The MAX1181 is a +3V, dual 10-bit, analog-to-digital
converter (ADC) featuring fully-differential wideband
track-and-hold (T/H) inputs, driving two pipelined, ninestage ADCs. The MAX1181 is optimized for low-power,
high-dynamic performance applications in imaging,
instrumentation, and digital communication applications. The MAX1181 operates from a single +2.7V to
+3.6V supply, consuming only 246mW, while delivering
a typical signal-to-noise ratio (SNR) of 59dB at an input
frequency of 20MHz and a sampling rate of 80Msps.
The T/H driven input stages incorporate 400MHz (-3dB)
input amplifiers. The converters may also be operated
with single-ended inputs. In addition to low operating
power, the MAX1181 features a 2.8mA sleep mode, as
well as a 1µA power-down mode to conserve power
during idle periods.
An internal +2.048V precision bandgap reference sets
the full-scale range of the ADC. A flexible reference
structure allows the use of the internal or external
reference, if desired for applications requiring
increased accuracy or a different input voltage range.
The MAX1181 features parallel, CMOS-compatible
three-state outputs. The digital output format is set to
two’s complement or straight offset binary through a
single control pin. The device provides for a separate
output power supply of +1.7V to +3.6V for flexible interfacing. The MAX1181 is available in a 7mm ✕ 7mm, 48pin TQFP package, and is specified for the extended
industrial (-40°C to +85°C) temperature range.
Pin-compatible higher and lower speed versions of the
MAX1181 are also available. Please refer to the
MAX1180 datasheet for 105Msps, the MAX1182
datasheet for 65Msps, the MAX1183 datasheet for
40Msps, and the MAX1184 datasheet for 20Msps. In
addition to these speed grades, this family includes a
20Msps multiplexed output version (MAX1185), for
which digital data is presented time-interleaved on a
single, parallel 10-bit output port.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
VDD, OVDDto GND ...............................................-0.3V to +3.6V
OGND to GND.......................................................-0.3V to +0.3V
INA+, INA-, INB+, INB- to GND ...............................-0.3V to V
DD
REFIN, REFOUT, REFP, REFN, CLK,
COM to GND ............................................-0.3V to (V
DD
+ 0.3V)
OE, PD, SLEEP, T/B, D9A–D0A,
D9B–D0B to OGND ................................-0.3V to (OV
(VDD= +3V, OVDD= +2.5V, internal reference, differential input at -0.5dB FS, f
CLK
= 80.0005678MHz, CL≈ 10pF. TA= +25°C,
unless otherwise noted.)
ELECTRICAL CHARACTERISTICS (continued)
(VDD= +3V, OVDD= +2.5V; 0.1µF and 1.0µF capacitors from REFP, REFN, and COM to GND; REFOUT connected to REFIN through
a 10kΩ resistor, V
IN
= 2V
p-p
(differential w.r.t. COM), CL= 10pF at digital outputs (Note 5), f
CLK
= 83.333MHz (50% duty cycle), TA=
T
MIN
to T
MAX
, unless otherwise noted. Typical values are at TA= +25°C.)
Note 1: SNR, SINAD, THD, SFDR, and HD3 are based on an analog input voltage of -0.5dB FS, referenced to a +1.024V full-scale
input voltage range.
Note 2: Intermodulation distortion is the total power of the intermodulation products relative to the individual carrier. This number is
6dB or better, if referenced to the two-tone envelope.
Note 3: Digital outputs settle to V
IH
, VIL. Parameter guaranteed by design.
Note 4: With REFIN driven externally, REFP, COM, and REFN are left floating while powered down.
Note 5: Equivalent dynamic performance is obtainable over full OV
1COMCommon-Mode Voltage Input/Output. Bypass to GND with a ≥0.1µF capacitor.
2, 6, 11, 14, 15V
3, 7, 10, 13, 16GNDAnalog Ground
4INA+Channel ‘A’ Positive Analog Input. For single-ended operation, connect signal source to INA+.
5INA-Channel ‘A’ Negative Analog Input. For single-ended operation, connect INA- to COM.
8INB-Channel ‘B’ Negative Analog Input. For single-ended operation, connect INB- to COM.
9INB+Channel ‘B’ Positive Analog Input. For single-ended operation, connect signal source to INB+.
