• Generates/Detects digital bit patterns for analyzing,
evaluating and troubleshooting digital communications systems
• Operates at speeds from DC to 52 MHz
• Programmable polynomial length and feedback taps
for generation of any other pseudorandom pattern up
to 32 bits in length including: 26–1, 29–1, 211–1,
15
2
–1, 220–1, 223–1, and 232–1
• Programmable user–defined pattern and length for
generation of any repetitive pattern up to 32 bits in
length
• Large 32–bit error count and bit count registers
• Software programmable bit error insertion
• Fully independent transmit and receive sections
• 8–bit parallel control port
• Detects test patterns with bit error rates up to 10
DESCRIPTION
The DS2172 Bit Error Rate T ester (BERT) is a software
programmable test pattern generator, receiver, and
analyzer capable of meeting the most stringent error
performance requirements of digital transmission facilities. Two categories of test pattern generation (Pseudorandom and Repetitive) conform to CCITT/ITU O.151,
O.152, O.153, and O.161 standards. The DS2172
operates at clock rates ranging from DC to 52 MHz. This
wide range of operating frequency allows the DS2172 to
be used in existing and future test equipment, transmission facilities, switching equipment, multiplexers,
DACs, Routers, Bridges, CSUs, DSUs, and CPE equipment.
The DS2172 user programmable pattern registers provide the unique ability to generate loopback patterns
required for T1, Fractional–T1, Smart Jack, and other
–2
PIN ASSIGNMENT
TDATA
TDIS
TCLK
VSS
VDD
RCLK
RDIS
RDATA
32 31 30 29 28 27 26 25
TL
AD0
AD1
TEST
VSS
AD2
AD3
AD4
1
2
3
4
DS2172
32–PIN TQFP
5
6
7
8
9 101112131415 16
AD5
AD6
AD7
BTS
VSS
VDD
RD (DS)
test procedures. Hence the DS2172 can initiate the
loopback, run the test, check for errors, and finally deactivate the loopback.
The DS2172 consists of four functional blocks: the pattern generator, pattern detector , error counter , and control interface. The DS2172 can be programmed to generate any pseudorandom pattern with length up to 2
bits (See T able 5, Note 9) or any user programmable bit
pattern from 1 to 32 bits in length. Logic inputs can be
used to configure the DS2172 for applications requiring
gap clocking such as Fractional–T1, Switched–56,
DDS, normal framing requirements, and per–channel
test procedures. In addition, the DS2172 can insert
single or 10
–1
to 10–7 bit errors to verify equipment
operation and connectivity .
RL
24
23
RLOS
LC
22
21
VSS
20
VDD
19
INT
WR (R/W)
18
17
ALE (AS)
CS
32–1
Copyright 1997 by Dallas Semiconductor Corporation.
All Rights Reserved. For important information regarding
patents and other intellectual property rights, please refer to
Dallas Semiconductor data books.
031197 1/20
DS2172
1.0 GENERAL OPERATION
1.1 Pattern Generation
The DS2172 is programmed to generate a particular
test pattern by programming the following registers:
– Pattern Set Registers (PSR)
– Pattern Length Register (PLR)
– Polynomial Tap Register (PTR)
– Pattern Control Register (PCR)
– Error Insertion Register (EIR)
Please see Tables 4 and 5 for examples of how to program these registers in order to generate some standard test patterns. Once these registers are programmed, the user will then toggle the TL (Transmit
Load) bit or pin to load the pattern into the onboard pattern generation circuitry and the pattern will begin
appearing at the TDATA pin.
1.2 Pattern Synchronization
The DS2172 expects to receive the same pattern that it
transmitted. The synchronizer examines the data at
RDATA and looks for characteristics of the transmitted
pattern. The user can control the onboard synchronizer
with the Sync Enable and Resync bits in the Pattern
Control Register.
