.1µF
0.1µF
300
300
300
300
300
600
600
0.1µF
0.1µF
0.1µF
MAX4108
-5V
+5V
MAX4108
-5V
+5V
MAX4108
600
0.1µF
0.1µF
600
0.1µF
0.1µF
0.1µF
LOWPASS FILTER
R
IS0
50
LOWPASS FILTER
R
IS0
50
LOWPASS FILTER
R
IS0
50
C
IN
22pF
C 22pF
C
IN
22pF
INA+
COM
INA-
IN
MAX1182
INB+
+5V
-5V
600
0.1µF
600
0.1µF
0.1µF
LOWPASS FILTER
R
IS0
50
C 22pF
INB-
IN
INPUT
MAX4108
300
+5V
-5V
300
0.1µF
0.1µF
300
300
300
-5V
600
0.1µF
600
MAX4108
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with
Internal Reference and Parallel Outputs
______________________________________________________________________________________ 17
Figure 6. Transformer-Coupled Input Drive
Static Parameter Definitions
Integral Nonlinearity (INL)
Integral nonlinearity is the deviation of the values on an actual transfer function from a straight line. This straight line can be either a best straight-line fit or a line drawn between the endpoints of the transfer function, once offset and gain errors have been nullified. The static lin­earity parameters for the MAX1182 are measured using the best straight-line fit method.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between an actual step-width and the ideal value of 1LSB. A DNL
error specification of less than 1LSB guarantees no missing codes and a monotonic transfer function.
Dynamic Parameter Definitions
Aperture Jitter
Figure 9 depicts the aperture jitter (tAJ), which is the sample-to-sample variation in the aperture delay.
Aperture Delay
Aperture delay (tAD) is the time defined between the falling edge of the sampling clock and the instant when an actual sample is taken (Figure 9).
25
INA+
22pF
0.1µF
V
IN
N.C.
MINICIRCUITS
0.1µF
V
IN
N.C.
MINICIRCUITS
1
1
3
2
2
T1
TT1–6
T1
TT1–6
6
5
2.2µF
43
6
5
2.2µF
4
0.1µF
25
22pF
25
22pF
0.1µF
25
22pF
COM
INA-
MAX1182
INB+
INB-
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with Internal Reference and Parallel Outputs
18 ______________________________________________________________________________________
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital samples, the theoretical maximum SNR is the ratio of the full-scale analog input (RMS value) to the RMS quantiza­tion error (residual error). The ideal, theoretical minimum analog-to-digital noise is caused by quantization error only and results directly from the ADCs resolution (N-Bits):
SNR
dB[max]
= 6.02dBx N + 1.76
dB
In reality, there are other noise sources besides quanti­zation noise e.g. thermal noise, reference noise, clock jitter, etc. SNR is computed by taking the ratio of the RMS signal to the RMS noise, which includes all spec­tral components minus the fundamental, the first five harmonics, and the DC offset.
Signal-to-Noise Plus Distortion (SINAD)
SINAD is computed by taking the ratio of the RMS sig­nal to all spectral components minus the fundamental and the DC offset.
Effective Number of Bits (ENOB)
ENOB specifies the dynamic performance of an ADC at a specific input frequency and sampling rate. An ideal ADCs error consists of quantization noise only. ENOB is computed from:
Figure 7: Using an Op Amp for Single-Ended, AC-Coupled Input Drive
REFP
1k
1k
R
ISO
50
C
IN
22pF
INA+
V
IN
MAX4108
100
0.1µF
REFN
100
REFP
V
IN
MAX4108
100
100
0.1µF
REFN
1k
1k
R
ISO
50
0.1µF
0.1µF
C
IN
22pF
R
50
C
22pF
R
50
C
22pF
COM
ISO
INA-
IN
MAX1182
INB+
ISO
INB-
IN
ENOB
SINAD
=
176
dB dB
602..
dB
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with
Internal Reference and Parallel Outputs
______________________________________________________________________________________ 19
Total Harmonic Distortion (THD)
THD is typically the ratio of the RMS sum of the first four harmonics of the input signal to the fundamental itself. This is expressed as:
where V
1
is the fundamental amplitude, and V2through V5are the amplitudes of the 2nd- through 5th-order harmonics.
Spurious-Free Dynamic Range (SFDR)
SFDR is the ratio expressed in decibels of the RMS amplitude of the fundamental (maximum signal compo­nent) to the RMS value of the next largest spurious component, excluding DC offset.
Intermodulation Distortion (IMD)
The two-tone IMD is the ratio expressed in decibels of either input tone to the worst 3rd-order (or higher) inter­modulation products. The individual input tone levels are at -6.5dB full scale and their envelope is at -0.5dB full scale.
Figure 8. Typical QAM Application, Using the MAX1182
HOLD
ANALOG
INPUT
SAMPLED
DATA (T/H)
T/H
t
AD
t
AJ
TRACK TRACK
CLK
Figure 9. T/H Aperture Timing
Chip Information
TRANSISTOR COUNT: 10,811 PROCESS: CMOS
DOWNCONVERTER
MAX2451
0°
90°
÷
8
INA+ INA-
MAX1182
INB+ INB-
DSP
POST
PROCESSING
THD
20
log
2
VVVV
2
10
 
2
+++
3
V
2
4
1
2
5
  
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with Internal Reference and Parallel Outputs
GND
REFERENCE
OUTPUT DRIVERS
CONTROL
T/H
T/H
PIPELINE
ADC
DEC
OUTPUT DRIVERS
REFOUT
REFN
COM
REFP
REFIN
INA+
INA-
CLK
INB+
INB-
V
DD
DEC
PIPELINE
ADC
OGND OV
DD
D9A–D0A
OE
D9B–D0B
T/B PD SLEEP
MAX1182
10
10
10
10
Functional Diagram
20 ______________________________________________________________________________________
MAX1182
Dual 10-Bit, 65Msps, +3V, Low-Power ADC with
Internal Reference and Parallel Outputs
Package Information
Maxim cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim product. No circuit patent licenses are implied. Maxim reserves the right to change the circuitry and specifications without notice at any time.
Maxim Integrated Products, 120 San Gabriel Drive, Sunnyvale, CA 94086 408-737-7600 ____________________ 21
© 2001 Maxim Integrated Products Printed USA is a registered trademark of Maxim Integrated Products.
48L,TQFP.EPS
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