12CLKConverter Clock Input
17T/B
18SLEEP
19PD
20OE
21D9BThree-State Digital Output, Bit 9 (MSB), Channel B
22D8BThree-State Digital Output, Bit 8, Channel B
23D7BThree-State Digital Output, Bit 7, Channel B
24D6BThree-State Digital Output, Bit 6, Channel B
25D5BThree-State Digital Output, Bit 5, Channel B
26D4BThree-State Digital Output, Bit 4, Channel B
27D3BThree-State Digital Output, Bit 3, Channel B
28D2BThree-State Digital Output, Bit 2, Channel B
29D1BThree-State Digital Output, Bit 1, Channel B
30D0BThree-State Digital Output, Bit 0 (LSB), Channel B
31, 34OGNDOutput Driver Ground
32, 33OV
35D0AThree-State Digital Output, Bit 0 (LSB), Channel A
36D1AThree-State Digital Output, Bit 1, Channel A
37D2AThree-State Digital Output, Bit 2, Channel A
38D3AThree-State Digital Output, Bit 3, Channel A
39D4AThree-State Digital Output, Bit 4, Channel A
DD
Analog Supply Voltage. Bypass to GND with a capacitor combination of 2.2µF in parallel with
0.1µF.
T/B selects the ADC digital output format.
High: Two’s complement.
Low: Straight offset binary.
Sleep Mode Input.
High: Deactivates the two ADCs, but leaves the reference bias circuit active.
Low: Normal operation.
Power-Down Input.
High: Power-down mode.
Low: Normal operation.
Output Enable Input.
High: Digital outputs disabled.
Low: Digital outputs enabled.
Output Driver Supply Voltage. Bypass to OGND with a capacitor combination of 2.2µF in parallel
DD
with 0.1µF.
Page 10
MAX1181
Detailed Description
The MAX1181 uses a nine-stage, fully-differential
pipelined architecture (Figure 1), that allows for highspeed conversion while minimizing power consumption. Samples taken at the inputs move progressively
through the pipeline stages every half clock cycle.
Counting the delay through the output latch, the clockcycle latency is five clock cycles.
1.5-bit (two-comparator) flash ADCs convert the heldinput voltages into a digital code. The digital-to-analog
converters (DACs) convert the digitized results back
into analog voltages, which are then subtracted from
the original held-input signals. The resulting error signals are then multiplied by two, and the residues are
passed along to the next pipeline stages where the
process is repeated until the signals have been
processed by all nine stages. Digital error correction
compensates for ADC comparator offsets in each of
these pipeline stages and ensures no missing codes.
Input Track-and-Hold (T/H) Circuits
Figure 2 displays a simplified functional diagram of the
input track-and-hold (T/H) circuits in both track-andhold mode. In track mode, switches S1, S2a, S2b, S4a,
S4b, S5a and S5b are closed. The fully-differential circuits sample the input signals onto the two capacitors
(C2a and C2b) through switches S4a and S4b. S2a and
S2b set the common mode for the amplifier input, and
open simultaneously with S1, sampling the input waveform. Switches S4a and S4b are then opened before
switches S3a and S3b connect capacitors C1a and
C1b to the output of the amplifier and switch S4c is
closed. The resulting differential voltages are held on
capacitors C2a and C2b. The amplifiers are used to
charge capacitors C1a and C1b to the same values
originally held on C2a and C2b. These values are then
presented to the first-stage quantizers and isolate the
pipelines from the fast-changing inputs. The wide input
bandwidth T/H amplifiers allow the MAX1181 to track
and sample/hold analog inputs of high frequencies
(> Nyquist). Both ADC inputs (INA+, INB+, INA-, and
INB-) can be driven either differentially or single-ended.
Match the impedance of INA+ and INA-, as well as
INB+ and INB-, and set the common-mode voltage to
midsupply (V
DD
/2) for optimum performance.
Analog Inputs and Reference
Configurations
The full-scale range of the MAX1181 is determined by
the internally generated voltage difference between
REFP (VDD/2 + V
REFIN
/4) and REFN (VDD/2 -
V
REFIN
/4). The full-scale range for both on-chip ADCs is
adjustable through the REFIN pin, which is provided for
this purpose.
REFOUT, REFP, COM (VDD/2) and REFN are internally
buffered low-impedance outputs.