In pseudorandom mode, the received pattern is tested
to see if it fits the polynomial generator as defined in the
transmit side. For pseudorandom patterns, only the
original pattern and an all ones pattern or an all zeros
pattern will satisfy this test. Synchronization in pseudorandom pattern mode should be qualified by using the
RA1 and RA0 indicators in the Status Register. Once in
synchronization (SR0. = 1) any deviation from this pattern will be counted by the Bit Error Count Register.
In repetitive pattern mode a received pattern of the
same length as being transmitted will satisfy this test.
Synchronization in repetitive pattern mode should be
qualified by using the RA1 and RA0 indicators in the
Status Register and examining the Pattern Receive
Register (PRR0––3). See section 10 for an explanation
of the Pattern Receive Register. Once in synchronization (SR.0 = 1) any deviation from this pattern will be
counted by the Bit Error Count Register.
1.3 BER Calculation
Users can calculate the actual Bit Error Rate (BER) of
the digital communications channel by reading the bit
error count out of the Bit Error Count Register (BECR)
and reading the bit count out of the Bit Count Register
(BCR) and then dividing the BECR value with the BCR
value. The user has total control over the integration
period of the measurement. The LC (Load Count) bit or
pin is used to set the integration period.
1.4 Generating Errors
Via the Error Insertion Register (EIR), the user can
intentionally inject a particular error rate into the transmitted data stream. Injecting errors allows users to
stress communication links and to check the functionality of error monitoring equipment along the path.
1.5 Power–Up Sequence
On power–up, the registers in the DS2172 will be in a
random state. The user must program all the internal
registers to a known state before proper operation can
be insured.
031197 2/20
DS2172 FUNCTIONAL BLOCK DIAGRAM Figure 1
DS2172
RDIS
RCLK
RDATA
TDIS
TCLK
TDATA
RECEIVE
RATE
CONTROL
TRANSMIT
RATE
CONTROL
DETECTOR
LOOPBACK MUX
RECEIVE PATTERN
REGISTERS
ERROR
INSERTION
PARALLEL CONTROL PORT
BTSRDWRTESTALECSINTAD0–AD7
DS2172 PATTERN GENERATION BLOCK DIAGRAM Figure 2
TAP A FEEDBACK
BIT ERROR COUNTER
BIT COUNTER
PATTERN
PATTERN
GENERATOR
LC
SYNC
RL
TL
EIR.5
XOR
XORDFFDFFDFFDFF
01N–2N–1
TAP B FEEDBACK
PCR.5
NOTES:
1. Tap A always equals length (N–1) of pseudorandom or repetitive pattern.
2. Tab B can be programmed to any feedback tap for pseudorandom pattern generation.
031197 3/20
DS2172
DETAILED PIN DESCRIPTION Table 1
PINSYMBOLTYPEDESCRIPTION
1TLITransmit Load. A positive–going edge loads the pattern generator with the
2AD0I/OData Bus. A 8–bit multiplexed address/data bus.
3AD1I/OData Bus. A 8–bit multiplexed address/data bus.
4TESTITest. Set high to 3–state all output pins (INT, ADx, TDATA, RLOS). Should
5V
SS
6AD2I/OData Bus. A 8–bit multiplexed address/data bus.
7AD3I/OData Bus. A 8–bit multiplexed address/data bus.
8AD4I/OData Bus. A 8–bit multiplexed address/data bus.
9AD5I/OData Bus. A 8–bit multiplexed address/data bus.
10AD6I/OData Bus. A 8–bit multiplexed address/data bus.
11AD7I/OData Bus. A 8–bit multiplexed address/data bus.
12V
13V
SS
DD
14BTSIBus Type Select. Strap high to select Motorola bus timing; strap low to select
15RD (DS)IRead Input (Data Strobe).
16CSIChip Select. Must be low to read or write the port.
17ALE (AS)IAddress Latch Enable (Address Strobe). A positive going edge serves to
18WR (R/W)IWrite Input (Read/Write).