The MAX1181 provides three modes of reference operation:
• Internal reference mode
• Buffered external reference mode
• Unbuffered external reference mode
In the internal reference mode, connect the internal reference output REFOUT to REFIN through a resistor
(e.g., 10kΩ) or resistor divider, if an application
requires a reduced full-scale range. For stability and
Dual 10-Bit, 80Msps, +3V, Low-Power ADC with
Internal Reference and Parallel Outputs
44D9AThree-State Digital Output, Bit 9 (MSB), Channel A
45REFOUT
46REFINReference Input. V
47REFP
48REFN
Internal Reference Voltage Output. May be connected to REFIN through a resistor or a resistor
divider.
REFIN
Positive Reference Input/Output. Conversion range is ±(V
with a > 0.1µF capacitor.
Negative Reference Input/Output. Conversion range is ±(V
with a > 0.1µF capacitor.
= 2 x (V
- V
REFP
). Bypass to GND with a >1nF capacitor.
REFN
- V
REFN
- V
REFN
). Bypass to GND
). Bypass to GND
REFP
REFP
Page 11
noise filtering purposes, bypass REFIN with a >10nF
capacitor to GND. In internal reference mode, REFOUT,
COM, REFP, and REFN become low-impedance outputs.
In the buffered external reference mode, adjust the reference voltage levels externally by applying a stable
and accurate voltage at REFIN. In this mode, COM,
REFP, and REFN become outputs. REFOUT may be left
open or connected to REFIN through a >10kΩ resistor.
In the unbuffered external reference mode, connect
REFIN to GND. This deactivates the on-chip reference
buffers for REFP, COM, and REFN. With their buffers
shut down, these nodes become high impedance and
may be driven through separate external reference
sources.
Clock Input (CLK)
The MAX1181’s CLK input accepts CMOS-compatible
clock signals. Since the interstage conversion of the
device depends on the repeatability of the rising and
falling edges of the external clock, use a clock with low
jitter and fast rise and fall times (< 2ns). In particular,
sampling occurs on the rising edge of the clock signal,
requiring this edge to provide lowest possible jitter. Any
significant aperture jitter would limit the SNR performance of the on-chip ADCs as follows:
SNRdB= 20 ✕log10(1 / [2π x f
IN
✕
tAJ]),
where fINrepresents the analog input frequency and
tAJis the time of the aperture jitter.
Clock jitter is especially critical for undersampling
applications. The clock input should always be considered as an analog input and routed away from any analog input or other digital signal lines.
The MAX1181 clock input operates with a voltage threshold set to VDD/2. Clock inputs with a duty cycle other
than 50% must meet the specifications for high and low
periods as stated in the Electrical Characteristics.
System Timing Requirements
Figure 3 depicts the relationship between the clock
input, analog input, and data output. The MAX1181
samples at the rising edge of the input clock. Output
data for channels A and B is valid on the next rising
edge of the input clock. The output data has an internal
latency of five clock cycles. Figure 4 also determines
the relationship between the input clock parameters
and the valid output data on channels A and B.
Digital Output Data, Output Data Format
Selection (T/B), Output Enable (
OE
)
All digital outputs, D0A–D9A (Channel A) and D0B–D9B
(Channel B), are TTL/CMOS logic-compatible. There is a
= INPUT VOLTAGE BETWEEN INA+ AND INA- (DIFFERENTIAL OR SINGLE-ENDED)
INA
= INPUT VOLTAGE BETWEEN INB+ AND INB- (DIFFERENTIAL OR SINGLE-ENDED)
V
INB
V
OUT
x2
10
STAGE 8
2-BIT FLASH
ADC
STAGE 9
V
IN
V
INB
T/H
FLASH
ADC
1.5 BITS
STAGE 1STAGE 2
T/H
Σ
DAC
DIGITAL CORRECTION LOGIC
D9B–D0B
V
OUT
x2
2-BIT FLASH
ADC
STAGE 8STAGE 9
10
Page 12
MAX1181
five clock cycle latency between any particular sample
and its corresponding output data. The output coding
can be chosen to be either straight offset binary or two’s
complement (Table 1) controlled by a single pin (T/B).