19INTOAlarm Interrupt. Flags host controller during conditions defined in Status
20V
21V
DD
SS
22LCILoad Count. A positive–going edge latches the current bit and bit error count
23RLOSOReceive Loss Of Sync. Indicates the real time status of the receive synchro-
contents of the Pattern Set Registers. The MSB of the repetitive or pseudorandom pattern appears at TDATA after the third positive edge of TCLK from
asserting TL. TL is logically OR’ed with PCR.7 and should be tied to V
not used. See Figure 8 for timing information.
be tied to V
to enable all outputs.
SS
–Signal Ground. 0.0 volts. Should be tied to local ground plane.
–Signal Ground. 0.0 volts. Should be tied to local ground plane.
–Positive Supply. 5.0 volts.
Intel bus timing. This pin controls the function of the RD
(R/W) pins. If BTS = 1, then these pins assume the function listed in
WR
(DS), ALE(AS), and
parenthesis ().
demultiplex the bus.
Register. Active low, open drain output.
–Positive Supply. 5.0 volts.
–Signal Ground. 0.0 volts. Should be tied to local ground plane.
into the user accessible BCR and BECR registers and clears the internal
count registers. LC is logically OR’ed with control bit PCR.4. Should be tied
if not used.
to V
SS
nizer. Active high output; transitions low after receiving 32 matching bits.
SS
if
031197 4/20
PINDESCRIPTIONTYPESYMBOL
24RLIReceive Load. A positive–going edge loads the previous 32 bits of data
received at RDATA into the Pattern Receive Registers. RL is logically OR’ed
with control bit PCR.3. Should be tied to V
if not used.
SS
25RDATAIReceive Data. Received NRZ serial data, sampled on the rising edge of
RCLK.
26RDISIReceive Disable. Set high to prevent the data at RDATA from being
sampled. Set low to allow bits at RDATA to be sampled. Should be tied to V
if not used. See Figure 6 for timing information. All receive side operations
are disabled when RDIS is high.
27RCLKIReceive Clock. Input clock from transmission link. 0 to 52 MHz. Can be a
gapped clock. Fully independent from TCLK.
28V
29V
DD
SS
–Positive Supply. 5.0 volts.
–Signal Ground. 0.0 volts. Should be tied to local ground plane.
30TCLKITransmit Clock. Transmit demand clock. 0 to 52 MHz. Can be a gapped
clock. Fully independent of RCLK.
31TDISITransmit Disable. Set high to hold the current bit being transmitted at
TDATA. Set low to allow the next bit to appear at TDATA. Should be tied to
if not used. See Figure 7 for timing information. All transmit side opera-
V
SS
tions are disabled when TDIS is high.
32TDATAOTransmit Data. Transmit NRZ serial data, updated on the rising edge of
TCLK.
DS2172
SS
031197 5/20
DS2172
DS2172 REGISTER MAP Table 2
ADDRESSR/WREGISTER NAME
00R/WPattern Set Register 3.
01R/WPattern Set Register 2.
02R/WPattern Set Register 1.
03R/WPattern Set Register 0.
04R/WPattern Length Register.
05R/WPolynomial Tap Register.
06R/WPattern Control Register.
07R/WError Insert Register.
08RBit Counter Register 3.
1. The Test Register must be set to 00 hex to insure
proper operation of the DS2172.
2.0 PARALLEL CONTROL INTERFACE
The DS2172 is controlled via a multiplexed bi–directional address/data bus by an external microcontroller
or microprocessor. The DS2172 can operate with either
Intel or Motorola bus timing configurations. If the BTS
pin is tied low, Intel timing will be selected; if tied high,
Motorola timing will be selected. All Motorola bus signals are listed in parenthesis (). See the timing diagrams in the A.C. Electrical Characteristics for more
details. The multiplexed bus on the DS2172 saves pins
because the address information and data information
share the same signal paths. The addresses are presented to the pins in the first portion of the bus cycle and
data will be transferred on the pins during second portion of the bus cycle. Addresses must be valid prior to
the falling edge of ALE(AS), at which time the DS2172
latches the address from the AD0 to AD7 pins. Valid
write data must be present and held stable during the
later portion of the DS or WR
DS2172 outputs a byte of data during the latter portion of
the DS or RD pulses. The read cycle is terminated and
the bus returns to a high impedance state as RD transitions high in Intel timing or as DS transitions low in Motorola timing. The DS2172 can also be easily connected
to non–multiplexed buses. RCLK and TCLK are used to
update counters and load transmit and receive pattern
registers. At slow clock rates, sufficient time must be
allowed for these port operations.