Pull T/B low to select offset binary and high to activate
two’s complement output coding. The capacitive load
on the digital outputs D0A–D9A and D0B–D9B should
be kept as low as possible (<15pF), to avoid large digital currents that could feed back into the analog portion
of the MAX1181, thereby degrading its dynamic performance. Using buffers on the digital outputs of the ADCs
can further isolate the digital outputs from heavy capacitive loads. To further improve the dynamic performance
Dual 10-Bit, 80Msps, +3V, Low-Power ADC with
Internal Reference and Parallel Outputs
of the MAX1181 small-series resistors (e.g., 100Ω), add
to the digital output paths, close to the MAX1181.
Figure 4 displays the timing relationship between output enable and data output valid, as well as powerdown/wake-up and data output valid.
Power-Down (PD) and Sleep
(SLEEP) Modes
The MAX1181 offers two power-save modes; sleep and
full power-down mode. In sleep mode (SLEEP = 1),
only the reference bias circuit is active (both ADCs are
disabled) and current consumption is reduced to
2.8mA.
To enter full power-down mode, pull PD high. With OE
simultaneously low, all outputs are latched at the last
value prior to the power-down. Pulling OE high, forces
the digital outputs into a high-impedance state.
Applications Information
Figure 5 depicts a typical application circuit containing
two single-ended to differential converters. The internal
reference provides a VDD/2 output voltage for levelshifting purposes. The input is buffered and then split
to a voltage follower and inverter. One lowpass filter per
ADC suppresses some of the wideband noise associated with high-speed operational amplifiers. The user
may select the R
ISO
and CINvalues to optimize the filter performance to suit a particular application. For the
application in Figure 5, a R
ISO
of 50Ω is placed before
the capacitive load to prevent ringing and oscillation.
The 22pF CINcapacitor acts as a small bypassing
capacitor.
Using Transformer Coupling
An RF transformer (Figure 6) provides an excellent
solution to convert a single-ended source signal to a
fully-differential signal, required by the MAX1181 for
optimum performance. Connecting the center tap of the
transformer to COM provides a VDD/2 DC level shift to
the input. Although a 1:1 transformer is shown, a stepup transformer may be selected to reduce the drive
requirements. A reduced signal swing from the input
driver, such as an op amp, may also improve the overall distortion.
In general, the MAX1181 provides better SFDR and
THD with fully-differential input signals, than a singleended drive, especially for high input frequencies. In
differential input mode, even-order harmonics are lower
as both inputs (INA+, INA- and/or INB+, INB-) are balanced, and each of the ADC inputs only require half the
signal swing compared to single-ended mode.
Single-Ended AC-Coupled Input Signal
Figure 7 shows an AC-coupled, single-ended application. Amplifiers, like the MAX4108, provide high-speed,
high bandwidth, low-noise, and low distortion to maintain the integrity of the input signal.
Typical QAM Demodulation Application
The most frequently used modulation technique for digital communications application is the Quadrature
Amplitude Modulation (QAM). QAMs are typically found
in spread-spectrum based systems. A QAM signal represents a carrier frequency modulated in both amplitude and phase. At the transmitter, modulating the
baseband signal with quadrature outputs, a local oscillator followed by subsequent up-conversion can generate the QAM signal. The result is an in-phase (I) and a
quadrature (Q) carrier component, where the Q component is 90 degrees phase-shifted with respect to the inphase component. At the receiver, the QAM signal is
divided down into its I and Q components, essentially
representing the modulation process reversed. Figure 8
displays the demodulation process performed in the
analog domain, using the dual-matched, +3V, 10-bit
ADCs, MAX1181 and the MAX2451 quadrature demodulators, to recover and digitize the I and Q baseband
signals. Before being digitized by the MAX1181, the
mixed-down signal components may be filtered by
matched analog filters, such as Nyquist or pulse-shaping filters which remove any unwanted images from the
mixing process, enhances the overall signal-to-noise
(SNR) performance, and minimizes intersymbol interference.
Grounding, Bypassing,
and Board Layout
The MAX1181 requires high-speed board layout design
techniques. Locate all bypass capacitors as close to
the device as possible, preferably on the same side as
the ADC, using surface-mount devices for minimum
inductance. Bypass VDD, REFP, REFN, and COM with
two parallel 0.1µF ceramic capacitors and a 2.2µF
bipolar capacitor to GND. Follow the same rules to
bypass the digital supply (OVDD) to OGND. Multilayer
boards with separate ground and power planes, produce the highest level of signal integrity. Consider the
use of a split ground plane arranged to match the physical location of the analog ground (GND) and the digital
output driver ground (OGND) on the ADCs package.