pulses. In a read cycle, the
3.0 PATTERN SET REGISTERS
The Pattern Set Registers (PSR) are loaded each time a
new pattern (whether it be pseudorandom or repetitive)
is to be generated. When a pseudorandom pattern is
generated, all four PSRs must be loaded with FF Hex.
When a repetitive pattern is to be created, the four PSRs
are loaded with the pattern that is to be repeated.
Please see Tables 4 and 5 for some programming
examples.
Length Bits LB4 to LB0 determine the length of the
pseudorandom polynomial or programmable repetitive
pattern that is generated and detected. With the
pseudorandom patterns, the “Tap A” feedback position
of the pattern generator is always equal to the value in
the Pattern Length Register (PLR). Please refer to Figure 2 for a block diagram of the pattern generator and to
Tables 4 and 5 for some programming examples.
PLR: PATTERN LENGTH REGISTER (Address=04 Hex)
(MSB)(LSB)
–
SYMBOLPOSITIONNAME AND DESCRIPTION
–PLR1.7Not Assigned. Should be set to 0 when written to.
–PLR1.6Not Assigned. Should be set to 0 when written to.
–PLR1.5Not Assigned. Should be set to 0 when written to.
LB4 PLR1.4Length Bit 4.
LB3 PLR1.3 Length Bit 3.
LB2PLR1.2Length Bit 2.
LB1PLR1.1Length Bit 1.
LB0PLR1.0Length Bit 0.
5.0 POLYNOMIAL TAP REGISTER
Polynomial T ap Bits PT4 – PT0 determine the feedback
position of T ap B connected to the XOR input of the pattern generator. Feedback Tap B provides one of two
––LB4LB3LB2LB1LB0
feedback paths within the pattern generator. Please
refer to Figure 2 for a block diagram of the pattern generator and to Tables 4 and 5 for register programming
examples.
PTR: POLYNOMIAL TAP REGISTER (Address=05 Hex)
(MSB)(LSB)
–––PT4PT3PT2PT1PT0
SYMBOLPOSITIONNAME AND DESCRIPTION
–PTR.7Not Assigned. Should be set to 0 when written to.
–PTR.6Not Assigned. Should be set to 0 when written to.
–PTR.5Not Assigned. Should be set to 0 when written to.
PT4 PTR.4Polynomial Tap Bit 4.
031197 7/20
DS2172
PT3 PTR.3Polynomial Tap Bit 3.
PT2 PTR.2Polynomial Tap Bit 2.
PT1 PTR.1Polynomial Tap Bit 1.
PT0 PTR.0Polynomial Tap Bit 0.
6.0 PATTERN CONTROL REGISTER
The Pattern Control Register (PCR) is used to configure
the operating parameters of the DS2172 and to control
the patterns being generated and received. Also the
PCR is used to control the pattern synchronizer and the
error and bit counters.
PCR: PATTERN CONTROL REGISTER (Address=06 Hex)
(MSB)(LSB)
TLQRSSPSLCRLSYNCERESYNCLPBK
SYMBOLPOSITIONNAME AND DESCRIPTION
TLPCR.7Transmit Load. A low to high transition loads the pattern generator with
QRSSPCR.6Zero Suppression Select. Forces a “one” into the pattern whenever the
PSPCR.5Pattern Select.
LCPCR.4Latch Count Registers. A low to high transition latches the bit and error
RLPCR.3Receive Data Load. A transition from low to high loads the previous 32 bits
SYNCEPCR.2SYNC Enable.
RESYNCPCR.1Initiate Manual Resync Process. A low to high transition will force the
LPBKPCR.0Transmit/Receive Loopback Select. When enabled, the RDA T A input is
the contents of the Pattern Set Registers. PCR.7 is logically ORed with the
input pin TL. Must be cleared and set again for subsequent loads.
next 14 bit positions are all “zeros”. Should only be set when using the
QRSS pattern.
0 = Zero suppression disabled
1 = Zero suppression enabled
0 = Repetitive Pattern
1 = Pseudorandom Pattern
counts into the user accessible registers BCR and BECR and clears the
internal register count. PCR.4 is logically OR’ed with input pin LC. Must be
cleared and set again for subsequent loads.
of data received at RDATA into the Pattern Receive Registers (PRR).
PCR.3 is logically OR’ed with input pin RL. Must be cleared and set again
for subsequent latches.
0 = auto resync is enabled.
1 = auto resync is disabled.
DS2172 to resynchronize to the incoming pattern at RDATA. Must be
cleared and set again for a subsequent resync.
disabled; TDATA continues to output data as normal. See Figure 1.
0 = loopback disabled
1 = loopback enabled
031197 8/20
DS2172
7.0 ERROR INSERT REGISTER
The Error Insertion Register (EIR) controls circuitry
within the DS2172 that allows the generated pattern to
automatically at regular intervals by properly programming the EIR0 to EIR2 bits or bit errors can be inserted at
random (under microcontroller control) via the EIR.3 bit.
be intentionally corrupted. Bit errors can be inserted
EIR: ERROR INSERT REGISTER (Address=07 Hex)
(MSB)(LSB)
–
SYMBOLPOSITIONNAME AND DESCRIPTION
–EIR.7Not Assigned. Should be set to 0 when written to.
–EIR.6Not Assigned. Should be set to 0 when written to.
TINVEIR.5Transmit Data Inversion Select.
RINVEIR.4Receive Data Inversion Select.
SBEEIR.3Single Bit Error Insert. A low to high transition will create a single bit error.
EIB2EIR.2Error Insert Bit 2. See Table 3.
EIB1EIR.1Error Insert Bit 1. See Table 3.
EIB0EIR.0Error Insert Bit 0. See Table 3.
–TINVRINVSBEEIR2EIR1EIR0
0 = do not invert data to be transmitted at TDATA
1 = invert data to be transmitted at TDATA
0 = do not invert data received at RDATA
1 = invert data received at RDATA
Must be cleared and set again for a subsequent bit error to be inserted. Can
be used to accomplish rates not addressed in Table 3 (e.g., BER of less
all ones0000FFFFFFFF00
all zeros0000FFFFFFFE00
alternating ones and zeros0001FFFFFFFE00
double alternating ones and zeros0003FFFFFFFC00
3 in 240017FF20002200
1 in 16000FFFFF000100
1 in 80007FFFFFF0100
1 in 40003FFFFFFF100
D4 Line Loopback Activate0004FFFFFFF000
D4 Line Loopback Deactivate0002FFFFFFFC00
NOTES FOR TABLES 4 AND 5:
1. PTR = Polynomial Tap Register (address = 05)
2. PLR = Pattern Length Register (address = 04)
3. PSR3 = Pattern Set Register 3 (address = 00)
4. PSR2 = Pattern Set Register 2 (address = 01)
5. PSR1 = Pattern Set Register 1 (address = 02)
6. PSR0 = Pattern Set Register 0 (address = 03)
7. TINV = Transmit Data Inversion Select Bit (EIR.5)
8. RINV = Receive Data Inversion Select Bit (EIR.4)
32
9. For the 2
–1 pattern, the random pattern actually repeats every (4093 x 220 ) + 1046529 bits instead of 232 – 1.