The two ground planes should be joined at a single
point, such that the noisy digital ground currents do not
interfere with the analog ground plane. The ideal location of this connection can be determined experimentally at a point along the gap between the two ground
planes, which produces optimum results. Make this
connection with a low-value, surface-mount resistor (1Ω
to 5Ω), a ferrite bead, or a direct short. Alternatively, all
ground pins could share the same ground plane, if the
ground plane is sufficiently isolated from any noisy, digital systems ground plane (e.g., downstream output
buffer or DSP ground plane). Route high-speed digital
signal traces away from the sensitive analog traces of
either channel. Make sure to isolate the analog input
lines to each respective converter to minimize channelto-channel crosstalk. Keep all signal lines short and
free of 90 degree turns.
Integral nonlinearity is the deviation of the values on an
actual transfer function from a straight line. This straight
line can be either a best straight-line fit or a line drawn
between the endpoints of the transfer function, once
offset and gain errors have been nullified. The static linearity parameters for the MAX1181 are measured using
the best straight-line fit method.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between an
actual step-width and the ideal value of 1LSB. A DNL
error specification of less than 1LSB guarantees no
missing codes and a monotonic transfer function.
Dynamic Parameter Definitions
Aperture Jitter
Figure 9 depicts the aperture jitter (tAJ), which is the
sample-to-sample variation in the aperture delay.
Aperture Delay
Aperture delay (tAD) is the time defined between the
falling edge of the sampling clock and the instant when
an actual sample is taken (Figure 9).
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error).
The ideal, theoretical minimum analog-to-digital noise is
caused by quantization error only and results directly
from the ADC’s resolution (N-Bits):
SNR
dB[max]
= 6.02
dB
✕
N + 1.76
dB
In reality, there are other noise sources besides quantization noise; thermal noise, reference noise, clock jitter,
etc. SNR is computed by taking the ratio of the RMS
signal to the RMS noise, which includes all spectral
components minus the fundamental, the first five harmonics, and the DC offset.
Signal-to-Noise Plus Distortion (SINAD)
SINAD is computed by taking the ratio of the RMS signal to all spectral components minus the fundamental
and the DC offset.
Effective Number of Bits (ENOB)
ENOB specifies the dynamic performance of an ADC at
a specific input frequency and sampling rate. An ideal
ADC’s error consists of quantization noise only. ENOB
is computed from:
Total Harmonic Distortion (THD)
THD is typically the ratio of the RMS sum of the first four
harmonics of the input signal to the fundamental itself.
This is expressed as:
where V1is the fundamental amplitude, and V2through
V5are the amplitudes of the 2nd- through 5th-order
harmonics.
Spurious-Free Dynamic Range (SFDR)
SFDR is the ratio expressed in decibels of the RMS
amplitude of the fundamental (maximum signal component) to the RMS value of the next largest spurious
component, excluding DC offset.
Intermodulation Distortion (IMD)
The two-tone IMD is the ratio expressed in decibels of
either input tone to the worst 3rd-order (or higher) intermodulation products. The individual input tone levels
are at -6.5dB full scale and their envelope is at -0.5dB
full scale.
Chip Information
TRANSISTOR COUNT: 10,811
PROCESS: CMOS
Figure 9. T/H Aperture Timing
CLK
ANALOG
INPUT
t
AD
SAMPLED
DATA (T/H)
T/H
TRACKTRACK
V
DD
GND
INA+
INA-
t
AJ
HOLD
T/H
PIPELINE
ADC
OGND
OV
DD
DEC
10
OUTPUT
DRIVERS
10
D9A–D0A
CLK
INB+
T/H
INB-
CONTROL
PIPELINE
REFERENCE
ADC
DEC
10
OUTPUT
DRIVERS
10
MAX1181
REFOUT
REFN
COM
REFP
REFIN
OE
D9B–D0B
T/B
PD
SLEEP
Page 19
MAX1181
Dual 10-Bit, 80Msps, +3V, Low-Power ADC with
Internal Reference and Parallel Outputs
Maxim cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim product. No circuit patent licenses are
implied. Maxim reserves the right to change the circuitry and specifications without notice at any time.
Maxim Integrated Products, 120 San Gabriel Drive, Sunnyvale, CA 94086 408-737-7600 ____________________ 19