8.0 BIT COUNT REGISTERS
The Bit Count Registers (BCR3 to BCR0) comprise a
32–bit count of bits (actually RCLK cycles) received at
RDATA. BC31 is the MSB of the 32 bit count. The bit
counter increments for each cycle of RCLK when input
pin RDIS is low. The bit counter is disabled during loss
of SYNC. The Status Register bit BCOF is set when this
the user must clear the BCR by either toggling the LC bit
or pin. The DS2172 latches the bit count into the BCR
registers and clears the internal bit count when either
the PCR.4 bit or the LC input pin toggles from low to
high. The bit count and bit error count (available via the
BECRs) are used by an external processor to compute
the BER performance on a loop or channel basis.
32–bit register overflows. Upon an overflow condition,
The Bit Error Count Registers (BECR3 to BECR0) comprise a 32–bit count of bits received in error at RDATA.
The bit error counter is disabled during loss of SYNC.
BEC31 is the MSB of the 32 bit count. The Status Register bit BECOF is set when this 32–bit register overflows.
Upon an overflow condition, the user must clear the
BECR by either toggling the LC bit or pin. The DS2172
latches the bit error count into the BECR registers and
clears the internal bit error count when either the PCR.4
bit or the LC input pin toggles from low to high. The bit
count (available via the BCRs) and bit error count are
used by an external processor to compute the BER performance on a loop or channel basis.
The Pattern Receive Register (PRR) provide access to
the data patterns received at RDA T A. The operation of
these registers depends on the synchronization status
of the DS2172. Asserting the RL bit (PCR.3) or pin during an out–of –sync condition (SR.0 = 0) will latch the
previous 32 bits of data received at RDAT A into the PRR
registers. When the DS2172 is in sync (SR.0 = 1)
asserting RL will latch the pattern that to which the
BEC30BEC29BEC28BEC27BEC26BEC25BEC24
device has established synchronization. Since the
receiver has no knowledge of the start or end of the pattern, the data in the PRR registers will have no particular
alignment. As an example, if the receiver has synchronized to the pattern 00100110, PRR1 may report
1001 1000, 11000100 or any rotation thereof. Once synchronization is established, bit errors cannot be viewed
in the PRR registers.
The Status Register (SR) contains information on the
current real time status of the DS2172. When a particular event has occurred, the appropriate bit in the register
will be set to a one. All of the bits in these registers
(except for the SYNC bit) operate in a latched fashion.
This means that if an event occurs and a bit is set to a
one in any of the registers, it will remain set until the user
reads that bit. For the BED, BCOF, and BECOF status
031197 12/20
bits, they will be cleared when read and will not be set
again until the event has occurred again. For RLOS,
RA0, and RA1 status bits, they will be cleared when
read if the condition no longer persists.
The SR register has the unique ability to initiate a hardware interrupt via the INT
events in the SR can be either masked or unmasked
from the interrupt pins via the Interrupt Mask Register
(IMR).
pin. Each of the alarms and
PRR3
(addr.=10 Hex)
PRR2
(addr.=11 Hex)
PRR1
(addr.=12 Hex)
PRR0
(addr.=13 Hex)
SR: STATUS REGISTER (Address=14 Hex)
(MSB)(LSB)
–
RA1RA0RLOSBEDBCOFBECOFSYNC
SYMBOLPOSITIONNAME AND DESCRIPTION
–SR.7Not Assigned. Could be any value when read.
RA1SR.6Receive All Ones. Set when 32 consecutive ones are received; allowed to
be cleared when a zero is received.
RA0SR.5Receive All Zeros. Set when 32 consecutive zeros are received; allowed
to be cleared when a one is received.
RLOSSR.4Receive Loss Of Sync. Set when the device is searching for synchroniza-
tion. Once sync is achieved, will remain set until read.
BEDSR.3Bit Error Detection. Set when bit errors are detected.
BCOFSR.2Bit Counter Overflow. Set when the 32–bit BCR overflows.
BECOFSR.1Bit Error Count Overflow. Set when the 32–bit BECR overflows.
SYNCSR.0Sync. Real time status of the synchronizer (this bit is not latched). Will be
set when the incoming pattern at RDATA matches for 32 consecutive bit
positions. Will be cleared when 6 or more bits out of 64 are received in error
(if PCR.2 = 0).
IMR: INTERRUPT MASK REGISTER (Address=15 Hex)
(MSB)(LSB)
–RA1RA0RLOSBEDBCOFBECOFSYNC
DS2172
SYMBOLPOSITIONNAME AND DESCRIPTION
–IMR.7Not Assigned. Should be set to zero when written to.
RA1IMR.6Receive All Ones.
0 = interrupt masked
1 = interrupt enabled
RA0IMR.5Receive All Zeros.
0 = interrupt masked
1 = interrupt enabled
RLOSIMR.4Receive Loss Of Sync.
0 = interrupt masked
1 = interrupt enabled
BEDIMR.3Bit Error Detection.
0 = interrupt masked
1 = interrupt enabled
BCOFIMR.2Bit Counter Overflow.
0 = interrupt masked
1 = interrupt enabled
BECOFIMR.1Bit Error Count Overflow.
0 = interrupt masked
1 = interrupt enabled
SYNCIMR.0Sync.
0 = interrupt masked
1 = interrupt enabled
031197 13/20
DS2172
12.0 AC TIMING AND DC OPERATING CHARACTERISTICS
ABSOLUTE MAXIMUM RATINGS*
Voltage on Any Pin Relative to Ground–1.0V to +7.0V
Operating Temperature0°C to 70°C
Storage Temperature–55°C to +125°C
Soldering Temperature260°C for 10 seconds
* This is a stress rating only and functional operation of the device at these or any other conditions above those
indicated in the operation sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods of time may affect reliability.
RECOMMENDED DC OPERATING CONDITIONS(0°C to 70°C)
PARAMETERSYMBOLMINTYPMAXUNITSNOTES
Logic 1V
Logic 0V
SupplyV
IH
IL
DD
2.0VDD+0.3V
–0.3+0.8V
4.505.50V
CAPACITANCE(tA=25°C)
PARAMETERSYMBOLMINTYPMAXUNITSNOTES
Input CapacitanceC
Output CapacitanceC
IN
OUT
5pF
7pF
DC CHARACTERISTICS(0°C to 70°C; VDD=5V ± 10%)
PARAMETERSYMBOLMINTYPMAXUNITSNOTES
Supply Current @ 5VI
Input LeakageI
Output LeakageI
Output Current @ 2.4VI
Output Current @ 0.4VI
DD
LO
OH
OL
IL
–1.0+1.0µA2
–1.0mA
+4.0mA
10mA1
1.0µA3
NOTES:
1. TCLK = RCLK = 1.544 MHz; outputs open circuited.
2. 0.0V < V
3. Applies to INT when tri–stated.
031197 14/20
< V
IN
DD
DS2172
AC CHARACTERISTICS – PARALLEL PORT(0°C to 70°C; VDD=5V ± 10%)
PARAMETERSYMBOLMINTYPMAXUNITSNOTES
Cycle Timet
CYC
Pulse Width, DS Low or RD HighPW
Pulse Width, DS High or RD LowPW
Input Rise/Fall TimestR, t
R/W Hold Timet
R/W Setup Time Before DS Hight
CS Setup Time Before DS, WR or
Active
RD
CS Hold Timet
Read Data Hold Timet
Write Data Hold Timet
Mux’ed Address Valid to AS or
ALE Fall
Mux’ed Address Hold Timet
Delay Time DS, WR or RD to AS
or ALE Rise
RWH
RWS
t
CS
CH
DHR
DHW
t
ASL
AHL
t
ASD
Pulse Width AS or ALE HighPW
Delay Time, AS or ALE to DS,
or RD
WR
Output Data Delay Time from DS
or RD
Data Setup Timet
t
ASED
t
DDR
DSW
EL
EH
F
ASH
200ns
100ns
100ns
20ns
10ns
50ns
20ns
0ns
550ns
0ns
15ns
10ns
20ns
30ns
10ns
550ns
50ns
031197 15/20
DS2172
INTEL BUS READ AC TIMING (BTS=0) Figure 3
PW
ALE
t
ASD
ASH
t
CYC
WR
RD
t
ASD
PW
EL
t
CS
CS
t
ASL
AD0–AD7
t
AHL
INTEL BUS WRITE AC TIMING (BTS=0) Figure 4
PW
PW
ASH
t
EL
t
CS
t
ASL
ALE
WR
RD
CS
t
ASD
t
ASD
t
ASED
ASED
PW
EH
t
CH
t
DDR
t
CYC
PW
EH
t
t
DHR
t
DHW
CH
AD0–AD7
031197 16/20
t
t
AHL
DSW
MOTOROLA BUS AC TIMING (BTS=1) Figure 5
PW
ASH
AS
DS
R/W
AD0–AD7
(READ)
CS
AD0–AD7
(WRITE)
t
ASD
t
ASL
t
ASL
PW
t
t
AHL
AHL
t
ASED
EL
t
RWS
t
CS
t
DDR
DS2172
PW
EH
t
CYC
t
DSW
t
RWH
t
DHR
t
CH
t
DHW
031197 17/20
DS2172
AC CHARACTERISTICS – RECEIVE SIDE(0°C to 70°C; VDD=5V ± 10%)
PARAMETERSYMBOLMINTYPMAXUNITSNOTES
RCLK Periodt
RCLK Pulse Widtht
RDATA Set Up to RCLK Risingt
RDATA Hold from RCLK Risingt
RDIS Set Up to RCLK Risingt
RDIS Hold from RCLK Risingt
RL and LC Pulse Widtht
CP
CH
t
SU1
HD1
SU2
HD2
WRL
RLCK Rise and Fall TimestR, t
CL
F
19ns
8
8
ns
ns
4ns
0ns
4ns
0ns
25ns
10ns1
AC CHARACTERISTICS – TRANSMIT SIDE(0°C to 70°C; VDD=5V ± 10%)
PARAMETERSYMBOLMINTYPMAXUNITSNOTES
TCLK Periodt
TCLK Pulse Widtht
TDATA Delay from TCLK Risingt
TDIS Set Up to TCLK Risingt
TDIS Hold from TCLK Risingt
TL Pulse Widtht
TL Set Up to TCLK Risingt
TL Hold Off from TCLK Risingt
CP
CH
t
DD
SU
HD
WTL
STL
HTL
TCLK Rise and Fall TimetR, t
CL
F
19ns
8
8
ns
ns
9ns
4ns
0ns
15ns
4ns
0ns
10ns1
NOTE:
1. The maximum rise and fall time is either 10 ns or 10% of tCP whichever is less.
031197 18/20
RECEIVE AC TIMING Figure 6
t
R
DS2172
t
t
F
CL
t
CH
RCLK
t
SU1
RDATA
t
SU2
RDIS
RL/LC
TRANSMIT AC TIMING Figure 7
t
R
TCLK
TDATA
TDIS
t
DD
t
CP
t
HD1
t
HD2
t
F
t
WRL
t
CP
t
CL
t
CH
SEE NOTE BELOW
t
SU
t
HD
NOTE: When TDIS is high about the rising edge of TCLK, TDAT A will not be updated and will be held with the previous
valve until TDIS is low about the rising edge of TCLK.
TRANSMIT AC TIMING FOR THE TL INPUT Figure 8
TCLK
TDATA
t
t
HTL
TL
NOTE: The rising edge of TL causes the internal pattern generation circuitry to be reloaded; the first bit of the new
pattern (the shaded one) will appear after two TCLK periods.
STL
t
WTL
031197 19/20
DS2172
DS2172 32–PIN TQFP
031197 20/20
GAUGE
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